KR19980015470A - Manufacturing process of magnetic head used in hard disk drive - Google Patents
Manufacturing process of magnetic head used in hard disk drive Download PDFInfo
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- KR19980015470A KR19980015470A KR1019960034774A KR19960034774A KR19980015470A KR 19980015470 A KR19980015470 A KR 19980015470A KR 1019960034774 A KR1019960034774 A KR 1019960034774A KR 19960034774 A KR19960034774 A KR 19960034774A KR 19980015470 A KR19980015470 A KR 19980015470A
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- magnetic head
- manufacturing process
- silicon dioxide
- dioxide layer
- hard disk
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Abstract
본 발명은 하드 디스크 드라이버에 사용되는 자기 헤드의 제조공정에 관한 것으로서, 상부 코어와 이산화규소층 사이의 접착력을 향상시킴으로써, 내부식성과 내화학성을 증가시킨 자기헤드의 제조공정에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a manufacturing process of a magnetic head used in a hard disk drive, and more particularly, to a manufacturing process of a magnetic head having improved corrosion resistance and chemical resistance by improving adhesion between an upper core and a silicon dioxide layer.
본 발명에 의한 자기헤드 제조공정은 이산화 규소층을 형성하는 공정에서 적어도 스퍼터링 방식이 수행된다.In the magnetic head manufacturing process according to the present invention, at least the sputtering process is performed in the process of forming the silicon dioxide layer.
따라서, 자기헤드의 신뢰성을 확보할 수 있는 이점을 가진다.Therefore, it has an advantage that the reliability of the magnetic head can be secured.
Description
본 발명은 하드디스크 드라이버에 사용되는 자기헤드의 제조공정에 관한 것으로서, 보다 상세하게는 상부코아와 이산화규소층 사이의 접착력을 향상시킴으로써 내부식성과 내화학성을 증가시킨 자기헤드의 제조공정에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a manufacturing process of a magnetic head used in a hard disk drive, and more particularly, to a manufacturing process of a magnetic head in which corrosion resistance and chemical resistance are improved by improving adhesion between an upper core and a silicon dioxide layer .
종래의 이산화규소층을 형성하는 공정은 주로 화학 증기 증착(CVD)공법이 이용되었다. 이러한 공법에 의한 이산화규소층은 상부코아와의 접착력이 약하여, 증착공정 다음에 행하여 지는 후공정인 기계적 연마공정에서 층사이가 분리되어 아주A conventional chemical vapor deposition (CVD) process was used to form the conventional silicon dioxide layer. The silicon dioxide layer formed by such a method has a weak adhesive force with the upper core, and the layers are separated from each other in the mechanical polishing step, which is performed after the deposition step,
미세한 틈이 형성되기 쉽다.A minute gap is likely to be formed.
이러한 틈은 화학적인 분위기 및 오염 등에 의하여 쉽게 반응하여 부식을 발생케 한다. 따라서, 자기헤드는 이러한 부식으로 인하여 정상적인 동작이 불가능하게 된다.These gaps easily react due to chemical atmosphere and pollution and cause corrosion. Therefore, the magnetic head becomes impossible to operate normally due to such corrosion.
본 발명의 목적은, 이산화규소층의 제조공정을 개선하여, 내부식성과 내화학성을 증가시킨 자기 헤드의 제조공정을 제공하는 것에 있다.It is an object of the present invention to provide a manufacturing process of a magnetic head in which the manufacturing process of a silicon dioxide layer is improved to increase corrosion resistance and chemical resistance.
도 1a 내지 1e는 본 발명에 따른 자기헤드의 하부폴(bottom pole)의 제조공정도,FIGS. 1A to 1E are a manufacturing process diagram of a bottom pole of a magnetic head according to the present invention,
도 2a 내지 2b는 본 발명에 따른 자기헤드의 필라 및 코일패턴 제조공정도,FIGS. 2A and 2B are views showing a process of manufacturing a pillar and a coil pattern of a magnetic head according to the present invention,
도 3a 내지 3g는 본 발명에 따른 자기헤드의 상부요크(upper yoke)에서 폴 피스(pole piece)까지의 제조공정도이다.3A to 3G are manufacturing process diagrams from an upper yoke to a pole piece of a magnetic head according to the present invention.
*도면의 주요 부분에 대한 부호의 설명*Description of the Related Art [0002]
10: 기판10: substrate
11: 산화막11: oxide film
12: 퍼말로이(permalloy)12: permalloy
13: 절연막13: Insulating film
21: 필라(pillar)21: pillar
23: 코일패턴23: coil pattern
전술한 목적을 달성하기 위한 본 발명의 특징은, 부상면상에 코어가 설치된 자기헤드 제조공정에 있어서, 상부코어에 이산화규소층을 형성하는 공정이 적어도 스퍼터링 방식에의해 수행되는 것으로 특징으로 하는 자기 헤드의 제조공정에 있다.According to an aspect of the present invention, there is provided a method of manufacturing a magnetic head having a core on a floating surface, the method comprising: forming a silicon dioxide layer on an upper core by at least a sputtering method; .
이하, 첨부도면에 의거 본 발명에 따른 자기헤드의 제조공정의 바람직한 실시예를 상세히 설명한다.Hereinafter, preferred embodiments of a manufacturing process of a magnetic head according to the present invention will be described in detail with reference to the accompanying drawings.
본 실시예는 크게 3가지 공정으로 나누어지는데, 제1과정은 하부 폴(BOTTOM POLE) 제조공정이고, 제 2 과정은 필라(PILLAR) 및 코일 패턴 제조공정이며, 제3 과정은 상부요크(UPPER POLE)에서 폴 피스(POLE PIECE)까지의 제조공정이다.The first embodiment is a process of manufacturing a bottom pole, the second process is a process of manufacturing a PILLAR and a coil pattern, the third process is a process of manufacturing an upper yoke ) To pole piece (POLE PIECE).
먼저, 제 1 과정을 도1a내지 도1e를 참조하여 설명하면, 실리콘 기판(10)위에 산화막(11)을 형성한다. 이어서 에칭(식각)하고자 하는 부분을 제외한 소정부위에 감광막(photoresist)을 입힌 후 에칭을 행한다.First, a first process will be described with reference to FIGS. 1A to 1E. An oxide film 11 is formed on a silicon substrate 10. Subsequently, photoresist is applied to a predetermined portion except the portion to be etched (etching), and etching is performed.
이러한 에칭공정후에 니켈-철 합금인 퍼말로이(permalloy,12)를 도금한다. 이어서, 이산화규소(Sio2)으로 된 절연막(13)을 입힌다.After this etching process, nickel-iron alloy permalloy 12 is plated. Then, an insulating film 13 made of silicon dioxide (Sio2) is deposited.
한편, 필라(21) 및 코일 패턴(23) 제조 공정인 제 2 과정을 도2a내지 도2d를 참조하여 설명하면, 전술한 제 1 과정에서 에칭하고자 하는 부분을 제외한 나머지 부위를 감광막(photoresist)로 씌운 다음 에칭을 행하고 다시 퍼말로이(12)를 도금한다.2A to 2D, a second process which is a manufacturing process of the pillar 21 and the coil pattern 23 will be described. In the first process, the remaining portions except the portion to be etched are photoresist After the covering, etching is performed, and the permalloy 12 is plated again.
이어서, 코일 패턴을 위한 에칭이 행해지는데 전술한 바와 마찬가지의 감광막을 소정부위에 입힌 다음 에칭이 행해진다. 이러한 에칭으로 형성된 에칭부에 코일을 감아 코일 패턴(23)이 완성된다.Subsequently, the etching for the coil pattern is performed, and the same photoresist film as described above is applied to a predetermined portion, and then etching is performed. The coil is wound around the etched portion formed by such etching to complete the coil pattern 23.
여기서, 동일한 공정이 반복되는 필라 및 코일 패턴 공정은 생략한다.Here, the pillar and coil pattern processes in which the same process is repeated are omitted.
도 3a내지 도3g는 본 발명에 따른 자기헤드의 상부요크에서 폴 피스 까지의 제조공정을 나타내고 있다.전술한 공정에서의 결과물인 자기 헤드에서 절연층으로서의 이산화규소층을 피막하고, 이어서 에칭하고자 하는 소정부위를 제외한 나머지 부위에 감광막을 씌운 다음, 에칭을 행한다.3A to 3G show a manufacturing process from the upper yoke to the pole piece of the magnetic head according to the present invention. In the resultant magnetic head in the above-described process, the silicon dioxide layer as the insulating layer is coated, The photoresist film is coated on the remaining portions except for the predetermined portion, and then etching is performed.
이러한 에칭공정 후 다시 퍼말로이로 도금한 다음, 이산화규소층을 입히는 공정이 행해진다. 여기에서 포토 마스크를 이용하여 부분 공정이 수행되었지만, 본원 발명이 추구하고자 하는 이산화규소층(33) 형성공정인 스퍼터링 공정으로 한 번에 수행될 수도 있음은 물론이다. 이어서 최종적으로 다시 절연층(34)인 이산화규소층을 피막한다.After the etching process, the surface is again plated with permalloy, and then a silicon dioxide layer is coated. Here, the partial process is performed using the photomask, but it goes without saying that the present invention may be performed at one time by the sputtering process, which is the process of forming the silicon dioxide layer 33 to be sought. Finally, the silicon dioxide layer as the insulating layer 34 is finally coated.
한편, 전술한 실시예의 설명에서, 보통 도금 공정후에 수행되는 평탄화 공정은 당연히 요구되는 공정이므로 여기에서는 설명하지 않았다.On the other hand, in the description of the above-described embodiments, the planarization process performed after the usual plating process is a process that is naturally required, and thus is not described here.
또한, 전술한 이산화규소층(33)을 형성하는 공정에서 스퍼터링 공정만으로 수행될 수도 있지만, 일정 두께 만큼 스퍼터링 방식을 수행한 후, 나머지는 CVD 공정으로 적절히 안배하여 수행할 수도 있다.In addition, the silicon dioxide layer 33 may be formed only by the sputtering process. Alternatively, the silicon dioxide layer 33 may be sputtered by a predetermined thickness, and the remaining portion may be suitably arranged by a CVD process.
또한, 전술한 이산화규소층 형성공정은 산화알루미늄(AL2O3)로 대신하여 수행될 수도 있다.Further, the above-described silicon dioxide layer forming step may be performed in place of aluminum oxide (AL2O3).
이상 설명한 바와 같이, 본 발명에 따른 자기헤드의 제조공정은 이산화규소층 또는 산화알루미늄층을 형성하는 공정에서 스퍼터링 방식이 수행됨으로써, 니켈과 철을 함유하고 있는 상부코어와 이산화규소의 접착력을 향상시키게되고, 헤드의 상부코어가 부식되는 것을 방지하는 이점을 가진다.As described above, in the manufacturing process of the magnetic head according to the present invention, the sputtering process is performed in the step of forming the silicon dioxide layer or the aluminum oxide layer, thereby improving the adhesion between silicon dioxide and the upper core containing nickel and iron And has an advantage of preventing the upper core of the head from being corroded.
Claims (3)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960034774A KR19980015470A (en) | 1996-08-21 | 1996-08-21 | Manufacturing process of magnetic head used in hard disk drive |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960034774A KR19980015470A (en) | 1996-08-21 | 1996-08-21 | Manufacturing process of magnetic head used in hard disk drive |
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| Publication Number | Publication Date |
|---|---|
| KR19980015470A true KR19980015470A (en) | 1998-05-25 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960034774A Ceased KR19980015470A (en) | 1996-08-21 | 1996-08-21 | Manufacturing process of magnetic head used in hard disk drive |
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| KR (1) | KR19980015470A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6177163A (en) * | 1984-09-21 | 1986-04-19 | Fujitsu Ltd | magnetic head |
| JPS6361405A (en) * | 1986-08-30 | 1988-03-17 | Nec Home Electronics Ltd | Manufacture of thin film laminated type magnetic head |
| JPS63189908A (en) * | 1987-02-03 | 1988-08-05 | Toshiba Corp | Moving device |
| JPH03189908A (en) * | 1989-12-19 | 1991-08-19 | Matsushita Electric Ind Co Ltd | Magnetic head and its manufacture |
| JPH05334625A (en) * | 1992-05-29 | 1993-12-17 | Asahi Glass Co Ltd | Method of manufacturing protective film and insulating film of thin film element, and thin film magnetic head |
| JPH07110912A (en) * | 1993-10-14 | 1995-04-25 | Sanyo Electric Co Ltd | Magnetic head and manufacture thereof |
-
1996
- 1996-08-21 KR KR1019960034774A patent/KR19980015470A/en not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6177163A (en) * | 1984-09-21 | 1986-04-19 | Fujitsu Ltd | magnetic head |
| JPS6361405A (en) * | 1986-08-30 | 1988-03-17 | Nec Home Electronics Ltd | Manufacture of thin film laminated type magnetic head |
| JPS63189908A (en) * | 1987-02-03 | 1988-08-05 | Toshiba Corp | Moving device |
| JPH03189908A (en) * | 1989-12-19 | 1991-08-19 | Matsushita Electric Ind Co Ltd | Magnetic head and its manufacture |
| JPH05334625A (en) * | 1992-05-29 | 1993-12-17 | Asahi Glass Co Ltd | Method of manufacturing protective film and insulating film of thin film element, and thin film magnetic head |
| JPH07110912A (en) * | 1993-10-14 | 1995-04-25 | Sanyo Electric Co Ltd | Magnetic head and manufacture thereof |
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