KR900012276A - 다이내믹형 반도체기억장치 - Google Patents

다이내믹형 반도체기억장치

Info

Publication number
KR900012276A
KR900012276A KR1019900000195A KR900000195A KR900012276A KR 900012276 A KR900012276 A KR 900012276A KR 1019900000195 A KR1019900000195 A KR 1019900000195A KR 900000195 A KR900000195 A KR 900000195A KR 900012276 A KR900012276 A KR 900012276A
Authority
KR
South Korea
Prior art keywords
memory device
type semiconductor
semiconductor memory
dynamic type
dynamic
Prior art date
Application number
KR1019900000195A
Other languages
English (en)
Other versions
KR940009285B1 (ko
Inventor
유키히토 오오와키
겐지 츠치다
다이사부로 다카시마
Original Assignee
가부시키가이샤 도시바
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1002454A external-priority patent/JPH02183491A/ja
Priority claimed from JP1002453A external-priority patent/JP2845467B2/ja
Priority claimed from JP01002452A external-priority patent/JP3083094B2/ja
Application filed by 가부시키가이샤 도시바 filed Critical 가부시키가이샤 도시바
Publication of KR900012276A publication Critical patent/KR900012276A/ko
Application granted granted Critical
Publication of KR940009285B1 publication Critical patent/KR940009285B1/ko

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4097—Bit-line organisation, e.g. bit-line layout, folded bit lines
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/528—Geometry or layout of the interconnection structure
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Geometry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Dram (AREA)
KR1019900000195A 1988-01-09 1990-01-09 다이내믹형 반도체기억장치 KR940009285B1 (ko)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP89-2452 1988-01-09
JP89-2453 1988-01-09
JP89-2454 1988-01-09
JP1002454A JPH02183491A (ja) 1989-01-09 1989-01-09 半導体装置およびダイナミック型半導体記憶装置
JP1002453A JP2845467B2 (ja) 1989-01-09 1989-01-09 ダイナミック型半導体記憶装置
JP01002452A JP3083094B2 (ja) 1989-01-09 1989-01-09 ダイナミック型半導体記憶装置

Publications (2)

Publication Number Publication Date
KR900012276A true KR900012276A (ko) 1990-08-03
KR940009285B1 KR940009285B1 (ko) 1994-10-06

Family

ID=27275352

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900000195A KR940009285B1 (ko) 1988-01-09 1990-01-09 다이내믹형 반도체기억장치

Country Status (3)

Country Link
US (1) US5144583A (ko)
KR (1) KR940009285B1 (ko)
DE (1) DE4000429C2 (ko)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2953708B2 (ja) * 1989-07-31 1999-09-27 株式会社東芝 ダイナミック型半導体記憶装置
JPH03171662A (ja) * 1989-11-29 1991-07-25 Sharp Corp 信号線システム
US5287322A (en) * 1991-07-17 1994-02-15 Sgs-Thomson Microelectronics, Inc. Integrated circuit dual-port memory device having reduced capacitance
US5311477A (en) * 1991-07-17 1994-05-10 Sgs-Thomson Microelectronics, Inc. Integrated circuit memory device having flash clear
JP3440335B2 (ja) * 1993-08-18 2003-08-25 日本テキサス・インスツルメンツ株式会社 半導体メモリ装置
KR100215595B1 (ko) * 1993-09-21 1999-08-16 니시무로 타이죠 다이나믹형 반도체 기억장치
US5440516A (en) * 1994-01-27 1995-08-08 Sgs-Thomson Microelectronics, Inc. Testing circuitry of internal peripheral blocks in a semiconductor memory device and method of testing the same
EP0697735B1 (en) * 1994-08-15 2002-03-27 International Business Machines Corporation Single twist layout and method for paired line conductors of integrated circuits
US5907508A (en) * 1997-10-28 1999-05-25 International Business Machines Corporation Method and apparatus for single clocked, non-overlapping access in a multi-port memory cell
US5877976A (en) * 1997-10-28 1999-03-02 International Business Machines Corporation Memory system having a vertical bitline topology and method therefor
US5956286A (en) * 1997-10-28 1999-09-21 International Business Machines Corporation Data processing system and method for implementing a multi-port memory cell
US5870349A (en) * 1997-10-28 1999-02-09 International Business Machines Corporation Data processing system and method for generating memory control signals with clock skew tolerance
KR100278656B1 (ko) * 1998-05-12 2001-02-01 윤종용 트위스트된비트라인구조를갖는반도체메모리장치
KR100300047B1 (ko) * 1998-05-30 2001-09-22 김영환 노이즈 간섭 방지를 위한 데이터라인 배열 구조를 갖는 반도체 메모리 소자
DE19908428C2 (de) * 1999-02-26 2000-12-07 Siemens Ag Halbleiterspeicheranordnung mit Bitleitungs-Twist
US6124199A (en) * 1999-04-28 2000-09-26 International Business Machines Corporation Method for simultaneously forming a storage-capacitor electrode and interconnect
US6201272B1 (en) 1999-04-28 2001-03-13 International Business Machines Corporation Method for simultaneously forming a storage-capacitor electrode and interconnect
US6320780B1 (en) * 1999-09-28 2001-11-20 Infineon Technologies North America Corp. Reduced impact from coupling noise in diagonal bitline architectures
US6327170B1 (en) * 1999-09-28 2001-12-04 Infineon Technologies Ag Reducing impact of coupling noise in multi-level bitline architecture
US6188598B1 (en) * 1999-09-28 2001-02-13 Infineon Technologies North America Corp. Reducing impact of coupling noise
US6504246B2 (en) * 1999-10-12 2003-01-07 Motorola, Inc. Integrated circuit having a balanced twist for differential signal lines
US6498758B1 (en) * 2002-01-16 2002-12-24 Lsi Logic Corporation Twisted bitlines to reduce coupling effects (dual port memories)
JP3984090B2 (ja) * 2002-04-01 2007-09-26 株式会社東芝 強誘電体メモリ装置
US6909663B1 (en) 2003-09-26 2005-06-21 Lattice Semiconductor Corporation Multiport memory with twisted bitlines
US6992939B2 (en) * 2004-01-26 2006-01-31 Micron Technology, Inc. Method and apparatus for identifying short circuits in an integrated circuit device
US20100044093A1 (en) * 2008-08-25 2010-02-25 Wilinx Corporation Layout geometries for differential signals
TWI520273B (zh) * 2011-02-02 2016-02-01 半導體能源研究所股份有限公司 半導體儲存裝置
US8780614B2 (en) * 2011-02-02 2014-07-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device
US10861787B1 (en) * 2019-08-07 2020-12-08 Micron Technology, Inc. Memory device with bitline noise suppressing scheme

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2919166C2 (de) * 1978-05-12 1986-01-02 Nippon Electric Co., Ltd., Tokio/Tokyo Speichervorrichtung
JPS60254489A (ja) * 1984-05-31 1985-12-16 Fujitsu Ltd 半導体記憶装置
JPS6251096A (ja) * 1985-08-28 1987-03-05 Nec Corp 半導体記憶装置
EP0293578B1 (en) * 1987-06-05 1993-09-01 International Business Machines Corporation High density layout for memory arrays

Also Published As

Publication number Publication date
DE4000429A1 (de) 1990-07-12
US5144583A (en) 1992-09-01
KR940009285B1 (ko) 1994-10-06
DE4000429C2 (de) 1994-12-01

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Legal Events

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E902 Notification of reason for refusal
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Payment date: 20090928

Year of fee payment: 16

EXPY Expiration of term