SG106568A1 - Chip scale surface mount package for semiconductor device and process of fabricating the same - Google Patents

Chip scale surface mount package for semiconductor device and process of fabricating the same

Info

Publication number
SG106568A1
SG106568A1 SG9905072A SG1999005072A SG106568A1 SG 106568 A1 SG106568 A1 SG 106568A1 SG 9905072 A SG9905072 A SG 9905072A SG 1999005072 A SG1999005072 A SG 1999005072A SG 106568 A1 SG106568 A1 SG 106568A1
Authority
SG
Singapore
Prior art keywords
fabricating
semiconductor device
same
surface mount
chip scale
Prior art date
Application number
SG9905072A
Other languages
English (en)
Inventor
Felix Zandman
Y Mohammed Kasem
Yueh-Se Ho
Original Assignee
Vishay Intertechnology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vishay Intertechnology Inc filed Critical Vishay Intertechnology Inc
Publication of SG106568A1 publication Critical patent/SG106568A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/50Multistep manufacturing processes of assemblies consisting of devices, each device being of a type provided for in group H01L27/00 or H01L29/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49805Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers the leads being also applied on the sidewalls or the bottom of the substrate, e.g. leadless packages for surface mounting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/065Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L25/0657Stacked arrangements of devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/04All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
    • H01L2225/065All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/06503Stacked arrangements of devices
    • H01L2225/06513Bump or bump-like direct electrical connections between devices, e.g. flip-chip connection, solder bumps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/04All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
    • H01L2225/065All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/06503Stacked arrangements of devices
    • H01L2225/06517Bump or bump-like direct electrical connections from device to substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/04All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
    • H01L2225/065All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/06503Stacked arrangements of devices
    • H01L2225/06551Conductive connections on the side of the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/04All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
    • H01L2225/065All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/06503Stacked arrangements of devices
    • H01L2225/06582Housing for the assembly, e.g. chip scale package [CSP]
    • H01L2225/06586Housing with external bump or bump-like connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/095Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
    • H01L2924/097Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701Low temperature co-fired ceramic [LTCC]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
SG9905072A 1999-09-13 1999-10-09 Chip scale surface mount package for semiconductor device and process of fabricating the same SG106568A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/395,095 US6271060B1 (en) 1999-09-13 1999-09-13 Process of fabricating a chip scale surface mount package for semiconductor device

Publications (1)

Publication Number Publication Date
SG106568A1 true SG106568A1 (en) 2004-10-29

Family

ID=23561666

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9905072A SG106568A1 (en) 1999-09-13 1999-10-09 Chip scale surface mount package for semiconductor device and process of fabricating the same

Country Status (7)

Country Link
US (2) US6271060B1 (fr)
EP (1) EP1085561B1 (fr)
JP (1) JP3343535B2 (fr)
KR (1) KR100419352B1 (fr)
CN (1) CN1177358C (fr)
SG (1) SG106568A1 (fr)
TW (1) TW441051B (fr)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7211877B1 (en) * 1999-09-13 2007-05-01 Vishay-Siliconix Chip scale surface mount package for semiconductor device and process of fabricating the same
JP3368876B2 (ja) * 1999-11-05 2003-01-20 株式会社東京精密 半導体チップ製造方法
US6853074B2 (en) * 1999-12-27 2005-02-08 Matsushita Electric Industrial Co., Ltd. Electronic part, an electronic part mounting element and a process for manufacturing such the articles
EP1284014A4 (fr) * 2000-04-20 2006-09-13 Digirad Corp Technique pour supprimer le courant de bord dans des dispositifs a semiconducteurs
US6856006B2 (en) * 2002-03-28 2005-02-15 Siliconix Taiwan Ltd Encapsulation method and leadframe for leadless semiconductor packages
SE518640C2 (sv) * 2000-07-11 2002-11-05 Mydata Automation Ab Förfarande, anordning för applicering av ett visköst medium på ett substrat, anordning för applicering av ytterligare visköst medium samt användningen av screentryckning
US6606247B2 (en) * 2001-05-31 2003-08-12 Alien Technology Corporation Multi-feature-size electronic structures
KR100394808B1 (ko) * 2001-07-19 2003-08-14 삼성전자주식회사 웨이퍼 레벨 적층 칩 패키지 및 그 제조 방법
FR2828428B1 (fr) * 2001-08-07 2003-10-17 Soitec Silicon On Insulator Dispositif de decollement de substrats et procede associe
SG139508A1 (en) * 2001-09-10 2008-02-29 Micron Technology Inc Wafer dicing device and method
SG102639A1 (en) * 2001-10-08 2004-03-26 Micron Technology Inc Apparatus and method for packing circuits
SG115429A1 (en) * 2001-11-16 2005-10-28 Micron Technology Inc Stackable semiconductor package and wafer level fabrication method
US7214569B2 (en) * 2002-01-23 2007-05-08 Alien Technology Corporation Apparatus incorporating small-feature-size and large-feature-size components and method for making same
KR100452819B1 (ko) 2002-03-18 2004-10-15 삼성전기주식회사 칩 패키지 및 그 제조방법
KR100452818B1 (ko) * 2002-03-18 2004-10-15 삼성전기주식회사 칩 패키지 및 그 제조방법
KR100461718B1 (ko) * 2002-03-18 2004-12-14 삼성전기주식회사 칩 패키지 및 그 제조방법
SG142115A1 (en) 2002-06-14 2008-05-28 Micron Technology Inc Wafer level packaging
US6875691B2 (en) * 2002-06-21 2005-04-05 Mattson Technology, Inc. Temperature control sequence of electroless plating baths
US6667191B1 (en) 2002-08-05 2003-12-23 Asat Ltd. Chip scale integrated circuit package
US6921719B2 (en) * 2002-10-31 2005-07-26 Strasbaugh, A California Corporation Method of preparing whole semiconductor wafer for analysis
US6975527B1 (en) * 2002-11-12 2005-12-13 Integrated Device Technology, Inc. Memory device layout
US6797312B2 (en) * 2003-01-21 2004-09-28 Mattson Technology, Inc. Electroless plating solution and process
US7253735B2 (en) 2003-03-24 2007-08-07 Alien Technology Corporation RFID tags and processes for producing RFID tags
SG119185A1 (en) 2003-05-06 2006-02-28 Micron Technology Inc Method for packaging circuits and packaged circuits
JP3693665B2 (ja) * 2003-08-06 2005-09-07 東京エレクトロン株式会社 容量検出回路及び容量検出方法
US7615479B1 (en) 2004-11-08 2009-11-10 Alien Technology Corporation Assembly comprising functional block deposited therein
US7353598B2 (en) * 2004-11-08 2008-04-08 Alien Technology Corporation Assembly comprising functional devices and method of making same
US20060109130A1 (en) * 2004-11-22 2006-05-25 Hattick John B Radio frequency identification (RFID) tag for an item having a conductive layer included or attached
US7688206B2 (en) 2004-11-22 2010-03-30 Alien Technology Corporation Radio frequency identification (RFID) tag for an item having a conductive layer included or attached
US7385284B2 (en) * 2004-11-22 2008-06-10 Alien Technology Corporation Transponder incorporated into an electronic device
US20060286706A1 (en) * 2005-06-21 2006-12-21 Salian Arvind S Method of making a substrate contact for a capped MEMS at the package level
US7316965B2 (en) * 2005-06-21 2008-01-08 Freescale Semiconductor, Inc. Substrate contact for a capped MEMS and method of making the substrate contact at the wafer level
US9093359B2 (en) * 2005-07-01 2015-07-28 Vishay-Siliconix Complete power management system implemented in a single surface mount package
DE102005061263B4 (de) 2005-12-20 2007-10-11 Infineon Technologies Austria Ag Halbleiterwafersubstrat für Leistungshalbleiterbauelemente sowie Verfahren zur Herstellung desselben
US7626262B2 (en) * 2006-06-14 2009-12-01 Infineon Technologies Ag Electrically conductive connection, electronic component and method for their production
US7476563B2 (en) 2006-11-17 2009-01-13 Freescale Semiconductor, Inc. Method of packaging a device using a dielectric layer
US7696016B2 (en) * 2006-11-17 2010-04-13 Freescale Semiconductor, Inc. Method of packaging a device having a tangible element and device thereof
US7588951B2 (en) * 2006-11-17 2009-09-15 Freescale Semiconductor, Inc. Method of packaging a semiconductor device and a prefabricated connector
US7807511B2 (en) * 2006-11-17 2010-10-05 Freescale Semiconductor, Inc. Method of packaging a device having a multi-contact elastomer connector contact area and device thereof
US7521284B2 (en) * 2007-03-05 2009-04-21 Texas Instruments Incorporated System and method for increased stand-off height in stud bumping process
US8208266B2 (en) * 2007-05-29 2012-06-26 Avx Corporation Shaped integrated passives
CN101315899B (zh) * 2007-05-30 2010-11-24 热速得控股股份有限公司 标签式集成线路软板制作方法及其结构
US7763983B2 (en) * 2007-07-02 2010-07-27 Tessera, Inc. Stackable microelectronic device carriers, stacked device carriers and methods of making the same
SG149725A1 (en) * 2007-07-24 2009-02-27 Micron Technology Inc Thin semiconductor die packages and associated systems and methods
SG149724A1 (en) 2007-07-24 2009-02-27 Micron Technology Inc Semicoductor dies with recesses, associated leadframes, and associated systems and methods
US20090032871A1 (en) * 2007-08-01 2009-02-05 Louis Vervoort Integrated circuit with interconnected frontside contact and backside contact
US8426960B2 (en) * 2007-12-21 2013-04-23 Alpha & Omega Semiconductor, Inc. Wafer level chip scale packaging
US8169081B1 (en) 2007-12-27 2012-05-01 Volterra Semiconductor Corporation Conductive routings in integrated circuits using under bump metallization
US8001434B1 (en) 2008-04-14 2011-08-16 Netlist, Inc. Memory board with self-testing capability
US8709870B2 (en) * 2009-08-06 2014-04-29 Maxim Integrated Products, Inc. Method of forming solderable side-surface terminals of quad no-lead frame (QFN) integrated circuit packages
US8193620B2 (en) * 2010-02-17 2012-06-05 Analog Devices, Inc. Integrated circuit package with enlarged die paddle
EP2390909A1 (fr) * 2010-05-24 2011-11-30 Jerry Hu Mise en boîtier miniature pour des composants discrets
US8362606B2 (en) 2010-07-29 2013-01-29 Alpha & Omega Semiconductor, Inc. Wafer level chip scale package
CN110035601B (zh) * 2019-04-23 2020-05-26 Oppo广东移动通信有限公司 一种层叠板及终端设备
US11296005B2 (en) 2019-09-24 2022-04-05 Analog Devices, Inc. Integrated device package including thermally conductive element and method of manufacturing same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5533664A (en) * 1993-09-07 1996-07-09 Kabushiki Kaisha Toshiba Method of manufacturing a semiconductor device
US5926380A (en) * 1996-05-17 1999-07-20 Lg Semicon Co., Ltd. Lead frame lattice and integrated package fabrication method applied thereto

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3698080A (en) 1970-11-02 1972-10-17 Gen Electric Process for forming low impedance ohmic attachments
JPS51426A (en) 1974-06-19 1976-01-06 Kenichi Yoshimura Senjobutsuno haakuhojiki
US4249299A (en) 1979-03-05 1981-02-10 Hughes Aircraft Company Edge-around leads for backside connections to silicon circuit die
DE3009985A1 (de) 1980-03-14 1981-09-24 Siemens AG, 1000 Berlin und 8000 München Montageverfahren zur herstellung von leuchtdiodenzeilen
US5235211A (en) * 1990-06-22 1993-08-10 Digital Equipment Corporation Semiconductor package having wraparound metallization
US5170146A (en) * 1991-08-01 1992-12-08 Motorola, Inc. Leadless resistor
US5270261A (en) 1991-09-13 1993-12-14 International Business Machines Corporation Three dimensional multichip package methods of fabrication
US5375041A (en) * 1992-12-02 1994-12-20 Intel Corporation Ra-tab array bump tab tape based I.C. package
KR0140034B1 (ko) * 1993-12-16 1998-07-15 모리시다 요이치 반도체 웨이퍼 수납기, 반도체 웨이퍼의 검사용 집적회로 단자와 프로브 단자와의 접속방법 및 그 장치, 반도체 집적회로의 검사방법, 프로브카드 및 그 제조방법
US5753529A (en) 1994-05-05 1998-05-19 Siliconix Incorporated Surface mount and flip chip technology for total integrated circuit isolation
JP2570628B2 (ja) * 1994-09-21 1997-01-08 日本電気株式会社 半導体パッケージおよびその製造方法
US5767578A (en) 1994-10-12 1998-06-16 Siliconix Incorporated Surface mount and flip chip technology with diamond film passivation for total integated circuit isolation
JP3537447B2 (ja) 1996-10-29 2004-06-14 トル‐シ・テクノロジーズ・インコーポレイテッド 集積回路及びその製造方法
US6054760A (en) * 1996-12-23 2000-04-25 Scb Technologies Inc. Surface-connectable semiconductor bridge elements and devices including the same
JP3796016B2 (ja) * 1997-03-28 2006-07-12 三洋電機株式会社 半導体装置
US5888884A (en) 1998-01-02 1999-03-30 General Electric Company Electronic device pad relocation, precision placement, and packaging in arrays
US6008529A (en) * 1998-06-25 1999-12-28 Bily Wang Laser diode package

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5533664A (en) * 1993-09-07 1996-07-09 Kabushiki Kaisha Toshiba Method of manufacturing a semiconductor device
US5926380A (en) * 1996-05-17 1999-07-20 Lg Semicon Co., Ltd. Lead frame lattice and integrated package fabrication method applied thereto

Also Published As

Publication number Publication date
EP1085561A1 (fr) 2001-03-21
EP1085561B1 (fr) 2012-08-22
CN1288255A (zh) 2001-03-21
KR20010029402A (ko) 2001-04-06
TW441051B (en) 2001-06-16
US6441475B2 (en) 2002-08-27
CN1177358C (zh) 2004-11-24
KR100419352B1 (ko) 2004-02-19
US20010000631A1 (en) 2001-05-03
JP2001085366A (ja) 2001-03-30
US6271060B1 (en) 2001-08-07
JP3343535B2 (ja) 2002-11-11

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