KR20120035509A - Semiconductor substrate for solarcell and texturing method thereof - Google Patents
Semiconductor substrate for solarcell and texturing method thereof Download PDFInfo
- Publication number
- KR20120035509A KR20120035509A KR1020100097052A KR20100097052A KR20120035509A KR 20120035509 A KR20120035509 A KR 20120035509A KR 1020100097052 A KR1020100097052 A KR 1020100097052A KR 20100097052 A KR20100097052 A KR 20100097052A KR 20120035509 A KR20120035509 A KR 20120035509A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- photoacryl
- pattern
- solar cell
- semiconductor substrate
- Prior art date
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- 238000000034 method Methods 0.000 title claims abstract description 56
- 239000000758 substrate Substances 0.000 title claims abstract description 56
- 239000004065 semiconductor Substances 0.000 title claims abstract description 41
- 238000000149 argon plasma sintering Methods 0.000 claims abstract description 27
- 238000004528 spin coating Methods 0.000 claims abstract description 6
- 238000001020 plasma etching Methods 0.000 claims description 13
- 229920002284 Cellulose triacetate Polymers 0.000 claims description 6
- 239000004952 Polyamide Substances 0.000 claims description 6
- 239000004743 Polypropylene Substances 0.000 claims description 6
- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 claims description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 6
- 229910052760 oxygen Inorganic materials 0.000 claims description 6
- 239000001301 oxygen Substances 0.000 claims description 6
- 229920002647 polyamide Polymers 0.000 claims description 6
- -1 polyethylene terephthalate Polymers 0.000 claims description 6
- 229920000139 polyethylene terephthalate Polymers 0.000 claims description 6
- 239000005020 polyethylene terephthalate Substances 0.000 claims description 6
- 229920001155 polypropylene Polymers 0.000 claims description 6
- 238000002834 transmittance Methods 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 5
- 238000000576 coating method Methods 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 229910001220 stainless steel Inorganic materials 0.000 claims description 3
- 239000010935 stainless steel Substances 0.000 claims description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims 1
- 230000031700 light absorption Effects 0.000 abstract description 4
- 230000003287 optical effect Effects 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 238000003486 chemical etching Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000003929 acidic solution Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02327—Optical elements or arrangements associated with the device the optical elements being integrated or being directly associated to the device, e.g. back reflectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02366—Special surface textures of the substrate or of a layer on the substrate, e.g. textured ITO/glass substrate or superstrate, textured polymer layer on glass substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photovoltaic Devices (AREA)
Abstract
Description
TECHNICAL FIELD The present invention relates to a semiconductor substrate for a solar cell, and more particularly, to a semiconductor substrate for a solar cell and a texturing method thereof capable of improving light scattering effects.
A solar cell is a photovoltaic device that converts photons into electrical energy using a semiconductor. The principle of converting sunlight into electrical energy in a solar cell uses the p-n junction principle of a semiconductor.
In more detail, semiconductors such as Si, Ge, and As have a conduction band and a valence band, and a forbidden band, in which an electron cannot exist between the valence band and the conduction band. ) And the width of this ban is called the energy gap. When the energy corresponding to the energy gap, ie, light is irradiated to the semiconductor, photons are absorbed by the semiconductor, and the absorbed photons provide a pair of free electrons and holes in a stable state in the substrate. can be changed into a hole. Since the generated electrons and holes exist stably for a certain time of life, the electrons and positively charged holes are separated within this time and then recombined from the outside through the electrode terminals to consume current. It becomes usable.
In addition, doping a p-type impurity in one portion of the semiconductor crystal and an n-type impurity in the remaining portion forms a single crystal ane p-type semiconductor and an n-type semiconductor, and a metallic interface between the p-type semiconductor and the n-type semiconductor. Is called a pn junction. Since the p-type semiconductor is doped with a trivalent acceptor atom, a lot of curves are generated, and since the n-type semiconductor is doped with a pentavalent donor atom, many electrons are formed.
Therefore, in the pn junction, as the hole concentrations and the electron concentrations of the p-type and n-type semiconductors are different, holes diffuse toward the n-type semiconductor and p-type semiconductors. Only the acceptor ions remain, only the positively charged donor ions remain on the n-type semiconductor side, and ± space charges are generated near the junction to suppress the diffusion of holes and electrons, resulting in thermal equilibrium. do. When an energy source is externally applied to the pn junction that has reached this passion equilibrium state, the p-type semiconductor shows a positive voltage and the n-type semiconductor shows a negative voltage, so that current can be obtained as the current flows in only one direction. Can be.
On this principle, a solar cell's ability to convert sunlight into electrical energy generally measures the efficiency at which light energy is converted into electrical energy, the value of which is a ratio of the amount of incident light at the electrical output of the solar cell, usually It is expressed in%.
Therefore, many studies have been conducted to increase the efficiency of solar cells, and one method is to use a method of maximizing light absorption by texturing the wafer surface. As the texturing method, a chemical etching method, a plasma etching method, a mechanical scribing method, a photolithography method, and the like are used.
Among the above methods, the chemical etching method is getting much attention as a method of texturing a large amount of wafers at a low price in a short time. Chemical etching methods include isotropic etching and anisotropic etching, and as an example of isotropic etching, haze the TCO (Transparent Conductive Oxide) surface deposited on glass using an acidic solution. There is a way to handle it.
In this case, since the internal reflectance is weak, the average free path of the solar light is shortened, which causes a problem of deterioration of the light efficiency.
SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor substrate for a solar cell and a texturing method thereof capable of improving the efficiency of light by increasing the internal reflectance to increase the scattering effect of sunlight.
A semiconductor substrate for a solar cell according to an embodiment of the present invention includes a substrate, a photoacryl coated on the substrate and having an embo pattern formed on a surface thereof through an exposure process, and a light absorbing layer formed on the photoacryl. The photoacryl includes a plurality of light scattering means that have been hazed on the emboss pattern through a plasma etching process.
A texturing method of a semiconductor substrate for a solar cell according to an embodiment of the present invention comprises the steps of preparing a substrate, coating a photoacryl excellent in light transmittance through spin coating on the substrate, and the surface of the photoacryl through an exposure process Forming an emboss pattern on the embossed pattern; forming a plurality of light scattering means on the emboss pattern through an oxygen plasma etching process; and forming the emboss pattern and a plurality of light scattering means Forming a light absorbing layer on the photoacrylic.
The semiconductor substrate for a solar cell according to the embodiment of the present invention is formed on the substrate by coating the photoacryl on the substrate and then forming an emboss pattern through an exposure process, and haze treatment on the emboss pattern using a plasma etching method. The internal reflectance of the TCO can be improved to improve the light efficiency.
1 is a cross-sectional view of a semiconductor substrate for a solar cell according to an embodiment of the present invention.
2A to 2D are diagrams sequentially showing a manufacturing process of the solar cell semiconductor substrate of FIG. 1.
FIG. 3A is a view showing an embo pattern formed on the photoacrylic of FIG. 1, and FIG. 3B is a plurality of light scattering patterns on the embo pattern of FIG. This is a view showing a state formed.
4 is a flowchart illustrating a manufacturing process procedure for manufacturing a semiconductor substrate for a solar cell according to an embodiment of the present invention.
Hereinafter, embodiments according to the present invention will be described with reference to the accompanying drawings.
1 is a cross-sectional view of a semiconductor substrate for a solar cell according to an embodiment of the present invention.
As shown in FIG. 1, a semiconductor substrate for a solar cell according to an embodiment of the present invention includes a
The
The
The light scattering means 110a is formed on the emboss pattern through a plasma etching process. The light scattering means 110a is formed on an emboss pattern of the
The
2A to 2D are diagrams sequentially showing a manufacturing process of the solar cell semiconductor substrate of FIG. 1.
As shown in FIG. 2A, a
The size and height of the embo pattern vary depending on the exposure amount generated during the exposure process, and the ambo pattern having the optimal reflectance is determined according to the degree of the exposure amount. As described above, the
As the ambo pattern having an optimal reflectance is formed on the
Subsequently, as shown in FIG. 2C, the
As the plurality of
Subsequently, as shown in FIG. 2D, the
FIG. 3A is a view showing an embo pattern formed on the photoacrylic of FIG. 1, and FIG. 3B is a plurality of light scattering patterns on the embo pattern of FIG. This is a view showing a state formed.
As shown in FIG. 1 and FIG. 3A, an emboss corresponding to a reflectance of 96 to 97% through an exposure process after coating a photoacryl (110 of FIG. 1) having excellent light transmittance on the
The embo pattern may be formed in a semicircle shape or an elliptical shape. As shown in FIG. 3B, a plurality of haze-processed light scattering means are formed on the
Such a plurality of light scattering means can increase the light absorption efficiency from the light absorbing layer (130 of FIG. 1) of the solar cell.
Forming an emboss (ambo) on the
In addition, since the internal reflectance is improved through the emboss pattern and the plurality of light scattering means 110a, the light scattering effect is increased, thereby increasing the absorption efficiency of the
4 is a flowchart illustrating a manufacturing process procedure for manufacturing a semiconductor substrate for a solar cell according to an embodiment of the present invention.
As shown in FIG. 4, a photoacryl having excellent transmittance is coated on the substrate. (s10)
Subsequently, the photoacryl-coated substrate is exposed to form an embossed pattern having a semicircle or ellipse shape on the photoacryl surface. Subsequently, a plurality of light scattering means are formed on the embo pattern through an oxygen plasma etching process. (s30) Subsequently, a transparent conductive oxide (TCO) and a light absorbing layer are sequentially formed on the substrate having the embossed pattern on which the light scattering means is formed. (s40)
That is, the solar cell semiconductor substrate according to the embodiment of the present invention coats the photoacryl on the substrate, forms an optimal embo pattern to increase the internal reflectance of the photoacryl, and then hazes through a plasma etching process. By forming a plurality of treated light scattering patterns on the embossed pattern, the internal reflectance of the solar cell may be increased to increase the light scattering effect.
100: substrate 110: photoacrylic
110a: light scattering means 120: TCO
130: light absorption layer
Claims (8)
Photoacryl coated on the substrate and having an embo pattern formed on its surface through an exposure process; And
And a light absorbing layer formed on the photo acrylic.
The photoacryl is a semiconductor substrate for a solar cell, characterized in that it comprises a plurality of light scattering means haze (haze) through the plasma etching process on the embo (ambo) pattern.
The shape of the embo pattern is determined in accordance with the exposure amount during the exposure process so that the internal reflectance of the photoacryl is 96 ~ 97%.
The embossed pattern has a semicircle or elliptical shape.
The substrate is characterized in that it is composed of any one of glass, stainless steel, polyethylene terephthalate (PET), polyethylenenaphthelate (PEN), polypropylene (PP), polyamide (PI), or triacetyl cellulose (TAC). Semiconductor substrate for solar cell.
Coating a photoacryl having excellent light transmittance through spin coating on the substrate;
Forming an ambo pattern on the photoacryl surface through an exposure process;
Forming a plurality of light scattering means on the embo pattern through an oxygen plasma etching process; And
And forming a light absorbing layer on the photoacryl on which the emboss pattern and the plurality of light scattering means are formed.
The shape of the emboss (ambo) pattern is a texturing method of the semiconductor substrate for a solar cell, characterized in that determined according to the exposure amount during the exposure process so that the internal reflectance of the photoacryl is 96 ~ 97%.
The substrate is characterized in that it is composed of any one of glass, stainless steel, polyethylene terephthalate (PET), polyethylenenaphthelate (PEN), polypropylene (PP), polyamide (PI), or triacetyl cellulose (TAC). Texturing method of semiconductor substrate for solar cell.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020100097052A KR20120035509A (en) | 2010-10-05 | 2010-10-05 | Semiconductor substrate for solarcell and texturing method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020100097052A KR20120035509A (en) | 2010-10-05 | 2010-10-05 | Semiconductor substrate for solarcell and texturing method thereof |
Publications (1)
Publication Number | Publication Date |
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KR20120035509A true KR20120035509A (en) | 2012-04-16 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020100097052A KR20120035509A (en) | 2010-10-05 | 2010-10-05 | Semiconductor substrate for solarcell and texturing method thereof |
Country Status (1)
Country | Link |
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KR (1) | KR20120035509A (en) |
-
2010
- 2010-10-05 KR KR1020100097052A patent/KR20120035509A/en not_active Application Discontinuation
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