KR900012107A - 프로우빙 시험 방법 및 그 장치 - Google Patents

프로우빙 시험 방법 및 그 장치

Info

Publication number
KR900012107A
KR900012107A KR1019890000423A KR890000423A KR900012107A KR 900012107 A KR900012107 A KR 900012107A KR 1019890000423 A KR1019890000423 A KR 1019890000423A KR 890000423 A KR890000423 A KR 890000423A KR 900012107 A KR900012107 A KR 900012107A
Authority
KR
South Korea
Prior art keywords
test method
probing test
probing
test
Prior art date
Application number
KR1019890000423A
Other languages
English (en)
Other versions
KR0127639B1 (ko
Inventor
와타루 가라사와
Original Assignee
도오교오 에레구토론 가부시끼 가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 도오교오 에레구토론 가부시끼 가이샤 filed Critical 도오교오 에레구토론 가부시끼 가이샤
Priority to KR1019890000423A priority Critical patent/KR0127639B1/ko
Publication of KR900012107A publication Critical patent/KR900012107A/ko
Application granted granted Critical
Publication of KR0127639B1 publication Critical patent/KR0127639B1/ko

Links

KR1019890000423A 1989-01-17 1989-01-17 프로우빙 시험 방법 및 그 장치 KR0127639B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019890000423A KR0127639B1 (ko) 1989-01-17 1989-01-17 프로우빙 시험 방법 및 그 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019890000423A KR0127639B1 (ko) 1989-01-17 1989-01-17 프로우빙 시험 방법 및 그 장치

Publications (2)

Publication Number Publication Date
KR900012107A true KR900012107A (ko) 1990-08-03
KR0127639B1 KR0127639B1 (ko) 1998-07-01

Family

ID=70050226

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890000423A KR0127639B1 (ko) 1989-01-17 1989-01-17 프로우빙 시험 방법 및 그 장치

Country Status (1)

Country Link
KR (1) KR0127639B1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100317600B1 (ko) * 1998-01-26 2002-04-24 곽정소 웨이퍼의칩샘플링측정방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100317600B1 (ko) * 1998-01-26 2002-04-24 곽정소 웨이퍼의칩샘플링측정방법

Also Published As

Publication number Publication date
KR0127639B1 (ko) 1998-07-01

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