KR20080002031U - Multi device test handler - Google Patents

Abstract

The present invention relates to a test handler capable of inspecting characteristics of various kinds of semiconductor products. The test handler of the present invention includes a device selector having selection buttons for selecting a type of device to be tested, a device supplied with the device, A loading rail for free-falling, a plurality of stoppers installed in the loading rails in order to restrain the free-fall of the device, a primary device sorting cylinder for sorting the devices constrained by the stoppers in a standby position, and The device sorted by the primary device sorting cylinder is loaded, and the I / T test unit which checks the insulation characteristics of the device and the device which has been inspected by the I / T test unit are waited and selected by the device selector. The selector to sort the device by type according to the select button A second device sorting cylinder comprising first, second and third device sorting cylinders operated by a button and a device sorted by the first, second and third device sorting cylinders one by one, and selected According to the type of test pin is activated according to the number of pins of the device is provided with an E / T test unit for checking the electrical characteristics of the device.

Test, Handler, Semiconductor, Device, Multi-Type

Description

Multi-device test handler for testing various semiconductor device characteristics

1 is a front view showing the configuration of a conventional semiconductor device test handler;

2 is a front view showing the configuration of a semiconductor device test handler of the present invention;

3 is a front view showing a device select portion for operating the semiconductor device test handler of the present invention;

4 is a front view illustrating inspecting a 4-pin semiconductor using the semiconductor device test handler of the present invention;

5 is an enlarged view illustrating main parts of the E / T test unit in FIG. 4;

<Description of Major Symbols in Drawing>

1 ': device

103, 105, 107, 109: stopper

102: primary device sorting cylinder

104, 106, 108: secondary device sorting cylinder

110: I / T test unit

120: E / T test unit

The present invention relates to a semiconductor device test handler for inspecting the characteristics of semiconductor products, and more specifically, to improve the efficiency of equipment by configuring to test the characteristics of various types of semiconductor products having various pin counts in one equipment. And improved semiconductor device test handler.

After completion of the manufacturing process, the semiconductor device is judged as good or defective by the test process for the finished product. In this test process, an automated inspection apparatus commonly called a "test handler" is used.

Among them, the vertical test handler refers to a method of transferring a device by gravity, and constitutes a rail through which the device flows. In this general contact method for testing a device, when a device is supplied to a test site, which is a test site, a physical force is applied to the lead part of the device and the socket of the test site, and the device and the lead part are contacted from the socket of the test site. An electrical signal is applied to test the device.

Referring to FIG. 1, a conventional vertical test handler includes a loading rail for supplying a packaged semiconductor device 1, and an I / T test unit 10 for inspecting insulation characteristics of the device 1 loaded from the loading rail. ) And an E / T test unit 20 for finally inspecting the electrical characteristics of the device 1.

A plurality of devices 1 are supplied to a loading rail for flowing the device 1 downward by gravity by an external loading device (not shown). In addition, a plurality of stoppers (3) (5) (7) for stopping the device (1) flowing downward by gravity is provided in several places in the loading rail.

The stopper (3) (5) (7) loads the device (1) flowing from the loading rail by the driving device (not shown) to the I / T test unit 10 and the E / T test unit 20 It works to wait.

1 shows a test handler for inspecting a semiconductor device 1 having 4 pins, the conventional test handler loads 4 4-pin semiconductor devices 1 into the I / T test unit 10 one by one. Inspect the insulation properties.

To this end, the devices 1 loaded on the rails are arranged four by one by the operation of the device sorting cylinder 2 on the side, as shown in the enlarged view of FIG. 1, and the four devices 1 aligned. Is moved to the I / T test unit 10 to test the insulation characteristics.

The I / T test unit 10 is provided with a rod-shaped tester 11, the tester 11 is in contact with the lead portion of the devices (1) to supply an electrical signal to the device (1) insulation characteristics Check it.

In addition, a device sorting cylinder 6 for loading the device 1 one by one in the E / T test unit 20 is provided, and the E / T test unit 20 has four pins of the device 1. Four test pins 21 are provided in contact with each other, and each test pin 21 contacts the lead of the device 1 for inspection.

However, such a conventional semiconductor device test handler is a device having a structure capable of inspecting only one type of semiconductor element 1, and a type of semiconductor device is inspected by one device. There is a hassle to buy and use a large number of equipment, which is not cost-effective, there is a problem that lowers the efficiency and productivity of work.

In addition, as a result of repetitive work with one piece of equipment, when one type of device is discontinued or orders are reduced, a situation arises that the equipment must be stopped, and thus there is a problem in that the efficiency and utility of the device are inferior.

Therefore, the present invention was devised in view of the above-mentioned problems of the prior art, and a semiconductor device test handler which improves the efficiency and productivity of the equipment by allowing the inspection of various types of products in one device by inspecting them with easy operation. The purpose is to provide.

In order to achieve the above object, according to the present invention, a device select unit including selection buttons for selecting a type of device to be tested is installed, a loading rail supplied with a device and installed to be inclined to slide the device, and free fall of the device. In order to constrain the plurality of stoppers installed in several places on the loading rail, and the device bound by the stopper is supplied in an amount corresponding to the size of the I / T tester, corresponding to the size of the I / T tester from the stopper A sorting primary device sorting cylinder that is spaced apart, an I / T test section for loading a device sorted by the primary device sorting cylinder, and inspecting the insulation characteristic of the device, and a device constrained by a stopper Sorts one by one according to the device type selected in the device selector. Secondary device sorting cylinder that is spaced apart from the stopper corresponding to the size of the device and the test pin is activated according to the number of pins of the device according to the type of device selected from the device selector to inspect the electrical characteristics of the device. A semiconductor device test handler comprising: an E / T test unit.

In the present invention, the I / T test unit is provided with a tester part corresponding to the distance between the stopper and the primary device sorting cylinder, press the pins of at least one device at a time according to the number of pins of the device at a time and then supply power It is characterized by inspecting the insulation characteristics.

Hereinafter, with reference to the accompanying drawings, preferred embodiments of the present invention as described above in detail as follows.

2 is a front view showing the configuration of the semiconductor device test handler of the present invention, Figure 3 is a front view showing a device selector for operating the semiconductor device test handler of the present invention.

As shown therein, the test handler of the present invention provides a loading rail for supplying the device 1 'and freely dropping the device 1' and inspecting the insulation characteristics of the device 1 'loaded from the loading rail. An I / T test unit 110 and an E / T test unit 120 for finally inspecting the electrical characteristics of the device.

A plurality of devices 1 'are supplied to a loading rail for flowing the device 1' downward by gravity by an external loading device (not shown). Further, a plurality of stoppers 103, 105, 107 and 109 for stopping the device 1 'flowing downward by gravity are provided in several places in the loading rail.

Specifically, the stoppers 103, 105, 107, and 109 may include a first stopper 103 for sorting before loading a device in the I / T test unit 110, and an I / T test unit 110. The second stopper 105 for loading the device into the device, the third stopper 107 for sorting before loading the device into the E / T test unit 120, and the device to the E / T test unit 120. It consists of a fourth stopper 109 for loading the.

The stoppers 103, 105, 107, and 109 pass through the I / T test unit 110 and the E / T test unit 120 to the device 1 ′ flowing from the loading rail by a driving device (not shown). To load or wait for

In addition, the test handler of the present invention is the primary device sorting cylinder 102 for sorting the device 1 ′ restrained by the first stopper 103 on the standby position before being loaded into the I / T test unit 110. Secondary device sorting cylinders 104, 106 and 108 are provided to wait for the device, which has been inspected by the I / T test unit 110, before being loaded into the E / T test unit 120.

Here, the primary device sorting cylinder 102 is for sorting a device loaded in the I / T test unit 110, and there is a difference in the number of sorting according to the number of pins of the device.

That is, since the I / T test unit 110 is loaded with four 4-pin semiconductors, two 8-pin semiconductors, and one 16-pin semiconductor, the primary device sorting cylinder 102 is inspected. In the case of four-pin semiconductor, four, eight-pin semiconductor, 16-pin semiconductor is sorted so that only one is loaded into the I / T test unit 110.

For this purpose, the primary device sorting cylinder 102 should be installed at a proper position.

2 is a diagram illustrating an example of inspecting a semiconductor device 1 ′ having 16 pins. A 16-pin semiconductor device is loaded into the I / T test unit 110 to perform inspection. By operation of the device sorting cylinder 102, the devices 1 'are aligned one by one.

On the other hand, Figure 4 is a front view showing the inspection of the 4-pin semiconductor device 1 using the semiconductor device test handler of the present invention, when the 4-pin semiconductor device 1 is inspected, the primary device sorting cylinder 102 ) Sorts the four devices 1 so that the four devices 1 are loaded into the I / T test unit 110.

The I / T test unit 110 loads a device sorted by the primary device sorting cylinder 102 and inspects insulation characteristics. The I / T test unit 110 has a rod-shaped tester 111 on both sides to press the pins of the devices at once. After supplying power, inspect the insulation characteristics.

The secondary device sorting cylinders 104 and 106 and 108 positioned below the I / T test unit 110 may sort the devices by types according to selection buttons selected by the device selector. It consists of first, second and third device sorting cylinders operated by

In detail, the device select unit includes a selection button for selecting a semiconductor to be inspected according to the number of pins of the semiconductor. As shown in FIG. 3, a 4-pin, 6-pin, 8-pin, and 16-pin semiconductor device is provided. The first, second and third device sorting cylinders 104, 106 and 108 are automatically operated according to the type of device selected as the operator presses the select button. Sorting is done.

Here, the first device sorting cylinder 104 is a cylinder for sorting 16 pin semiconductor, the second device sorting cylinder 106 is a cylinder for sorting 8 pin semiconductor, and the third device sorting cylinder 108 is 4 As a cylinder for sorting a pin semiconductor, each cylinder is operated according to the type of device selected according to the selection button to load one device into the E / T test unit 120.

The E / T test unit 120 of the present invention loads the devices sorted by the first, second and third device sorting cylinders 104, 106 and 108 one by one, and according to the type of the selected device. The test pin 121 is activated according to the number of pins of the device to inspect the electrical characteristics of the device.

That is, the E / T test unit 120 may be installed to the left and right of the sixteen test pins 121 to inspect the maximum 16-pin semiconductor device 1 ′.

Here, the E / T test unit 120 of the present invention is characterized in that the inspection device capable of inspecting 4-pin, 6-pin, 8-pin, 16-pin semiconductor, for example, when the 4-pin device As shown in FIG. 4, one 4-pin semiconductor is loaded and inspected by the third device sorting cylinder 108.

In this case, as shown in FIG. 5, the test is performed while only the four lowest test pins 121a of the E / T test unit 120 are activated. That is, the remaining test pins 121b that do not contact the pins of the device 1 are deactivated and the test is performed while only the four test pins 121a at the bottom of the E / T test unit 120 are activated.

In addition, when the 8-pin device is entered, the eight test pins 121 at the bottom thereof are activated, and the remaining test pins are inactivated to test the 8-pin device.

When the 16-pin device comes in, as shown in FIG. 2, all 16 test pins 121 are activated and inspected.

In this case, two 16-pin devices 1 'may be loaded and sequentially tested by the E / T test unit 120 as shown in the drawing.

Referring to the method of inspecting the device using the test handler of the present invention as follows.

First, elements flowed down from the storage along the loading rails are caught by the first stopper 103 in a standby state.

At this time, the device 1 ′ bound by the first stopper 103 is loaded on the standby position before being loaded into the I / T test unit 110 by the primary device sorting cylinder 102.

Thereafter, the first stopper 103 is removed and the device in the standby state is supplied to the I / T test unit 110.

In this case, a stopper 105 is provided at the bottom of the I / T test unit 110 to prevent the elements from flowing down until the test is finished.

In the I / T test unit 110, four 4-pin semiconductors, two 8-pin semiconductors, and one 16-pin semiconductor are loaded and inspected, and rod-shaped testers 111 are provided at both sides of the pins of the devices. After pressing, supply power and inspect insulation.

At the end of the inspection, the second stopper 105 is pulled out and the elements flow down into the E / T test section.

At this time, the devices are not directly supplied to the E / T test unit 120, but are sorted one by one by the secondary device sorting cylinders 104, 106 and 108, and the secondary device sorting cylinders 104 and 106 are sorted one by one. There is also a stopper 107 at (108) to hold the flow down elements.

The E / T test unit 120 supplies devices one by one.

For example, if four 4-pin devices are inspected by the I / T test unit 110 and loaded by the stopper 107, the third device sorting cylinder 108 may hold the second device from below. When the stopper 107 is removed, only the lowest element is supplied to the E / T test unit 120.

The E / T test unit 120 also has a stopper 109 at the bottom, so that the supplied device stops at the correct position.

The E / T test unit 120 has 16 test pins 121 of 8 on each side.

When the 4-pin device comes in, the test is performed with only the four test pins 121 at the bottom being activated.

When the 8-pin device comes in, the eight test pins at the bottom are entered. When the 16-pin device comes in, all 16 test pins are activated and checked.

As described above, when the select button of the device select unit is fixed, the secondary device sorting cylinders 104, 106 and 108 operate according to the select button, and the test pin 121 of the E / T test unit 120 operates. In addition, it is activated and operated according to the number of pins of the device.

For example, if the select button of the device select unit is fixed to 4 pins, the third device sorting cylinder 108 is operated, and only four test pins 121 of the E / T test unit 120 are operated at the bottom. I / T test and E / T test will be available.

The present invention is not limited to the above-described embodiment, and of course, modifications by those skilled in the art are possible without departing from the spirit of the present invention.

Therefore, the scope of the claims in the present invention is not defined within the scope of the detailed description, but will be limited by the claims and the technical spirit thereof.

As described above, since the present invention is a method of inspecting several types of semiconductor devices in one device, a single device may be purchased and used regardless of the type of semiconductor device, thereby greatly reducing the cost.

In addition, there is an advantage in reducing the fatigue of the operator and increase the efficiency and productivity of the work because it can inspect a variety of products with a single device in the way of working multiple equipment.

In addition, it is possible to respond quickly to customer's demands and to reduce the equipment downtime, which is advantageous in terms of efficiency.

Claims (2)

A device selector provided with selection buttons for selecting the type of device to be tested; A loading rail to which the device is supplied and installed to be inclined so that the device slides; A plurality of stoppers installed in several places on the loading rail to restrain free fall of the device, A primary device sorting cylinder for sorting spaced apart from the stopper to correspond to the size of the I / T tester so that the device constrained by the stopper is supplied in an amount corresponding to the size of the I / T tester; An I / T test unit which loads a device sorted by the primary device sorting cylinder and inspects an insulation characteristic of the device; A secondary device sorting cylinder which is spaced apart from the stopper in correspondence with the size of the devices so that the devices constrained by the stopper are sorted one by one according to the type of device selected in the device select unit; And an E / T test unit configured to check the electrical characteristics of the device by activating test pins according to the number of pins of the device according to the type of device selected by the device selector. The method of claim 1, The I / T test part is provided with a tester part corresponding to the distance between the stopper and the primary device sorting cylinder, and presses at least one pin of the loaded device at a time according to the number of pins of the device, and then supplies power to inspect the insulation characteristics. Semiconductor device test handler, characterized in that.

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