RU2013159327A - METHOD FOR MEASURING QUALITY OF RESONANCE CIRCUIT AND DEVICE FOR ITS IMPLEMENTATION - Google Patents
METHOD FOR MEASURING QUALITY OF RESONANCE CIRCUIT AND DEVICE FOR ITS IMPLEMENTATION Download PDFInfo
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- RU2013159327A RU2013159327A RU2013159327/28A RU2013159327A RU2013159327A RU 2013159327 A RU2013159327 A RU 2013159327A RU 2013159327/28 A RU2013159327/28 A RU 2013159327/28A RU 2013159327 A RU2013159327 A RU 2013159327A RU 2013159327 A RU2013159327 A RU 2013159327A
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Abstract
1. Способ измерения добротности резонансного контура, заключающийся в возбуждении колебаний за счет положительной обратной связи в контуре, стабилизации этих колебаний на выходе резонансного контура за счет введения отрицательной обратной связи по их амплитуде с помощью схемы автоматического регулирования усиления с источником опорного сигнала, отличающийся тем, что добротность Q определяют путем измерения амплитуды сигнала на выходе звена отрицательной обратной связи Uи расчета по формуле:Q=K/U, где К - постоянная величина.2. Способ измерения добротности резонансного контура по п. 1, отличающийся тем, что дополнительно измеряют величину опорного сигнала, а добротность Q определяют по формуле:Q=KU/U, где U- величина опорного сигнала.3. Устройство для измерения добротности резонансного контура, содержащее цепь положительной обратной связи, выполненную в виде последовательно включенных усилителя и устройства сдвига фазы, цепь отрицательной обратной связи, содержащую источник опорного сигнала и последовательно включенных детектора, дифференциального усилителя и умножителя, при этом источник опорного сигнала соединен со входом дифференциального усилителя, второй вход умножителя соединен с выходом устройства сдвига фазы, вход детектора соединен с выходом устройства сдвига фазы, отличающееся тем, что в него введен вычислительный блок, реализующий функцию K/V, при этом вход вычислительного блока соединен с выходом дифференциального усилителя.1. The method of measuring the quality factor of the resonant circuit, which consists in exciting oscillations due to positive feedback in the circuit, stabilizing these oscillations at the output of the resonant circuit by introducing negative feedback in amplitude using the automatic gain control circuit with a reference signal source, characterized in that the quality factor Q is determined by measuring the amplitude of the signal at the output of the negative feedback link U and calculating by the formula: Q = K / U, where K is a constant value. 2. The method of measuring the quality factor of the resonant circuit according to claim 1, characterized in that the value of the reference signal is additionally measured, and the quality factor Q is determined by the formula: Q = KU / U, where U is the value of the reference signal. 3. A device for measuring the quality factor of a resonant circuit containing a positive feedback circuit made in the form of a series-connected amplifier and a phase shift device, a negative feedback circuit containing a reference signal source and series-connected detector, differential amplifier and multiplier, while the reference signal source is connected to differential amplifier input, the second input of the multiplier is connected to the output of the phase shift device, the detector input is connected to the output of the device phase shift, characterized in that it introduced a computing unit that implements the function K / V, while the input of the computing unit is connected to the output of the differential amplifier.
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RU2013159327/28A RU2564699C2 (en) | 2013-12-30 | 2013-12-30 | Method to measure good quality of resonant circuit and device for its realisation |
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RU2013159327/28A RU2564699C2 (en) | 2013-12-30 | 2013-12-30 | Method to measure good quality of resonant circuit and device for its realisation |
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RU2013159327A true RU2013159327A (en) | 2015-07-10 |
RU2564699C2 RU2564699C2 (en) | 2015-10-10 |
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RU2013159327/28A RU2564699C2 (en) | 2013-12-30 | 2013-12-30 | Method to measure good quality of resonant circuit and device for its realisation |
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Families Citing this family (1)
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RU2652639C1 (en) * | 2017-02-27 | 2018-04-28 | Арина Валерьевна Старцева | Method of the kelvin-voigt model coefficients determining for the micro-mechanical resonator adhesive connection with the base |
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SU970264A1 (en) * | 1979-12-07 | 1982-10-30 | Предприятие П/Я Г-4493 | Device for measuring quality factor |
SU1153303A1 (en) * | 1983-11-11 | 1985-04-30 | Предприятие П/Я Г-4493 | Device for measuring tuned-circuit q-factor |
AU8774998A (en) * | 1997-08-13 | 1999-03-08 | California Institute Of Technology | Gyroscopes and compensation |
DE60116111T2 (en) * | 2000-05-16 | 2006-11-02 | Chandler, Stephen Antony Gerard, Stroud | RETRACTED HIGH-FREQUENCY AMPLIFIERS |
EP2282404A1 (en) * | 2009-08-03 | 2011-02-09 | Nxp B.V. | Frequency selection and amplifying device |
US8578775B2 (en) * | 2010-02-08 | 2013-11-12 | Freescale Semiconductor, Inc. | Generation, injection and use of pilot tones for gyro system characterization |
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MM4A | The patent is invalid due to non-payment of fees |
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Effective date: 20191211 |