KR900006161B1 - 동작검사를 행하는 반도체 메모리장치 - Google Patents

동작검사를 행하는 반도체 메모리장치 Download PDF

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Publication number
KR900006161B1
KR900006161B1 KR1019860004792A KR860004792A KR900006161B1 KR 900006161 B1 KR900006161 B1 KR 900006161B1 KR 1019860004792 A KR1019860004792 A KR 1019860004792A KR 860004792 A KR860004792 A KR 860004792A KR 900006161 B1 KR900006161 B1 KR 900006161B1
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KR
South Korea
Prior art keywords
semiconductor memory
bit lines
transistors
memory device
word
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
KR1019860004792A
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English (en)
Korean (ko)
Other versions
KR870000708A (ko
Inventor
데쯔지 다께구찌
Original Assignee
후지쓰 가부시끼가이샤
야마모도 다꾸마
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 후지쓰 가부시끼가이샤, 야마모도 다꾸마 filed Critical 후지쓰 가부시끼가이샤
Publication of KR870000708A publication Critical patent/KR870000708A/ko
Application granted granted Critical
Publication of KR900006161B1 publication Critical patent/KR900006161B1/ko
Expired legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/34—Accessing multiple bits simultaneously
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5004—Voltage
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5006—Current

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1019860004792A 1985-06-17 1986-06-17 동작검사를 행하는 반도체 메모리장치 Expired KR900006161B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP60131591A JPS61289600A (ja) 1985-06-17 1985-06-17 半導体記憶装置
JP60-131591 1985-06-17
JP131591 1985-06-17

Publications (2)

Publication Number Publication Date
KR870000708A KR870000708A (ko) 1987-02-20
KR900006161B1 true KR900006161B1 (ko) 1990-08-24

Family

ID=15061631

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860004792A Expired KR900006161B1 (ko) 1985-06-17 1986-06-17 동작검사를 행하는 반도체 메모리장치

Country Status (5)

Country Link
US (1) US4720818A (https=)
EP (1) EP0206695B1 (https=)
JP (1) JPS61289600A (https=)
KR (1) KR900006161B1 (https=)
DE (1) DE3684638D1 (https=)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62293598A (ja) * 1986-06-12 1987-12-21 Toshiba Corp 半導体記憶装置
FR2622019B1 (fr) * 1987-10-19 1990-02-09 Thomson Semiconducteurs Dispositif de test structurel d'un circuit integre
JPH01113999A (ja) * 1987-10-28 1989-05-02 Toshiba Corp 不揮発性メモリのストレステスト回路
WO1989007297A1 (fr) * 1988-01-27 1989-08-10 Oki Electric Industry Co., Ltd. Micro-ordinateur et procede de verification
JPH01208795A (ja) * 1988-02-16 1989-08-22 Toshiba Corp 半導体記憶装置
JPH02189080A (ja) * 1989-01-18 1990-07-25 Mitsubishi Electric Corp メモリデータ合成装置
US5266939A (en) * 1989-01-18 1993-11-30 Mitsubishi Denki Kabushiki Kaisha Memory data synthesizer
US5117426A (en) * 1990-03-26 1992-05-26 Texas Instruments Incorporated Circuit, device, and method to detect voltage leakage
US5181205A (en) * 1990-04-10 1993-01-19 National Semiconductor Corporation Short circuit detector circuit for memory arrays
JPH04119595A (ja) * 1990-09-11 1992-04-21 Toshiba Corp 不揮発性半導体メモリ
DE69129492T2 (de) * 1990-10-02 1998-11-05 Toshiba Kawasaki Shi Kk Halbleiterspeicher
JP3237127B2 (ja) * 1991-04-19 2001-12-10 日本電気株式会社 ダイナミックランダムアクセスメモリ装置
DE4223532A1 (de) * 1992-07-17 1994-01-20 Philips Patentverwaltung Schaltungsanordnung zum Prüfen der Adressierung wenigstens einer Matrix
US5392248A (en) * 1993-10-26 1995-02-21 Texas Instruments Incorporated Circuit and method for detecting column-line shorts in integrated-circuit memories
US5508631A (en) * 1994-10-27 1996-04-16 Mitel Corporation Semiconductor test chip with on wafer switching matrix
DE19542029C1 (de) * 1995-11-10 1997-04-10 Siemens Ag Verfahren zum selbsttätigen Ermitteln der nötigen Hochspannung zum Programmieren/Löschen eines EEPROMs
DE19612441C2 (de) * 1996-03-28 1998-04-09 Siemens Ag Schaltungsanordnung mit einer Testschaltung
JP4727785B2 (ja) * 2000-01-26 2011-07-20 富士通セミコンダクター株式会社 半導体記憶装置及び半導体記憶装置のワード線欠陥検出方法
US6992925B2 (en) * 2002-04-26 2006-01-31 Kilopass Technologies, Inc. High density semiconductor memory cell and memory array using a single transistor and having counter-doped poly and buried diffusion wordline
JP4981661B2 (ja) 2004-05-06 2012-07-25 サイデンス コーポレーション 分割チャネルアンチヒューズアレイ構造
US9123572B2 (en) 2004-05-06 2015-09-01 Sidense Corporation Anti-fuse memory cell
US7755162B2 (en) 2004-05-06 2010-07-13 Sidense Corp. Anti-fuse memory cell
US8735297B2 (en) 2004-05-06 2014-05-27 Sidense Corporation Reverse optical proximity correction method
KR100870423B1 (ko) * 2007-06-27 2008-11-26 주식회사 하이닉스반도체 반도체메모리소자
JP7086795B2 (ja) * 2018-09-03 2022-06-20 ルネサスエレクトロニクス株式会社 半導体装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4850646A (https=) * 1971-10-26 1973-07-17
JPS6042560B2 (ja) * 1981-03-17 1985-09-24 日本電信電話株式会社 半導体記憶装置
JPS6085800U (ja) * 1983-11-18 1985-06-13 日本電気株式会社 半導体読出し専用メモリ

Also Published As

Publication number Publication date
EP0206695B1 (en) 1992-04-01
EP0206695A3 (en) 1989-12-06
JPS61289600A (ja) 1986-12-19
US4720818A (en) 1988-01-19
JPH0451919B2 (https=) 1992-08-20
EP0206695A2 (en) 1986-12-30
KR870000708A (ko) 1987-02-20
DE3684638D1 (de) 1992-05-07

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