KR20000011443U - Test equipment of base station wireless board in mobile communication system - Google Patents

Abstract

The present invention relates to a test apparatus for a base station wireless board in a mobile communication system that can test any wireless board using one integrated test equipment. In the mobile communication system according to the present invention, a test apparatus for a base station wireless board is connected to the main test unit including at least one processor, ROM, RAM, and monitor, and the main test unit, and at least one back board interface connection unit. It consists of an extended test unit including a.

Description

Test equipment of base station wireless board in mobile communication system

The present invention relates to a test apparatus for wireless base station wireless boards in a mobile communication system, and more particularly, to a test apparatus for wireless base station wireless boards suitable for integrated use with various wireless boards.

Conventional test apparatus is made separately according to the test purpose and connected to the base station wireless board if necessary to perform the desired test. In Fig. 1, the local oscillator control jig 30 and the gain control jig 20, which are a kind of test apparatus, are respectively provided to the frequency conversion board 42 for the radio base station and the control board 41 for controlling the frequency conversion board 42. Seemed connected. Here, the test device may be changed according to the test purpose.

Here, the frequency conversion board 42 serves to convert a frequency (usually hundreds of MHz to several GHz) for communicating with a mobile communication terminal in a wireless base station to a baseband frequency for IQ modulation. In addition, the control board 41 is a board for controlling the frequency conversion board 42, and usually has a built-in processor and has a parallel or serial interface specification. However, the conventional local oscillator control jig 30 and the gain control jig 20 are used when the control board 41 malfunctions or does not operate normally.

In addition, the local oscillator control jig 30 uses an 8-bit controller 33 for data transmission with a local oscillator chip that usually uses a serial data transmission method, as shown in FIG. And an LCD module 31. The gain control jig 20 may use the variable resistor 21 or the like to control the analog voltage level for controlling the CDMA signal transmission and reception gain in the frequency conversion board 42.

The test jig for the conventional mobile communication wireless base station wireless board is configured separately for each function and the operation according to the function is as follows.

First, when controlling the local oscillator, the local oscillator control jig 30 uses an 8-bit controller 33 or the like for the local oscillator chip, address, serial data, serial clock, and locking. It sends and receives a detected signal (locked detected signal) and the like to control the local oscillator 43 and check the locking state.

In the gain control, the gain control jig 20 transmits using a variable resistor or the like. Generate the control voltage (usually 0-5V) of the receive gain controller and transfer it to the frequency conversion board 42. The receive gain controller controls the gain of the transmit and receive power according to the received control voltage.

In addition, when using the conventional control board 41, as shown in FIG. 4, the processor is built in, while communicating to the personal computer 10 through the control board 41 having a parallel or serial interface specification, the control board The control and the state of the frequency conversion board 42 are checked through a signal connection connected to the back board of the parallel or serial interface type 41 and the frequency conversion board 42 again.

However, such a conventional test apparatus had the following disadvantages.

First, there is no versatility in conventional test equipment. That is, when testing each wireless board, it is necessary to prepare a test jig suitable for the characteristics of each wireless board separately so that each test is possible.

Second, the test function is limited when testing each wireless board using a conventional test device. That is, in the related art, only a part of various test functions of the base station wireless boards can be tested. Therefore, in the related art, accurate and reliable testing is inevitably impossible.

Third, when testing using a conventional test apparatus, the precondition that the existing control board must operate normally is absolutely necessary, and must also test the frequency conversion board and the power measurement boards through the back board in the self. Therefore, it is impossible to test the wireless board if these conditions are not satisfied.

The object of the present invention is to provide a test apparatus for a base station wireless board in a mobile communication system that can test any wireless board using one integrated test equipment. It is to provide.

According to an aspect of the present invention for achieving the above object, the test apparatus of the base station wireless board in the mobile communication system is a main test unit consisting of at least one processor, ROM, RAM, monitor, and the main test unit and And an extended test unit including at least one back board interface connection unit and connected to a wireless board to be tested.

1 is a block diagram showing a conventional wireless board and jig is connected.

2 is a block diagram of a conventional local oscillator control jig.

3 is a block diagram of a conventional gain control jig.

Figure 4 is a block diagram showing a conventional control jig and a wireless board is connected.

5 is a block diagram of a test apparatus according to an embodiment of the present invention.

Figure 6 is a block diagram showing that the test apparatus of the base station wireless board of the present invention is connected to the base station wireless board.

* Description of the symbols for the main parts of the drawings *

10: Personal Computer 20: Gain Control Jig

21: variable resistor 30: local oscillator control jig

31: LCD Module 32: Key Pad

33: controller 40, 400: self

41: control board 42: frequency conversion board

43 local oscillator 44 gain regulator

45: transmission power measurement board 46: power measurement board

50, 300: back board 100: main test section

110: processor 120: ROM

130: RAM 140: Monitor

150a, 150b: parallel bus interface connections

160; Back board interface connection 200: expansion test unit

Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings.

As shown in FIG. 5, the test apparatus according to the present invention includes a main test unit 100 including a processor 110, a ROM 120, a RAM 130, a monitor 140, and a parallel bus interface connection unit 150a. The extended test unit includes a parallel bus interface connection unit 150b and a backboard interface connection unit 160.

An operation description of each component of the integrated test apparatus according to the present invention is as follows.

The core block is composed of a general-purpose processor 110, a ROM 120, a RAM 130, and the like. Parallel bus interface connections 150a, 150b are address, data. Parallel matching signals consisting of an address strobe, a data strobe, a read strobe, a write strobe, and the like are connected to the parallel bus interface connections 150a and 150b. The main test unit 100 and the extended test unit 200 are transmitted through the connection.

The monitor 140 is used to communicate with the personal computer 10 by using a cable of the RS232 interface.

The back board interface connection unit 160 may be applied to a parallel / serial bus interface according to the system shape, but in an embodiment of the present invention, only necessary signals such as a power supply need to be connected.

In the configuration of the test apparatus according to the present invention, the frequency conversion board 42 is connected to the expansion test unit 200 as shown in FIG. At this time, the main test unit 100 jig is connected and plugged into the extended test unit 200. After that, the frequency converter board 42, the power measurement board 46, and the like are controlled and tested using a jig software program prepared in advance through the personal computer 10.

Specific operations are entered in the personal computer 10. The output address signal and data are exchanged with the processor 110 in the integrated test device through a serial communication method of an RS232 interface, and the processor 110 in the integrated test device is matched with the extended test unit 200 in a parallel communication method to transmit a signal. To pass. In addition, the extended test unit 200 exchanges a control signal and a state check signal with the frequency conversion board 42 and the power measurement board 46.

Based on this behavior, the integrated test device allows you to perform all of the following functional tests, including some of the things you can do with a conventional test device. The types of functional tests are the SHELF BUS TEST function, PLL FREQUENCY SYNTHESIZER LOCKING TEST, EEPROM WRITE AND READ TEST, D / A CONVERTER SET TO DESIRED VALUE TEST), THERMAL SENSOR READ TEST, STATUS AND TEST RESULT DISPLAY TEST, Analog / Digital and Digital / Analog Converter Debug Test (A / D & DA CONVERTER) DEBUG TEST) and SERIAL DATA DEBUG TEST can be divided into 8 types. Functional description of each is as follows.

First, the SHELF BUS TEST function allows data and address traffic light signals to reach the frequency conversion board 42 and the power measurement board 46 through an 8-bit parallel bus or serial bus generated by the integrated test device of the present invention. This is a test function that checks if it is delivered correctly. The bus between the wireless boards from the integrated test device may be parallel or serial, and in the case of the serial method, as in the parallel / serial converter which converts the parallel bus signals from the processor 110 in the integrated jig to serial. Additional on-board serial / parallel converters are needed. Such a parallel / serial converter and a serial / parallel converter can be implemented by using a field programmable gate array (FPGA) which is widely used.

The local oscillator frequency synthesis locking test (PLL FREQUENCY SYNTHESIZER LOCKING TEST) function is a frequency conversion board (42) and a power measurement board (46) for the frequency (typically hundreds of MHz to several GHz) for communicating with a mobile communication terminal in a mobile radio base station We need some local oscillator (PLL FREQUENCY SYNTHESIZER), which is required for converting the Ny into baseband frequency for IQ modulation, and it is a test function that sets the frequency of this local oscillator and checks its locking status.

The EEPROM WRITE AND READ TEST function is used to record board history, etc. in the frequency conversion board 42, and to store board calibration data in the power measurement board 46. This is a test function that writes and reads data from EPIROM.

The D / A CONVERTER SET TO DESIRED VALUE TEST function is used by the frequency conversion board 42 to adjust the gain of the transmit output of the CDMA signal and the gain of the received signal. The test function controls the control voltage of the digital signal attenuator through a digital-to-analog converter.

The THERMAL SENSOR READ TEST function is a test function that reads the temperature data of a temperature sensor used to check board characteristics as the temperature changes on the frequency conversion board 42 and the power measurement board.

STATUS AND TEST RESULT DISPLAY TEST indicates whether a 10 MHz signal exists as a reference signal for the local signal generator in the frequency conversion board 42 and the power measurement board 46, and locks the local signal generator. It is a test function that notifies the status, checks the status of the wireless board itself (FAIL), checks the status of the parallel bus and checks the display of the status.

The analog / digital and digital-to-analog converter debug test (A / D & DA CONVERTER DEBUG TEST) function controls the control voltage of the digital signal attenuator from the lowest value of the control voltage when no test function is performed. It is a test function that finds and corrects an error part while writing data at regular intervals up to the maximum value.

The serial data debug test (SERIAL DATA DEBUG TEST) function allows the components of the local oscillator chip, EPI, temperature sensor, etc. used in the local signal generator to send and receive serial data, and check whether the serial data transmit / receive port is working properly. Is a test function.

According to the present invention described above, there are the following effects.

First, the test apparatus for a wireless board according to the present invention is versatile. That is, when testing various types of wireless boards, all necessary tests are possible by preparing only the extended test unit 200 according to the required test purpose.

Second, the range of test functions was improved. That is, not only all necessary tests described in the operation description of the present invention using the integrated test apparatus according to the present invention are possible, but also accurate and reliable testing is possible through a personal computer.

Third, the surrounding environment of the test apparatus according to the present invention is greatly simplified. In other words, using the integrated test apparatus according to the present invention, self-connecting only the minimum necessary power, and the remaining necessary control signals can directly control the frequency conversion board and power measurement boards through the expansion test unit prepared for each necessary purpose .

Claims (3)

A main test unit including at least one processor, a ROM, a RAM, and a monitor, and an extended test unit connected to the main test unit and including at least one back board interface connection unit and connected to a wireless board to be tested Test device for base station wireless boards in mobile communication systems. The test apparatus of claim 1, wherein the main test unit and the extended test unit are each provided with a bus interface connection unit for executing data communication. The monitor of claim 1, wherein the monitor is connected to and communicates with a personal computer by using an interface-type cable, and address signals and data input / output from the personal computer are transmitted and received through a serial communication method of the interface with the processor. The processor is a test device for a base station wireless board in a mobile communication system, characterized in that for transmitting a signal matched with the expansion test unit in a parallel communication method.