KR960030308A - Particle dust treatment method and apparatus for semiconductor device manufacturing process - Google Patents

Particle dust treatment method and apparatus for semiconductor device manufacturing process Download PDF

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KR960030308A
KR960030308A KR1019950001038A KR19950001038A KR960030308A KR 960030308 A KR960030308 A KR 960030308A KR 1019950001038 A KR1019950001038 A KR 1019950001038A KR 19950001038 A KR19950001038 A KR 19950001038A KR 960030308 A KR960030308 A KR 960030308A
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dust
semiconductor device
manufacturing process
device manufacturing
particulate matter
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KR1019950001038A
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KR100319783B1 (en
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도시오 아와지
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도시오 아와지
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Abstract

본 발명은 구성이 간단하고, 게다가, 소형이면서, 0.01㎛ 정도 이상의 미립자분진을 장기간에 걸처서 포획할 수 있는 반도체소자 제조공정의 미립자분진 처리방법 및 그 장치를 제공하는 것을 목적으로 한다.SUMMARY OF THE INVENTION An object of the present invention is to provide a method and apparatus for treating particulate matter in a semiconductor device manufacturing process which is simple in construction and capable of capturing particulate dust of about 0.01 µm or more over a long period of time.

본 발명은 반도체소자 제조공정에 있어서 미립자분진을 발생하는 미립자분진 발생원에서 미립자분진을 함유하는 기체를 눈의 크기가 상류측에서 하류측으로 순서로 작아지는 3층 이상의 필터를 적층한 적층필터의 여과하여 미립자분진을 분리하여 회수하는 반도체소자 제조공정의 미립자분진 처리방법에 있어서, 미립자 발생원으로부터의 상기 기체를 상기 적층필터에 통하기 전에 회전브러시에 통하여 수분 및 유분을 분리하는 것을 특징으로 한다.The present invention is to filter the gas containing the particulate dust from the particulate dust generating source which generates the particulate dust in the semiconductor device manufacturing process by stacking the laminated filter having three or more layers of filters in which the size of the eyes becomes smaller in order from the upstream side to the downstream side. A fine particle dust treatment method of a semiconductor device manufacturing process for separating and recovering fine particle particles, characterized in that water and oil are separated through a rotary brush before passing the gas from the particle generation source through the multilayer filter.

Description

반도체소자 제조공정의 미립자분진 처리방법 및 그 장치Particle dust treatment method and apparatus for semiconductor device manufacturing process

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명 장치의 구성도, 제2도는 본 발명에 사용되는 제1층과 제2층의 필터의 관계를 도시하는 모식도.1 is a configuration diagram of the apparatus of the present invention, and FIG. 2 is a schematic diagram showing a relationship between a filter of a first layer and a second layer used in the present invention.

Claims (17)

반도체소자 제조공정에서 미립자분진을 발생하는 미립자분진 발생원에서 미립자분진을 함유하는 기체를 눈의 크기가 상류측에서 하류측으로 순서로 작아지는 3층 이상의 필터를 적층한 적층필터로 여과하여 미립자분진을 분리하여 회수하는 반도체소자 제조공정의 미립자분진 처리방법에 있어서, 상기 미립자분진 발생원으로 부터의 상기 기체를 상기 적층필터에 통과하기 전에 회전브러시를 통하여 수분 및 유분을 분리하는 것을 특징 으로 하는 반도체소자 제조공정의 미립자분진 처리방법.Particle dust is generated in the semiconductor device manufacturing process by filtering a gas containing particulate dust from a layered filter in which three or more layers of filters are formed in which the size of the eyes becomes smaller in order from the upstream side to the downstream side. A fine particle dust treatment method of a semiconductor device manufacturing step of recovering a semiconductor device, wherein the water and oil are separated through a rotary brush before passing the gas from the particle dust generating source through the multilayer filter. Fine particle dust treatment method. 제1항에 있어서, 회전브러시를 세로축심 주위로 회전시켜, 그 회전브러시의 아래측에서 위측으로 기체를 통과시키는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리방법.The method for processing particulate matter in a semiconductor device manufacturing process according to claim 1, wherein the rotating brush is rotated around the longitudinal axis to pass gas from the lower side to the upper side of the rotating brush. 제1항 또는 제2항에 있어서, 회전브러시가 정위치에서 회전가능하게, 또는 좌우 혹은 상하로 이동가능하게 형성되어 있는 것을 특징으로 하는 미립자분진 처리방법.The method for treating particulate matter according to claim 1 or 2, wherein the rotating brush is formed to be rotatable in a fixed position, or to be movable left and right or up and down. 제1항 내지 제3항 중 어느 한 항에 있어서, 액분리실의 밑부분에 흡수성폴리머, 흡유성폴리머 또는 흡수성폴리머와 흡유성폴리머의 적층체를 배치하고, 분리된 수분 또는 오일 혹은 수분과 오일을 이 흡수성폴리머, 흡유성폴리머 또는 흡수성폴리머와 흡유성폴리머의 적층체에 흡수시켜 폐기하는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리방법.The absorbent polymer, the oil absorbent polymer, or the laminate of the absorbent polymer and the oil absorbent polymer is disposed at the bottom of the liquid separation chamber, and the separated water or oil or water and oil is disposed. A method for treating particulate matter in a semiconductor device manufacturing process, characterized in that the absorbent polymer, the oil absorbent polymer, or the laminate of the absorbent polymer and the oil absorbent polymer is absorbed and disposed of. 제1항 내지 제4항 중 어느 한 항에 있어서, 기체를 회전브러시와 적층필터와의 사이에서 적층필터의 가장 상류측의 필터 보다도 눈이 큰 별도의 예비필터에 통하는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리방법.5. The semiconductor device according to any one of claims 1 to 4, wherein the gas is passed between a rotary brush and the laminated filter through a separate preliminary filter having an eye larger than the filter at the most upstream side of the laminated filter. Particulate matter treatment method of process. 제1항 내지 제5항 중 어느 한 항에 있어서, 미립자분진을 포획한 적층필터를 폐기용 기기내에 밀봉하여 폐기하는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리방법.6. The method for treating particulate matter in a semiconductor device manufacturing process according to any one of claims 1 to 5, wherein the multilayer filter which traps particulate dust is sealed in a waste machine and disposed of. 반도체소자 제조공정에서 미립자분진을 발생하는 미립자분진 발생원에서 유도되는 미립자분진을 포함하는 기체를 여과하는 상류측에서 하류측에 눈의 크기가 순서로 작아지는 3층 이상의 필터를 적층한 적층필터를 갖는 집진장치를 설치한 반도체소자 제조공정의 미립자분진 처리장치에 있어서, 미립자분진 발생원과 적층필터와의 사이에 배치된 통형의 액분리실과, 이 액분리실내에 액분리실의 축심주위로 회전가능하게 설치된 회전 브러시와, 이 회전브러시를 회전구동하는 구동장치를 구비하는 액분리장치가 설치되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.Has a laminated filter in which three or more layers of filters are laminated on the downstream side from the upstream side through which the gas containing the particulate dust derived from the particulate dust generation source that generates particulate dust in the semiconductor device manufacturing process is reduced in order. A particulate matter processing apparatus of a semiconductor device manufacturing process provided with a dust collecting device, comprising: a cylindrical liquid separation chamber disposed between a particulate dust generating source and a laminated filter, and rotatably installed around the axis of the liquid separation chamber in the liquid separation chamber. An apparatus for treating particulate matter in a semiconductor device manufacturing process, comprising a liquid separation device having a rotating brush and a driving device for rotating the rotating brush. 제7항에 있어서, 액분리실이 세로축에 배치되고, 이 액분리실이 회전브러시의 아래에서 개구하고, 미립자 분진 발생원에 액분리실을 연통시키는 입구와, 상기 회전브러시의 상방에서 개구하고, 집진장치에 연통하는 출구를 구비하는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.8. The liquid separation chamber according to claim 7, wherein the liquid separation chamber is arranged on the longitudinal axis, and the liquid separation chamber opens under the rotary brush, opens the inlet through which the liquid separation chamber communicates with the particulate dust generating source, and opens above the rotary brush. An apparatus for treating particulate matter in a semiconductor device manufacturing process, comprising an outlet communicating with it. 제7항 또는 제8항에 있어서, 회전브러시가 원반상 혹은 나선상으로 형성되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The particulate matter processing apparatus of claim 7 or 8, wherein the rotating brush is formed in a disk shape or a spiral shape. 제7항 내지 제9항 중 어느 한 항에 있어서, 액분리장치가 액분리실의 밑부에 수납되는 흡수성폴리머, 흡유성폴리머 또는 흡수성폴리머와 흡유성폴리머의 적층체를 구비하는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The semiconductor device according to any one of claims 7 to 9, wherein the liquid separation device comprises an absorbent polymer, an oil absorbent polymer, or a laminate of an absorbent polymer and an oil absorbent polymer, which is housed at the bottom of the liquid separation chamber. Apparatus for treating particulate matter in a manufacturing process. 제7항 내지 제10항 중 어느 한 항에 있어서, 액분리실에 있어서 회전브러시 보다도 하측의 부분이 분리가능하게 설치되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The particulate matter processing apparatus according to any one of claims 7 to 10, wherein a lower portion of the liquid separation chamber is provided so as to be separated from the rotary brush. 제7항 내지 제11항 중 어느 한 항에 있어서, 액분리장치와 적층필터와의 사이에서 기체를 여과하는 적층 필터의 가장 상류측의 필터 보다도 눈이 큰 별도의 예비필터가 설치되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The preliminary filter according to any one of claims 7 to 11, wherein a separate preliminary filter having a larger eye than a filter at the most upstream side of the laminated filter for filtering gas between the liquid separation device and the laminated filter is provided. An apparatus for treating particulate matter in a semiconductor device manufacturing process. 제7항 내지 제12항 중 어느 한 항에 있어서, 액분리장치의 출구에 복수의 집진장치가 접속되고, 복수의 집진장치의 중에서 선택된 1개 또는 복수의 집진장치에 선택적으로 기류를 유도하는 집진장치 선택수단이 설치되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The dust collector according to any one of claims 7 to 12, wherein a plurality of dust collectors are connected to an outlet of the liquid separator, and dust collecting selectively induces air flow to one or a plurality of dust collectors selected from among the plurality of dust collectors. An apparatus for treating particulate matter in a semiconductor device manufacturing process, characterized in that an apparatus selecting means is provided. 제7항 내지 제13항 중 어느 한 항에 있어서, 액분리장치의 출구에 접속되는 1개 또는 복수의 집진장치의 집진실에 복수의 적층필터가 병렬적으로 설치되고, 그 집진실의 복수의 적층필터 중에서 선택된 1개 또는 복수의 적층필터에 선택적으로 기류를 유도하는 필터선택 수단이 설치되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The dust collecting chamber according to any one of claims 7 to 13, wherein a plurality of stacked filters are provided in parallel in a dust collecting chamber of one or a plurality of dust collecting apparatuses connected to an outlet of the liquid separation apparatus, and a plurality of dust collecting chambers of the dust collecting chamber are installed. A fine particle dust treatment apparatus for a semiconductor device manufacturing process, characterized in that filter selection means for selectively inducing air flow is provided in one or a plurality of laminated filters selected from the laminated filters. 제7항 내지 제14항 중 어느 한 항에 있어서, 집진장치에는 미립자분진을 포획한 적층필터를 밀봉하는 폐기용 용기가 설치되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The particulate matter processing apparatus according to any one of claims 7 to 14, wherein the dust collector is provided with a waste container for sealing a laminated filter that traps particulate dust. 제15항에 있어서, 집진장치의 케이스체와 별체로 형성되고, 케이스체에 끼우고 빼는 폐기용 용기가 설치되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.The particulate matter processing apparatus according to claim 15, characterized in that a waste container is formed separately from the case body of the dust collector, and is disposed in and removed from the case body. 제16항에 있어서, 집진장치의 케이스체가 폐기용 용기로 겸용되어 있는 것을 특징으로 하는 반도체소자 제조공정의 미립자분진 처리장치.17. The fine particle dust treatment apparatus of a semiconductor device manufacturing process according to claim 16, wherein the case body of the dust collecting apparatus is also used as a waste container. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950001038A 1995-01-21 1995-01-21 Particle dust treatment method in semiconductor device manufacturing process and apparatus therefor KR100319783B1 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100450660B1 (en) * 1997-10-10 2004-11-16 삼성전자주식회사 Receptacle for storing materials used for semiconductor fabrication process
KR20160028295A (en) 2014-09-03 2016-03-11 노영석 The perfluoro compounds separation system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR890004043Y1 (en) * 1986-07-14 1989-06-17 장영진 Soot eliminating device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100450660B1 (en) * 1997-10-10 2004-11-16 삼성전자주식회사 Receptacle for storing materials used for semiconductor fabrication process
KR20160028295A (en) 2014-09-03 2016-03-11 노영석 The perfluoro compounds separation system

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