KR20010069086A - Synchrotron X-ray small-angle scattering apparatus - Google Patents

Abstract

PURPOSE: A small-angle scattering measuring device for radiate light is provided to increase the precision of experiments by integrally controlling all parts relating to the measurement and measuring data required for analyzing scattering data by a main control part, and conveniently carry out the small-angle scattering experiments required for analyzing the structure of a high molecule. CONSTITUTION: A small-angle scattering measuring method for radiate light includes a beam line(100), through which input radiate light passes and is scattered by the reaction with a predetermined sample for analyze the structure of the sample, for outputting a signal indicating the scattering, a beam line control part(110) for controlling predetermined parts of the beam line to control the radiate light passing through the beam line, a signal detection part(120) for detecting a signal of the scattered radiate light which passes the beam line, and a main control part(130) for communicating with the beam line control part and storing and displaying the signals received from the signal detection part.

Description

Synchrotron X-ray small-angle scattering apparatus

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a radiation accelerator control device, and more particularly, to a radiation incidence scattering measurement apparatus capable of scattering measurement and necessary collective control at one main part so that incineration scattering measurement and display of radiation is more accurately performed.

Radiated light, especially x-rays, provides information about small structures that cannot be obtained with visible light. X-ray incineration scattering is one of the main methods for structural analysis of polymers. The radiation incineration scattering method is performed in a device such as a radiation accelerator, and in the related art, in conducting such incineration scattering experiments, various types of control and data acquisition required for each of them are performed in separate devices. These devices are based on Macintosh or IBM compatible computers. However, recent advances in computer technology have led to the emergence of high-performance, inexpensive computers with high-resolution bitmap display systems, which enable more accurate detection and control of various control and measurement devices related to radiation incineration scattering using a single computer. There is a need for a measurement system.

The technical problem to be achieved by the present invention is to provide a radiation incineration scattering measuring apparatus that can more accurately detect and control a variety of control and measurement devices related to radiation incineration scattering using a single computer to obtain more accurate data.

1 is a block diagram of the radiation incineration scattering measuring apparatus of the present invention.

FIG. 2 is a detailed block diagram of the radiation incineration scattering measuring apparatus of FIG.

<Explanation of symbols for the main parts of the drawings>

100 ... beam line 101 ... light shielding

102.Beryllium Windows 103 ... Slit 1

104 ... Attenuator 105 ... Second Slit

106 Ionization Chamber 107

108 The second ionization chamber 109 Beam guide

110 ... beam line control 111 ... stepping motor

Stepping motor drive 113 Stepping motor controller

114 ... Thermostat 115 ... RS 232 interface

CCD detector 117 Chiller

118 ... CCD detector controller 120 ... signal detector

130 Main control unit Stepping motor drive unit

210 ... high voltage power supply 220 ... current amplifier

230 ... Analog / Digital Converter 240 ... Temperature Control

In order to accomplish the above object, the radiation incineration scattering measuring apparatus comprises: a beam line which is scattered in response to a predetermined sample to analyze the structure while the input radiation light is passed and the scattered signal is output; A beam line controller for controlling certain portions of the beam line to control the radiated light passing through the beam line; A signal detector for detecting the scattered radiation signal passing through the beam line; And a main controller to communicate with the beam line controller and to store and display a signal received from the signal detector.

The beam line may include a light shielding film for opening and closing an input radiation light source; A slit for focusing the radiation beam passing through the light shielding film; An attenuator capable of adjusting the intensity of the radiation signal past the slit; A first ionization chamber filled with a gas capable of activating the radiation light for the radiation signal passing through the attenuator so that the radiation light is ionized when the radiation light passes, allowing the intensity of the radiation to pass through to be measured electrically; A sample stage on which a sample to be reacted with radiation passing through the first ionization chamber is placed; A second ionization chamber in which the radiation is filled with a gas activating a signal scattered in response to the sample to be ionized when the scattering signal passes, so that the intensity of the scattered signal passing through can be measured electrically; And a beam guide through which the scattered beam passing through the second ionization chamber passes.

The beam line controller may include a stepping motor driver for controlling opening and closing of the light shielding film; A high voltage power supply for supplying high voltage power for forming an electric field in the first and second ionization chambers; A current amplifier for amplifying the current generated in the first and second ionization chambers; An analog / digital converter for digitally converting an output value from the current amplifier and inputting it to the main controller; And according to the command of the main controller is preferably provided with a temperature control unit for adjusting the temperature of the sample stage.

The signal detector may include: a CCD detector configured to detect scattered light passing through the scattered beam guide; A cooling device for cooling the CCD detector; And a CCD detector controller for controlling the CCD detector and the cooling device.

The main control unit controls the stepping motor driving unit, obtains data from the analog / digital converter, calculates, stores, and displays the intensity of the emitted light, gives a temperature control command to the temperature control unit, and cools the temperature of the signal detection unit. It is preferable that the computer to control and store and display the data received from the signal detector.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

1 is a block diagram of the radiation incineration scattering measuring apparatus of the present invention, the radiation incineration scattering measuring apparatus is composed of a beam line 100, a beam line control unit 110, a signal detector 120 and the main control unit 130 do. The beam line 100 is a path through which input radiation is passed and scattered in response to a sample to analyze its structure, and the scattered signal is output, and components for controlling and measuring the radiation at each predetermined position of the beamline (not shown). City). The beam line controller 110 controls the above-described components included in the beam line to control the emission light passing through the beam line 100. The signal detector 120 detects the final radiated light signal passing through the beam line 100. The main controller 130 communicates with the beam line controller 110 to transmit various control commands, process data obtained from the beam line controller 110, and store and display a signal received from the signal detector 120. do. The emission light used herein is light generated through an emission accelerator, and in particular, x-rays that provide molecular structure information on the sample by being scattered by reacting with the sample.

FIG. 2 is a detailed block diagram of the radiation incineration scattering measuring apparatus of FIG. The beam line 100 includes a light shielding film 101, a beryllium window 102, a first slit 103, an attenuator 104, a second slit 105, a first ionization chamber 106, and a sample bed 107. , Components of the second ionization chamber 108 and the beam guide 109 are included. The light shielding film 101 is for opening and closing to pass or prevent the input radiation light source. The beryllium window 102 can selectively pass x-rays and does not need to be used unless the radiation used in this measurement device is x-rays. The first slit 103 is for adjusting the size of the radiation emitted through the light shielding film 101 and the beryllium window 102. The attenuator 104 is a device capable of adjusting the intensity of the radiation signal passing through the first slit 103. The second slit 105 is for refocusing the intensity-controlled emission light. The first ionization chamber 106 is filled with a gas capable of activating radiation (e.g., a gas capable of activating x-rays for x-rays) with respect to the radiation signal passing through the attenuator 105, and ionized when the radiation passes. This makes it possible to electrically measure the intensity of the radiation passing through it. This is possible because when radiation (or x-ray) passes through the electric field formed in the first ionization chamber 106, the radiation generates ions as the ions in the ionization chamber move along the electric field. The sample stage 107 is a place where a sample (object to analyze the molecular structure) to react with radiation light (or x-ray) is placed and scattered in response to the sample while passing through the sample stage 107. The second ionization chamber 108 makes it possible to measure the intensity of the scattered signal in response to a predetermined sample in the same manner as the principle in the first ionization chamber 106. The beam guide 109 serves as a guide through which the scattered beam from the second ionization chamber 108 passes, and is in a vacuum state in order to prevent the intensity of the scattered beam from being attenuated by scattering with and. The beam line controller 110 that controls the components included in the beam line 100 includes a stepping motor driver 200 including a stepping motor 111, a stepping motor drive 112, and a stepping motor controller 113. A high temperature power supply 210, a current amplifier 220, an analog-to-digital converter 230, and a temperature controller 240 including a temperature controller 114 and an RS 232 interface 115 are included. The stepping motor driver 200 is for controlling the opening and closing of the light shielding film 101. The stepping motor controller 113 of the stepping motor driver 200 may include a PPMC-103C stepping motor AI control chip to drive the stepping motor 111 to perform various motion adjustment commands. The PPMC-103C is one of the famous robotics chips that is easy to use and has all the essential features. Once the command is sent from the main control unit 130 to the PPMC-103C, it is possible to observe the state in which the command is performed when necessary even if the resource of the main control unit 130 is no longer used. This is very suitable for the measuring device of the present invention. After setting the operating mode and parameters of the stepping motor in advance, it is possible to control other devices during the measurement without the need for further control of the stepping motor. Therefore, in this device, the whole device can be driven in multiple working modes and the operating efficiency of the measuring device can be increased. Acceleration / deceleration may also be performed to reduce the opening and closing time of the light shielding film 101. The stepping motor is initially activated by acceleration and maintains its speed when it reaches a certain speed, and then decelerates when the target is near. The high voltage power supply 210 supplies high voltage power to form an electric field in the first and second ionization chambers 106 and 108. The current amplifier 220 amplifies the intensity of the emitted light signal immediately reacted with the sample and the intensity of the scattered light signal reacted with the sample detected by the first and second ionization chambers 106 and 108, respectively. The analog / digital converter 230 converts the current signal in the analog state amplified by the current amplifier 220 into a digital signal and outputs the value to the main controller 140. In this case, the analog-to-digital converter 230 preferably converts one sampling signal into a 12-bit digital signal. The temperature controller 240 is a device for controlling the temperature of the sample stand, and has a programmable temperature controller 114 to maintain the temperature of the sample stand constant or increase or decrease it to a desired temperature, which is an RS 232 interface 115. Through the main control unit 130 may receive a control command. The signal detector 120 controls the CCD detector 116 for detecting the scattered light passing through the scattering beam guide, a cooling device 117 for cooling the CCD detector 116, and a CCD detector 116 and the cooling device 117. CCD detector controller 118. Currently, many x-ray detectors based on CCD technology have been developed and are being used commercially. In accelerator experiments, the CCD detector must satisfy several requirements. First, it must be (1) small, simple and light, (2) easy to be connected electrically or thermally when used in connection with a computer, and (3) easy to attach to a linear mover that moves the probe on the measuring table. do. In the present invention, it is preferable to use an x-ray detection detector of a fiber optic taper type manufactured by Princeton Instruments having a diameter of 38.1 mm. The front of the taper is coated with phosphorus. Phosphorus, taper and CCD are all located in a vacuum atmosphere wrapped with a beryllium window through which x-rays can pass. CCD detector consists of 1152X1242 pixels and the pixel size is 22.5X22.5 to be. Since the maximum resolution of the CCD detector depends on the pixel size and the optical device of the CCD detector, a CCD having the above resolution is preferable for polymer research. The data detected by the CCD detector 116 for the signal passing through the beam guide 109 is made into image data through the CCD detector controller 118. The CCD detector controller 118 is preferably a high performance model ST-138 manufactured by Princeton Instruments, for example, and the CCD detector controller 118 provides two analog / digital converters (not shown). One of these analog / digital converters is for receiving optimized images at high speed, and the other is for receiving optimized images with high accuracy. The CCD detector controller 118 also enables high speed (eg 1 MHz) DMA data transfer to the memory of the main controller 130. The data rate can be, for example, 16 bits per pixel. The CCD detector 116 is cooled through the cooling device 117 controlled by the CCD detector controller 118. In general, the dark current of a CCD caused by ambient heat is doubled every 4 to 7 degrees Celsius as an exponential function of temperature. At room temperature, the electrons generate a high thermal rate, and thus, the pixel may be saturated even with a short exposure time without x-rays. To prevent this unwanted information, the CCD detector must be operated at low temperatures. In general, CCDs are cooled to temperatures below minus 100 degrees Celsius with liquid nitrogen systems, or cooled to temperatures below minus 80 degrees Celsius with thermoelectric cooling mechanisms. In the present invention, the latter case was taken and actually tested. Such installation makes it easy to move the CCD detector, maintain the temperature of the CCD stably, and reduce radiation injection into the CCD detector cooler and the CCD sensor. The main controller 130 controls the stepping motor driver 200, obtains data from the analog / digital converter 230, calculates, stores, and displays the intensity of the emitted light, and adjusts the temperature to the temperature controller 114. It is a computer that issues commands, controls the cooling temperature of the signal detector 120, and stores and displays the data received from the signal detector 120.

According to the present invention, by controlling all the devices related to the measurement in the main control unit and measuring the data necessary for analyzing the scattering data in real time, it is possible to increase the accuracy of the experiment and to easily perform the incineration scattering experiment required for the structural analysis of the polymer. have.

Claims (9)

A beam line which is scattered in response to a predetermined sample to analyze the structure while the input radiation is passed and outputs the scattered signal; A beam line controller for controlling certain portions of the beam line to control the radiated light passing through the beam line; A signal detector for detecting the scattered radiation signal passing through the beam line; And a main control unit communicating with the beam line control unit and storing and displaying a signal received from the signal detection unit. The method of claim 1, wherein the beam line, A light shielding film for opening and closing an input radiation light source; A slit for focusing the radiation beam passing through the light shielding film; An attenuator capable of adjusting the intensity of the radiation signal past the slit; A first ionization chamber filled with a gas capable of activating the radiation light for the radiation signal passing through the attenuator so that the radiation light is ionized when the radiation light passes, allowing the intensity of the radiation to pass through to be measured electrically; A sample stage on which a sample to be reacted with radiation passing through the first ionization chamber is placed; A second ionization chamber in which the radiation is filled with a gas activating a signal scattered in response to the sample to be ionized when the scattering signal passes, so that the intensity of the scattered signal passing through can be measured electrically; And And a beam guide through which the scattered beam passing through the second ionization chamber passes. The method of claim 2, wherein the beam line control unit, A stepping motor driver for controlling opening and closing of the light shielding film; A high voltage power supply for supplying high voltage power for forming an electric field in the first and second ionization chambers; A current amplifier for amplifying the current generated in the first and second ionization chambers; An analog / digital converter for digitally converting an output value from the current amplifier and inputting it to the main controller; And Radiation incineration scattering measurement device, characterized in that it comprises a temperature control unit for adjusting the temperature of the sample table according to the command of the main controller. The apparatus of claim 3, wherein the analog-to-digital converter is a 12-bit A / D converter that converts an analog signal into a 12-bit digital signal. The method of claim 3, wherein the stepping motor driving unit, And a stepping motor controller incorporating a PPMC-103C stepping motor AI control chip for driving the stepping motor. The method of claim 3, wherein the temperature control unit, A temperature controller for controlling the temperature of the sample stage; And And an RS-232 serial interface for communicating with the main controller and the temperature controller. The method of claim 1, wherein the signal detector, A CCD detector for detecting scattered light passing through the scattered beam guide; A cooling device for cooling the CCD detector; And And a CCD detector controller for controlling the CCD detector and the cooling device. The main control part according to any one of claims 1 to 7, Control the stepping motor driver, obtain data from the analog / digital converter, calculate, store and display the intensity of the emitted light, give temperature control command to the temperature controller, control the cooling temperature of the signal detector, and signal Radiation incineration scattering measuring device characterized in that the computer for storing and displaying the data received from the detection unit. The method of claim 1, The emission light incineration scattering measuring apparatus, characterized in that the radiation light is x-ray light.