SE1650932A1 - Method and system for analyzing high voltage circuit breakers - Google Patents

Method and system for analyzing high voltage circuit breakers

Info

Publication number
SE1650932A1
SE1650932A1 SE1650932A SE1650932A SE1650932A1 SE 1650932 A1 SE1650932 A1 SE 1650932A1 SE 1650932 A SE1650932 A SE 1650932A SE 1650932 A SE1650932 A SE 1650932A SE 1650932 A1 SE1650932 A1 SE 1650932A1
Authority
SE
Sweden
Prior art keywords
contact
method
arrangements
arrangement
contact arrangement
Prior art date
Application number
SE1650932A
Inventor
Rudholm Stig
Stanisic Zoran
Original Assignee
Megger Sweden Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Megger Sweden Ab filed Critical Megger Sweden Ab
Priority to SE1650932A priority Critical patent/SE1650932A1/en
Publication of SE1650932A1 publication Critical patent/SE1650932A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/333Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
    • G01R31/3333Apparatus, systems or circuits therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/333Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices

Abstract

A method for analyzing a circuit breaker phase (100) comprising a first contact arrangement (108) and a second contact arrangement (108) electrically coupled in series comprises the following steps: a) electrically coupling the first and second contact arrangements (108) to electrical ground; b) triggering a contact operation timer at a start of a test; c) applying a test voltage across the first contact arrangement while the first and second contact arrangements remain electrically coupled to electrical ground and the second contact arrangement is short circuited; d) applying a test voltage across the second contact arrangement while the first and second contact arrangements remain electrically coupled to electrical ground and the first contact arrangement is short circuited; and repeating steps c) and d) while detecting at least one of a first closure of the two contact arrangements and a first opening of the two contact arrangements using the test voltage and determining the timing of the contact arrangements based upon the operation of the contact operation timer. A method which is reliable and safe is thereby provided. A system for implementing the method is also provided.
SE1650932A 2016-06-29 2016-06-29 Method and system for analyzing high voltage circuit breakers SE1650932A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SE1650932A SE1650932A1 (en) 2016-06-29 2016-06-29 Method and system for analyzing high voltage circuit breakers

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE1650932A SE1650932A1 (en) 2016-06-29 2016-06-29 Method and system for analyzing high voltage circuit breakers
PCT/SE2017/050729 WO2018004443A1 (en) 2016-06-29 2017-06-29 Method and system for analyzing high voltage circuit breakers

Publications (1)

Publication Number Publication Date
SE1650932A1 true SE1650932A1 (en) 2017-12-30

Family

ID=60787724

Family Applications (1)

Application Number Title Priority Date Filing Date
SE1650932A SE1650932A1 (en) 2016-06-29 2016-06-29 Method and system for analyzing high voltage circuit breakers

Country Status (2)

Country Link
SE (1) SE1650932A1 (en)
WO (1) WO2018004443A1 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6850072B1 (en) * 2003-03-31 2005-02-01 General Electric Company Methods and apparatus for analyzing high voltage circuit breakers
US6879175B2 (en) * 2003-03-31 2005-04-12 Teradyne, Inc. Hybrid AC/DC-coupled channel for automatic test equipment
EP2664936B1 (en) * 2012-05-10 2018-08-22 Omicron electronics GmbH Measuring device for testing an electrical circuit breaker
EP2700962B1 (en) * 2012-08-24 2018-11-07 Omicron electronics GmbH Measurement of a resistance of a switch contact of an electrical circuit breaker

Also Published As

Publication number Publication date
WO2018004443A1 (en) 2018-01-04

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Legal Events

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