KR20100045079A - A appparatus and method of contact probe - Google Patents

Abstract

PURPOSE: An apparatus and a method of manufacturing a contact probe are provided to form a probe tip and a cut plat in a barrel without an additional plunger by forming a probe tip without additional cutting. CONSTITUTION: A crest(112a) and a root(112a) are consecutively formed on a plate of a rectangular. A circular cut section(116) is formed on the top of the plate. The circular cut section has an uncut section(116a). The cut section is vertically bent inwardly. A compression coil spring(130) is inserted into the plate. An upper side of the compression coil spring is touched with a lower side of the cut section. The top of a contact pin is inserted into the lower part of the plate. The plate is shaped as a barrel of a cylindrical type.

Description

Inspection probe device and its manufacturing method {A appparatus and method of contact probe}

The present invention relates to an inspection device for inspection and a method for manufacturing the same, and more particularly, to form a cylindrical barrel with both ends by opening a flat plate, but the inspection object through the barrel formed with a projection protrusion of the shape of the mountain and the valley on the top The inspection probe device characterized in that the contact terminal of the contact.

Chips are integrated circuits that perform various functions due to logic elements formed on the surface of thin and small pieces of plate, and electrical signals transmitted from circuit boards are transmitted through a bus to accomplish this operation.

In general, many chips are mounted in various kinds of electronic products, and these chips play an important role in determining the performance of electronic products.

In addition, a printed circuit board (PCB) is formed by coating copper on a thin substrate made of epoxy or bakelite resin, which is an insulator, to form circuit wiring, and to form an electrical circuit such as an integrated circuit, a resistor, or a switch. The components are mounted on the printed circuit board by soldering on the circuit wiring.

Micro-chip is a chip made of high density integrated electronic circuits of the circuit board. The process is inspected by an inspection device to check whether the chip is mounted in an electronic product before it is assembled. It is essential.

In order to check whether the semiconductor chip is operated properly, a test probe device is mounted on the test socket device, and the test chip is contacted with the semiconductor chip to apply a test current to the test circuit board.

1 is a cross-sectional view showing a conventional inspection probe device.

As shown, the conventional inspection probe device 5 has a barrel 8 and a plunger 7 slidably installed in the outer cylinder, and a contact pin 6 is formed at the lower end of the outer cylinder. The compression coil spring 9 is accommodated in the outer cylinder to elastically support the plunger.

When the microchip is inspected through such a configuration, the microchip rests on the upper portion of the socket, and the pressing portion installed in the socket presses the microchip downward so that the microchip comes into contact with the plunger of the probe device.

However, the process of manufacturing a conventional inspection probe device employing such a structure is difficult to manufacture a cylindrical cylinder of a small diameter, the compression coil spring and the contact pin is coupled to the inside of the barrel, the upper end of the cylindrical plunger (plunger) There is a problem that manufacturing time and manufacturing cost are high due to the machining process and the combination of each component, such as the need to form a probe protrusion through milling.

SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and an object of the present invention is to provide a probe device for semiconductor chip inspection and a method of manufacturing the same, which are easy to manufacture and can reduce manufacturing costs.

According to the present invention, there is provided a method of manufacturing an inspection probe device according to the present invention, comprising: a first step of continuously forming an acid and a valley at an upper end of a rectangular plate, and a second step of forming a circular cutout plate having an uncut portion on an upper part of the plate; Forming the flat plate in a semi-cylindrical shape, the third step of vertically bending the incision plate, and inserting a compression coil spring into the inside of the flat plate formed in the semi-cylindrical shape in the third step of the compression coil spring A fourth step of bringing the upper surface into contact with the lower surface of the incision plate, and inserting an upper portion of the contact pin in the lower portion of the plate, and forming the plate into a cylindrical barrel, and the peaks and valleys are crown-shaped probes. It is characterized by consisting of a fifth step of forming a projection.

Here, the second step is to form a depression so as to project downward in the horizontal direction in the center of the plate, the fifth step is characterized in that the depression is formed as a locking projection protruding outward from the outer peripheral surface of the barrel.

In addition, the second step is characterized in that the acid formed on the upper end of the plate bent upward at a predetermined angle.

The second step is to form an upward bent portion bent upward in the lower end of the plate, the third step is characterized in that the upward bent portion is coupled to the engaging groove formed on the outer peripheral surface of the contact pin.

The inspection probe according to the present invention includes a barrel having both ends opened, a compression coil spring inserted into the barrel, and a contact pin coupled to a lower portion of the barrel, wherein the barrel has an upper end portion. A rectangular plate formed with a valley and a valley formed in succession is formed by a cylindrical tube, wherein the hill and the valley form a crown-shaped probe projection, and the recessed portion projecting downward in the horizontal direction in the center of the plate outward from the outer peripheral surface of the barrel A protruding locking jaw is formed, and a circular cutout plate having an uncut portion is vertically bent inward during the tube making process to contact the upper portion of the compression coil spring.

Here, the probe projection is characterized in that the inward bending at a predetermined angle toward the center of the barrel, the barrel is formed inwardly bent inwardly bent inward toward the center at the lower end, the locking groove formed on the outer peripheral surface of the contact pin accommodated in the lower portion It is characterized by being bound to.

Inspection apparatus for inspection and its manufacturing method according to the present invention by forming a cylindrical barrel with both ends opened by forming a flat plate and a probe protrusion is formed on the top of the barrel, it is possible to form a probe protrusion without a separate cutting process, There is an advantage that it is easy to manufacture the inspection probe device and to reduce the production cost by configuring the barrel to form the probe protrusion and the cutting plate in the barrel without the need for a separate plunger.

With reference to the accompanying drawings will be described in more detail the probe for inspection and the manufacturing method of the present invention.

2 and 3 are an external view and a cross-sectional view showing a test probe device according to an embodiment of the present invention.

As shown, the inspection probe device 100 according to the present invention includes a barrel 110, a contact pin 120, and a compression coil spring 130.

The barrel 110 is to replace the conventional barrel and the plunger to form a cylindrical tube with both ends opened to form a flat plate, the top and bottom of the probe projection 112 is formed in the shape of a continuous valley, the barrel ( A compression coil spring 130 providing an elastic force is accommodated in the inside of the 110, and an upper portion of the contact pin 120 is received in a lower portion thereof.

Therefore, when the probe protrusion 112 contacts the connection terminal of the test object (semiconductor chip), the probe protrusion 112 is transferred to the contact pin 120 through the barrel 110 and the compression coil spring 130, and the contact pin is a circuit board for inspection. A test current is sent to the PCB to check whether the semiconductor chip is operating normally.

In addition, as shown in FIG. 3, the upper portion of the flat plate 110a is circularly cut, but a portion of the flat plate 110a is not cut so that a vertical cut-out plate 116 is vertically bent inwardly during the formation of the compression coil spring 130. It is preferable that the compression coil spring 130 is coupled to the inside of the barrel 110 while the upper surface is in contact with the lower surface of the cutting plate 116 and the lower surface is in contact with the upper surface of the contact pin 120. Do.

Here, the cutting plate 116 serves to restrain the upper surface of the compression coil spring 130, the foreign matter generated by the impact when the probe protrusion 112 is a test object contact probe device for inspection It also serves to prevent the inflow inside.

In addition, the inward bent portion 118 is formed at the lower end of the barrel 110, it is preferable that the engaging groove 122 formed on the outer peripheral surface of the contact pin can be coupled to the barrel in a restrained state.

Looking at the manufacturing method of the inspection probe device according to the invention in detail, Figure 4 is a manufacturing example showing a manufacturing method of the inspection probe device according to an embodiment of the present invention.

The manufacturing procedure of the inspection probe device according to the present invention, as shown in Fig. 4 (a) is a first to continuously form a peak (112b) and the valley (112a) on the upper portion of the rectangular flat plate (110a) Steps, but as shown in (a) of FIG. 4, the peaks 112b and the valleys 112a are not limited to four and many may be formed.

Next, as shown in (b) of FIG. 4, a circular incision is made on the upper portion of the flat plate 110a, and a portion thereof undergoes a second step of forming the incision plate 116 that is not cut.

Here, the uncut portion 116a, in which the cutout plate 116 is not cut, may be formed on the upper side as shown in FIG. 4B, but may also be formed on the lower side.

Here, in the second step, as shown in (c) of FIG. 4, the recess 114a is formed to protrude downward in the horizontal direction at the center of the flat plate 110a, and the acid formed at the upper end of the flat plate 110a. A step of bending upward 112b at a predetermined angle and forming the upwardly bent portion 118a upwardly bent at the lower end of the plate 110a may be added.

5 is a side view of (c) of FIG. 4, in which the peak 112b formed at the upper end is bent upward at a predetermined angle (a), and the depression 114a and the upward bent portion 118a are formed in detail. have.

Next, the third step is to form the flat plate (110a) in a semi-cylindrical shape as shown in Figure 4 (d), the cutting plate 116 is vertically bent inward, the fourth step is shown in FIG. As shown in (e), the compression coil spring 130 is inserted into the flat plate 110a formed in the semi-cylindrical shape in the third step, but the upper surface of the compression coil spring 130 is the incision plate ( 116) to the bottom surface.

In addition, the upper portion of the contact pin 120 in contact with the circuit board for inspection is inserted in the lower portion of the flat plate (110a).

Here, the upper bent portion 118a formed in the second step is coupled to the engaging groove 122 formed on the upper outer circumferential surface of the contact pin 130 so that the contact pin 120 can be firmly fixed.

Finally, as shown in (f) of FIG. 4, the plate 110a is formed into a barrel 110 having a cylindrical shape, and the peaks and valleys form a crown-shaped probe protrusion 112.

In the fifth step, the depression 114a formed in the second step is formed as a locking jaw 114 protruding outward from the outer circumferential surface of the barrel 110, and the upward bending part 118a is an inward bending part ( 118 is formed to restrain the downward movement of the engaging groove 122 of the contact pin 120.

Here, the probe protrusion 112 is bent inwardly at a predetermined angle inward in the manufacturing process of the plate 110a as shown in Figure 5 so that each projection is the center of the barrel as shown in Figure 4 (f) It is preferable to make it face.

Next, the use aspect of the inspection probe device according to the present invention will be described.

6 is a cross-sectional view showing a state in which the inspection probe device according to an embodiment of the present invention is mounted on the inspection socket.

As shown in FIG. 6, the inspection probe device 100 according to the present invention is coupled to a through hole 22 formed perpendicularly to the inspection socket 20, and the upper portion of the inspection probe device 100 is disposed above the inspection socket 20. Protrusion is formed so that the probe protrusion 112 can be brought into contact with the contact terminal (solder ball, etc.) of the inspection object (2: semiconductor chip), and the lower portion of the electrode pad 3 of the inspection circuit board (4: PCB) Protrude downward to contact

In particular, in the present invention, the bottom surface of the contact pin 120 is in contact with the electrode pad 3.

 In addition, the locking jaw 114 protruding from the outer circumferential surface of the barrel 110 is coupled to be caught by the protrusion 24 protruding from the through hole 22 of the inspection socket 20.

Therefore, when the compression coil spring 130 is coupled in a compressed state, and the electrode contact terminal 1 of the test object 2 is in contact with the probe protrusion 112, the compression coil is moved in a vertically downward direction of the barrel. When the spring 130 is elastically compressed and the inspection is completed, the barrel 110 is vertically raised by the elastic force of the compression coil spring 130 to return to the original position.

As described above, the present invention is to produce a barrel using a flat plate, it can be seen that it provides a basic technical idea to provide an inspection probe device having a probe protrusion formed on the top, the scope of the basic idea of the present invention as such Of course, many other variations are possible to those of ordinary skill in the art.

1 is a conceptual perspective view showing a conventional semiconductor chip inspection socket.

Figure 2 is an external view showing the inspection probe device according to an embodiment of the present invention.

3 is a cross-sectional view of FIG.

Figure 4 is a production example showing a manufacturing method of the inspection probe device according to an embodiment of the present invention.

Fig. 5 is a side view of Fig. 4C.

6 is a cross-sectional view showing a state in which the inspection probe device according to an embodiment of the present invention mounted on the inspection socket.

<Explanation of symbols for main parts of drawing>

100: inspection probe 110: barrel

110a: reputation

112: probe projection 112a, 112b: mountain, goal

114: engaging jaw 114a: depression

116: incision plate 116a: non-incision

118: inward bending portion 118a: upward bending portion

120: contact pin 122: locking groove

130: compression coil spring

Claims (7)

A first step of continuously forming hills and valleys on an upper end of the rectangular flat plate; A second step of forming a circular cutout plate having an uncut portion on an upper portion of the plate; A third step of forming the flat plate into a semi-cylindrical shape, wherein the cutting plate is vertically bent inwardly; Inserting a compression coil spring into the inside of the plate formed in a semi-cylindrical shape in the third step, wherein the upper surface of the compression coil spring is in contact with the lower surface of the incision plate, the upper portion of the contact pin in the lower portion of the plate Inserting a fourth step; And a fifth step of forming the flat plate into a barrel of a cylindrical shape and the acid and the valley forming a crown-shaped probe protrusion. The method of claim 1, The second step, To form a recess to protrude downward in the horizontal direction in the center of the plate, The fifth step, And the depression is formed as a locking projection protruding outward from the outer circumferential surface of the barrel. The method of claim 1, The second step, Method of producing a test probe for the inspection, characterized in that the acid formed on the upper end of the plate bent upward at a predetermined angle. The method of claim 1, The second step is Forming an upwardly bent portion bent upwardly at the lower end of the plate, The third step, And the upwardly bent portion is coupled to the engaging groove formed on the outer circumferential surface of the contact pin. In the inspection probe device comprising a barrel having both ends opened, a compression coil spring inserted into the barrel and a contact pin coupled to the lower portion of the barrel, The barrel, A rectangular plate formed with a valley and a valley formed in a continuous upper end is formed by a cylindrical tube, wherein the hill and the valley form a crown-shaped probe protrusion, and a depression protruding downward in the horizontal direction in the center of the plate is formed from the outer circumferential surface of the barrel. To form an outwardly protruding locking jaw, At the top of the barrel, A circular incision plate having an uncut portion is vertically bent inward during the tube making process, characterized in that the contact with the upper portion of the compression coil spring. The method of claim 5, The probe projection is, Inspection probe device characterized in that the inward bending at a predetermined angle toward the center of the barrel. The method of claim 5, The barrel, An inward bending portion bent inward toward the center at the lower end is formed, the inspection probe device characterized in that it is constrained by the engaging groove formed on the outer peripheral surface of the contact pin accommodated in the lower portion.

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