SU502205A1 - Eddy current device for monitoring electrically conductive products - Google Patents
Eddy current device for monitoring electrically conductive productsInfo
- Publication number
- SU502205A1 SU502205A1 SU1978321A SU1978321A SU502205A1 SU 502205 A1 SU502205 A1 SU 502205A1 SU 1978321 A SU1978321 A SU 1978321A SU 1978321 A SU1978321 A SU 1978321A SU 502205 A1 SU502205 A1 SU 502205A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- sensor
- phase
- electrically conductive
- eddy current
- frequency
- Prior art date
Links
Description
1one
Изобретение относитс к области неразрушающего контрол токовихревым методом электропроводных изделий и может быть использовано дл контрол электромагнитных параметров.The invention relates to the field of non-destructive testing by a vortex method of electrically conductive products and can be used to control electromagnetic parameters.
Известны токовихревые устройства дл контрол электропроводных изделий, содержащие генератор, выполненный в виде усилител с положительной обратной св зью, датчик параметрического типа и частотомер. Недостатком известных устройств вл етс зависимость показаний этих устройств от зазора между датчиком и изделием, что снижает точность измерени параметров изделий.Eddy current devices for monitoring electrically conductive products are known, comprising a generator configured as an amplifier with positive feedback, a parametric type sensor, and a frequency counter. A disadvantage of the known devices is the dependence of the readings of these devices on the gap between the sensor and the product, which reduces the accuracy of measurement of the parameters of the products.
С целью повышени точности контрол электромагнитных параметров издели предложенное устройство снабжено включенными в цепи обратной св зи последовательно соединенными с датчиком фазовращателем и четырехполюсником с линейной фазочастотной характеристикой, а датчик выполнен трансформаторным.In order to improve the accuracy of monitoring the electromagnetic parameters of the product, the proposed device is equipped with a phase shifter and a quadrupole with linear phase-frequency characteristic connected in series with the sensor, and the sensor is transformer-based.
На фиг. 1 показана структурна схема предлагаемого устройства; на фиг. 2 - годографы вносимой э. д. с. дл трансформаторного датчика; па фпг. 3 - фазочастотпа характеристика четырехполюспика.FIG. 1 shows a block diagram of the proposed device; in fig. 2 - hodographs introduced by e. d. for transformer sensor; pa fpg. 3 - phase characteristic four-pole characteristic.
Устройство содержпт усилитель 1, фазовращатель 2, четырехполюсник 3 с линейной фазочастотной характеристикой, трансформаторный датчик 4, эталонное изделие 5, контролируемое изделие 6, частотомер 7 и компенсатор 8 начального напр жени .The device contains an amplifier 1, a phase shifter 2, a quadrupole 3 with a linear phase-frequency characteristic, a transformer sensor 4, a reference product 5, a controlled product 6, a frequency meter 7, and an initial voltage compensator 8.
Усилитель, фазовращатель, компенсатор иAmplifier, Phaser, Compensator and
трансформаторный датчик соединены каскадпо-последовательно в замкнутую систему с положительной обратной св зью. Коэффициент передачи системы в разомкнутом состо нии за счет усилител сделан больше единицы (баланс амплитуд) прп минимально возможном коэффициенте передачи трансформаторного датчика. Фазовращатель компенсирует начальный набег фазы, а компенсатор - начальное напр жение датчика. В измерительной зоне датчика располагаетс контролируемое изделие. Частотомер соединен с выходом усилител и регистрирует изменение частоты.The transformer sensor is connected in cascade in series to a closed system with positive feedback. The transmission coefficient of the system in the open state at the expense of the amplifier is made larger than one (amplitude balance). The minimum possible transmission coefficient of the transformer sensor is made. The phase shifter compensates the initial phase shift, and the compensator compensates the initial voltage of the sensor. A monitored product is located in the measuring area of the sensor. The frequency meter is connected to the output of the amplifier and registers the change in frequency.
Устройство работает следующим образом.The device works as follows.
При номинальном значении зазора ho от датчика до издели и номинальном значении толщины /о издели , фазовый сдвиг вносимой э. д. с. относительно тока равен сро. Суммарный набег фаз по замкнутому контуру в режиме генерации должен равн тьс нулю (баланс фаз). Дл этого фазовращателем 2 ввод т начальный сдвиг фаз (-сро). В итоге автогенератор работает на частоте /о.With the nominal gap value ho from the sensor to the product and the nominal thickness / of the product, the phase shift is e. d. relative to current The total phase incursion in a closed loop in the generation mode must be zero (phase balance). For this, phase shifter 2 introduces an initial phase shift (-cro). As a result, the oscillator operates at a frequency / o.
При уменьшении толщины издели до /iWhen reducing the thickness of the product to / i
фаза вносимой э. д. с. измен етс до значени phase introduced by e. d. changes to value
Фь В результате по вл етс набег фазы АФ Ф1-фо и частота генерации измен етс до значени /ь При этом за счет линейной фазочастотной характеристики четырехполюсника приращение частоты пр мо пропорционально изменению фазы и соответственно параметру издели . При увеличении толщины до /2 измеп етс фаза вносимой э.д.с. до ф2 и частота уменьшаетс до значени /2.As a result, the phase shift of AF F1-pho appears and the generation frequency changes to the value of /. At the same time, due to the linear phase-frequency characteristic of the quadrupole, the frequency increment is directly proportional to the phase change and, accordingly, to the product parameter. As the thickness increases to / 2, the phase of the emf applied changes. to f2 and the frequency decreases to a value of / 2.
Применение четырехполюсника с линейной фазочастотиой характеристикой позвол ет производить преобразование параметров издели , вли ющих на фазу вносимой э. д. с. непосредственно в частоту, причем закон преобразовани «приращение фазы-приращение частоты - линейный.The use of a quadrupole with a linear phase-frequency characteristic allows the conversion of the product parameters that affect the phase of the input em. d. directly into the frequency, with the conversion law "phase increment-frequency increment linear.
В силу того, что линии вли ни зазора (hi-kg) близки к радиальным пр мым, фаза и, следовательно, частота при его изменении остаетс посто нной. Поэтому предлагаемое Зстройство подавл ет вли ние изменений зазора .Due to the fact that the lines of influence of the gap (hi-kg) are close to the radial straight lines, the phase and, consequently, the frequency with its change remains constant. Therefore, the proposed Device suppresses the effect of gap changes.
Предлагаемое устройство может быть использовано во всех случа х толщинометрии и электромагнитного контрол , когда полезна информаци заключена в изменении фазы вносимой э.д.с. и ее приращений дл различных датчиков.The proposed device can be used in all cases of thickness measurement and electromagnetic control, when useful information is contained in a change in the phase of the emf applied. and its increments for various sensors.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU1978321A SU502205A1 (en) | 1973-12-24 | 1973-12-24 | Eddy current device for monitoring electrically conductive products |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU1978321A SU502205A1 (en) | 1973-12-24 | 1973-12-24 | Eddy current device for monitoring electrically conductive products |
Publications (1)
Publication Number | Publication Date |
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SU502205A1 true SU502205A1 (en) | 1976-02-05 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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SU1978321A SU502205A1 (en) | 1973-12-24 | 1973-12-24 | Eddy current device for monitoring electrically conductive products |
Country Status (1)
Country | Link |
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SU (1) | SU502205A1 (en) |
Cited By (8)
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US5453689A (en) * | 1991-12-06 | 1995-09-26 | Massachusetts Institute Of Technology | Magnetometer having periodic winding structure and material property estimator |
US5793206A (en) * | 1995-08-25 | 1998-08-11 | Jentek Sensors, Inc. | Meandering winding test circuit |
US6144206A (en) * | 1997-01-06 | 2000-11-07 | Jentek Sensors, Inc. | Magnetometer with waveform shaping |
US6188218B1 (en) | 1997-10-29 | 2001-02-13 | Jentek Sensors, Inc. | Absolute property measurement with air calibration |
US6377039B1 (en) | 1997-11-14 | 2002-04-23 | Jentek Sensors, Incorporated | Method for characterizing coating and substrates |
US6420867B1 (en) | 1997-03-13 | 2002-07-16 | Jentek Sensors, Inc. | Method of detecting widespread fatigue and cracks in a metal structure |
US6486673B1 (en) | 1997-01-06 | 2002-11-26 | Jentek Sensors, Inc. | Segmented field dielectrometer |
US6781387B2 (en) | 1997-01-06 | 2004-08-24 | Jentek Sensors, Inc. | Inspection method using penetrant and dielectrometer |
-
1973
- 1973-12-24 SU SU1978321A patent/SU502205A1/en active
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
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US6252398B1 (en) | 1991-12-06 | 2001-06-26 | Massachusetts Institute Of Technology | Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometers |
US5453689A (en) * | 1991-12-06 | 1995-09-26 | Massachusetts Institute Of Technology | Magnetometer having periodic winding structure and material property estimator |
US5629621A (en) * | 1991-12-06 | 1997-05-13 | Massachusetts Institute Of Technology | Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometers |
US5990677A (en) * | 1991-12-06 | 1999-11-23 | Massachusetts Institute Of Technology | Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometer |
US6433542B2 (en) | 1991-12-06 | 2002-08-13 | Massachusetts Institute Of Technology | Apparatus and method for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometers |
US5793206A (en) * | 1995-08-25 | 1998-08-11 | Jentek Sensors, Inc. | Meandering winding test circuit |
US5966011A (en) * | 1995-08-25 | 1999-10-12 | Jentek Sensors, Inc. | Apparatus for measuring bulk materials and surface conditions for flat and curved parts |
US6198279B1 (en) | 1995-08-25 | 2001-03-06 | Jentek Sensors, Inc. | Test material analysis using offset scanning meandering windings |
US6351120B2 (en) | 1995-08-25 | 2002-02-26 | Jentek Sensors, Inc. | Test circuit on flexible membrane with adhesive |
US6486673B1 (en) | 1997-01-06 | 2002-11-26 | Jentek Sensors, Inc. | Segmented field dielectrometer |
US6144206A (en) * | 1997-01-06 | 2000-11-07 | Jentek Sensors, Inc. | Magnetometer with waveform shaping |
US6781387B2 (en) | 1997-01-06 | 2004-08-24 | Jentek Sensors, Inc. | Inspection method using penetrant and dielectrometer |
US6420867B1 (en) | 1997-03-13 | 2002-07-16 | Jentek Sensors, Inc. | Method of detecting widespread fatigue and cracks in a metal structure |
US6188218B1 (en) | 1997-10-29 | 2001-02-13 | Jentek Sensors, Inc. | Absolute property measurement with air calibration |
USRE39206E1 (en) * | 1997-10-29 | 2006-07-25 | Jentek Sensors, Inc. | Absolute property measurement with air calibration |
US6377039B1 (en) | 1997-11-14 | 2002-04-23 | Jentek Sensors, Incorporated | Method for characterizing coating and substrates |
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