PT1152861E - Processo para a producao de componentes, sua utilizacao, peca armazenada ao ar e camara de tratamento sob vacuo - Google Patents
Processo para a producao de componentes, sua utilizacao, peca armazenada ao ar e camara de tratamento sob vacuoInfo
- Publication number
- PT1152861E PT1152861E PT00902526T PT00902526T PT1152861E PT 1152861 E PT1152861 E PT 1152861E PT 00902526 T PT00902526 T PT 00902526T PT 00902526 T PT00902526 T PT 00902526T PT 1152861 E PT1152861 E PT 1152861E
- Authority
- PT
- Portugal
- Prior art keywords
- vacuum treatment
- treatment chamber
- peca
- stored
- production
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
- B23K1/206—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
- Treatments Of Macromolecular Shaped Articles (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Telephone Function (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH31599 | 1999-02-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
PT1152861E true PT1152861E (pt) | 2006-07-31 |
Family
ID=4184215
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PT00902526T PT1152861E (pt) | 1999-02-19 | 2000-02-14 | Processo para a producao de componentes, sua utilizacao, peca armazenada ao ar e camara de tratamento sob vacuo |
Country Status (13)
Country | Link |
---|---|
US (2) | US6605175B1 (pt) |
EP (1) | EP1152861B1 (pt) |
JP (1) | JP2002537641A (pt) |
KR (1) | KR20010108240A (pt) |
CN (1) | CN1347357A (pt) |
AT (1) | ATE321622T1 (pt) |
CA (1) | CA2371771A1 (pt) |
DE (1) | DE50012480D1 (pt) |
ES (1) | ES2259993T3 (pt) |
HK (1) | HK1046113A1 (pt) |
PT (1) | PT1152861E (pt) |
TW (1) | TW462904B (pt) |
WO (1) | WO2000048779A1 (pt) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6605175B1 (en) * | 1999-02-19 | 2003-08-12 | Unaxis Balzers Aktiengesellschaft | Process for manufacturing component parts, use of same, with air bearing supported workpieces and vacuum processing chamber |
KR20020080954A (ko) * | 2001-04-18 | 2002-10-26 | 주성엔지니어링(주) | 냉벽 화학기상증착 방법 및 장치 |
DE10210216A1 (de) * | 2002-03-08 | 2003-10-16 | Behr Gmbh & Co | Verfahren zum Löten von Aluminium |
US6902774B2 (en) * | 2002-07-25 | 2005-06-07 | Inficon Gmbh | Method of manufacturing a device |
WO2004028732A1 (ja) * | 2002-09-25 | 2004-04-08 | Toray Engineering Co., Ltd. | 接合方法および装置 |
JP2006080099A (ja) * | 2002-09-26 | 2006-03-23 | Toray Eng Co Ltd | 接合方法および装置 |
US7482249B2 (en) * | 2002-11-29 | 2009-01-27 | Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. | Method and device for machining a wafer, in addition to a wafer comprising a separation layer and a support layer |
US7387738B2 (en) * | 2003-04-28 | 2008-06-17 | Air Products And Chemicals, Inc. | Removal of surface oxides by electron attachment for wafer bumping applications |
US7897029B2 (en) * | 2008-03-04 | 2011-03-01 | Air Products And Chemicals, Inc. | Removal of surface oxides by electron attachment |
US8361340B2 (en) * | 2003-04-28 | 2013-01-29 | Air Products And Chemicals, Inc. | Removal of surface oxides by electron attachment |
JP4892209B2 (ja) * | 2005-08-22 | 2012-03-07 | 日立化成デュポンマイクロシステムズ株式会社 | 半導体装置の製造方法 |
JP4691417B2 (ja) * | 2005-08-22 | 2011-06-01 | 日立化成デュポンマイクロシステムズ株式会社 | 回路接続構造体及びその製造方法及び回路接続構造体用の半導体基板 |
US7434719B2 (en) * | 2005-12-09 | 2008-10-14 | Air Products And Chemicals, Inc. | Addition of D2 to H2 to detect and calibrate atomic hydrogen formed by dissociative electron attachment |
JP2007258317A (ja) * | 2006-03-22 | 2007-10-04 | Shin Etsu Chem Co Ltd | 半導体装置の製造方法 |
JP5210496B2 (ja) * | 2006-03-27 | 2013-06-12 | 神港精機株式会社 | 半導体装置の製造方法 |
JP2007329309A (ja) * | 2006-06-08 | 2007-12-20 | Matsushita Electric Ind Co Ltd | 電子部品の製造方法 |
EP2022591B1 (de) * | 2007-08-03 | 2010-07-14 | Siemens Aktiengesellschaft | Verfahren zur Erzeugung einer lötfähigen metallischen Oberfläche und Lötverfahren |
KR101046520B1 (ko) | 2007-09-07 | 2011-07-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 내부 챔버 상의 부산물 막 증착을 제어하기 위한 pecvd 시스템에서의 소스 가스 흐름 경로 제어 |
DE102011105645A1 (de) * | 2011-06-07 | 2012-12-13 | Oerlikon Trading Ag, Trübbach | Entschichtungsverfahren für harte Kohlenstoffschichten |
CN102259218B (zh) * | 2011-07-06 | 2012-12-19 | 哈尔滨工业大学 | 真空活化焊接装置 |
CH705951B1 (de) * | 2011-12-23 | 2017-12-15 | Awaiba Consultadoria Desenvolvimento E Comércio De Componentes Microelectrónicos Unipessoal Lda | Optische Sensoranordnung und Verfahren zur Herstellung sowie Verwendung derselben. |
CN104064480A (zh) * | 2013-03-22 | 2014-09-24 | 江西创成半导体有限责任公司 | 聚酰亚胺喷涂 |
US10636661B2 (en) * | 2016-01-15 | 2020-04-28 | Taiwan Semiconductor Manufacturing Company Ltd. | Apparatus and method for wafer bonding |
CN108872380B (zh) * | 2018-06-04 | 2021-10-22 | 航天特种材料及工艺技术研究所 | 多层粘接构件的粘接缺陷检测方法 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4598022A (en) * | 1983-11-22 | 1986-07-01 | Olin Corporation | One-step plasma treatment of copper foils to increase their laminate adhesion |
GB8827933D0 (en) | 1988-11-30 | 1989-01-05 | Plessey Co Plc | Improvements relating to soldering processes |
US4921157A (en) | 1989-03-15 | 1990-05-01 | Microelectronics Center Of North Carolina | Fluxless soldering process |
US4965530A (en) | 1989-09-26 | 1990-10-23 | General Electric Company | Parallelled amplifier with switched isolation resistors |
DE4032328A1 (de) | 1989-11-06 | 1991-09-19 | Wls Karl Heinz Grasmann Weichl | Verfahren und vorrichtung zur verarbeitung von zu verloetenden fuegepartnern |
US5225378A (en) * | 1990-11-16 | 1993-07-06 | Tokyo Electron Limited | Method of forming a phosphorus doped silicon film |
JP3115015B2 (ja) * | 1991-02-19 | 2000-12-04 | 東京エレクトロン株式会社 | 縦型バッチ処理装置 |
DE59202116D1 (de) | 1991-04-23 | 1995-06-14 | Balzers Hochvakuum | Verfahren zur Abtragung von Material von einer Oberfläche in einer Vakuumkammer. |
DE4209720A1 (de) | 1992-03-25 | 1993-09-30 | Hermann Ing Grad Marr | Beleimautomat zum Beleimen von Werkstücken |
CH687111A5 (de) | 1992-05-26 | 1996-09-13 | Balzers Hochvakuum | Verfahren zum Erzeugen einer Niederspannungsentladung, Vakuumbehandlungsanlage hierfuer sowie Anwendung des Verfahrens. |
US5383984A (en) * | 1992-06-17 | 1995-01-24 | Tokyo Electron Limited | Plasma processing apparatus etching tunnel-type |
US5409543A (en) | 1992-12-22 | 1995-04-25 | Sandia Corporation | Dry soldering with hot filament produced atomic hydrogen |
US5938854A (en) * | 1993-05-28 | 1999-08-17 | The University Of Tennessee Research Corporation | Method and apparatus for cleaning surfaces with a glow discharge plasma at one atmosphere of pressure |
US5647945A (en) * | 1993-08-25 | 1997-07-15 | Tokyo Electron Limited | Vacuum processing apparatus |
US5616208A (en) * | 1993-09-17 | 1997-04-01 | Tokyo Electron Limited | Vacuum processing apparatus, vacuum processing method, and method for cleaning the vacuum processing apparatus |
US5546322A (en) | 1994-04-12 | 1996-08-13 | International Business Machines Corporation | Method and system for analyzing plasma data |
JP3247270B2 (ja) * | 1994-08-25 | 2002-01-15 | 東京エレクトロン株式会社 | 処理装置及びドライクリーニング方法 |
US5832600A (en) * | 1995-06-06 | 1998-11-10 | Seiko Epson Corporation | Method of mounting electronic parts |
CH692446A5 (de) * | 1996-04-15 | 2002-06-28 | Esec Sa | Verfahren zur Herstellung von Werkstücken und von Teilen hierfür |
US6605175B1 (en) * | 1999-02-19 | 2003-08-12 | Unaxis Balzers Aktiengesellschaft | Process for manufacturing component parts, use of same, with air bearing supported workpieces and vacuum processing chamber |
US6383573B1 (en) * | 2000-05-17 | 2002-05-07 | Unaxis Balzers Aktiengesellschaft | Process for manufacturing coated plastic body |
US6902774B2 (en) * | 2002-07-25 | 2005-06-07 | Inficon Gmbh | Method of manufacturing a device |
-
1999
- 1999-02-25 US US09/257,207 patent/US6605175B1/en not_active Expired - Lifetime
-
2000
- 2000-02-14 CA CA002371771A patent/CA2371771A1/en not_active Abandoned
- 2000-02-14 DE DE50012480T patent/DE50012480D1/de not_active Expired - Lifetime
- 2000-02-14 KR KR1020017010559A patent/KR20010108240A/ko not_active Application Discontinuation
- 2000-02-14 CN CN00806504A patent/CN1347357A/zh active Pending
- 2000-02-14 ES ES00902526T patent/ES2259993T3/es not_active Expired - Lifetime
- 2000-02-14 WO PCT/CH2000/000082 patent/WO2000048779A1/de active IP Right Grant
- 2000-02-14 AT AT00902526T patent/ATE321622T1/de not_active IP Right Cessation
- 2000-02-14 JP JP2000599549A patent/JP2002537641A/ja not_active Withdrawn
- 2000-02-14 PT PT00902526T patent/PT1152861E/pt unknown
- 2000-02-14 EP EP00902526A patent/EP1152861B1/de not_active Expired - Lifetime
- 2000-02-15 TW TW089102496A patent/TW462904B/zh not_active IP Right Cessation
-
2002
- 2002-10-24 HK HK02107724.6A patent/HK1046113A1/zh unknown
-
2003
- 2003-06-23 US US10/600,511 patent/US20050172983A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1152861A1 (de) | 2001-11-14 |
TW462904B (en) | 2001-11-11 |
HK1046113A1 (zh) | 2002-12-27 |
ATE321622T1 (de) | 2006-04-15 |
DE50012480D1 (de) | 2006-05-18 |
US20050172983A1 (en) | 2005-08-11 |
JP2002537641A (ja) | 2002-11-05 |
US6605175B1 (en) | 2003-08-12 |
EP1152861B1 (de) | 2006-03-29 |
CA2371771A1 (en) | 2000-08-24 |
KR20010108240A (ko) | 2001-12-07 |
CN1347357A (zh) | 2002-05-01 |
WO2000048779A1 (de) | 2000-08-24 |
ES2259993T3 (es) | 2006-11-01 |
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