RU2710603C1 - Method for prediction of service life of a light-emitting diode light source during operation - Google Patents

Method for prediction of service life of a light-emitting diode light source during operation Download PDF

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RU2710603C1
RU2710603C1 RU2019117430A RU2019117430A RU2710603C1 RU 2710603 C1 RU2710603 C1 RU 2710603C1 RU 2019117430 A RU2019117430 A RU 2019117430A RU 2019117430 A RU2019117430 A RU 2019117430A RU 2710603 C1 RU2710603 C1 RU 2710603C1
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Prior art keywords
heating temperature
light source
led light
service life
during
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RU2019117430A
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Russian (ru)
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Дмитрий Алексеевич Филатов
Павел Валерьевич Терентьев
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Федеральное Государственное Бюджетное Образовательное Учреждение Высшего Образования "Нижегородская Государственная Сельскохозяйственная Академия" (ФГБОУ ВО НГСХА)
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K13/00Thermometers specially adapted for specific purposes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67248Temperature monitoring
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/0004Devices characterised by their operation

Abstract

FIELD: electrical engineering.
SUBSTANCE: invention relates to electrical engineering and can be used for LED lighting systems with controlled light flux. Disclosed is a method of predicting service life of a light-emitting diode light source during operation. Method comprises measuring the heating temperature of a light-emitting diode light source and the power consumed when the light flux varies, constructing a functional relationship between the heating temperature of the light-emitting diode light source and the power consumed, calculation for design period of operation of average value of consumed power and on its basis determination according to functional dependence of average heating temperature of light-emitting diode light source, calculating, in relative units, the fraction from the maximum service life of the LED light source at the heating temperature in the steady-state mode and at the average heating temperature during operation, predicting (determining) the service life of LED light sources by comparing the heating temperature in steady-state mode and the average heating temperature during operation.
EFFECT: high accuracy of predicting service life of a light-emitting diode light source with variable operating mode during operation.
1 cl, 1 dwg

Description

The invention relates to electrical engineering and can be used for LED lighting systems with adjustable luminous flux.
A known method of rejection (predicting the life) of high-power LEDs based on InGaN / GaN, including measuring the spectral density of the low-frequency noise of the LEDs when applying voltage in the forward direction and current density J from the interval 0.1 <J <10 A / cm, carrying out the aging process, carried out over a period of at least 50 hours at a temperature T J pn junction from the interval T J = 50-150 ° C, ambient temperature T b from the interval T b = 25-120 ° C, current density J through the LED at a voltage of forward from interval J = 35-10 0 A / cm, repeated measurement of the spectral density of the low-frequency noise of the LEDs under the mentioned conditions and rejection of the LEDs with a service life of less than 50,000 hours by exceeding the spectral density of the low-frequency noise of the LEDs after the aging process by more than an order of magnitude compared to the value before the aging process [patent RU 2523105, IPC H01L 33/30, 2010.01, publ. 07/20/2014 Bull. No. 20].
A known method for determining the service life (rejection) of high-power blue LEDs, proposed by Philips Lumileds (USA) [article Liftime Behav oire of LED Systems White Paper WP15, website http://www.philipslumileds.com]. This method takes into account the contribution to the service life of catastrophic failures and the slow development of aging to the level of efficiency (power) L 70 . The method contains the following sequence of operations: measuring the external quantum efficiency of the control group of LEDs (100 pcs.) From each batch; the aging process of the LEDs for 1000 hours in a mode using a combination of the values of the parameters T J , T b and I F from the corresponding ranges: T J = 50-120 ° C, T b = 25-85 ° C, I f = 0.35- 1A (corresponds to a current density of J = 35-100 A / cm); measurement of the efficiency (power) of control LEDs; determination of the probability of failures from experimental data on the number of failures in the control group of 100 LEDs from each batch after aging for 1000 hours, taking into account the number of failed LEDs up to 1000 hours and the minimum operating time of these LEDs; determination according to the obtained failure probability values of the average value of the life of the LEDs at fixed values of T J , T b , J, from previously calculated dependencies linking the probability of failure and the life of the LEDs according to level L 70 . The calculated dependencies take into account both phenomena (catastrophic failures and the slow development of aging). If there are no failures in 1000 hours, then a probability of 0.5 is used, which reflects the average level of L 70 .
A disadvantage of the known methods is that they can be used for light sources (ICs) with a steady mode of operation (with a constant light flux) and are not correct for ICs with a changing mode of operation (with a changing forced light flux) during operation.
The objective of the present invention is to predict the life of the LED light source with a changing mode of operation (with changing forced luminous flux) during operation.
The solution to this problem allows you to plan the replacement of the LED light source with a changing mode of operation to reduce economic damage from untimely replacement.
The problem is solved by the implementation of the method, including measuring the heating temperature of the LED light source and the amount of power consumed by changing the light flux, building a functional dependence of the heating temperature of the LED light source on the magnitude of the consumed power, calculating the average value of the consumed power for the calculation period of work and determining it by functional dependence of the average heating temperature of the LED light source, calculation in relative fraction of the maximum service life of an LED light source at a heating temperature in steady state and at an average heating temperature during operation, predicting (determining) the service life of LED light sources by comparing the heating temperature in a steady state and the average heating temperature during operation.
Before the start of operation, a representative sample is created from a batch of light sources (IP), and the heating temperature of the LED light source and the amount of power consumed by changing the light flux are measured experimentally. Then, on the basis of the obtained data, the functional dependence of the heating temperature of the LED light source on the amount of power consumption when changing the light flux is determined.
During operation, the average value of power consumption R cf for the estimated period of operation is determined by the expression:
Figure 00000001
where W slave - consumed electricity by LED light sources during operation for the billing period, kW⋅h; T slave - operating time by LED light sources, hour; N is the number of LED light sources, pcs.
Knowing the value of power consumption, from the functional dependence obtained before the start of operation, determine the average heating temperature of the LED light source during operation t cf.
The fraction of the maximum service life (at a heating temperature of an LED light source of 40 ° C) is calculated in relative units at a heating temperature in steady state and at an average heating temperature during operation by the expression:
Figure 00000002
where t is the heating temperature of the LED light source, ° C.
Determine (predict) the life of the LED light sources in hours by comparing the heating temperature in the steady state and the average heating temperature during operation by the expression:
Figure 00000003
Where
Figure 00000004
- the predicted service life of the LED light source with a changing forced luminous flux during operation, hours;
Figure 00000005
- the life of the LED light source in steady state (with a constant light flux), hours;
Figure 00000006
- the proportion of the maximum life of the LED light source at a heating temperature in steady state, rel. units;
Figure 00000007
- the proportion of the maximum life of the LED light source at an average heating temperature with a forced forced luminous flux during operation, rel. units
The method is illustrated in Fig., Which shows the functional dependence of the heating temperature of the LED light source on the amount of power consumption
Example. The method is carried out when the salad is irradiated in a winter greenhouse. It is necessary to predict the life of LED greenhouse lamps with a unit power of 100 W with an adjustable luminous flux with a service life of 30,000 hours in a steady state. The total number of fixtures is 120 pcs. The operating time of the fixtures is 3 seasons (9000 hours). Electricity consumed over 3 seasons amounted to 93,200 kWh.
Before starting operation, we determine the functional dependence of the heating temperature of the LED light source on the amount of power consumption when the light flux changes. The resulting functional relationship is shown in FIG. The heating temperature in the steady state (power consumption is equal to the nominal) is 78 ° C.
According to the expression (1) for the estimated period of work, we determine the average value of power consumption R cf by the expression:
Figure 00000008
which is 86% of the rated power of the LED light source.
According to the functional dependence shown in Fig., We determine the average heating temperature of the LED light source during operation t cf. t avg = 65.8 ° C.
According to expression (2), we calculate in relative units the fraction of the maximum service life at a heating temperature in the steady state:
T '' = 4.9358⋅e -0.042 * 78 = 0.19 p.u.
According to the expression (2), we calculate in relative units the fraction of the maximum service life at the average heating temperature during operation by the expression:
T '' = 4.9358⋅e -0.042 * 65.8 = 0.31 p.u.
According to expression (3), we will predict (define) the life of the LED light sources in hours by comparing the heating temperature in the steady state and the average heating temperature during operation:
Figure 00000009
Conclusion. In this operating mode, it is necessary to replace the LED light source to reduce economic damage from untimely replacement no later than 48950 hours of operation.

Claims (3)

  1. A method for predicting the life of an LED light source during operation, including measuring the heating temperature of the LED light source and the amount of power consumed by changing the light flux, constructing a functional dependence of the heating temperature of the LED light source on the amount of consumed power, calculating the average amount of power consumption for the estimated period of operation and based on it, determination of the functional dependence of the average heating temperature of the LED source light, calculation in relative units of a fraction of the maximum service life of an LED light source at a heating temperature in steady state and at an average heating temperature during operation, predicting (determining) the service life of LED light sources by comparing the steady state temperature and average heating temperature during operation according to the formula:
  2. Figure 00000010
  3. Where
    Figure 00000011
    - the predicted service life of the LED light source with a changing forced luminous flux during operation, hours;
    Figure 00000012
    - the life of the LED light source in steady state (with a constant light flux), hours;
    Figure 00000013
    - the proportion of the maximum life of the LED light source at a heating temperature in steady state, rel. units;
    Figure 00000014
    - the proportion of the maximum life of the LED light source at an average heating temperature with a forced forced luminous flux during operation, rel. units
RU2019117430A 2019-06-04 2019-06-04 Method for prediction of service life of a light-emitting diode light source during operation RU2710603C1 (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103364032A (en) * 2013-07-15 2013-10-23 中国科学院半导体研究所 Semiconductor luminescent device or module online multifunctional test system and method
US20140049260A1 (en) * 2012-08-16 2014-02-20 Chien-Ping Wang Method of measuring thermal electric characteristics of semiconductor device
RU2523105C1 (en) * 2013-03-12 2014-07-20 Федеральное государственное бюджетное учреждение науки Физико-технический институт им. А.Ф. Иоффе Российской академии наук METHOD OF SCREENING HIGH-POWER InGaN/GaN LIGHT-EMITTING DIODES

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140049260A1 (en) * 2012-08-16 2014-02-20 Chien-Ping Wang Method of measuring thermal electric characteristics of semiconductor device
RU2523105C1 (en) * 2013-03-12 2014-07-20 Федеральное государственное бюджетное учреждение науки Физико-технический институт им. А.Ф. Иоффе Российской академии наук METHOD OF SCREENING HIGH-POWER InGaN/GaN LIGHT-EMITTING DIODES
CN103364032A (en) * 2013-07-15 2013-10-23 中国科学院半导体研究所 Semiconductor luminescent device or module online multifunctional test system and method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
"Liftime Behavoire of LED Systems White Paper WP15". Найдено в Интернет: URL https://www.lumileds.com/uploads/167/WP15-. (найдено 14.10.2019). СОЛДАТКИН В.С. РЯПОЛОВА Ю.В., АФОНИН К.Н. и др., "АНАЛИЗ СРОКА СЛУЖБЫ СВЕТОДИОДНЫХ ИЗЛУЧАЮЩИХ ЭЛЕМЕНТОВ", ДОКЛАДЫ ТУСУРа, номер 3(37), 2015, с.55-61. *
СОЛДАТКИН В.С. РЯПОЛОВА Ю.В., АФОНИН К.Н. и др., "АНАЛИЗ СРОКА СЛУЖБЫ СВЕТОДИОДНЫХ ИЗЛУЧАЮЩИХ ЭЛЕМЕНТОВ", ДОКЛАДЫ ТУСУРа, номер 3(37), 2015, с.55-61. *

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