KR102399934B1 - 본딩 헤드 - Google Patents

본딩 헤드 Download PDF

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Publication number
KR102399934B1
KR102399934B1 KR1020207030918A KR20207030918A KR102399934B1 KR 102399934 B1 KR102399934 B1 KR 102399934B1 KR 1020207030918 A KR1020207030918 A KR 1020207030918A KR 20207030918 A KR20207030918 A KR 20207030918A KR 102399934 B1 KR102399934 B1 KR 102399934B1
Authority
KR
South Korea
Prior art keywords
arm
base
spring
load sensor
load
Prior art date
Application number
KR1020207030918A
Other languages
English (en)
Korean (ko)
Other versions
KR20200135515A (ko
Inventor
토루 마에다
신 타카야마
Original Assignee
가부시키가이샤 신가와
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 신가와 filed Critical 가부시키가이샤 신가와
Publication of KR20200135515A publication Critical patent/KR20200135515A/ko
Application granted granted Critical
Publication of KR102399934B1 publication Critical patent/KR102399934B1/ko

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/52—Mounting semiconductor bodies in containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Die Bonding (AREA)
  • Wire Bonding (AREA)
KR1020207030918A 2018-08-06 2019-08-06 본딩 헤드 KR102399934B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018147318 2018-08-06
JPJP-P-2018-147318 2018-08-06
PCT/JP2019/030995 WO2020032068A1 (ja) 2018-08-06 2019-08-06 ボンディングヘッド

Publications (2)

Publication Number Publication Date
KR20200135515A KR20200135515A (ko) 2020-12-02
KR102399934B1 true KR102399934B1 (ko) 2022-05-19

Family

ID=69413497

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020207030918A KR102399934B1 (ko) 2018-08-06 2019-08-06 본딩 헤드

Country Status (5)

Country Link
JP (1) JP6905778B2 (ja)
KR (1) KR102399934B1 (ja)
CN (1) CN112585732A (ja)
TW (1) TWI711089B (ja)
WO (1) WO2020032068A1 (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107289872A (zh) 2017-06-28 2017-10-24 京东方科技集团股份有限公司 测高装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6085842U (ja) * 1983-11-18 1985-06-13 株式会社新川 ダイボンダ−のコレツトタツチ検出機構
GB8826488D0 (en) * 1988-11-11 1988-12-14 Emhart Deutschland Quality control for wire bonding
JP2501946B2 (ja) * 1990-09-26 1996-05-29 三菱電機株式会社 ダイボンド装置およびその制御方法
JPH086352Y2 (ja) * 1991-06-03 1996-02-21 光洋電子工業株式会社 非接触検出器の取付構造
JP3005786B2 (ja) 1993-07-26 2000-02-07 株式会社新川 チップボンデイング方法及び装置
JP2002110706A (ja) * 2000-09-27 2002-04-12 Nidec Tosok Corp ボンディング装置
JP2008270591A (ja) * 2007-04-23 2008-11-06 Shinkawa Ltd ダイボンダにおける湾曲回路基板の固定方法及びプログラム
KR20100085030A (ko) * 2007-11-06 2010-07-28 파나소닉 주식회사 부품 실장기, 부품 장착 헤드 및 부품 장착 방법
JP5762185B2 (ja) * 2011-07-12 2015-08-12 株式会社新川 ダイボンディング装置
JP5997448B2 (ja) * 2012-01-31 2016-09-28 ファスフォードテクノロジ株式会社 ダイボンダ及びボンディング方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107289872A (zh) 2017-06-28 2017-10-24 京东方科技集团股份有限公司 测高装置

Also Published As

Publication number Publication date
KR20200135515A (ko) 2020-12-02
TWI711089B (zh) 2020-11-21
JP6905778B2 (ja) 2021-07-21
JPWO2020032068A1 (ja) 2021-01-07
TW202008474A (zh) 2020-02-16
WO2020032068A1 (ja) 2020-02-13
CN112585732A (zh) 2021-03-30

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