KR20150030833A

KR20150030833A - Liquid crystal display device and method for driving the same

Info

Publication number: KR20150030833A
Application number: KR20130109942A
Authority: KR
Inventors: 조영성; 허승호
Original assignee: 엘지디스플레이 주식회사
Priority date: 2013-09-12
Filing date: 2013-09-12
Publication date: 2015-03-23
Also published as: KR101981113B1

Abstract

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device and a method of driving the same that reduce the bezel size by utilizing an AP inspection line formed for an auto probe (AP) inspection as a common voltage line (Vcom line).
A liquid crystal display device according to an embodiment of the present invention includes a plurality of gate lines and a plurality of data lines formed to cross each other in an active region of a liquid crystal panel; An AP inspection line, an AP inspection enable signal line and a data enable transistor formed in a non-display area of the liquid crystal panel for an auto-probe inspection; A switch unit including a common voltage enable signal line formed in a non-display area of the liquid crystal panel and a plurality of switches for using the AP inspection line as a common voltage line when the liquid crystal panel is driven to display an image; And a driving circuit unit for driving the liquid crystal panel.

Description

TECHNICAL FIELD [0001] The present invention relates to a liquid crystal display device and a method of driving the same,

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device and, more particularly, to a liquid crystal display device using a bezel size reduced by utilizing an AP inspection line formed for an auto probe (AP) inspection as a common voltage line will be.

Of the flat panel display devices, the liquid crystal display device (LCD) is suitable for portable devices and has a wide application field due to the advantages of development of mass production technology, ease of driving means, low power consumption, realization of high image quality and large screen realization.

The liquid crystal display device converts an image signal input from the outside into a data voltage and adjusts the transmittance of light passing through the liquid crystal layer of a plurality of pixels according to the data voltage to display an image according to the image signal.

Such a liquid crystal display device includes a process of forming various patterns including a thin film transistor (TFT) on a TFT array substrate (lower substrate); Forming various patterns including a color filter layer on a color filter array substrate; A liquid crystal cell process in which a TFT array substrate and a color filter array substrate are bonded to each other and liquid crystal is injected therebetween; And a module process of connecting a driving circuit portion to the TFT array substrate.

Here, after the TFT array substrate is manufactured, a signal inspection is performed to detect line defects such as shorts and disconnection of lines, defective TFTs, and the like.

Recently, an AP signal line and a data enable transistor (TR) are formed in a non-display region of a liquid crystal panel for signal inspection of a TFT array substrate, and a driving signal is applied to a gate line and a data line, It is checked whether the pixels are normally formed.

1 is a schematic view of a conventional liquid crystal display device.

Referring to FIG. 1, a liquid crystal display device according to the related art includes a liquid crystal panel 10 for displaying an image and a driving circuit 20 for driving the liquid crystal panel 10.

The liquid crystal panel 10 includes an active area 12 and a non-display area 14 in which an image is displayed. After the manufacture of the liquid crystal panel 10 is completed, at least one AP contact unit 30 (Needle Contact unit) 30 for performing an auto-probe (AP) inspection is formed in the non-display area below the liquid crystal panel 10.

In the active region 12, a plurality of pixels are defined so as to cross a plurality of gate lines and a plurality of data lines, and a TFT, a pixel electrode, a common electrode, and a storage capacitor Cst are formed in each pixel.

FIG. 2 is a view showing the A portion of the upper non-display area shown in FIG. 1, showing AP check lines and data enable TR for AP inspection.

2, a plurality of gate lines, a plurality of data lines, and a plurality of pixels for checking whether a plurality of pixels are normally formed are formed in the non-display area A on the upper side of the non-display area 14 of the liquid crystal panel 10 A plurality of data enable TRs 44 are formed below the plurality of data enable TRs 44 and a ground line, a data pad portion 46 and a plurality of data lines 48 Is formed.

Fig. 3 is a diagram showing AP test lines in the B part of the left non-display area shown in Fig. 1. Fig.

3, a plurality of AP inspection lines 42 are formed in the non-display area B on the side of the non-display area 14 of the liquid crystal panel 10 below the non-display area 14 of the liquid crystal panel 10 To the upper side. Further, a data enable signal line (not shown) is also formed so as to be routed from the lower side to the upper side of the non-display area 14 of the liquid crystal panel 10. [

When the enable signal is applied to the plurality of data enable TRs 44 at the time of the AP test, the plurality of data enable TRs 44 connect the plurality of AP test lines 42 to the data pad unit 46.

The data voltages of the R, G, and B pixels applied to the plurality of AP inspection lines 42 are applied to the plurality of data lines 48 via the data pad unit 46. Thus, an AP test is performed to confirm whether or not the pixel is normally formed. At this time, rather than performing mode inspection of all the pixels, it is determined whether or not all pixels are normally manufactured by driving several pixels determined as inspection samples.

FIG. 4 is a diagram illustrating a problem that the bezel size is increased due to the formation of the AP test lines.

Referring to FIG. 4, in the case of a liquid crystal panel of a COG (Chip on Glass) type, an AP test using a shorting bar can not be performed like a liquid crystal panel of a COF (Chip on Film) type.

Therefore, the COG type liquid crystal panel forms a plurality of AP inspection lines 42 and a plurality of data enable TRs 44 on the opposite side of the drive circuit portion 20 (source drive IC).

The AP inspection line 42 is necessary for the mass production inspection of the liquid crystal panel 10 but becomes a dummy line which is not used in actual driving after the liquid crystal panel 10 is manufactured.

When the liquid crystal panel 10 is actually driven, the unused AP inspection line 42 and the data enable signal line are routed to the left and right non-display areas of the liquid crystal panel 10, thereby increasing the size of the left and right bezel .

SUMMARY OF THE INVENTION The present invention is directed to a liquid crystal display device capable of reducing the size of the bezel on the left and right sides of a liquid crystal panel.

SUMMARY OF THE INVENTION It is an object of the present invention to provide a narrow bezel liquid crystal display device for solving the above-mentioned problems.

SUMMARY OF THE INVENTION It is a general object of the present invention to provide a liquid crystal display device capable of using an unused AP test line for other purposes when the liquid crystal panel is actually driven.

Other features and advantages of the invention will be set forth in the description which follows, or may be obvious to those skilled in the art from the description and the claims.

A liquid crystal display device according to an embodiment of the present invention includes a plurality of gate lines and a plurality of data lines formed to cross each other in an active region of a liquid crystal panel; An AP inspection line, an AP inspection enable signal line and a data enable transistor formed in a non-display area of the liquid crystal panel for an auto-probe inspection; A switch unit including a common voltage enable signal line formed in a non-display area of the liquid crystal panel and a plurality of switches for using the AP inspection line as a common voltage line when the liquid crystal panel is driven to display an image; And a driving circuit unit for driving the liquid crystal panel.

A driving method of a liquid crystal display device according to an embodiment of the present invention is characterized in that an AP inspection line is formed in a non-display area of the liquid crystal panel for an auto-probe inspection, A method of driving a liquid crystal display device having a plurality of switches connected to a voltage line, the method comprising: when the liquid crystal panel displays an image, turning on the plurality of switches to connect the AP inspection line to a common voltage line .

According to an embodiment of the present invention, a bezel of a left side and a right side of a liquid crystal panel may be reduced to realize a narrow bezel.

In order to accomplish the above-mentioned object, the liquid crystal display device according to the present invention uses the AP inspection lines for the inspection purpose in the AP inspection step and the AP inspection lines as the common voltage line when the liquid crystal panel is actually driven .

According to an embodiment of the present invention, there is provided a liquid crystal display device comprising: a common voltage line formed in a periphery of a GIP logic of a side non-display area; Can be formed in the upper non-display area of the liquid crystal panel, thereby reducing the size of the bezel on the left and right sides of the liquid crystal panel.

In addition, other features and advantages of the present invention may be newly understood through embodiments of the present invention.

1 is a schematic view of a conventional liquid crystal display device.
FIG. 2 is a view showing the A portion of the upper non-display area shown in FIG. 1, showing AP check lines and data enable TR for AP inspection.
Fig. 3 is a diagram showing AP test lines in the B part of the left non-display area shown in Fig. 1. Fig.
FIG. 4 is a diagram illustrating a problem that the bezel size is increased due to the formation of the AP test lines.
5 is a view schematically showing a liquid crystal display device according to an embodiment of the present invention.
Fig. 6 shows part C of the side non-display area shown in Fig. 5, and shows a part of the side non-display area of the liquid crystal panel.
7 is a diagram showing a switch unit, AP test lines, a switch unit, an AP enable signal line, and a common voltage enable signal line.
Fig. 8 shows part D of the upper non-display area shown in Fig. 5, and shows part of the upper non-display area of the liquid crystal panel.
Figure 9 is a diagram illustrating the use of AP test lines as a common voltage line by driving the switch portion.
10 is a diagram showing the effect of reducing the size of the bezel by eliminating the common voltage line formed outside the GIP logic of the side non-display area and utilizing the AP inspection line as a common voltage line (Vcom line).

Prior to the description with reference to the drawings, it is assumed that, after manufacturing a lower substrate (TFT array substrate) of a liquid crystal panel, an AP inspection line used for cell inspection is utilized as a common voltage line when the liquid crystal panel is driven do.

Therefore, illustration and detailed description of the upper substrate (color filter array substrate), the backlight unit and the driving circuit for driving the liquid crystal panel of the liquid crystal panel are omitted.

The liquid crystal display device according to the embodiment of the present invention uses AP inspection lines for AP inspection of a COG type liquid crystal panel as an AP inspection for AP inspection. When the liquid crystal panel is actually driven to display an image, the bezel size can be reduced by using the AP inspection lines as a common voltage line to reduce the line width of the common voltage line in the side non-display area of the liquid crystal panel.

By using the AP inspection lines formed in the upper non-display area of the liquid crystal panel as a common voltage line, it is possible to compensate the reduced width portion of the common voltage line.

Hereinafter, a liquid crystal display device and a driving method thereof according to an embodiment of the present invention will be described with reference to the accompanying drawings.

5 is a view schematically showing a liquid crystal display device according to an embodiment of the present invention.

Referring to FIG. 5, a liquid crystal display device according to an embodiment of the present invention includes a liquid crystal panel 100 for displaying an image and a driving circuit unit 200 for driving the liquid crystal panel 100.

A liquid crystal display device according to an embodiment of the present invention includes a thin film transistor (TFT) for driving each pixel on a lower substrate (TFT array substrate) of a liquid crystal panel 100 using amorphous silicon (a-Si) In addition, a gate shift register was integrated on a lower substrate of a liquid crystal panel by a GIP (Gate In Panel) method.

The liquid crystal panel 100 includes an active area 110 and a non-display area 120 in which an image is displayed. After the liquid crystal panel 100 is manufactured, at least one AP contact unit 300 for performing an auto probe (AP) inspection is formed in a non-display area below the liquid crystal panel 100.

In the active region 110, a plurality of pixels are defined so as to cross a plurality of gate lines and a plurality of data lines, and a TFT, a pixel electrode, a common electrode, and a storage capacitor Cst are formed in each pixel.

Fig. 6 shows part C of the side non-display area shown in Fig. 5, and shows a part of the side non-display area of the liquid crystal panel.

6, a plurality of gate lines, a plurality of data lines, and a plurality of APs for inspecting whether a plurality of pixels are normally formed are formed in a non-display area on the upper side of the non-display area 120 of the liquid crystal panel 100 Line 142, a plurality of common voltage enable signal lines 144, a plurality of AP inspection enable signal lines 146, and a switch unit 130 are formed.

A common voltage line is formed under the switch portion 130, and GIP logic of the gate shift register is formed outside the side surface portion of the non-display region. An active region 110 is formed inside the common voltage line.

A plurality of AP inspection lines 142 and a common voltage line are connected by a plurality of contact lines 148 with the switch unit 130 therebetween.

In addition, a plurality of AP inspection lines 142, a plurality of common voltage enable signal lines 144, a plurality of AP inspection enable signal lines 144, Display region 120 of the liquid crystal panel 10 is routed from the lower side to the upper side.

7 is a diagram showing a switch unit, AP test lines, a switch unit, an AP enable signal line, and a common voltage enable signal line.

Referring to FIG. 7, the liquid crystal display device according to the embodiment of the present invention can be used not only for AP inspection of the AP inspection line 142 but also for the AP inspection line 142 when driving the liquid crystal panel 100 as a common voltage line .

In order to use the AP test line 142 as a common voltage line, the switch unit 130 is composed of a plurality of switches 132. Each of the plurality of switches 132 is connected to the contact line 148 via the contact line 148, Line 142, and the other side is connected to the common voltage line.

Fig. 8 shows part D of the upper non-display area shown in Fig. 5, and shows part of the upper non-display area of the liquid crystal panel.

8, a plurality of gate lines, a plurality of data lines, and a plurality of pixels are normally provided in an upper non-display area D disposed above the active area in the non-display area 110 of the liquid crystal panel 100 A plurality of AP check lines 142, a plurality of AP check enable signal lines 146, and a plurality of data enable TRs 154 are formed.

In addition, a ground line is formed below the plurality of data enable TRs 154, and the data voltages of the R, G, and B pixels applied to the plurality of AP inspection lines 142 for the AP inspection of the pixels, A data pad unit 156 and a plurality of data lines 158 are formed.

When the AP check enable signal is applied to the plurality of AP check enable signal lines 146 at the time of the AP check, the plurality of data enable TRs 154 are switched to connect the plurality of AP check lines 142 to the plurality of data pads .

A plurality of data pads 156 are connected to a plurality of data lines 158 for pixel inspection and the data voltages of R, G, and B pixels applied to the plurality of AP inspection lines 142 are connected to a plurality of data lines 158 to the test pixels. Then, a VAP (Vision Auto Probe) inspection using an auto-probe device is performed to finally check whether each pixel is defective or not.

Figure 9 is a diagram illustrating the use of AP test lines as a common voltage line by driving the switch portion.

Referring to FIGS. 7 and 9, when the liquid crystal panel 100 actually drives and displays an image, a common voltage enable signal is applied to the common voltage enable signal line 144. At this time, the AP check enable signal is not applied to the AP check enable signal line 142.

When the common voltage enable signal is applied to the common voltage enable signal line 144, the plurality of switches 132 constituting the switch unit 130 are turned on.

When a plurality of switches are turned on, a plurality of AP test lines 142 are connected to a common voltage line. When the plurality of AP inspection lines 142 are connected to the common voltage line, the common voltage Vcom supplied to the common voltage line is also applied to the plurality of AP inspection lines 142. [ Thereby, a plurality of AP test lines 142 can be used as a common voltage line.

On the other hand, when the AP is inspected, the common voltage enable signal line 144 is not applied with the common voltage enable signal. When the common voltage enable signal is not applied, the plurality of switches 132 constituting the switch unit 130 are turned off.

When a plurality of switches 132 are turned off, an AP check enable signal is applied to a plurality of AP check enable signal lines 146 as described above with reference to FIG. 8, The data enable TR 154 is switched to couple the plurality of AP test lines 142 to the plurality of data pads.

The data voltages of the R, G, and B pixels applied to the plurality of AP inspection lines 142 are applied to the test pixels through the plurality of data lines 158 to perform the AP inspection.

10 is a diagram showing the effect of reducing the size of the bezel by eliminating the common voltage line formed outside the GIP logic of the side non-display area and utilizing the AP inspection line as a common voltage line (Vcom line).

Referring to FIG. 10, the common voltage line must be formed in a large area to sufficiently withstand the load of the common voltage Vcom supplied to the active region 110.

The liquid crystal display device of the present invention eliminates the common voltage line formed on the outer periphery of the GIP logic of the side non-display area which has been conventionally formed. However, a plurality of AP inspection lines 142 formed in the upper non- It is possible to sufficiently secure the area of the common voltage line by using it as a voltage line.

Therefore, the size of the bezel on the left and right sides of the liquid crystal panel 100 can be reduced by deleting the common voltage line having a width of 0.55 mm formed outside the GIP logic. As a result, the liquid crystal display device can be formed as a narrow bezel, thereby enhancing the design aesthetics.

It will be understood by those skilled in the art that the present invention can be embodied in other specific forms without departing from the spirit or essential characteristics thereof. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive.

The scope of the present invention is defined by the appended claims rather than the detailed description and all changes or modifications derived from the meaning and scope of the claims and their equivalents are to be construed as being included within the scope of the present invention do.

100: liquid crystal panel 110: active area
120: non-display area 130: switch part
132: switch 142: AP test line
144: common voltage enable signal line
146: AP test enable signal line
148: Contact Line 154: Data Enable TR
156: Data pad unit 158: Data line
200: driving circuit part 300: AP needle contact part

Claims

A plurality of gate lines and a plurality of data lines formed to cross each other in an active region of the liquid crystal panel;
An AP inspection line, an AP inspection enable signal line and a data enable transistor formed in a non-display area of the liquid crystal panel for an auto-probe inspection;
A switch unit including a common voltage enable signal line formed in a non-display area of the liquid crystal panel and a plurality of switches for using the AP inspection line as a common voltage line when the liquid crystal panel is driven to display an image; And
And a driving circuit for driving the liquid crystal panel.

The method according to claim 1,
Wherein when the liquid crystal panel is driven to display an image, a common voltage enable signal is applied to the common voltage enable signal line,
And the AP check enable signal is not applied to the AP check enable signal line.

3. The method of claim 2,
And switches the plurality of switches with a common voltage enable signal applied to a common voltage enable signal line when the liquid crystal panel is driven to display an image to connect the AP inspection line to a common voltage line. Display device.

The method of claim 3,
Wherein when the liquid crystal panel is driven to display an image, a common voltage is applied to the AP inspection line to use the AP inspection line as a common voltage line.

3. The method of claim 2,
And switches the data enable transistor to an AP test enable signal applied to the AP test enable signal line to connect the AP test line to the data pad when the auto-probe test is performed.

6. The method of claim 5,
Applying a data voltage of R, G and B pixels applied to the AP inspection line to a data line connected to the data pad,
And applies the data voltages of the R, G, and B pixels to the test pixels.

The method according to claim 1,
Wherein the driving circuit portion is formed on the liquid crystal panel by a COG (Chip on Glass) method.

An AP inspection line is formed in a non-display area of the liquid crystal panel for an auto-probe inspection, and a plurality of switches for connecting the AP inspection line to a common voltage line formed in a non-display area of the liquid crystal panel are formed, In the method,
Wherein when the liquid crystal panel displays an image, the plurality of switches are turned on to connect the AP inspection line to a common voltage line.

9. The method of claim 8,
Wherein when the liquid crystal panel is driven to display an image, a common voltage is applied to the AP inspection line so that the AP inspection line is used as a common voltage line.

10. The method of claim 9,
And connecting the AP inspection line and the data line when the auto-probe is inspected, and applying the data voltages of the R, G, and B pixels to the test pixels.