KR910001392A - 초단파 전기 신호의 측정을 위한 전기 광학 장치 - Google Patents

초단파 전기 신호의 측정을 위한 전기 광학 장치 Download PDF

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Publication number
KR910001392A
KR910001392A KR1019900009121A KR900009121A KR910001392A KR 910001392 A KR910001392 A KR 910001392A KR 1019900009121 A KR1019900009121 A KR 1019900009121A KR 900009121 A KR900009121 A KR 900009121A KR 910001392 A KR910001392 A KR 910001392A
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KR
South Korea
Prior art keywords
electro
optical device
quantum well
well structure
coplanar transmission
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KR1019900009121A
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English (en)
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KR930011425B1 (ko
Inventor
에이취. 녹스 웨인
에이. 비. 밀러 데이빗
Original Assignee
사무엘 에이취. 드워츠키
아메리칸 텔리폰 앤드 텔레그라프 캄파니
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Application filed by 사무엘 에이취. 드워츠키, 아메리칸 텔리폰 앤드 텔레그라프 캄파니 filed Critical 사무엘 에이취. 드워츠키
Publication of KR910001392A publication Critical patent/KR910001392A/ko
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Publication of KR930011425B1 publication Critical patent/KR930011425B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Light Receiving Elements (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

내용 없음

Description

초단파 전기 신호의 측정을 위한 전기 광학 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 원리에 따른 전기 광학 장치의 실시예에 대한 단면도.
제2도는 두개의 상이한 레벨로 인가된 전기장에 대해 광자 에너지와 함께 전송의 변화를 나타내는 그래프,
제3도는 전기 광학 장치의 두번째 실시예의 단면도.

Claims (10)

  1. 전기 신호의 특성을 측정하는 전기 광학 장치에 있어서, 거의 반절연성인 반도체 물질을 포함하는 다중 양자웰 구조, 상기 다중 양자 웰 구조위에 설치된 제1및 제2공면 전송선, 상기 제1및 2공면 전송선 사이에 고정된 전기 퍼텐셜을 접촉시키기 위한 전극 수단, 상기 다중 양자 웰 구조를 거의 포함하는 상기 제1및 제2공면 전송선사이의 영역을 광학 비임으로 조명하기 위한 수단 및, 상기 공면 전송선 사이에 전기 전기 신호를 분사하기 위한 수단을 포함하며, 상기 다중 양자 웰 구조가, 상기 광학 비임의 특징을 변조시키기 위해 상기 전기 신호의 진폭 변화에 응답하는 전기 광학 장치.
  2. 제1항에 있어서, 상기 공면 전송선이 공면 스트립 라인을 포함하는 전기 광학 장치.
  3. 제1항에 있어서, 상기 공면 전송선이 공면 도파관을 포함하는 전기 광학 장치.
  4. 제1항에 있어서, 상기 변조된 광학 비임에 응답하는 검출 수단을 포함하는 전기 광학 장치.
  5. 제4항에 있어서, 상기 분사용 수단이 광전도 스위치를 포함하는 전기 광학 장치.
  6. 제4항에 있어서, 상기 전기 신호가 전자 장치에 의해 발생되는 전기 광학 장치.
  7. 제6항에 있어서, 상기 전자 장치 및 상기 다중 양자 웰 구조가 단일한 반도체 기판상에 공동으로 제조되는 전기 광학 장치.
  8. 제1항에 있어서, 다중 양자 웰 구조가 106Ω.㎝보다 큰 비저항을 가진 상기 반도체 물질을 포함하는 상기 전기 광학 장치.
  9. 제1항에 있어서, 상기 조명 수단이 상기 광학 비임을 발생시키기 위한 레이저를 포함하는 전기 광학 장치.
  10. 제1항에 있어서, 상기 다중 양자 웰 구조가 GaAs/GaAlAs, InGaAs/Inp, InGaAs/InAlAs 및 GaSb/AlGaSb 계에서 선택된 Ⅲ-Ⅴ족 화합물로 구성된 상기 반도체 물질을 포함하는 전기 광학 장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019900009121A 1989-06-26 1990-06-21 초단파전기신호의 측정을 위한 전기광학장치 KR930011425B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/371,475 US4978910A (en) 1989-06-26 1989-06-26 Electrooptic apparatus for the measurement of ultrashort electrical signals
US371475 1999-08-10

Publications (2)

Publication Number Publication Date
KR910001392A true KR910001392A (ko) 1991-01-30
KR930011425B1 KR930011425B1 (ko) 1993-12-06

Family

ID=23464138

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900009121A KR930011425B1 (ko) 1989-06-26 1990-06-21 초단파전기신호의 측정을 위한 전기광학장치

Country Status (6)

Country Link
US (1) US4978910A (ko)
EP (1) EP0405802B1 (ko)
JP (1) JPH0337572A (ko)
KR (1) KR930011425B1 (ko)
CA (1) CA2014681C (ko)
DE (1) DE69022136T2 (ko)

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US5434698A (en) * 1989-11-13 1995-07-18 Dai Nippon Printing Co., Ltd. Potential sensor employing electrooptic crystal and potential measuring method
US5262660A (en) * 1991-08-01 1993-11-16 Trw Inc. High power pseudomorphic gallium arsenide high electron mobility transistors
US5635831A (en) * 1991-12-11 1997-06-03 Imatran Voima Oy Optical voltage and electric field sensor based on the pockels effect
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Also Published As

Publication number Publication date
CA2014681C (en) 1994-10-18
EP0405802A3 (en) 1992-04-15
EP0405802B1 (en) 1995-09-06
KR930011425B1 (ko) 1993-12-06
DE69022136D1 (de) 1995-10-12
CA2014681A1 (en) 1990-12-26
US4978910A (en) 1990-12-18
EP0405802A2 (en) 1991-01-02
JPH0337572A (ja) 1991-02-18
DE69022136T2 (de) 1997-02-20

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