NL7404433A - - Google Patents

Info

Publication number
NL7404433A
NL7404433A NL7404433A NL7404433A NL7404433A NL 7404433 A NL7404433 A NL 7404433A NL 7404433 A NL7404433 A NL 7404433A NL 7404433 A NL7404433 A NL 7404433A NL 7404433 A NL7404433 A NL 7404433A
Authority
NL
Netherlands
Application number
NL7404433A
Other versions
NL159498B (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL7404433A publication Critical patent/NL7404433A/xx
Publication of NL159498B publication Critical patent/NL159498B/en

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/22Analogue/digital converters pattern-reading type
    • H03M1/24Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip
    • H03M1/28Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding
    • H03M1/30Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental
    • H03M1/308Analogue/digital converters pattern-reading type using relatively movable reader and disc or strip with non-weighted coding incremental with additional pattern means for determining the absolute position, e.g. reference marks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/30Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/30Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes
NL7404433A 1973-05-14 1974-04-01 DEVICE FOR MEASURING A LENGTH OR ANGLE. NL159498B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH679273A CH553960A (en) 1973-05-14 1973-05-14 LENGTH OR ANGLE MEASURING DEVICE.

Publications (2)

Publication Number Publication Date
NL7404433A true NL7404433A (en) 1974-11-18
NL159498B NL159498B (en) 1979-02-15

Family

ID=4315100

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7404433A NL159498B (en) 1973-05-14 1974-04-01 DEVICE FOR MEASURING A LENGTH OR ANGLE.

Country Status (7)

Country Link
JP (1) JPS5610565B2 (en)
CH (1) CH553960A (en)
FR (1) FR2229949B1 (en)
GB (1) GB1472876A (en)
IT (1) IT1012199B (en)
NL (1) NL159498B (en)
SE (1) SE399473B (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892571U (en) * 1981-12-17 1983-06-23 有限会社 和田製作所 Ball tap with flow control valve
DE3201005A1 (en) * 1982-01-15 1983-07-28 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut DEVICE FOR ERROR CORRECTION IN POSITION MEASURING SYSTEMS
CH658126A5 (en) * 1983-03-07 1986-10-15 Maag Zahnraeder & Maschinen Ag MEASURING DEVICE AND METHOD FOR THE INSPECTION OF GEARS.
US4602155A (en) * 1983-07-25 1986-07-22 Bei Electronics, Inc. Zero reference generating method and apparatus for optical encoders
US4678908A (en) * 1983-07-25 1987-07-07 Bei Electronics, Inc. Zero reference generating method and apparatus for optical encoders
GB8322886D0 (en) * 1983-08-25 1983-09-28 Lucas Ind Plc Transducer means
JPS61219815A (en) * 1985-03-27 1986-09-30 Yokogawa Electric Corp Apparatus for measuring shape of disc
DE3611204A1 (en) * 1986-04-04 1987-10-15 Heidenhain Gmbh Dr Johannes MEASURING DEVICE
DE3617254A1 (en) * 1986-05-22 1987-11-26 Heidenhain Gmbh Dr Johannes MEASURING DEVICE
EP0286322B1 (en) * 1987-04-03 1994-06-15 Hitachi, Ltd. Method and apparatus for detecting a rotation angle
DE10300918B4 (en) 2003-01-13 2014-11-06 Robert Bosch Gmbh Apparatus and method for detecting the relative movement of two relatively movable machine parts
CN101650153B (en) * 2009-09-08 2011-06-08 长春理工大学 Angular measuring device of flight stance simulation platform
DE102018202556A1 (en) * 2018-02-20 2019-08-22 Dr. Johannes Heidenhain Gmbh Optical position measuring device
CN110879041B (en) * 2019-11-08 2021-06-22 杭州电子科技大学 Linear double-code-channel absolute steel tape ruler and reading method thereof

Also Published As

Publication number Publication date
NL159498B (en) 1979-02-15
IT1012199B (en) 1977-03-10
FR2229949B1 (en) 1978-11-17
CH553960A (en) 1974-09-13
DE2416212B2 (en) 1975-07-10
JPS5610565B2 (en) 1981-03-09
FR2229949A1 (en) 1974-12-13
GB1472876A (en) 1977-05-11
JPS5017668A (en) 1975-02-25
DE2416212A1 (en) 1974-11-28
SE399473B (en) 1978-02-13

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Legal Events

Date Code Title Description
SNR Assignments of patents or rights arising from examined patent applications

Owner name: DR. JOHANNES HEIDENHAIN GMBH

NL80 Abbreviated name of patent owner mentioned of already nullified patent

Owner name: CONTRAVES

V4 Lapsed because of reaching the maxim lifetime of a patent