KR102007959B1 - Method of Analyzing Polarizer Defect Through Projection Analysis - Google Patents

Method of Analyzing Polarizer Defect Through Projection Analysis Download PDF

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Publication number
KR102007959B1
KR102007959B1 KR1020150127125A KR20150127125A KR102007959B1 KR 102007959 B1 KR102007959 B1 KR 102007959B1 KR 1020150127125 A KR1020150127125 A KR 1020150127125A KR 20150127125 A KR20150127125 A KR 20150127125A KR 102007959 B1 KR102007959 B1 KR 102007959B1
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KR
South Korea
Prior art keywords
polarizing plate
film
adhesive layer
projection image
polarizing
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KR1020150127125A
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Korean (ko)
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KR20170029935A (en
Inventor
김훈열
권오철
남윤호
박기성
조남기
최항석
황태준
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주식회사 엘지화학
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Priority to KR1020150127125A priority Critical patent/KR102007959B1/en
Publication of KR20170029935A publication Critical patent/KR20170029935A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/24Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/30Measuring arrangements characterised by the use of optical means for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image

Abstract

The present invention discloses a method for analyzing defects caused by local variations in thickness of a polarizing plate. According to the present invention, the first polarizing plate projection image of the polarizing plate, the second polarizing plate projection image with the protective film removed from the polarizing plate, the third polarizing plate projection image with the polarizing plate removed to the release film, and the adhesive layer is coated Determine whether white spots or black spots are identified in the protective film projection image of the protective film removed from the polarizing plate in a closed state, and optionally, by unevenness through reflection analysis on the surface of the base film exposed by removing the protective film and the release film. By confirming the shape of, it is possible to quickly and accurately analyze the mechanism and cause of the generation of white spot defects and black spot defects caused by the local thickness change of the pressure-sensitive adhesive layer or adhesive layer included in the polarizing plate.

Description

Method of Analyzing Polarizer Defect Through Projection Analysis
The present invention relates to a method for analyzing white spots or black spot defects due to a local thickness change of a polarizing plate, and more particularly, to a method for easily analyzing a cause of defect occurrence of a polarizing plate through a projection analysis using a beam projector. will be.
A polarizer is a key component attached to a panel of an image display device such as a liquid crystal display (LCD), and is an optical film that receives natural light (unpolarized light) incident from the backlight and transmits light that vibrates in only one direction. to be.
The polarizing plate typically has a cross-sectional structure as shown in FIG. As shown in the figure, the polarizing plate 10 is a first substrate bonded to the upper and lower portions of the polarizing film 11 through the polarizing film 11 and the adhesive layers 12a, 12b for converting natural light into polarized light, respectively On the first base film 13 and the second base film 14, respectively, through the polarizing laminate P including the film 13 and the second base film 14 and the pressure-sensitive adhesive layers 15a and 15b. And a protective film 16 and a release film 17 adhered thereto.
The protective film 16 is manufactured separately from the polarizing plate 10 and then supplied in the form of a film roll. The adhesive layer 15a is coated on the lower surface of the protective film 16 in advance. The protective film 16 functions to protect the polarizing plate 10 in a process in which the polarizing plate 10 is stored, transported, and handled and is removed at an appropriate time. When the protective film 16 is removed, the pressure-sensitive adhesive layer 15a is removed together with the protective film 16. Meanwhile, the pressure-sensitive adhesive layer 15b interposed between the second base film 14 and the release film 17 is coated on the second base film 14. The release film 17 is removed immediately before attaching the polarizing plate 10 to the panel, wherein the pressure-sensitive adhesive layer 15b remains on the second base film 14 to adhere the polarizing plate 10 to the surface of the panel. Let's do it.
The polarizing film 11 varies depending on the type of the polarizing plate 10, and a polyvinyl alcohol (PVA) film having a polarization property through a stretching and iodine dyeing process is typically used. In addition, a Tri-Acetyl Cellulose (TAC) film is used as the first base film 13 and the second base film 14, and PET (PolyEthylene Threphthalate) is used as the protective film 16 and the release film 17. ) Films are typically used. In addition, the adhesive layers 12a and 12b are formed using an adhesive that is cured by heat or ultraviolet (UV), and the pressure sensitive adhesive layers (PSA) are typically used for the adhesive layers 15a and 15b. In addition, the first base film 13 or the second base film 14 may further include a surface coating having characteristics such as scattering, hardness enhancement, antireflection, low reflection, and the like.
On the other hand, in the manufacturing of the polarizing plate 10, if the foreign matter in the particulate material is mixed in the adhesive or pressure-sensitive adhesive in the process of adhering or adhering the raw film, or if the solid on the gel (gel) is contained in the adhesive or pressure-sensitive adhesive, there is a foreign matter or solid In part, the thickness of the polarizing plate 10 varies locally. In addition, the thickness of the polarizing plate 10 varies locally even when the adhesive or the pressure-sensitive adhesive is pressed by an external force or pressed in the raw film constituting the polarizing plate 10 before it is completely cured by heat or ultraviolet rays.
When the thickness of the polarizing plate 10 is locally changed, since the light passing through the polarizing plate 10 is collected or dispersed, the quality of an image displayed through the panel is degraded. Therefore, if the thickness of the polarizing plate 10 is locally changed, it is necessary to analyze the cause quickly and accurately to improve the manufacturing process.
One method of analyzing the local thickness change of the polarizing plate 10 is a reflection analysis method that checks the presence of irregularities by illuminating the surface of the polarizing plate 10 and visually observing the reflective surface thereof. By the way, the reflection analysis method can easily check the irregularities appearing on the appearance of the polarizing plate 10, but there is a limit in not accurately interpreting the process of expressing the irregularities and estimating the causative process.
Expensive electron microscopy and component analysis equipment may be used to more accurately analyze the local thickness change of the polarizer 10. In other words, after finding the uneven portion by the reflection analysis method, it is possible to estimate the causative process of the foreign substance by observing the cut surface of the uneven portion with an electron microscope, collecting the foreign substance and analyzing the components thereof.
However, analytical techniques using electron microscopes not only require expensive equipment, but also require long analysis times and are not suitable for analyzing a large amount of samples. In addition, if it takes a long time to analyze the thickness defects of the polarizing plate 10, it is difficult to quickly respond to find the process that caused the defects and improve the process.
The present invention was developed under the background of the prior art as described above, and improved defect analysis capable of quickly and accurately estimating the location of the layer of material that provided the cause of the locally changed polarizer thickness and the causal process causing the local thickness change. The purpose is to provide a method.
In the defect analysis method of the polarizing plate through the projection analysis method according to the present invention for achieving the above technical problem, by using a beam projector to irradiate a beam to the polarizing plate sample to analyze the defect of the polarizing plate using a projection image formed on the screen It is a way.
At a location where the thickness of the polarizer is locally increased, the point functions as a convex lens. Thus, locally increased thickness points appear as white spots in the projected image. Conversely, at a location where the thickness of the polarizer is locally reduced, the point functions as a concave lens. Thus, locally reduced thickness points appear as black spots in the projected image.
Hereinafter, defects appearing as white spots on the projection image will be referred to as white point defects, and defects appearing as black spots on the projection image will be referred to as black spot defects.
In the present invention, the polarizing plate to be subjected to the white spot or black spot defect analysis, the first base film and the second adhered to the upper surface and the lower surface of the polarizing film through the polarizing film, the first and second adhesive layers, respectively And a protective film and a release film adhered onto the first base film and the second base film, respectively, through a polarizing laminate including a base film, and first and second adhesive layers.
Defect analysis method of a polarizing plate according to an aspect of the present invention, the step of projecting a beam on the polarizing plate to obtain a first polarizing plate projection image; Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; And projecting a beam onto the removed protective film to obtain a protective film projection image, wherein white spots are observed in the first polarizing plate projection image and the protective film projection image and white spots are observed in the second polarizing plate projection image. If not, it may be determined that the thickness of the first adhesive layer is locally increased at the point where the white spot is observed so that a white spot defect occurs.
Preferably, the present invention may determine that particulate matter or gel-like solids are introduced into the first adhesive layer so that the thickness of the first adhesive layer is locally increased to generate the white spot defect.
According to another aspect of the present invention, a defect analysis method of a polarizing plate includes: projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image; Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; Sequentially removing the release film and the second adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And confirming convex or concave and convex and concave and convexities on the surface of the second substrate film through a reflection analysis method, wherein a white spot is observed in the first polarizing plate projection image and the second polarizing plate projection image, and the third polarizing plate projection image. If no white spot is observed and no convex or concave and convexities are observed on the surface of the second base film, the thickness of the second adhesive layer is locally increased at the point where the white spot is observed. have.
Preferably, the present invention may determine that particulate matter or gel-like solids are introduced into the second adhesive layer so that the thickness of the second adhesive layer is locally increased to generate the white spot defect.
According to another aspect of the present invention, a defect analysis method of a polarizing plate includes: projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image; Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; Removing the release film and the second adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And identifying convex and convexities on the surface of the second substrate film through a reflection analysis method, wherein white spots are observed in the first polarizing plate projection image, the second polarizing plate projection image, and the third polarizing plate projection image. When convex unevenness is observed on the surface of the second base film, it may be determined that a white spot defect occurs due to a locally increased thickness of the first adhesive layer or the second adhesive layer at the point where the white spot is observed.
Preferably, the present invention comprises the steps of observing the convex uneven portion of the surface of the second substrate film through an optical microscope; And when a particulate foreign substance or a solid substance on a gel is identified at the convex convex-concave portion, a thickness of the first adhesive layer or the second adhesive layer is locally increased by the foreign substance or the solid substance to determine that the white spot defect is generated. If the foreign matter or the solid on the gel is not identified at the convex convex and convex portions, the thickness of the first adhesive layer or the second adhesive layer is localized by pressing at least one of the films constituting the polarizing laminate. Determining that the white point defect has occurred by increasing.
According to another aspect of the present invention, a defect analysis method of a polarizing plate includes: projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image; Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; And projecting a beam onto the removed protective film to obtain a protective film projection image, wherein black spots are observed in the first polarizing plate projection image and the protective film projection image and black spots are observed in the second polarizing plate projection image. If not, the thickness of the first adhesive layer is locally reduced at the point where the black spot is observed, it can be determined that a black spot defect has occurred.
Preferably, the present invention comprises the steps of observing whether there is concave-convex irregularities on the surface of the protective film removed through a reflection analysis; And when the concave-convex irregularities are observed, the thickness of the first adhesive layer is locally reduced due to the pressing of the protective film by external force after the protective film is adhered to the first base film, thereby determining that the black spot defect has occurred. It may further comprise a.
Preferably, the present invention comprises the steps of observing whether concave-convex irregularities are present on the surface of the first adhesive layer coated on the removed protective film through a reflection analysis method; And when the concave-convex irregularities are observed, due to the pressing applied to the first adhesive layer coated on the protective film during the manufacturing process of the protective film, the thickness of the first adhesive layer is locally reduced to cause the black spot defect. Determining; may further include.
According to another aspect of the present invention, a defect analysis method of a polarizing plate includes: projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image; Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; Sequentially removing the release film and the second adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And confirming convex or concave and convex and concave and convexities on the surface of the second base film through a reflection analysis method, wherein black spots are observed in the first polarizing plate projection image and the second polarizing plate projection image, and the third polarizing plate projection image. If no black spot is observed in the concave and convexities on the surface of the second base film, the release film is adhered to the second base film, and then the concave and convex unevenness is observed by pressing the release film. It is determined that a dark spot defect occurs due to a local decrease in the thickness of the second adhesive layer, or a black spot is observed in the first polarizing plate projection image and the second polarizing plate projection image, and no black spot is observed in the third polarizing plate projection image, When convex unevenness is observed on the surface of the base film, the adhesive layer included in the polarizing laminate is completely cured. When the second adhesive layer is first formed on the second base film, which is a surface on which the second adhesive layer is to be formed by an external force, and the second adhesive layer is formed on the second base film in a subsequent process, the first It can be determined that the black spot defect occurred at the point where the block unevenness occurred due to the locally reduced thickness of the adhesive agent layer.
According to another aspect of the present invention, a defect analysis method of a polarizing plate includes: projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image; Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; Removing the release film and the second adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And identifying convex or concave and convex and concave and convexities on the surface of the second substrate film through a reflection analysis method, wherein black spots are observed in the first polarizing plate projection image, the second polarizing plate projection image, and the third polarizing plate projection image. If concave and convexities are observed on the surface of the second base film, black spot defects due to local reduction in thickness of the first adhesive layer or the second adhesive layer included in the polarizing laminate at the point where the concave and convexities are observed. It can be determined that this occurred.
Preferably, the present invention, if the concave-convex irregularities on the surface of the second substrate film is repeated with the same cycle, the transfer roller before the first adhesive layer or the second adhesive layer contained in the polarizing laminate is completely cured It can be determined that the thickness of the first adhesive layer or the second adhesive layer is locally reduced at the point where the concave-convex irregularities are observed by the periodic pressing applied by the result, resulting in the dark spot defect.
Preferably, the present invention, if the concave-convex irregularities are repeated with a period on the surface of the second base film, the core rod is rotated at least one of the films constituting the polarizing laminate when the period is increased or decreased gradually It can be determined that the black spot defect has occurred by periodically pressing by.
Preferably, the present invention, if the concave-convex irregularities are repeated with a period on the surface of the second base film, the core rod is rotated at least one of the films constituting the polarizing laminate when the period is increased or decreased gradually It may be determined that the black spot defect is generated by being pressed by the foreign matter particles introduced between the film and the film in the process of being wound on.
According to the present invention, by analyzing the white spot defect and the black spot defect caused by the local thickness change of the polarizing plate, the combination analysis and the reflection analysis method are selectively used to quickly and accurately analyze the location and the cause process of the material layer causing the white spot defect and the black spot defect. can do. In addition, defect analysis results can be quickly applied to improve the polarizer manufacturing process.
The following drawings appended hereto illustrate one embodiment of the present invention, and together with the following description serve to further understand the spirit of the present invention, the present invention is limited only to those described in such drawings. It should not be interpreted.
1 is a cross-sectional view showing the structure of a polarizing plate according to the prior art.
2 is a diagram illustrating the concept of a projection analysis method used in the polarizing plate defect analysis method according to the present invention.
3 is a view for explaining the principle of the appearance of white spots in the projection image when the thickness of the polarizing plate is locally increased.
4 is a view for explaining the principle of the appearance of black spots in the projection image when the thickness of the polarizing plate is locally reduced.
5 is a view showing an example in which the thickness of the polarizing plate is locally reduced due to the pressing by an external force.
6 is a view showing an example in which the thickness of the adhesive layer or the pressure-sensitive adhesive layer is locally increased by particulate matter or solids on a gel.
7 is a view showing an example in which the thickness of the adhesive layer or the pressure-sensitive adhesive layer is locally increased by the pressing of the raw film constituting the polarizing plate.
8 is a view showing an example in which the thickness of the adhesive layer or the pressure-sensitive adhesive layer is locally reduced by the pressing of the raw film constituting the polarizing plate.
FIG. 9 illustrates a state in which a raw material film is pressed by a protrusion present on the surface of the core rod when the raw film is wound on the core rod, and the foreign matter particles introduced between the film and the film when the raw film is wound on the core rod. It is a figure which shows the state (b) which a raw material film is pressed by conceptually.
10 is a cross-sectional view of a polarizing plate sample showing a case where a white point defect occurs due to a foreign material introduced into an adhesive layer of a protective film.
11 is a cross-sectional view of a polarizing plate sample showing a case where a white point defect occurs due to a foreign material introduced into an adhesive layer of a release film.
It is sectional drawing of the polarizing plate sample which shows the case where a white-point defect generate | occur | produced by pressing of the polarizing laminated body which hardening of the adhesive bond layer was completed.
It is sectional drawing of the polarizing plate sample which shows the case where a white-point defect generate | occur | produced by the foreign material which flowed into the adhesive bond layer contained in the polarizing laminated body.
It is sectional drawing of the polarizing plate sample which shows the case where a white-point defect generate | occur | produced by the press of the raw material film contained in a polarizing laminated body.
15 is a cross-sectional view of a polarizing plate sample showing a case where a black spot defect occurs due to a change in thickness of the pressure-sensitive adhesive layer due to pressing of a protective film.
16 is a cross-sectional view of a polarizing plate sample showing a case where a black spot defect occurs due to the pressing of the pressure-sensitive adhesive layer coated on the protective film in the process of manufacturing the protective film.
17 is a cross-sectional view of a polarizing plate sample showing a case where a black spot defect occurs due to a thickness change of the pressure-sensitive adhesive layer due to pressing of a release film.
It is sectional drawing of the polarizing plate sample which shows the case where a black spot defect generate | occur | produced by pressing of the polarizing laminated body which hardening of the adhesive bond layer was completed.
It is sectional drawing of the polarizing plate sample which shows the case where a black spot defect generate | occur | produced by the press of the raw material film contained in a polarizing laminated body.
Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. Prior to this, terms or words used in the present specification and claims should not be construed as being limited to the common or dictionary meanings, and the inventors should properly explain the concept of terms in order to best explain their own applications. Based on the principle that can be defined, it should be interpreted as meaning and concept corresponding to the technical idea of the present invention. Therefore, the embodiments described in the specification and the drawings shown in the drawings are only one embodiment of the present invention and do not represent all of the technical idea of the present invention, various equivalents that may be substituted for them in the present invention point of view. It should be understood that there may be variations and examples.
Polarizing plate defect analysis method according to an embodiment of the present invention uses a projection analysis method conceptually shown in FIG. That is, according to the present invention, the local thickness of the polarizing plate using the projection image 50 formed on the screen 40 by irradiating a beam to the polarizing plate sample 20 to be analyzed for defects using the beam projector 30. It is a method of analyzing defects caused by change.
The type of the beam projector 30 is not particularly limited, but it is preferable to use a DLP (Digital Lighting Processing) type beam projector in that it is possible to obtain a projected image 50 with good visibility. In addition, the screen 40 preferably uses a white screen in consideration of the visibility of the projection image 50.
Each distance between the polarizing plate sample 20 and the screen 40 and the beam projector 30 may be appropriately adjusted to optimize the visibility of the projection image 50.
Preferably, the distance between the polarizing plate sample 20 and the screen 40 is adjusted in the range of 0.2 to 0.3m. In addition, the distance between the polarizing plate sample 20 and the beam projector 30 is adjusted in the range of 1 to 3m.
The projection image 50 may include white spots or black spots at different thicknesses when the polarizing plate sample 20 has a locally different thickness, and may be visible when the polarizing plate sample 20 has a uniform thickness. Does not include
The white spot appears at a point A where the thickness of the polarizing plate sample 20 is increased locally, as shown in FIG. 3. This is because when the beam is irradiated to the point A having increased thickness, the point serves as a block lens to condense the beam to make the point A brighter than the surroundings.
On the other hand, the black spot appears at the point B where the thickness of the polarizing plate sample 20 is locally reduced, as shown in FIG. 4. This is because when the beam is irradiated to the point B whose thickness is reduced, the point serves as a concave lens to diverge the beam to make the point B darker than the surroundings.
On the other hand, in the polarizing plate sample 20, since no beam condensing or diverging occurs in the region where there is no change in thickness, no white spot or black spot is observed.
Hereinafter, defects appearing as white spots on the projection image will be referred to as white point defects, and defects appearing as black spots on the projection image will be referred to as black spot defects.
In the polarizing plate sample 20, the white spot defect means a portion having a relatively thicker thickness than other portions, and the black spot defect means a portion having a relatively thin thickness than other portions.
The white spot defect and the black spot defect occur mainly when the thicknesses of the adhesive layer and the pressure-sensitive adhesive layer included in the polarizing plate sample 20 change locally.
According to one aspect, the thickness change of the adhesive layer and the pressure-sensitive adhesive layer may occur in the process of curing the liquid adhesive and the pressure-sensitive adhesive constituting the adhesive layer and the pressure-sensitive adhesive layer by a heat or ultraviolet rays in a solid phase.
That is, as shown in Figure 5, when the external force is applied by the winding roller or the transfer roller, etc. before the liquid adhesive or pressure-sensitive adhesive (C) coated between the two raw film ① and ② is completely cured The thickness of the adhesive or pressure-sensitive adhesive occurs around the center.
According to another aspect, the thickness change of the adhesive layer and the pressure-sensitive adhesive layer is also caused by foreign matter.
That is, as shown in Figure 6, in the process of coating the liquid adhesive or pressure-sensitive adhesive (C) between the two raw film ① and ②, particulate foreign matter (P 1 ) is introduced or gel to the adhesive or pressure-sensitive adhesive (C) When the solids P 2 of the phase are present, the thickness of the adhesive layer or the pressure-sensitive adhesive layer increases around the portion where the foreign matter P 1 and the solids P 2 are present.
According to another aspect, the thickness change of the adhesive layer and the pressure-sensitive adhesive layer occurs when the irregularities are present on the surface on which the adhesive layer and the pressure-sensitive adhesive layer is coated.
For example, as shown in FIG. 7, when a liquid adhesive or pressure-sensitive adhesive (C) is coated on the surface with concave-convex and concave, the thicknesses of the adhesive layer and the pressure-sensitive adhesive layer formed on the concave-convex portion D increase more than other portions. do.
On the other hand, as shown in Figure 8, when the liquid adhesive or the adhesive (C) is coated on the surface with convex concavities and convexities, the thickness of the adhesive layer and the adhesive layer formed on the convex concavities and convex portion (E) is reduced.
The concave and convex concave and convex concave and convex may be present in at least one selected from a polarizing film, a first base film, and a second base film among the raw films constituting the polarizing plate.
In one aspect, the concave and convex concave and convex concave and convex may be formed by an external force applied by a transfer roller used in the manufacturing process of the polarizing plate. Since the feed roller rotates, the unevenness generated by the feed roller is repeated at regular intervals.
In another aspect, as described above, the concave convex and the convex irregularities is illustrated in (a) of Fig. 9, when the raw film in the process of being wound around the core rod periodically by the protrusions existing on the surface of the core rod is pressed Can occur.
In another aspect, the concave and convex concave and convex concave and convex concave and concave concave concave concave concave concave concave concave concave concave concave concave concave concave convex concave convex concave convex concave convex concave convex concave Can be caused by pressing.
The unevenness caused by the pressing of the core rod and the foreign matter particles is repeated periodically. At this time, the period in which the pressed marks are repeated may gradually decrease or increase. In the former case, when the raw material film wound up as shown in FIG. 9 (b) is unwound, it is when it comprises the layer of a polarizing plate. On the contrary, in the latter case, when the raw material film wound up as shown in FIG. 9 (b) is unwound and wound on another core rod, it is unwound again to form a layer of the polarizing plate.
This invention analyzes a white spot defect or a black spot defect selectively using a reflection analysis method together with the said projection analysis method. The reflection analysis method is an analysis method for identifying whether the unevenness is present on the reflective surface and the position after irradiating light on the surface of the analysis sample. In the present invention, the reflection analysis method is preferably applied to the surface of the polarizing plate sample 20 in the protective film and / or the release film is removed.
According to the present invention, through selective use of the projection analysis method and the reflection analysis method, it is possible to estimate which layer among the multilayer materials constituting the polarizing plate sample 20 has a local thickness change, and cause the process with high accuracy. It can be estimated.
In the present invention, the polarizing plate sample 20 is a polarizing laminate having a structure in which a polarizing film is bonded between the first base film and the second base film through an adhesive layer, the first base film and the second base film. It includes a protective film and a release film each adhered through an adhesive layer on.
The structure of such a polarizing plate sample 20 is substantially the same as that of the conventional polarizing plate shown in FIG. Of course, the polarizing plate sample 20 may further include other functional films between the first base film and the protective film and / or between the second base film and the release film.
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According to one aspect, the polarizing plate defect analysis method according to the present invention can proceed with the following process can be estimated with a high accuracy the position where the white point defect is generated and the cause of the process causing the white point defect.
First, a beam projector 30 is used to irradiate the polarizing plate sample 20 to form a first polarizing plate projection image on the screen 40. The first polarizing plate projection image is a projection image of the polarizing plate sample 20 in a finished state.
Subsequently, it is determined whether a white spot exists in the first polarizing plate projection image. If the white point is present, it means that a white point defect, which is relatively thicker than the other part of the thickness of the polarizing plate portion corresponding to the white point position, is generated in the polarizing plate.
If it is determined that a white point defect has occurred, the top protective film and its adhesive layer are removed together from the polarizing plate sample 20 to confirm whether the white point defect is caused by an increase in the local thickness of the adhesive layer coated on the protective film. do. At this time, the pressure-sensitive adhesive layer is removed with the protective film in a state coated on the protective film.
Subsequently, a beam is irradiated onto the polarizing plate sample 20 from which the protective film is removed by using a projection analysis method to obtain a second polarizing plate projection image on the screen. Then, it is determined whether a white point exists on the second polarizing plate projection image.
If the white spot disappears in the second polarizing plate projection image, the white spot defect is caused by a local thickness change in the pressure-sensitive adhesive layer of the protective film. On the contrary, if the white spot does not disappear in the second polarizing plate projection image, the white spot defect is formed in another material layer. It can be discriminated as having occurred.
If the white point disappears from the second polarizing plate projection image, the protective film removed from the polarizing plate sample 20 is irradiated with a beam to form a protective film projection image on the screen 40, and the protective film projection image Check for the existence of a white spot.
When the white spot is identified in the protective film projection image, particulate matter or gel-like solid matter is introduced into the pressure-sensitive adhesive layer coated on the protective film portion corresponding to the spot where the white spot is observed, and the thickness is partially thickened, resulting in a white spot defect. Can be determined.
FIG. 10 illustrates a state in which the thickness of the pressure-sensitive adhesive layer 27a is locally increased due to particulate foreign matter or gel-like solid matter introduced into the pressure-sensitive adhesive layer 27a of the protective film 21 (see dotted line). It is sectional drawing of the polarizing plate sample 20 shown.
In FIG. 10, reference numeral 23 denotes a polarizing film, reference numerals 22 and 24 denote first and second substrate films, reference numeral 21 denotes a protective film, reference numeral 25 denotes a release film, and reference numeral 26a and 26b represents an adhesive layer, and reference numerals 27a and 27b represent an adhesive layer.
On the other hand, if a white spot is confirmed in the second polarizing plate projection image, there is a possibility that a white spot defect occurs as the pressure-sensitive adhesive layer of the release film is locally increased in thickness. Therefore, the analysis process may be further performed.
First, the release film and its pressure-sensitive adhesive layer are sequentially removed from the polarizing plate sample 20 from which the protective film is removed, leaving only the polarizing laminate. Here, the polarizing laminate includes a first base film, a polarizing film and a second base film sequentially bonded through an adhesive layer.
Subsequently, a beam is irradiated onto the polarizing laminate to form a third polarizing plate projection image on the screen, and to determine whether a white spot exists in the third polarizing plate projection image.
If no white spot is observed in the third polarizing plate projection image, the white spot defect may be caused by a locally increased thickness of the pressure-sensitive adhesive layer in the process of adhering the release film.
On the other hand, if the white spot is observed in the third polarizing plate projection image, it can be seen that the white spot defect is caused by the locally increasing thickness of the adhesive layer included in the polarizing laminate.
If the white spot is not observed in the third polarizing plate projection image, the reflection process is used to reflect light onto the surface of the second base film to observe the presence or absence of irregularities on the reflective surface of the second base film. It is possible to indirectly estimate the cause of the white point defect caused by.
The reason why the projection analysis method is not directly applied to the release film removed from the second base film in order to check whether the white spot defect exists in the pressure-sensitive adhesive layer of the release film is that the adhesive layer is the release film when the release film is removed. Because it does not remain in.
For reference, when the release film is removed from the second base film, since the pressure-sensitive adhesive layer remains on the surface of the second base film, the pressure-sensitive adhesive layer is separately removed using a chemical solvent or a tape having a large adhesive strength. Therefore, unlike the protective film, it is difficult to apply the projection analysis method to the release film.
According to one aspect, when there is no white point in the third polarizing plate projection image and when the reflection surface of the second substrate film is observed through the reflection analysis method, if the concave or convex irregularities do not exist on the reflection surface, the release film is In the process of adhering to the second base film, it is possible to determine that a white spot defect is generated by locally increasing the thickness of the pressure-sensitive adhesive layer due to the inflow of particulate matter or a solid on the gel into the pressure-sensitive adhesive layer coated at the spot where the white spot is observed. .
FIG. 11 illustrates a state in which the thickness of the pressure-sensitive adhesive layer 27b is locally increased (see dotted circle) due to particulate foreign matter or gel-like solid matter introduced into the pressure-sensitive adhesive layer 27b of the release film 25. It is sectional drawing of the polarizing plate sample 20 shown.
According to another aspect, if white spots do not exist in the third polarizing plate projection image and concave-convexities are identified on the surface of the second base film, the first base film and the second base film may be a polarizing film to form a polarizing laminate. It can be determined that a white point defect is generated by an external press applied to the polarizing laminate after the adhesive layer used to adhere to the cured layer is completely cured. The external depression may be applied by a conveying roller used to convey the polarizing laminate or by a core rod used to wind the polarizing laminate in the form of a roll. For reference, if an external force is applied to the polarizing laminate after the adhesive layer included in the polarizing laminate is completely cured, the thickness of the polarizing laminate does not change substantially depending on the position even if a pressed mark occurs on the surface.
When concave and convexities are formed on the surface of the second base film by the external pressing, the thickness of the pressure-sensitive adhesive layer is locally increased in the concave and convex portions while the adhesive is coated on the surface of the second base film for adhesion of the release film. This creates a white point defect. In this case, the process section in which the white point defect is generated may be limited to that after the curing of the adhesive layer included in the polarizing laminate is completed, before the adhesive layer is coated on the surface of the second base film.
Meanwhile, the pressure-sensitive adhesive layer for adhesion of the release film may be coated on the release film instead of the second base film. In this example, when the release film coated with the pressure-sensitive adhesive layer is attached to the surface of the second base film having the concave-convex irregularities caused by external pressing, the thickness of the pressure-sensitive adhesive layer is locally increased at the part of the concave-convex uneven surface of the second base film. Thus, white point defects may occur. In this case, the process section in which the white point defect is generated may be limited to after attaching the release film coated with the pressure-sensitive adhesive layer to the surface of the second base film after the curing of the adhesive layer included in the polarizing laminate is completed.
12 is a pressure-sensitive adhesive layer used to adhere the release film 25 by generating concave-convex irregularities in the pressed portion by pressing the polarizing laminates 22, 23, and 24 in which the adhesive layers 26a, 26b are completely cured by external force. It is sectional drawing of the polarizing plate sample 20 which showed the state in which the thickness of (27b) increased locally in a concave-convex concave-convex part (refer to a dotted line part), and a white point defect was produced.
According to the present invention, when a white spot is confirmed in all of the first polarizing plate projection image, the second polarizing plate projection image, and the third polarizing plate projection image, the thickness of the adhesive layer included in the polarizing laminate is locally increased to prevent the white spot defect. It can be determined that it has occurred and can proceed further with the following steps.
That is, by reflecting light on the surface of the second base film of the polarizing laminate from which the protective film and the release film have been removed, it is determined whether convex and convexities due to the increase in the thickness of the adhesive layer are present on the reflective surface.
If above When it is confirmed that convex irregularities are present on the reflective surface of the first substrate film or the second substrate film, the site where the convex irregularities are present is observed under an optical microscope. At this time, when particulate foreign matter or gel-like solid matter is observed at the site where the convex irregularities are present through the optical microscope, the adhesive layer is formed by the particulate foreign matter or gel-like solid matter contained in the adhesive layer included in the polarizing laminate. It can be determined that the thickness increased locally, resulting in white spot defects.
On the other hand, if a particulate foreign matter or a gel-like solid material is not observed at the site where the convex irregularities are present through the optical microscope, the adhesive layer is thickened at the site of the pressed mark due to the presence of pressed marks on the raw film constituting the polarizing laminate. It can be determined that the coating locally increases the thickness of the adhesive layer resulting in white spot defects.
FIG. 13 illustrates an adhesive layer of a portion in which particulate foreign matter flows into the adhesive layer 26b and foreign matter flows in the process of bonding the first base film 22 and the second base film 24 to the polarizing film 23. 26b) A cross-sectional view of a polarizing plate sample 20 showing a state where the thickness increases locally and a white point defect is generated. In the polarizing plate sample 20 having the cross-sectional structure illustrated in FIG. 13, when the reflective surface is observed by irradiating light on the surface of the second base film 24, convex unevenness is observed at a portion where foreign matter is introduced.
14 is pressed when the first base film 22 and the second base film 24 are convex downward in the raw film itself of the second base film 24 in the process of being bonded to the polarizing film 23. It is sectional drawing of the polarizing plate sample 20 which showed the state which the thickness of the adhesive bond layer 26b locally increased, and a white-point defect generate | occur | produced. In the polarizing plate sample 20 illustrated in FIG. 14, when the reflective surface is observed by irradiating light on the surface of the second base film 24, convex unevenness is observed in a portion where the raw film is pressed.
As described above, the presence of white spots is observed in the first polarizing plate projection image, the second polarizing plate projection image, the third polarizing plate projection image, or the protective film projection image using the projection analysis method, and the first substrate film using the reflection analysis method. And by checking the irregularities on the reflective surface of the second substrate film, it is possible to estimate with high accuracy the position and the cause process of the material layer causing the local thickness increase of the polarizing plate sample.
Next, a process of analyzing black spot defects using the polarizing plate defect analysis method according to the present invention will be described in detail.
<About the spot defect analysis Example >
First, a beam is irradiated onto a polarizing plate sample 20 using a projection analysis method to form a first polarizing plate projection image on a screen. Then, when black spots are identified in the first polarizing plate projection image, it may be determined that black spot defects having a relatively reduced cross-sectional thickness occur in the region of the polarizing plate sample 20 corresponding to the positions of the black spots.
When it is determined that black spot defects are generated in the polarizing plate sample 20, the black spot defect is formed on the upper portion of the polarizing plate sample 20 to confirm whether the black spot defect is caused by a locally reduced thickness of the adhesive layer coated on the protective film. The adhesive layer is removed together.
Then, a second polarizing plate projection image is formed on the screen by transmitting a beam through the polarizing plate sample 20 from which the protective film is removed, and it is checked whether black spots exist in the second polarizing plate projection image.
If a black spot is not identified in the second polarizing plate projection image, a black spot defect may be generated due to a local decrease in thickness of the pressure-sensitive adhesive layer of the protective film. Thus, the protective film is irradiated with the beam to form a protective film projection image on the screen 40, and to observe the presence of black spots in the protective film projection image.
When black spots are observed in the protective film projection image, light is emitted to the surface of the protective film exposed to the outside or the pressure-sensitive adhesive layer coated on the protective film to observe whether irregularities are present on the protective film reflective surface or the pressure-sensitive adhesive layer reflective surface.
If concave-convexity is confirmed on the protective film reflective surface, the pressure-sensitive adhesive of the protective film at the point where the protective film is pressed by an external force after the protective film is adhered to the first base film of the polarizing laminate. It can be determined that the layer thickness becomes relatively thin resulting in sunspot defects.
On the other hand, if concave-convexity is confirmed on the pressure-sensitive adhesive layer, the pressure-sensitive adhesive at the point where the pressure-sensitive adhesive layer is pressed by external force before the pressure-sensitive adhesive layer is completely cured after being coated on the pressure-sensitive adhesive surface of the protective film during the manufacturing process of the protective film itself. It can be determined that the thickness of the layer becomes relatively thin, resulting in sunspot defects.
15 is a thickness of the pressure-sensitive adhesive layer (27a) coated on the portion in the process of pressing the surface of the protective film 21 by the external force after the protective film 21 is adhered to the polarizing laminate (22, 23, 24) ? It is sectional drawing of the polarizing plate sample 20 which showed the state which became dark and a black spot defect occurred.
FIG. 16 shows that the pressure-sensitive adhesive layer 27a coated on the lower surface of the protective film 21 is pressed by external force during the manufacturing process of the protective film 21, and the protective film 21 is a polarizing laminate 22. , 23, 24 is a cross-sectional view of a polarizing plate sample 20 showing a state in which a black spot defect occurs due to a relatively thin thickness of the polarizing plate centered on the pressed portion and adhered to the first base film 22.
On the other hand, if the black spot does not disappear in the projection image of the second polarizing plate, to analyze whether a black spot defect has occurred due to the locally reduced thickness of the adhesive layer used to adhere the release film to the second base film of the polarizing laminate. You can further proceed with steps such as:
That is, when black spots exist in the second polarizing plate projection image, the release film and the pressure-sensitive adhesive layer thereof are sequentially removed from the second base film of the polarizing laminate to obtain a polarizing laminate. At this time, since the pressure-sensitive adhesive layer is not removed together with the release film, a chemical solvent or an adhesive tape having a large adhesive strength can be used for the removal thereof.
Subsequently, the polarizing laminate from which the release film has been removed is irradiated again to form a third polarizing plate projection image on the screen, and to observe the presence of black spots in the third polarizing plate projection image.
If the black spot disappears from the third polarizing plate projection image, it may be estimated that the thickness of the pressure-sensitive adhesive layer of the release film is locally reduced to cause a black spot defect. Therefore, the irregularities formed on the reflective surface of the second base film exposed to the outside through the reflection analysis method can determine the cause of the locally reduced pressure-sensitive adhesive layer thickness.
For reference, since the adhesive layer does not remain in the release film, it is difficult to apply the projection analysis method to the release film. Therefore, whether or not the thickness of the release film changes with respect to the pressure-sensitive adhesive layer utilizes an indirect analysis method of observing irregularities on the surface of the second base film.
According to one aspect, it is checked whether concave-convex irregularities exist on the second substrate film reflection surface. If concave and convexity exists on the reflective surface of the second base film, the release film is adhered to the second base film and then the release film is pressed by an external force, and the trace is concave and convex on the surface of the second base film. Remains in the form of and the thickness of the pressure-sensitive adhesive layer between the release film and the second substrate film is relatively thin, it can be determined that a black spot defect occurred at the corresponding site.
FIG. 17 shows a second base film in a process in which the surface of the release film 25 is pressed by an external force after the release film 25 is adhered to the second base film 24 of the polarizing laminates 22, 23, and 24. It is sectional drawing of the polarizing plate sample 20 which shows the state which the trace of pressing remains also in the form of concave convex-convex on the surface of (24), and the thickness of the adhesive layer 27b coated on this part was also reduced, and a black spot defect occurred.
According to another aspect, when convex convex and convexities are observed on the second substrate film reflecting surface, the convex convex and convexities are formed on the polarizing laminate by an external force after curing of the adhesive layer of the polarizing laminate is completely completed, and the second substrate film In the process of applying the pressure-sensitive adhesive layer to the thickness of the pressure-sensitive adhesive layer applied to the convex concave-convex portion is relatively thin, it can be determined that a black spot defect has occurred.
FIG. 18 shows that convex irregularities are formed in the process of pressing the polarizing laminates 22, 23 and 24 by external force after the curing of the adhesive layers 26a and 26b included in the polarizing laminates 22, 23 and 24 is completely completed. It is sectional drawing of the polarizing plate sample 20 which showed the state which the thickness of the adhesive layer 27b formed in each film of the polarizing laminated bodies 22, 23, and 24 coated on the said part became, and a black spot defect generate | occur | produced.
On the other hand, if black spots do not disappear in all of the first polarizing plate projection image, the second polarizing plate projection image, and the third polarizing plate projection image, the black spot defect is caused by a locally reduced thickness of the adhesive layer included in the polarizing laminate. It can be seen as.
Therefore, the present invention can further analyze the cause of the occurrence of dark spot defects caused by the local thickness change of the adhesive layer by further proceeding the analysis process as follows.
That is, when black spots exist in the third polarizing plate projection image, light is irradiated to the surface of the second base film exposed to the outside through a reflection analysis method to observe whether concave-convex irregularities exist on the reflective surface of the second base film.
If concave and convexities having the same period are observed on the second substrate film reflecting surface, the concave and convexities are pressed by an external force (for example, by a rotating feed roller) before the adhesive layer of the polarizing laminate is completely cured. It can be determined that the irregularities are formed at the same period and the thickness of the adhesive layer at the position corresponding to the concave and convexities is relatively thin, resulting in the occurrence of black spot defects at the same period.
19 is pressed in the process of being pressed by a roller for conveying the polarizing laminates 22, 23, 24 before the curing of the adhesive layers 26a, 26b included in the polarizing laminates 22, 23, 24 is completely completed. It is sectional drawing of the polarizing plate sample 20 which showed the state where a part of adhesive bond layer 26b became thin and a black spot defect generate | occur | produced. The portion whose thickness of the adhesive layer 26b is thin is periodically repeated by the rotation of the transfer roller, and is observed in the form of concave and convex irregularities periodically repeated on the surface of the second base film 24.
On the other hand, if concave-convex irregularities with increasing or decreasing repetition periods are observed on the second substrate film reflecting surface, some of the raw film itself constituting the polarizing laminate is pressed by a core rod and coated on the corresponding site. It can be determined that the thickness of the adhesive layer is large and black spot defects are generated.
Pressing by the core rod is applied to the film to be wound or unwinded as the core rod rotates, so that the pitch of the pressed position may gradually increase or decrease. Therefore, when concave-convex irregularities with increasing or decreasing repetition periods are observed on the second substrate film reflecting surface, pressing is applied through the core rod to the raw material film constituting the polarizing laminate and the adhesive layer coated on the pressed part. It can be determined that the thickness of is reduced locally to cause sunspot defects.
As described above, the presence of black spots in the first polarizing plate projection image, the second polarizing plate projection image, the third polarizing plate projection image, or the protective film projection image using the projection analysis method, and the first substrate film using the reflection analysis method And by checking the irregularities on the reflective surface of the second substrate film, it is possible to estimate with high accuracy the position and the cause process of the material layer that caused the local thickness reduction of the polarizing plate sample.
Although the present application has been described by way of limited embodiments and drawings, the present application is not limited thereto and will be described below by the person skilled in the art and the technical spirit of the present application. Of course, various modifications and variations are possible within the scope of the claims.

Claims (14)

  1. A polarizing laminate comprising a polarizing film, a first base film and a second base film bonded to upper and lower surfaces of the polarizing film through first and second adhesive layers, respectively, and first and second adhesive layers In the defect analysis method of the polarizing plate having a protective film and a release film adhered on the first substrate film and the second substrate film through each,
    Projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image;
    Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; And
    And projecting a beam onto the removed protective film to obtain a protective film projection image.
    When a white spot is observed in the first polarizing plate projection image and the protective film projection image and no white spot is observed in the second polarizing plate projection image, the thickness of the first adhesive layer is locally increased at the point where the white spot is observed. The defect analysis method of the polarizing plate characterized by determining that a white point defect has arisen.
  2. The method of claim 1,
    The first adhesive layer is a defect analysis method of the polarizing plate, characterized in that the particulate matter or gel-like solid matter is introduced into the first adhesive layer and the thickness is locally increased to cause the white spot defect.
  3. A polarizing laminate comprising a polarizing film, a first base film and a second base film bonded to upper and lower surfaces of the polarizing film through first and second adhesive layers, respectively, and first and second adhesive layers In the defect analysis method of the polarizing plate having a protective film and a release film adhered on the first substrate film and the second substrate film through each,
    Projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image;
    Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed;
    Sequentially removing the release film and the second adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And
    Including convex or concave irregularities on the surface of the second substrate film through a reflection analysis method;
    If the white spot is observed in the first polarizing plate projection image and the second polarizing plate projection image, and no white spot is observed in the third polarizing plate projection image, and no convex or concave irregularities are observed on the surface of the second substrate film, the white spot is Determination method of the polarizing plate, characterized in that the thickness of the second adhesive layer at the observed point locally determines that the white point defect occurred.
  4. The method of claim 3,
    The second adhesive layer is a defect analysis method of the polarizing plate, characterized in that the particulate matter or gel-like solid matter flows into the second adhesive layer to determine that the white spot defect has occurred by locally increasing the thickness.
  5. A polarizing laminate comprising a polarizing film, a first base film and a second base film bonded to upper and lower surfaces of the polarizing film through first and second adhesive layers, respectively, and first and second adhesive layers In the defect analysis method of the polarizing plate having a protective film and a release film adhered on the first substrate film and the second substrate film through each,
    Projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image;
    Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed;
    Removing the release film and the second adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And
    Including convex irregularities on the surface of the second substrate film through a reflection analysis method;
    When a white spot is observed in the first polarizing plate projection image, the second polarizing plate projection image, and the third polarizing plate projection image and convex irregularities are observed on the surface of the second base film, the first adhesive agent is observed at the point where the white spot is observed. Determination method of the polarizing plate, characterized in that the thickness of the layer or the second adhesive layer is locally increased to determine that a white point defect occurs.
  6. The method of claim 5,
    Observing the convex-convex portions on the surface of the second base film through an optical microscope; And
    When a particulate foreign matter or a solid on a gel is identified at the convex convex and convex portions, it is determined that the thickness of the first adhesive layer or the second adhesive layer is locally increased by the foreign matter or the solid, thereby causing the white spot defect. ,
    If a particulate foreign matter or a solid on a gel is not identified at the convex convex and convex portions, the thickness of the first adhesive layer or the second adhesive layer is locally reduced by pressing at least one of the films constituting the polarizing laminate. And increasing the determining that the white point defect has occurred.
  7. A polarizing laminate comprising a polarizing film, a first base film and a second base film bonded to upper and lower surfaces of the polarizing film through first and second adhesive layers, respectively, and first and second adhesive layers In the defect analysis method of the polarizing plate having a protective film and a release film adhered on the first substrate film and the second substrate film through each,
    Projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image;
    Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed; And
    And projecting a beam onto the removed protective film to obtain a protective film projection image.
    If black spots are observed in the first polarizing plate projection image and the protective film projection image and no black spots are observed in the second polarizing plate projection image, the thickness of the first adhesive layer is locally reduced at the point where the black spots are observed. The defect analysis method of the polarizing plate characterized by determining that a black spot defect has arisen.
  8. The method of claim 7, wherein
    Observing whether concave-convex irregularities exist on the surface of the removed protective film through reflection analysis; And
    When the concave-convex irregularities are observed, the thickness of the first adhesive layer is locally reduced due to the pressing of the protective film by external force after the protective film is adhered to the first base film, thereby determining that the black spot defect has occurred. Defect analysis method of the polarizing plate further comprising ;.
  9. The method of claim 7, wherein
    Observing whether concave-convex irregularities exist on the surface of the first adhesive layer coated on the removed protective film by reflection analysis; And
    When the concave-convex irregularities are observed, the thickness of the first adhesive layer is locally reduced due to the pressing applied to the first adhesive layer coated on the protective film during the manufacturing process of the protective film, thereby determining that the black spot defect has occurred. The defect analysis method of the polarizing plate further comprising.
  10. A polarizing laminate comprising a polarizing film, a first base film and a second base film bonded to upper and lower surfaces of the polarizing film through first and second adhesive layers, respectively, and first and second adhesive layers In the defect analysis method of the polarizing plate having a protective film and a release film adhered on the first substrate film and the second substrate film through each,
    Projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image;
    Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed;
    Sequentially removing the release film and the second adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And
    Including convex or concave irregularities on the surface of the second substrate film through a reflection analysis method;
    If black spots are observed in the first polarizing plate projection image and the second polarizing plate projection image, and no black spots are observed in the third polarizing plate projection image, and concave-convex irregularities are observed on the surface of the second base film, the release film may be 2, the thickness of the second adhesive layer is locally reduced by the pressing of the release film at the point where the concave-convex irregularities are observed after being adhered to the base film, or a black spot defect is determined.
    When black spots are observed in the first polarizing plate projection image and the second polarizing plate projection image and no black spots are observed in the third polarizing plate projection image, and convex irregularities are observed on the surface of the second base film, the polarizing laminate is included in the polarizing laminate. A method for analyzing a defect of a polarizing plate, characterized in that the black spot defect is generated by pressing of the polarizing laminate at a point where the convex unevenness is observed after the adhesive layer is completely cured.
  11. A polarizing laminate comprising a polarizing film, a first base film and a second base film bonded to upper and lower surfaces of the polarizing film through first and second adhesive layers, respectively, and first and second adhesive layers In the defect analysis method of the polarizing plate having a protective film and a release film adhered on the first substrate film and the second substrate film through each,
    Projecting a beam onto the polarizing plate to obtain a first polarizing plate projection image;
    Removing the protective film from the polarizing plate with the first adhesive layer coated thereon to obtain a second polarizing plate projection image by projecting a beam onto the polarizing plate while the first base film is exposed;
    Removing the release film and the first adhesive layer from the polarizing plate to project a beam onto the polarizing plate while the second base film is exposed to obtain a third polarizing plate projection image; And
    Including convex or concave irregularities on the surface of the second substrate film through a reflection analysis method;
    When black spots are observed in the first polarizing plate projection image, the second polarizing plate projection image, and the third polarizing plate projection image and concave and convex irregularities are observed on the surface of the second base film, the polarization lamination is performed at the point where the concave and concave and convexities are observed. Defect analysis method of the polarizing plate, characterized in that it is determined that a black spot defect occurs due to the local thickness reduction of the first adhesive layer or the second adhesive layer contained in the sieve.
  12. The method of claim 11,
    If concave and convexities are repeated on the surface of the second base film with the same period, by the periodic pressing applied by the transfer roller before the first adhesive layer or the second adhesive layer contained in the polarizing laminate is completely cured. And the thickness of the first adhesive layer or the second adhesive layer is locally reduced at the point where the concave-convex irregularities are observed, thereby determining that the black spot defect has occurred.
  13. The method of claim 11,
    If the concave-convex irregularities are repeated with a period on the surface of the second base film and the period is gradually increased or decreased, at least one of the films constituting the polarizing laminate is periodically pressed by a rotating core rod. The defect analysis method of the polarizing plate characterized by determining that the said black spot defect generate | occur | produced.
  14. The method of claim 11,
    If the concave-convex irregularities are repeated with a period on the surface of the second base film and the period is gradually increased or decreased, at least one of the films constituting the polarizing laminate is wound on a rotating core rod and the film; A method for analyzing defects of a polarizing plate, characterized in that the dark spot defect is determined by being pressed by foreign matter particles introduced between films.
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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100882252B1 (en) 2006-07-03 2009-02-06 올림푸스 가부시키가이샤 Semiconductor substrate defects detection device and method of detection of defects

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10307206A (en) * 1997-05-06 1998-11-17 Sony Corp Manufacture of polarizing plate
JP2004198163A (en) * 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd Defect inspection method for protective film adhered polarizing plate
KR20140089201A (en) * 2013-01-04 2014-07-14 동우 화인켐 주식회사 Method of detecting embossed defect and transmissive optical inspection device using the same
KR101587222B1 (en) * 2013-04-15 2016-01-20 주식회사 엘지화학 Apparatus for detecting alien substance for optical film
KR20150007719A (en) * 2013-07-12 2015-01-21 동우 화인켐 주식회사 Inspecting method for polarizing plate

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100882252B1 (en) 2006-07-03 2009-02-06 올림푸스 가부시키가이샤 Semiconductor substrate defects detection device and method of detection of defects

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