KR102531097B1 - 측면 저장 포드들, 전자 디바이스 프로세싱 시스템들, 및 이를 동작시키기 위한 방법들 - Google Patents
측면 저장 포드들, 전자 디바이스 프로세싱 시스템들, 및 이를 동작시키기 위한 방법들 Download PDFInfo
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- KR102531097B1 KR102531097B1 KR1020217015669A KR20217015669A KR102531097B1 KR 102531097 B1 KR102531097 B1 KR 102531097B1 KR 1020217015669 A KR1020217015669 A KR 1020217015669A KR 20217015669 A KR20217015669 A KR 20217015669A KR 102531097 B1 KR102531097 B1 KR 102531097B1
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- chamber
- storage container
- opening
- exhaust
- efem
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1924—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control
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- H01L21/6732—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/14—Vertical carrier comprising wall type elements whereby the substrates are horizontally supported, e.g. comprising sidewalls
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D53/00—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
- B01D53/02—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols by adsorption, e.g. preparative gas chromatography
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- H01L21/67017—
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- H01L21/67253—
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- H01L21/67346—
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- H01L21/67379—
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- H01L21/67389—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0452—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers
- H10P72/0454—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers surrounding a central transfer chamber
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0464—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the construction of the transfer chamber
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0604—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/18—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] characterised by being specially adapted for supporting a single substrate or by comprising a stack of such individual supports
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1918—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by coupling elements, kinematic members, handles or elements to be externally gripped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1921—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by substrate supports
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
- H10P72/1924—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control
- H10P72/1926—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control characterised by the presence of atmosphere modifying elements inside or attached to the closed carrier
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3404—Storage means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3406—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door or cover
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2253/00—Adsorbents used in seperation treatment of gases and vapours
- B01D2253/10—Inorganic adsorbents
- B01D2253/102—Carbon
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/20—Halogens or halogen compounds
- B01D2257/202—Single element halogens
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/20—Halogens or halogen compounds
- B01D2257/204—Inorganic halogen compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/40—Nitrogen compounds
- B01D2257/404—Nitrogen oxides other than dinitrogen oxide
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/40—Nitrogen compounds
- B01D2257/406—Ammonia
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3402—Mechanical parts of transfer devices
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201862751526P | 2018-10-26 | 2018-10-26 | |
| US62/751,526 | 2018-10-26 | ||
| US16/657,787 | 2019-10-18 | ||
| US16/657,787 US11508593B2 (en) | 2018-10-26 | 2019-10-18 | Side storage pods, electronic device processing systems, and methods for operating the same |
| PCT/US2019/057651 WO2020086710A1 (en) | 2018-10-26 | 2019-10-23 | Side storage pods, electronic device processing systems, and methods for operating the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20210066938A KR20210066938A (ko) | 2021-06-07 |
| KR102531097B1 true KR102531097B1 (ko) | 2023-05-09 |
Family
ID=70327366
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020217015669A Active KR102531097B1 (ko) | 2018-10-26 | 2019-10-23 | 측면 저장 포드들, 전자 디바이스 프로세싱 시스템들, 및 이를 동작시키기 위한 방법들 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US11508593B2 (https=) |
| JP (1) | JP7279158B2 (https=) |
| KR (1) | KR102531097B1 (https=) |
| CN (1) | CN112970098B (https=) |
| TW (1) | TWI799658B (https=) |
| WO (1) | WO2020086710A1 (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11508593B2 (en) * | 2018-10-26 | 2022-11-22 | Applied Materials, Inc. | Side storage pods, electronic device processing systems, and methods for operating the same |
| US11244844B2 (en) | 2018-10-26 | 2022-02-08 | Applied Materials, Inc. | High flow velocity, gas-purged, side storage pod apparatus, assemblies, and methods |
| US11373891B2 (en) * | 2018-10-26 | 2022-06-28 | Applied Materials, Inc. | Front-ducted equipment front end modules, side storage pods, and methods of operating the same |
| KR102202463B1 (ko) * | 2019-03-13 | 2021-01-14 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
| US20220310412A1 (en) * | 2021-03-23 | 2022-09-29 | Rorze Technology Incorporated | Gas circulation structure of equipment front end module (efem) |
| US20230062038A1 (en) * | 2021-08-30 | 2023-03-02 | Taiwan Semiconductor Manufacturing Company Limited | Vent port diffuser |
| TWI823271B (zh) * | 2022-02-24 | 2023-11-21 | 天虹科技股份有限公司 | 基板傳送方法 |
| KR102729958B1 (ko) * | 2022-06-15 | 2024-11-13 | 세메스 주식회사 | 장비 전단부 모듈 및 이의 동작 방법, 이를 포함하는 기판 처리 장치 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090087289A1 (en) | 2007-09-27 | 2009-04-02 | Tokyo Electron Limited | Structure for storing a substrate and semiconductor manufacturing apparatus |
| KR101682473B1 (ko) | 2013-10-18 | 2016-12-05 | 삼성전자주식회사 | 사이드 스토리지 및 이를 구비하는 반도체 소자 제조 설비 |
| JP2016225352A (ja) | 2015-05-27 | 2016-12-28 | 信越ポリマー株式会社 | 基板収納容器 |
| JP2019528486A (ja) | 2016-08-30 | 2019-10-10 | ブルックス オートメーション (ジャーマニー) ゲゼルシャフト ミット ベシュレンクテル ハフツングBrooks Automation (Germany) Gmbh | レチクル容器及び拡散板 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| RU2016356C1 (ru) * | 1991-09-24 | 1994-07-15 | Инженерный центр "Плазмодинамика" | Способ защиты сверхчистых поверхностей и устройство для создания потока защитной среды |
| US6415736B1 (en) * | 1999-06-30 | 2002-07-09 | Lam Research Corporation | Gas distribution apparatus for semiconductor processing |
| US6318945B1 (en) * | 1999-07-28 | 2001-11-20 | Brooks Automation, Inc. | Substrate processing apparatus with vertically stacked load lock and substrate transport robot |
| JP4763922B2 (ja) * | 2001-06-25 | 2011-08-31 | 株式会社神戸製鋼所 | 成膜装置及び成膜装置での汚染防止方法 |
| JP2005079250A (ja) * | 2003-08-29 | 2005-03-24 | Hitachi Kokusai Electric Inc | 基板処理装置 |
| JP2006245365A (ja) * | 2005-03-04 | 2006-09-14 | Hitachi High-Technologies Corp | 真空処理装置 |
| JP2010087169A (ja) * | 2008-09-30 | 2010-04-15 | Tokyo Electron Ltd | 気化器およびそれを用いた成膜装置 |
| JP2011061155A (ja) * | 2009-09-14 | 2011-03-24 | Hitachi Kokusai Electric Inc | 基板処理装置及び基板の搬送方法、並びに半導体装置の製造方法 |
| KR101090350B1 (ko) * | 2011-02-07 | 2011-12-07 | 우범제 | 퓸 제거장치 및 이를 이용한 반도체 제조장치 |
| KR101215962B1 (ko) | 2012-07-30 | 2012-12-27 | 이프로링크텍(주) | Efem의 버퍼 스토리지 박스 |
| TW201413780A (zh) | 2012-09-24 | 2014-04-01 | 尤金科技有限公司 | 煙氣移除設備及基板處理設備 |
| US20140261803A1 (en) * | 2013-03-15 | 2014-09-18 | Lam Research Corporation | High strip rate downstream chamber |
| TWI784799B (zh) * | 2013-12-13 | 2022-11-21 | 日商昕芙旎雅股份有限公司 | 設備前端模組(efem)系統 |
| KR102162366B1 (ko) * | 2014-01-21 | 2020-10-06 | 우범제 | 퓸 제거 장치 |
| US9881826B2 (en) * | 2014-10-24 | 2018-01-30 | Lam Research Corporation | Buffer station with single exit-flow direction |
| US9711353B2 (en) * | 2015-02-13 | 2017-07-18 | Panasonic Corporation | Method for manufacturing compound semiconductor epitaxial substrates including heating of carrier gas |
| KR101637498B1 (ko) * | 2015-03-24 | 2016-07-07 | 피코앤테라(주) | 웨이퍼 수납용기 |
| JP6450653B2 (ja) * | 2015-06-24 | 2019-01-09 | 東京エレクトロン株式会社 | 格納ユニット、搬送装置、及び、基板処理システム |
| KR20180045316A (ko) * | 2016-10-25 | 2018-05-04 | 삼성전자주식회사 | 설비 전방 단부 모듈 및 이를 포함하는 반도체 제조 장치 |
| US10159169B2 (en) * | 2016-10-27 | 2018-12-18 | Applied Materials, Inc. | Flexible equipment front end module interfaces, environmentally-controlled equipment front end modules, and assembly methods |
| KR102729711B1 (ko) | 2016-12-23 | 2024-11-13 | 피코앤테라(주) | 이에프이엠 |
| CN110770890B (zh) * | 2017-06-23 | 2023-09-08 | 应用材料公司 | 可索引侧储存仓设备、加热的侧储存仓设备、系统和方法 |
| US10388547B2 (en) * | 2017-06-23 | 2019-08-20 | Applied Materials, Inc. | Side storage pods, equipment front end modules, and methods for processing substrates |
| US11508593B2 (en) * | 2018-10-26 | 2022-11-22 | Applied Materials, Inc. | Side storage pods, electronic device processing systems, and methods for operating the same |
| JP2020161544A (ja) * | 2019-03-25 | 2020-10-01 | 住友金属鉱山株式会社 | 成膜装置および成膜方法 |
-
2019
- 2019-10-18 US US16/657,787 patent/US11508593B2/en active Active
- 2019-10-23 JP JP2021521401A patent/JP7279158B2/ja active Active
- 2019-10-23 WO PCT/US2019/057651 patent/WO2020086710A1/en not_active Ceased
- 2019-10-23 KR KR1020217015669A patent/KR102531097B1/ko active Active
- 2019-10-23 CN CN201980070776.1A patent/CN112970098B/zh active Active
- 2019-10-24 TW TW108138359A patent/TWI799658B/zh active
-
2022
- 2022-11-11 US US17/985,680 patent/US11791185B2/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090087289A1 (en) | 2007-09-27 | 2009-04-02 | Tokyo Electron Limited | Structure for storing a substrate and semiconductor manufacturing apparatus |
| KR101682473B1 (ko) | 2013-10-18 | 2016-12-05 | 삼성전자주식회사 | 사이드 스토리지 및 이를 구비하는 반도체 소자 제조 설비 |
| JP2016225352A (ja) | 2015-05-27 | 2016-12-28 | 信越ポリマー株式会社 | 基板収納容器 |
| JP2019528486A (ja) | 2016-08-30 | 2019-10-10 | ブルックス オートメーション (ジャーマニー) ゲゼルシャフト ミット ベシュレンクテル ハフツングBrooks Automation (Germany) Gmbh | レチクル容器及び拡散板 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112970098B (zh) | 2024-04-19 |
| JP2022505397A (ja) | 2022-01-14 |
| TW202034433A (zh) | 2020-09-16 |
| CN112970098A (zh) | 2021-06-15 |
| WO2020086710A1 (en) | 2020-04-30 |
| US20200135522A1 (en) | 2020-04-30 |
| JP7279158B2 (ja) | 2023-05-22 |
| US11791185B2 (en) | 2023-10-17 |
| TWI799658B (zh) | 2023-04-21 |
| US11508593B2 (en) | 2022-11-22 |
| KR20210066938A (ko) | 2021-06-07 |
| US20230073921A1 (en) | 2023-03-09 |
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| US20230105742A1 (en) | Equipment front end modules with induced gas mixing, and methods of use thereof |
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