MXPA05011767A - Metodo y disposicion para una prueba de bucle de senales. - Google Patents

Metodo y disposicion para una prueba de bucle de senales.

Info

Publication number
MXPA05011767A
MXPA05011767A MXPA05011767A MXPA05011767A MXPA05011767A MX PA05011767 A MXPA05011767 A MX PA05011767A MX PA05011767 A MXPA05011767 A MX PA05011767A MX PA05011767 A MXPA05011767 A MX PA05011767A MX PA05011767 A MXPA05011767 A MX PA05011767A
Authority
MX
Mexico
Prior art keywords
transceiver
loop
vin
generated
hecho
Prior art date
Application number
MXPA05011767A
Other languages
English (en)
Inventor
Per Oedlin
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Publication of MXPA05011767A publication Critical patent/MXPA05011767A/es

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/24—Arrangements for testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/305—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/305—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance
    • H04M3/306—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance for frequencies above the voice frequency, e.g. xDSL line qualification

Abstract

La invencion se refiere a una prueba de un solo extremo de un bucle (2,3) con ayuda de un transceptor (1), en donde se genera una impedancia (Zin(f)) del bucle. El transceptor (1) tiene una parte digital (41), un codec (42) y una parte analogica (43) y esta conectado al bucle. Con la ayuda de una senal de banda ancha transmitida y reflejada (vin, vout), se genera una funcion de transferencia de eco Hecho(f)=V(f)out/Vin(f) la cual puede ser expresada tambien como formula (I). Aqui, Zho(f), Zhyb(f) y He(f) son valores modelo para el transceptor (1). En un proceso de calibracion, un transceptor de prueba con el mismo tipo de hardware que el transceptor (1), esta conectado a impedancias conocidas que reemplazan el bucle (2, 3). Se genera Hecho(f)=V(f)out/Vin(f) para las impedancias conocidas y los valores de modelo son generados y almacenados en una memoria (11) en el transceptor (1). Los valores de modelo almacenados son despues utilizados cuando se genera la impedancia de entrada (Zin(f)) para el bucle (2, 3) despues de la medicion de la senal de banda ancha (Vin, Vout).
MXPA05011767A 2003-05-12 2004-03-04 Metodo y disposicion para una prueba de bucle de senales. MXPA05011767A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US46965803P 2003-05-12 2003-05-12
PCT/SE2004/000296 WO2004100512A1 (en) 2003-05-12 2004-03-04 Method and arrangement for signal loop test

Publications (1)

Publication Number Publication Date
MXPA05011767A true MXPA05011767A (es) 2006-01-26

Family

ID=33435251

Family Applications (3)

Application Number Title Priority Date Filing Date
MXPA05011767A MXPA05011767A (es) 2003-05-12 2004-03-04 Metodo y disposicion para una prueba de bucle de senales.
MXPA05011800A MXPA05011800A (es) 2003-05-12 2004-04-08 Metodo y arreglo para prueba de bucle de una linea perturbada.
MXPA05011766A MXPA05011766A (es) 2003-05-12 2004-05-11 Metodo y disposicion para estimar propiedades de linea.

Family Applications After (2)

Application Number Title Priority Date Filing Date
MXPA05011800A MXPA05011800A (es) 2003-05-12 2004-04-08 Metodo y arreglo para prueba de bucle de una linea perturbada.
MXPA05011766A MXPA05011766A (es) 2003-05-12 2004-05-11 Metodo y disposicion para estimar propiedades de linea.

Country Status (13)

Country Link
US (2) US7069165B2 (es)
EP (3) EP1625735B1 (es)
JP (1) JP4477626B2 (es)
KR (3) KR101018972B1 (es)
CN (3) CN1784881B (es)
AT (3) ATE384395T1 (es)
AU (1) AU2004236618B2 (es)
BR (3) BRPI0410286B8 (es)
DE (2) DE602004011333T2 (es)
DK (1) DK1625736T3 (es)
ES (1) ES2295851T3 (es)
MX (3) MXPA05011767A (es)
WO (3) WO2004100512A1 (es)

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Also Published As

Publication number Publication date
MXPA05011800A (es) 2006-02-17
WO2004099711A1 (en) 2004-11-18
BRPI0410263B1 (pt) 2014-05-20
ATE381851T1 (de) 2008-01-15
EP1625735B1 (en) 2008-01-16
ES2295851T3 (es) 2008-04-16
DE602004010801D1 (de) 2008-01-31
US20050027456A1 (en) 2005-02-03
EP1625736A1 (en) 2006-02-15
EP1625736B1 (en) 2007-12-19
EP1625348B1 (en) 2012-04-11
ATE384395T1 (de) 2008-02-15
BRPI0410272A (pt) 2006-05-16
CN1784881B (zh) 2010-06-02
KR101018972B1 (ko) 2011-03-02
AU2004236618A1 (en) 2004-11-18
JP4477626B2 (ja) 2010-06-09
AU2004237642A1 (en) 2004-11-18
EP1625348A1 (en) 2006-02-15
CN1784882B (zh) 2010-07-21
CN100582648C (zh) 2010-01-20
AU2004236618B2 (en) 2009-02-19
EP1625735A1 (en) 2006-02-15
KR20060033716A (ko) 2006-04-19
DE602004011333T2 (de) 2009-01-08
BRPI0410272B1 (pt) 2018-05-29
JP2007529139A (ja) 2007-10-18
MXPA05011766A (es) 2006-01-26
CN1784586A (zh) 2006-06-07
BRPI0410286A (pt) 2006-05-16
WO2004100513A1 (en) 2004-11-18
KR101215192B1 (ko) 2012-12-24
CN1784882A (zh) 2006-06-07
KR101063653B1 (ko) 2011-09-07
WO2004100512A1 (en) 2004-11-18
BRPI0410286B1 (pt) 2017-08-15
KR20060012602A (ko) 2006-02-08
US7362850B2 (en) 2008-04-22
DK1625736T3 (da) 2008-04-28
US7069165B2 (en) 2006-06-27
DE602004010801T2 (de) 2008-12-11
KR20060016781A (ko) 2006-02-22
BRPI0410286B8 (pt) 2018-02-27
DE602004011333D1 (de) 2008-03-06
BRPI0410263A (pt) 2006-05-16
CN1784881A (zh) 2006-06-07
US20070014393A1 (en) 2007-01-18
ATE553547T1 (de) 2012-04-15

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