NO954729A - Fölerkrets and procedure for compensation - Google Patents

Fölerkrets and procedure for compensation

Info

Publication number
NO954729A
NO954729A NO954729A NO954729A NO954729A NO 954729 A NO954729 A NO 954729A NO 954729 A NO954729 A NO 954729A NO 954729 A NO954729 A NO 954729A NO 954729 A NO954729 A NO 954729A
Authority
NO
Norway
Prior art keywords
transducer
amplifier
compensation
microprocessor
via
Prior art date
Application number
NO954729A
Other languages
Norwegian (no)
Other versions
NO954729D0 (en
Inventor
Jeffery I Baum
Jeffrey D Marvin
Sin Wa L Liu
Eric S Jacobsen
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US36763995A priority Critical
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of NO954729D0 publication Critical patent/NO954729D0/en
Publication of NO954729A publication Critical patent/NO954729A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress in general
    • G01L1/20Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281Arrangements for correcting or for compensating unwanted effects for temperature variations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress in general
    • G01L1/20Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268Arrangements for correcting or for compensating unwanted effects
    • G01L1/2275Arrangements for correcting or for compensating unwanted effects for non linearity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L25/00Testing or calibrating of apparatus for measuring force, work, torque, mechanical power, or mechanical efficiency

Abstract

Det er beskrevet en sensorkrets (20) og en framgangsmåte for kalibrering og temperatur-kompensering av forskyvning og spennvidde av sensorkretsen (20). Disclosed is a sensor circuit (20) and a method for calibration and temperature compensation of the offset and the span of the sensor circuit (20). Sensorkretsen (20) inkluderer en transducer (21) koplet til en mikroprosessor (22) via en forsterker (23) og en temperaturavfølingskrets (24). The sensor circuit (20) includes a transducer (21) coupled to a microprocessor (22) via an amplifier (23) and a temperaturavfølingskrets (24). En utgangsport av mikroprosessoren (22) er koplet til en første inngangsnode av forsterkeren (23) via et transducer-forskyvningskompenserings- nettverk (23) og til en andre inngangsnode av forsterkeren (23) via et transducer-spennvidde- kompenseringsnettverk (34), og dermed dannes et lukket-sløyfe-tilbakekoplingsnettverk. An output port of the microprocessor (22) is coupled to a first input node of the amplifier (23) via a transducer forskyvningskompenserings- network (23) and to a second input node of the amplifier (23) via a transducer spennvidde- compensation network (34), and thereby forming a closed-loop feedback network. I operasjon blir transducer-utgangssignalet sendt til mikroprosessoren (22) via forsterkeren (23). In operation, the transducer output signal sent to the microprocessor (22) through the amplifier (23). Mikroprosessoren (22) genererer et transducer-kompenseringssignal som tilbakekoples til inngangsnodene til forsterkeren (23) via transducer-forskyvningskompenseringsnettverk (33) og tranducer-spennviddekompenseringsnettverk (34) for å generere et kalibrert og temperaturkompensert transducer-utgangssignal (SCA). The microprocessor (22) generates a transducer compensation signal which is fed back to the input nodes of the amplifier (23) via transducer offset compensation network (33) and tranducer-span compensation network (34) for generating a calibrated and temperature compensated transducer output signal (SCA).
NO954729A 1995-01-03 1995-11-23 Fölerkrets and procedure for compensation NO954729A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US36763995A true 1995-01-03 1995-01-03

Publications (2)

Publication Number Publication Date
NO954729D0 NO954729D0 (en) 1995-11-23
NO954729A true NO954729A (en) 1996-07-04

Family

ID=23447993

Family Applications (1)

Application Number Title Priority Date Filing Date
NO954729A NO954729A (en) 1995-01-03 1995-11-23 Fölerkrets and procedure for compensation

Country Status (3)

Country Link
EP (1) EP0721099A3 (en)
JP (1) JPH08240499A (en)
NO (1) NO954729A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3384753B2 (en) * 1998-10-15 2003-03-10 タカタ株式会社 Seat load measuring device
DE10005445C2 (en) 1999-02-08 2002-08-14 Takata Corp Diagnostic procedures for a seat load measuring device
US6377110B1 (en) 1999-09-10 2002-04-23 Keystone Thermometrics Low-cost temperature sensor providing relatively high accuracy, a wide dynamic range and high linearity
DE10023114A1 (en) * 2000-05-11 2001-11-29 Infineon Technologies Ag Amplifier circuit with offset compensation, in particular for digital modulation devices
US7091902B2 (en) * 2003-12-17 2006-08-15 Xerox Corporation Systems and methods for characterizing the coverage of ad hoc sensor networks
EP1602907A1 (en) * 2004-05-31 2005-12-07 Gefran Sensori S.r.l. Automatic sensor correction with feedback microprocessor
US20060284627A1 (en) * 2005-06-17 2006-12-21 Ford Greg E Apparatus for correcting electrical signals
EP2546620B1 (en) * 2011-07-13 2014-04-09 ELMOS Semiconductor AG Ambient light compensation device for optical sensors equally exposed to useful light and ambient light
JP2015177205A (en) * 2014-03-13 2015-10-05 ヤマハ株式会社 Offset cancellation circuit

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4437164A (en) * 1981-03-05 1984-03-13 Bristol Babcock Inc. Ridge circuit compensation for environmental effects
US4478527A (en) * 1982-12-02 1984-10-23 General Signal Corporation Temperature compensation for zero and span changes in a measurement circuit
JPH0640036B2 (en) * 1985-09-24 1994-05-25 工業技術院長 Pressure sensation sensor output signal preprocessor
US4872349A (en) * 1986-10-31 1989-10-10 General Electric Company Microcomputerized force transducer
US4969059A (en) * 1988-03-28 1990-11-06 Rigidyne Corporation Offset nulling system for computer disk drives
JPH0777266B2 (en) * 1988-12-28 1995-08-16 株式会社豊田中央研究所 Semiconductor strain detection device
US5031461A (en) * 1990-02-05 1991-07-16 Motorola, Inc. Matched pair of sensor and amplifier circuits
US5115193A (en) * 1990-12-05 1992-05-19 Data Instruments, Inc. Inductive linear displacement transducer and temperature-compensating signal processor
US5193393A (en) * 1991-02-04 1993-03-16 Motorola, Inc. Pressure sensor circuit
US5187985A (en) * 1991-09-19 1993-02-23 Honeywell Inc. Amplified pressure transducer
US5460049A (en) * 1994-01-26 1995-10-24 Instrumention Northwest, Inc. Digitally-temperature-compensated strain-gauge pressure measuring apparatus

Also Published As

Publication number Publication date
JPH08240499A (en) 1996-09-17
EP0721099A3 (en) 1996-12-04
EP0721099A2 (en) 1996-07-10
NO954729D0 (en) 1995-11-23

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Legal Events

Date Code Title Description
FC2A Rejection of laid open patent application