KR970054065A - Capacitor Manufacturing Method - Google Patents

Capacitor Manufacturing Method Download PDF

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Publication number
KR970054065A
KR970054065A KR1019950058877A KR19950058877A KR970054065A KR 970054065 A KR970054065 A KR 970054065A KR 1019950058877 A KR1019950058877 A KR 1019950058877A KR 19950058877 A KR19950058877 A KR 19950058877A KR 970054065 A KR970054065 A KR 970054065A
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KR
South Korea
Prior art keywords
polysilicon
forming
nitride film
film
capacitor
Prior art date
Application number
KR1019950058877A
Other languages
Korean (ko)
Inventor
박유배
서원철
Original Assignee
문정환
Lg 반도체 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 문정환, Lg 반도체 주식회사 filed Critical 문정환
Priority to KR1019950058877A priority Critical patent/KR970054065A/en
Publication of KR970054065A publication Critical patent/KR970054065A/en

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Abstract

본 발명은 커패시터 제조방법에 관한 것으로 특히, 커패시터 용량을 증가시키는데 적합하도록 한 커패시터 제조방법에 관한 것이다.The present invention relates to a method of manufacturing a capacitor, and more particularly, to a method of manufacturing a capacitor adapted to increase the capacitor capacity.

이를 위한 본 발명의 커패시터 제조방법은 기판위에 폴리 실리콘을 형성하는 단계; 상기 폴리 실리콘위에 질화막을 형성하는 단계; 상기 질화막 및 폴리실리콘을 열산화하여 상기 폴리 실리콘의 그레인 사이에 산화막을 형성하는 단계; 상기 질화막 및 폴리실리콘을 열산화 하여 상기 폴리 실리콘의 그레인 사이에 산화막을 형성하는 단계; 상기 질화막 및 산화막을 제거하여 하부 전극을 형성하는 단게; 상기 하부 전극위에 유전막을 형성하는 단계; 상기 유전막위에 상부 전극을 형성하는 단계를 포함하여 이루어진다. 따라서, 일렉트릭 필드(Electric Field) 의 집중이 감소되어 신뢰성이 향상된다.Capacitor manufacturing method of the present invention for this purpose comprises the steps of forming polysilicon on a substrate; Forming a nitride film on the polysilicon; Thermally oxidizing the nitride film and the polysilicon to form an oxide film between the grains of the polysilicon; Thermally oxidizing the nitride film and the polysilicon to form an oxide film between the grains of the polysilicon; Removing the nitride film and the oxide film to form a lower electrode; Forming a dielectric film on the lower electrode; And forming an upper electrode on the dielectric layer. Therefore, the concentration of the electric field is reduced and the reliability is improved.

Description

커패시터 제조방법Capacitor Manufacturing Method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제2도는 본 발명의 커패시터 제조공정 단면도.2 is a cross-sectional view of a capacitor manufacturing process of the present invention.

Claims (3)

기판위에 폴리 실리콘을 형성하는 단계; 상기 폴리 실리콘위에 질화막을 형성하는 단계; 상기 질화막 및 폴리 실리콘을 열산화 하여 상기 폴리 실리콘의 그레인 사이에 산화막을 형성하는 단계; 상기 질화막 및 산화막을 제거하여 하부 전극을 형성하는 단계; 상기 하부 전극위에 유전막을 형성하는 단계; 상기 유전막위에 상부 전극을 형성하는 단계를 포함하여 이루어짐을 특징으로 하는 커패시터 제조방법.Forming polysilicon on the substrate; Forming a nitride film on the polysilicon; Thermally oxidizing the nitride film and the polysilicon to form an oxide film between the grains of the polysilicon; Removing the nitride film and the oxide film to form a lower electrode; Forming a dielectric film on the lower electrode; Capacitor manufacturing method comprising the step of forming an upper electrode on the dielectric film. 제1항에 있어서, 상기 질화막은 두께가 10Å∼150Å인 것을 특징으로 하는 커패시터 제조방법.The method of claim 1, wherein the nitride film has a thickness of 10 kV to 150 kV. 제1항에 있어서, 상기 질화막 형성시 온도를 약 450℃∼800℃로 하는 것을 특징으로 하는 커패시터 제조방법.The method of claim 1, wherein the temperature for forming the nitride film is about 450 ° C to 800 ° C. ※참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: It is to be disclosed based on the initial application.
KR1019950058877A 1995-12-27 1995-12-27 Capacitor Manufacturing Method KR970054065A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950058877A KR970054065A (en) 1995-12-27 1995-12-27 Capacitor Manufacturing Method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950058877A KR970054065A (en) 1995-12-27 1995-12-27 Capacitor Manufacturing Method

Publications (1)

Publication Number Publication Date
KR970054065A true KR970054065A (en) 1997-07-31

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ID=66618687

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950058877A KR970054065A (en) 1995-12-27 1995-12-27 Capacitor Manufacturing Method

Country Status (1)

Country Link
KR (1) KR970054065A (en)

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