SG11201507373VA - Polishing pad having polishing surface with continuous protrusions having tapered sidewalls - Google Patents
Polishing pad having polishing surface with continuous protrusions having tapered sidewallsInfo
- Publication number
- SG11201507373VA SG11201507373VA SG11201507373VA SG11201507373VA SG11201507373VA SG 11201507373V A SG11201507373V A SG 11201507373VA SG 11201507373V A SG11201507373V A SG 11201507373VA SG 11201507373V A SG11201507373V A SG 11201507373VA SG 11201507373V A SG11201507373V A SG 11201507373VA
- Authority
- SG
- Singapore
- Prior art keywords
- polishing
- tapered sidewalls
- continuous protrusions
- polishing pad
- polishing surface
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/829,990 US10160092B2 (en) | 2013-03-14 | 2013-03-14 | Polishing pad having polishing surface with continuous protrusions having tapered sidewalls |
PCT/US2014/020754 WO2014158892A1 (en) | 2013-03-14 | 2014-03-05 | Polishing pad having polishing surface with continuous protrusions having tapered sidewalls |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201507373VA true SG11201507373VA (en) | 2015-10-29 |
Family
ID=50346154
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201507373VA SG11201507373VA (en) | 2013-03-14 | 2014-03-05 | Polishing pad having polishing surface with continuous protrusions having tapered sidewalls |
Country Status (9)
Country | Link |
---|---|
US (1) | US10160092B2 (en) |
EP (1) | EP2969392B1 (en) |
JP (2) | JP6085064B2 (en) |
KR (2) | KR101708744B1 (en) |
CN (1) | CN105228797B (en) |
MY (1) | MY178773A (en) |
SG (1) | SG11201507373VA (en) |
TW (1) | TWI667098B (en) |
WO (1) | WO2014158892A1 (en) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014018170A1 (en) * | 2012-07-23 | 2014-01-30 | Jh Rhodes Company, Inc. | Non-planar glass polishing pad and method of manufacture |
KR102347711B1 (en) * | 2014-04-03 | 2022-01-06 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | Polishing pads and systems and methods of making and using the same |
US9849562B2 (en) * | 2015-12-28 | 2017-12-26 | Shine-File Llc | And manufacture of an abrasive polishing tool |
KR101698989B1 (en) * | 2016-01-22 | 2017-01-24 | 주식회사 썬텍인더스트리 | Embossed abrasive article and preparation method thereof |
JP6979030B2 (en) * | 2016-03-24 | 2021-12-08 | アプライド マテリアルズ インコーポレイテッドApplied Materials, Incorporated | Small textured pad for chemical mechanical polishing |
USD854902S1 (en) * | 2016-09-23 | 2019-07-30 | Husqvarna Construction Products North America, Inc. | Polishing or grinding pad |
WO2018142623A1 (en) * | 2017-02-06 | 2018-08-09 | 株式会社大輝 | Polishing pad recess forming method and polishing pad |
JP6884015B2 (en) * | 2017-03-22 | 2021-06-09 | 株式会社荏原製作所 | Substrate polishing equipment and polishing method |
JP6990993B2 (en) * | 2017-05-26 | 2022-01-12 | 富士紡ホールディングス株式会社 | Polishing pad and its manufacturing method, and manufacturing method of polished products |
KR20200014364A (en) * | 2017-06-01 | 2020-02-10 | 도쿄엘렉트론가부시키가이샤 | Gettering layer forming apparatus, gettering layer forming method and computer storage medium |
KR20190014307A (en) * | 2017-08-02 | 2019-02-12 | 새솔다이아몬드공업 주식회사 | Polishing pad dresser with rounded edge and polishing apparatus having the same |
WO2019026021A1 (en) * | 2017-08-04 | 2019-02-07 | 3M Innovative Properties Company | Microreplicated polishing surface with enhanced co-planarity |
USD958626S1 (en) * | 2017-08-30 | 2022-07-26 | Husqvarna Ab | Polishing or grinding pad assembly with abrasive disks, reinforcement and pad |
USD927952S1 (en) * | 2017-08-30 | 2021-08-17 | Husqvarna Ab | Polishing or grinding pad assembly with abrasive disk, spacer, reinforcement and pad |
MX2020013349A (en) * | 2018-06-15 | 2021-03-09 | Mirka Ltd | Abrading with an abrading plate. |
CN113661031A (en) * | 2019-04-09 | 2021-11-16 | 恩特格里斯公司 | Sector design of a disc |
KR102221514B1 (en) * | 2019-05-29 | 2021-03-03 | 한국생산기술연구원 | Polishing pad having flow resistance structure of polishing liquid |
US11524385B2 (en) * | 2019-06-07 | 2022-12-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP polishing pad with lobed protruding structures |
US20210299816A1 (en) * | 2020-03-25 | 2021-09-30 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Cmp polishing pad with protruding structures having engineered open void space |
US11833638B2 (en) | 2020-03-25 | 2023-12-05 | Rohm and Haas Electronic Materials Holding, Inc. | CMP polishing pad with polishing elements on supports |
KR102570825B1 (en) * | 2020-07-16 | 2023-08-28 | 한국생산기술연구원 | Polishing pad including porous protruding pattern and polishing apparatus including the same |
KR102572960B1 (en) * | 2021-06-10 | 2023-09-01 | 에프엔에스테크 주식회사 | Polishing pad including a plurality of pattern structures |
CN115056137A (en) * | 2022-06-20 | 2022-09-16 | 万华化学集团电子材料有限公司 | Polishing pad with grinding consistency end point detection window and application thereof |
Family Cites Families (35)
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US5632790A (en) * | 1990-05-21 | 1997-05-27 | Wiand; Ronald C. | Injection molded abrasive article and process |
CA2201156A1 (en) * | 1994-09-30 | 1996-04-11 | The Minnesota Mining & Manufacturing Company | Coated abrasive article, method for preparing the same, and method of using |
US5876268A (en) * | 1997-01-03 | 1999-03-02 | Minnesota Mining And Manufacturing Company | Method and article for the production of optical quality surfaces on glass |
US5882251A (en) | 1997-08-19 | 1999-03-16 | Lsi Logic Corporation | Chemical mechanical polishing pad slurry distribution grooves |
US6121143A (en) * | 1997-09-19 | 2000-09-19 | 3M Innovative Properties Company | Abrasive articles comprising a fluorochemical agent for wafer surface modification |
JP2000158327A (en) * | 1998-12-02 | 2000-06-13 | Rohm Co Ltd | Polishing cloth for chemimechanical polishing and chemimechanical polisher using same |
US6749714B1 (en) * | 1999-03-30 | 2004-06-15 | Nikon Corporation | Polishing body, polisher, polishing method, and method for producing semiconductor device |
JP2001079755A (en) * | 1999-09-08 | 2001-03-27 | Nikon Corp | Abrasive body and polishing method |
JP2000301450A (en) * | 1999-04-19 | 2000-10-31 | Rohm Co Ltd | Cmp polishing pad and cmp processing device using it |
US6458018B1 (en) | 1999-04-23 | 2002-10-01 | 3M Innovative Properties Company | Abrasive article suitable for abrading glass and glass ceramic workpieces |
KR100387954B1 (en) * | 1999-10-12 | 2003-06-19 | (주) 휴네텍 | Conditioner for polishing pad and method of manufacturing the same |
US6439986B1 (en) * | 1999-10-12 | 2002-08-27 | Hunatech Co., Ltd. | Conditioner for polishing pad and method for manufacturing the same |
US6776699B2 (en) * | 2000-08-14 | 2004-08-17 | 3M Innovative Properties Company | Abrasive pad for CMP |
JP2002057130A (en) * | 2000-08-14 | 2002-02-22 | Three M Innovative Properties Co | Polishing pad for cmp |
US6821189B1 (en) * | 2000-10-13 | 2004-11-23 | 3M Innovative Properties Company | Abrasive article comprising a structured diamond-like carbon coating and method of using same to mechanically treat a substrate |
JP2002346927A (en) | 2001-03-22 | 2002-12-04 | Mitsubishi Materials Corp | Cmp conditioner |
US7070480B2 (en) | 2001-10-11 | 2006-07-04 | Applied Materials, Inc. | Method and apparatus for polishing substrates |
JP2005183707A (en) * | 2003-12-19 | 2005-07-07 | Toyo Tire & Rubber Co Ltd | Polishing pad for cmp and polishing method using same |
JP4227008B2 (en) | 2003-12-22 | 2009-02-18 | 株式会社東芝 | Printed circuit board |
US7204742B2 (en) * | 2004-03-25 | 2007-04-17 | Cabot Microelectronics Corporation | Polishing pad comprising hydrophobic region and endpoint detection port |
US7150677B2 (en) * | 2004-09-22 | 2006-12-19 | Mitsubishi Materials Corporation | CMP conditioner |
US7182677B2 (en) * | 2005-01-14 | 2007-02-27 | Applied Materials, Inc. | Chemical mechanical polishing pad for controlling polishing slurry distribution |
US7594845B2 (en) * | 2005-10-20 | 2009-09-29 | 3M Innovative Properties Company | Abrasive article and method of modifying the surface of a workpiece |
US20080271384A1 (en) * | 2006-09-22 | 2008-11-06 | Saint-Gobain Ceramics & Plastics, Inc. | Conditioning tools and techniques for chemical mechanical planarization |
US9180570B2 (en) * | 2008-03-14 | 2015-11-10 | Nexplanar Corporation | Grooved CMP pad |
CN101327577B (en) | 2008-07-25 | 2010-04-21 | 南京航空航天大学 | Fixed abrasive polishing pad with self-finishing function and even wear |
JP2010045306A (en) | 2008-08-18 | 2010-02-25 | Kuraray Co Ltd | Polishing pad |
TWM352126U (en) * | 2008-10-23 | 2009-03-01 | Bestac Advanced Material Co Ltd | Polishing pad |
US9017140B2 (en) * | 2010-01-13 | 2015-04-28 | Nexplanar Corporation | CMP pad with local area transparency |
US8439994B2 (en) * | 2010-09-30 | 2013-05-14 | Nexplanar Corporation | Method of fabricating a polishing pad with an end-point detection region for eddy current end-point detection |
CN102601747B (en) * | 2011-01-20 | 2015-12-09 | 中芯国际集成电路制造(上海)有限公司 | A kind of grinding pad and preparation method thereof, using method |
US8968058B2 (en) | 2011-05-05 | 2015-03-03 | Nexplanar Corporation | Polishing pad with alignment feature |
US20120302148A1 (en) | 2011-05-23 | 2012-11-29 | Rajeev Bajaj | Polishing pad with homogeneous body having discrete protrusions thereon |
US8920219B2 (en) | 2011-07-15 | 2014-12-30 | Nexplanar Corporation | Polishing pad with alignment aperture |
US9649742B2 (en) | 2013-01-22 | 2017-05-16 | Nexplanar Corporation | Polishing pad having polishing surface with continuous protrusions |
-
2013
- 2013-03-14 US US13/829,990 patent/US10160092B2/en active Active
-
2014
- 2014-03-05 JP JP2016500664A patent/JP6085064B2/en active Active
- 2014-03-05 EP EP14712132.1A patent/EP2969392B1/en active Active
- 2014-03-05 CN CN201480027574.6A patent/CN105228797B/en active Active
- 2014-03-05 KR KR1020167011701A patent/KR101708744B1/en not_active Application Discontinuation
- 2014-03-05 SG SG11201507373VA patent/SG11201507373VA/en unknown
- 2014-03-05 WO PCT/US2014/020754 patent/WO2014158892A1/en active Application Filing
- 2014-03-05 MY MYPI2015703096A patent/MY178773A/en unknown
- 2014-03-05 KR KR1020157027915A patent/KR101669848B1/en active IP Right Grant
- 2014-03-13 TW TW103108870A patent/TWI667098B/en active
-
2016
- 2016-11-11 JP JP2016220375A patent/JP2017071053A/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
TW201505759A (en) | 2015-02-16 |
KR101708744B1 (en) | 2017-02-21 |
US20140273777A1 (en) | 2014-09-18 |
KR20160056946A (en) | 2016-05-20 |
US10160092B2 (en) | 2018-12-25 |
CN105228797B (en) | 2018-03-02 |
JP2017071053A (en) | 2017-04-13 |
MY178773A (en) | 2020-10-20 |
WO2014158892A1 (en) | 2014-10-02 |
JP6085064B2 (en) | 2017-02-22 |
KR20150127181A (en) | 2015-11-16 |
TWI667098B (en) | 2019-08-01 |
CN105228797A (en) | 2016-01-06 |
EP2969392A1 (en) | 2016-01-20 |
KR101669848B1 (en) | 2016-10-27 |
JP2016511162A (en) | 2016-04-14 |
EP2969392B1 (en) | 2020-04-15 |
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