KR20220023983A - 산화루테늄 가스의 흡수액, 산화루테늄의 분석 방법 및 트랩 장치, 정량 분석 장치 - Google Patents
산화루테늄 가스의 흡수액, 산화루테늄의 분석 방법 및 트랩 장치, 정량 분석 장치 Download PDFInfo
- Publication number
- KR20220023983A KR20220023983A KR1020217040358A KR20217040358A KR20220023983A KR 20220023983 A KR20220023983 A KR 20220023983A KR 1020217040358 A KR1020217040358 A KR 1020217040358A KR 20217040358 A KR20217040358 A KR 20217040358A KR 20220023983 A KR20220023983 A KR 20220023983A
- Authority
- KR
- South Korea
- Prior art keywords
- ion
- ruthenium oxide
- absorption liquid
- oxide gas
- group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
- G01N1/2214—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling by sorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D53/00—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
- B01D53/14—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols by absorption
- B01D53/1493—Selection of liquid materials for use as absorbents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
- G01N1/405—Concentrating samples by adsorption or absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2252/00—Absorbents, i.e. solvents and liquid materials for gas absorption
- B01D2252/20—Organic absorbents
- B01D2252/205—Other organic compounds not covered by B01D2252/00 - B01D2252/20494
- B01D2252/2053—Other nitrogen compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/60—Heavy metals or heavy metal compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2258/00—Sources of waste gases
- B01D2258/02—Other waste gases
- B01D2258/0216—Other waste gases from CVD treatment or semi-conductor manufacturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
- G01N1/2214—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling by sorption
- G01N2001/2217—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling by sorption using a liquid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3155—Measuring in two spectral ranges, e.g. UV and visible
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Molecular Biology (AREA)
- Biomedical Technology (AREA)
- Medicinal Chemistry (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- General Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Food Science & Technology (AREA)
- Combustion & Propulsion (AREA)
- Electrochemistry (AREA)
- Gas Separation By Absorption (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2019-115740 | 2019-06-21 | ||
| JP2019115740 | 2019-06-21 | ||
| PCT/JP2020/023732 WO2020256007A1 (ja) | 2019-06-21 | 2020-06-17 | 酸化ルテニウムガスの吸収液、酸化ルテニウムの分析方法およびトラップ装置、定量分析装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20220023983A true KR20220023983A (ko) | 2022-03-03 |
Family
ID=74040799
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020217040358A Withdrawn KR20220023983A (ko) | 2019-06-21 | 2020-06-17 | 산화루테늄 가스의 흡수액, 산화루테늄의 분석 방법 및 트랩 장치, 정량 분석 장치 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20220316996A1 (https=) |
| JP (1) | JP7606455B2 (https=) |
| KR (1) | KR20220023983A (https=) |
| TW (1) | TW202110527A (https=) |
| WO (1) | WO2020256007A1 (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114383899A (zh) * | 2021-12-01 | 2022-04-22 | 中国辐射防护研究院 | 一种气溶胶中放射性核素的液体吸收方法 |
| CN115028536A (zh) * | 2022-06-27 | 2022-09-09 | 昆明贵金属研究所 | 一种四正丙基过钌酸铵(ⅶ)的制备方法 |
| CN120361726A (zh) * | 2025-06-25 | 2025-07-25 | 中核核电运行管理有限公司 | 一种用于石墨慢化剂中碳-14回收的方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002267606A (ja) | 2001-03-12 | 2002-09-18 | Hitachi Ltd | ガス検知方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0752234B2 (ja) * | 1985-11-14 | 1995-06-05 | 石川島播磨重工業株式会社 | 核燃料再処理廃液のガラス固化方法 |
| JPH0269658A (ja) * | 1988-09-05 | 1990-03-08 | Ishikawajima Harima Heavy Ind Co Ltd | 揮発性ルテニウムの測定方法 |
| JPH07287096A (ja) * | 1994-04-18 | 1995-10-31 | Hitachi Ltd | ルテニウムの処理方法及び放射性液体廃棄物の処理方法並びに放射性液体廃棄物の処理装置 |
| JPH0972833A (ja) * | 1995-09-04 | 1997-03-18 | Mitsubishi Heavy Ind Ltd | 揮発性四酸化ルテニウムのサンプリング方法 |
| JP2000034563A (ja) * | 1998-07-14 | 2000-02-02 | Japan Energy Corp | 高純度ルテニウムスパッタリングターゲットの製造方法及び高純度ルテニウムスパッタリングターゲット |
| US6479297B1 (en) * | 2000-08-31 | 2002-11-12 | Micron Technology, Inc. | Sensor devices, methods and systems for detecting gas phase materials |
| FR2850878B1 (fr) * | 2003-02-10 | 2005-04-01 | Cogema | Procede et dispositif de capture de ruthenium present dans un effluent gazeux |
| US7476290B2 (en) * | 2003-10-30 | 2009-01-13 | Ebara Corporation | Substrate processing apparatus and substrate processing method |
| WO2011074601A1 (ja) * | 2009-12-17 | 2011-06-23 | 昭和電工株式会社 | ルテニウム系金属のエッチング用組成物およびその調製方法 |
| CN102616868B (zh) * | 2012-03-05 | 2014-04-30 | 阳光凯迪新能源集团有限公司 | 利用含钌废催化剂制备固体亚硝酰硝酸钌的方法 |
| JP6066267B2 (ja) * | 2012-08-30 | 2017-01-25 | 国立研究開発法人日本原子力研究開発機構 | ルテニウムの分離回収方法 |
| CN106148725B (zh) * | 2016-08-29 | 2018-07-10 | 金川集团股份有限公司 | 一种分离精炼锇的方法 |
| JP7219061B2 (ja) * | 2018-11-14 | 2023-02-07 | 関東化学株式会社 | ルテニウム除去用組成物 |
| WO2020166677A1 (ja) * | 2019-02-13 | 2020-08-20 | 株式会社トクヤマ | オニウム塩を含む半導体ウェハの処理液 |
-
2020
- 2020-06-17 WO PCT/JP2020/023732 patent/WO2020256007A1/ja not_active Ceased
- 2020-06-17 JP JP2021526834A patent/JP7606455B2/ja active Active
- 2020-06-17 KR KR1020217040358A patent/KR20220023983A/ko not_active Withdrawn
- 2020-06-17 US US17/619,310 patent/US20220316996A1/en not_active Abandoned
- 2020-06-19 TW TW109120817A patent/TW202110527A/zh unknown
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002267606A (ja) | 2001-03-12 | 2002-09-18 | Hitachi Ltd | ガス検知方法 |
Non-Patent Citations (1)
| Title |
|---|
| 일본 원자력 학회지, 1986 년, Vol.28, No.6, p 493-500 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2020256007A1 (ja) | 2020-12-24 |
| US20220316996A1 (en) | 2022-10-06 |
| JP7606455B2 (ja) | 2024-12-25 |
| JPWO2020256007A1 (https=) | 2020-12-24 |
| TW202110527A (zh) | 2021-03-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7590504B2 (ja) | 次亜塩素酸イオンを含む半導体ウェハの処理液 | |
| KR20220023983A (ko) | 산화루테늄 가스의 흡수액, 산화루테늄의 분석 방법 및 트랩 장치, 정량 분석 장치 | |
| US10626356B2 (en) | Treatment liquid and method for washing substrate | |
| CN113383408B (zh) | 含有鎓盐的半导体晶圆的处理液 | |
| TWI554591B (zh) | 用於移除鈦氮化物硬遮罩及蝕刻殘留物的組合物 | |
| TWI839661B (zh) | 釕處理液以及將該釕處理液使用於半導體製造步驟中處理釕之步驟之用途 | |
| JPWO2019187868A1 (ja) | 処理液 | |
| JP7646887B2 (ja) | 次亜塩素酸イオン、及びpH緩衝剤を含む半導体ウェハの処理液 | |
| JP7824135B2 (ja) | 半導体用処理液 | |
| JP4776191B2 (ja) | フォトレジスト残渣及びポリマー残渣除去組成物、並びにそれを用いた残渣除去方法 | |
| CN112831379B (zh) | 次氯酸烷基季铵盐溶液、其制造方法和半导体晶圆的处理方法 | |
| KR20230111234A (ko) | 반도체 웨이퍼의 처리액 및 그 제조 방법 | |
| TW202200843A (zh) | 釕之半導體用處理液 | |
| JP2022002291A (ja) | オニウム塩を含む半導体ウェハの処理液 | |
| US20230402275A1 (en) | Washing solution and washing method for semiconductor substrate | |
| TW202603149A (zh) | 處理液、使用其之基板處理方法及半導體基板之製造方法 | |
| WO2024070946A1 (ja) | 組成物、基板の処理方法、半導体デバイスの製造方法、化合物 | |
| WO2021039701A1 (ja) | 処理液 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |