SG143987A1 - Method for enhancing electrode surface area in dram cell capacitors - Google Patents
Method for enhancing electrode surface area in dram cell capacitorsInfo
- Publication number
- SG143987A1 SG143987A1 SG200607169-0A SG2006071690A SG143987A1 SG 143987 A1 SG143987 A1 SG 143987A1 SG 2006071690 A SG2006071690 A SG 2006071690A SG 143987 A1 SG143987 A1 SG 143987A1
- Authority
- SG
- Singapore
- Prior art keywords
- forming
- lower electrode
- texturizing
- depositing
- layer
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/01—Manufacture or treatment
- H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
- H10B12/03—Making the capacitor or connections thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
- H01L28/65—Electrodes comprising a noble metal or a noble metal oxide, e.g. platinum (Pt), ruthenium (Ru), ruthenium dioxide (RuO2), iridium (Ir), iridium dioxide (IrO2)
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
- H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
- H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
- H01L28/84—Electrodes with an enlarged surface, e.g. formed by texturisation being a rough surface, e.g. using hemispherical grains
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
- H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
- H01L28/90—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
- H01L28/91—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by depositing layers, e.g. by depositing alternating conductive and insulating layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/01—Manufacture or treatment
- H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
- H10B12/03—Making the capacitor or connections thereto
- H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B99/00—Subject matter not provided for in other groups of this subclass
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/050,390 US6794704B2 (en) | 2002-01-16 | 2002-01-16 | Method for enhancing electrode surface area in DRAM cell capacitors |
Publications (1)
Publication Number | Publication Date |
---|---|
SG143987A1 true SG143987A1 (en) | 2008-07-29 |
Family
ID=21964982
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200607169-0A SG143987A1 (en) | 2002-01-16 | 2003-01-16 | Method for enhancing electrode surface area in dram cell capacitors |
Country Status (11)
Country | Link |
---|---|
US (4) | US6794704B2 (zh) |
EP (2) | EP1466361B1 (zh) |
JP (2) | JP4423541B2 (zh) |
KR (1) | KR100701543B1 (zh) |
CN (1) | CN1643678B (zh) |
AT (1) | ATE430986T1 (zh) |
AU (1) | AU2003205203A1 (zh) |
DE (1) | DE60327508D1 (zh) |
SG (1) | SG143987A1 (zh) |
TW (1) | TW591705B (zh) |
WO (1) | WO2003063172A2 (zh) |
Families Citing this family (33)
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JP2002176114A (ja) * | 2000-09-26 | 2002-06-21 | Toshiba Corp | 半導体装置及びその製造方法 |
CN100418011C (zh) * | 2001-01-08 | 2008-09-10 | 国际商业机器公司 | 微结构的制造方法 |
US20040007063A1 (en) * | 2002-05-29 | 2004-01-15 | California Institute Of Technology | Micro machined polymer beam structure method and resulting device for spring applications |
US6773984B2 (en) * | 2002-08-29 | 2004-08-10 | Micron Technology, Inc. | Methods of depositing noble metals and methods of forming capacitor constructions |
US7419768B2 (en) * | 2002-11-18 | 2008-09-02 | Micron Technology, Inc. | Methods of fabricating integrated circuitry |
US6933224B2 (en) * | 2003-03-28 | 2005-08-23 | Micron Technology, Inc. | Method of fabricating integrated circuitry |
DE10333704B4 (de) * | 2003-07-23 | 2009-12-17 | Ovd Kinegram Ag | Sicherheitselement zur RF-Identifikation |
DE102004007633B4 (de) * | 2004-02-17 | 2010-10-14 | Qimonda Ag | Speicherzelle, Halbleiter-Speicherbauelement und Verfahren zur Herstellung einer Speicherzelle |
CN100382376C (zh) * | 2004-03-26 | 2008-04-16 | 陈建科 | 一种二氧化硅晶态电解质及其制备方法 |
KR100689813B1 (ko) * | 2004-09-08 | 2007-03-08 | 삼성전자주식회사 | 탄소나노튜브를 가진 반도체 메모리 장치 및 이의 제조 방법 |
KR100632938B1 (ko) * | 2004-12-22 | 2006-10-12 | 삼성전자주식회사 | 커패시터를 구비하는 디램 소자 및 그 형성 방법 |
JP2006190765A (ja) * | 2005-01-05 | 2006-07-20 | Elpida Memory Inc | 半導体装置及びその製造方法 |
KR100874912B1 (ko) * | 2006-12-06 | 2008-12-19 | 삼성전자주식회사 | 반도체 소자 및 그 제조방법 |
FR2913283A1 (fr) * | 2007-03-02 | 2008-09-05 | St Microelectronics Crolles 2 | Augmentation de la capacite d'un dispositif capacitif par micromasquage. |
KR100881396B1 (ko) * | 2007-06-20 | 2009-02-05 | 주식회사 하이닉스반도체 | 반도체 소자의 제조방법 |
US7700469B2 (en) * | 2008-02-26 | 2010-04-20 | Micron Technology, Inc. | Methods of forming semiconductor constructions |
US8124528B2 (en) * | 2008-04-10 | 2012-02-28 | Micron Technology, Inc. | Method for forming a ruthenium film |
WO2009133510A1 (en) * | 2008-04-29 | 2009-11-05 | Nxp B.V. | Method of manufacturing a capacitor on a nanowire and integrated circuit having such a capacitor |
US8258037B2 (en) | 2009-08-26 | 2012-09-04 | International Business Machines Corporation | Nanopillar decoupling capacitor |
TWI399831B (zh) * | 2009-10-02 | 2013-06-21 | Inotera Memories Inc | 堆疊式隨機動態存取記憶體之電容結構之製造方法 |
TWI399832B (zh) * | 2009-10-07 | 2013-06-21 | Inotera Memories Inc | 半導體記憶體之電容下電極製程 |
US9111775B2 (en) * | 2011-01-28 | 2015-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Silicon structure and manufacturing methods thereof and of capacitor including silicon structure |
US8524599B2 (en) | 2011-03-17 | 2013-09-03 | Micron Technology, Inc. | Methods of forming at least one conductive element and methods of forming a semiconductor structure |
KR101902468B1 (ko) | 2012-04-19 | 2018-11-13 | 삼성전자주식회사 | 커패시터, 이를 포함하는 반도체 장치, 커패시터 형성 방법 및 이를 이용한 반도체 장치 제조 방법 |
WO2015038340A1 (en) * | 2013-09-10 | 2015-03-19 | Bandgap Engineering, Inc. | Metal assisted etch combined with regularizing etch |
KR102160791B1 (ko) | 2014-02-03 | 2020-09-29 | 삼성디스플레이 주식회사 | 블록 공중합체 및 이를 사용한 패턴 형성 방법 |
US9406629B2 (en) * | 2014-10-15 | 2016-08-02 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package structure and manufacturing method thereof |
US9385129B2 (en) * | 2014-11-13 | 2016-07-05 | Tokyo Electron Limited | Method of forming a memory capacitor structure using a self-assembly pattern |
KR102525201B1 (ko) | 2016-03-22 | 2023-04-25 | 삼성디스플레이 주식회사 | 플렉서블 전자 장치 |
US10541172B2 (en) | 2016-08-24 | 2020-01-21 | International Business Machines Corporation | Semiconductor device with reduced contact resistance |
US10559569B2 (en) * | 2016-12-21 | 2020-02-11 | SK Hynix Inc. | Semiconductor device and method for fabricating the same |
KR102359267B1 (ko) | 2017-10-20 | 2022-02-07 | 삼성전자주식회사 | 집적회로 소자 및 그 제조 방법 |
TWI782464B (zh) * | 2021-03-26 | 2022-11-01 | 力晶積成電子製造股份有限公司 | 半導體元件及其製造方法 |
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US6190992B1 (en) * | 1996-07-15 | 2001-02-20 | Micron Technology, Inc. | Method to achieve rough silicon surface on both sides of container for enhanced capacitance/area electrodes |
US20010001210A1 (en) * | 1999-06-25 | 2001-05-17 | Rhodes Howard E. | Capacitor Structures |
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-
2002
- 2002-01-16 US US10/050,390 patent/US6794704B2/en not_active Expired - Fee Related
-
2003
- 2003-01-15 TW TW092100816A patent/TW591705B/zh not_active IP Right Cessation
- 2003-01-16 CN CN038061112A patent/CN1643678B/zh not_active Expired - Fee Related
- 2003-01-16 EP EP03703873A patent/EP1466361B1/en not_active Expired - Lifetime
- 2003-01-16 DE DE60327508T patent/DE60327508D1/de not_active Expired - Lifetime
- 2003-01-16 KR KR1020047011102A patent/KR100701543B1/ko not_active IP Right Cessation
- 2003-01-16 EP EP05075659A patent/EP1610379A3/en not_active Withdrawn
- 2003-01-16 AT AT03703873T patent/ATE430986T1/de not_active IP Right Cessation
- 2003-01-16 AU AU2003205203A patent/AU2003205203A1/en not_active Abandoned
- 2003-01-16 WO PCT/US2003/001474 patent/WO2003063172A2/en active Application Filing
- 2003-01-16 JP JP2003562941A patent/JP4423541B2/ja not_active Expired - Fee Related
- 2003-01-16 SG SG200607169-0A patent/SG143987A1/en unknown
- 2003-04-07 US US10/408,358 patent/US7148555B2/en not_active Expired - Fee Related
-
2006
- 2006-08-28 US US11/510,949 patent/US7642157B2/en not_active Expired - Fee Related
- 2006-08-31 US US11/514,694 patent/US7573121B2/en not_active Expired - Fee Related
-
2008
- 2008-10-10 JP JP2008264035A patent/JP2009060121A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5937294A (en) * | 1995-08-11 | 1999-08-10 | Micron Technology, Inc. | Method for making a container capacitor with increased surface area |
US6190992B1 (en) * | 1996-07-15 | 2001-02-20 | Micron Technology, Inc. | Method to achieve rough silicon surface on both sides of container for enhanced capacitance/area electrodes |
US6188097B1 (en) * | 1997-07-02 | 2001-02-13 | Micron Technology, Inc. | Rough electrode (high surface area) from Ti and TiN |
US20010001210A1 (en) * | 1999-06-25 | 2001-05-17 | Rhodes Howard E. | Capacitor Structures |
Non-Patent Citations (1)
Title |
---|
PREFERENTIAL SELF- ASSEMBLY OF SURFACE-MODIFIED SI/SIOX NANOPARTICLES ON UV-OZONE MICROPATTERNED POLY(DIMETHYLSILOXANE) FILMS * |
Also Published As
Publication number | Publication date |
---|---|
DE60327508D1 (de) | 2009-06-18 |
US20060292875A1 (en) | 2006-12-28 |
WO2003063172A2 (en) | 2003-07-31 |
WO2003063172A3 (en) | 2004-03-25 |
ATE430986T1 (de) | 2009-05-15 |
US20030203508A1 (en) | 2003-10-30 |
EP1610379A3 (en) | 2007-03-07 |
US6794704B2 (en) | 2004-09-21 |
TW591705B (en) | 2004-06-11 |
EP1466361A2 (en) | 2004-10-13 |
TW200307317A (en) | 2003-12-01 |
US7642157B2 (en) | 2010-01-05 |
KR20040077736A (ko) | 2004-09-06 |
US7573121B2 (en) | 2009-08-11 |
KR100701543B1 (ko) | 2007-03-30 |
EP1610379A2 (en) | 2005-12-28 |
US7148555B2 (en) | 2006-12-12 |
US20030134436A1 (en) | 2003-07-17 |
JP4423541B2 (ja) | 2010-03-03 |
EP1466361B1 (en) | 2009-05-06 |
JP2009060121A (ja) | 2009-03-19 |
US20070048955A1 (en) | 2007-03-01 |
JP2005527103A (ja) | 2005-09-08 |
CN1643678A (zh) | 2005-07-20 |
CN1643678B (zh) | 2010-04-28 |
AU2003205203A1 (en) | 2003-09-02 |
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