KR101996505B9 - 센서 신호 처리 장치 및 이를 포함하는 리드아웃 회로부 - Google Patents

센서 신호 처리 장치 및 이를 포함하는 리드아웃 회로부

Info

Publication number
KR101996505B9
KR101996505B9 KR1020130074535A KR20130074535A KR101996505B9 KR 101996505 B9 KR101996505 B9 KR 101996505B9 KR 1020130074535 A KR1020130074535 A KR 1020130074535A KR 20130074535 A KR20130074535 A KR 20130074535A KR 101996505 B9 KR101996505 B9 KR 101996505B9
Authority
KR
South Korea
Prior art keywords
processing device
signal processing
sensor signal
integrated circuit
readout integrated
Prior art date
Application number
KR1020130074535A
Other languages
English (en)
Other versions
KR101996505B1 (ko
KR20150001386A (ko
Inventor
전영득
조민형
김이경
Original Assignee
한국전자통신연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 한국전자통신연구원 filed Critical 한국전자통신연구원
Priority to KR1020130074535A priority Critical patent/KR101996505B1/ko
Priority to US14/179,508 priority patent/US9395213B2/en
Publication of KR20150001386A publication Critical patent/KR20150001386A/ko
Application granted granted Critical
Publication of KR101996505B1 publication Critical patent/KR101996505B1/ko
Publication of KR101996505B9 publication Critical patent/KR101996505B9/ko

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00Baseband systems
    • H04L25/02Details ; arrangements for supplying electrical power along data transmission lines
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/24Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analogue/Digital Conversion (AREA)
KR1020130074535A 2013-06-27 2013-06-27 센서 신호 처리 장치 및 이를 포함하는 리드아웃 회로부 KR101996505B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020130074535A KR101996505B1 (ko) 2013-06-27 2013-06-27 센서 신호 처리 장치 및 이를 포함하는 리드아웃 회로부
US14/179,508 US9395213B2 (en) 2013-06-27 2014-02-12 Sensor signal processing device and readout integrated circuit including the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020130074535A KR101996505B1 (ko) 2013-06-27 2013-06-27 센서 신호 처리 장치 및 이를 포함하는 리드아웃 회로부

Publications (3)

Publication Number Publication Date
KR20150001386A KR20150001386A (ko) 2015-01-06
KR101996505B1 KR101996505B1 (ko) 2019-10-01
KR101996505B9 true KR101996505B9 (ko) 2022-07-06

Family

ID=52115002

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020130074535A KR101996505B1 (ko) 2013-06-27 2013-06-27 센서 신호 처리 장치 및 이를 포함하는 리드아웃 회로부

Country Status (2)

Country Link
US (1) US9395213B2 (ko)
KR (1) KR101996505B1 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102286344B1 (ko) 2015-05-13 2021-08-09 한국전자통신연구원 아날로그-디지털 변환 장치 및 아날로그-디지털 변환 장치의 동작 방법
KR102501067B1 (ko) 2016-12-15 2023-02-21 한국전자통신연구원 마그네틱 센싱과 터치 센싱을 이용한 조명 제어 스위치 및 이를 이용한 방법
KR101949390B1 (ko) * 2017-07-20 2019-05-08 울산과학기술원 멀티 센싱 리드아웃 회로
KR102014220B1 (ko) * 2018-05-11 2019-08-26 재단법인대구경북과학기술원 복수의 센서의 센싱 신호를 디지털 값으로 변환하는 가변 가능한 디지털 컨버터

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5099239A (en) * 1989-09-21 1992-03-24 Xerox Corporation Multi-channel analogue to digital convertor
US7911456B2 (en) * 1992-06-08 2011-03-22 Synaptics Incorporated Object position detector with edge motion feature and gesture recognition
JP2000213908A (ja) * 1998-11-16 2000-08-04 Sony Corp 静電容量検出装置およびその検査方法並びに指紋照合装置
KR100295622B1 (ko) 1999-08-26 2001-07-12 신현준 진동/온도 복합센서
US7906826B2 (en) * 2002-02-05 2011-03-15 E-Phocus Many million pixel image sensor
KR20040095920A (ko) * 2003-04-29 2004-11-16 매그나칩 반도체 유한회사 지역적응 영상강화기법을 이용한 정전용량식지문감지센서의 단위화소 및 그를 이용한 지문감지장치
KR100782463B1 (ko) * 2005-04-13 2007-12-05 (주)실리콘화일 3차원 구조를 갖는 이미지 센서의 분리형 단위화소 및 그제조방법
EP1971129A1 (en) * 2007-03-16 2008-09-17 STMicroelectronics (Research & Development) Limited Improvements in or relating to image sensors
US8063350B2 (en) * 2007-08-03 2011-11-22 Cognex Corporation Circuits and methods allowing for pixel array exposure pattern control
EP2177880A1 (en) * 2008-10-16 2010-04-21 Dialog Imaging Systems GmbH Distance measurement with capacitive sensor
WO2010073598A1 (ja) * 2008-12-24 2010-07-01 パナソニック株式会社 平衡信号出力型センサー
CN109449171A (zh) * 2010-06-30 2019-03-08 生命科技公司 用于检测和测量化学反应和化合物的晶体管电路
US8854064B2 (en) * 2011-07-15 2014-10-07 Texas Instruments Incorporated Touch sensing method and apparatus
TW201315977A (zh) * 2011-10-05 2013-04-16 Ind Tech Res Inst 感測器陣列的讀取裝置與讀取方法

Also Published As

Publication number Publication date
US20150002216A1 (en) 2015-01-01
KR101996505B1 (ko) 2019-10-01
US9395213B2 (en) 2016-07-19
KR20150001386A (ko) 2015-01-06

Similar Documents

Publication Publication Date Title
TWI563645B (en) Imaging sensor system and integrated circuit system
IL245964B (en) A low noise detector and a test system that uses a low noise detector
EP3032822A4 (en) Imaging device and electronic device
GB2530468B (en) Magnet sensing device and process
TWI563503B (en) Semiconductor memory device and system including the same
EP2963917A4 (en) IMAGING ELEMENT AND ELECTRONIC DEVICE THEREFOR
TWI562142B (en) Storage element, storage device, and signal processing circuit
EP2993442A4 (en) Sensor device and electronic apparatus
EP2972171A4 (en) REACTIVE DEVICE WITH SENSORS
HK1207416A1 (en) Micro-hotplate device and sensor comprising such micro-hotplate device
EP2963491A4 (en) AGITATION QUANTITY DETECTION DEVICE AND IMAGING DEVICE
EP2963428A4 (en) CURRENT SENSOR AND ELECTRONIC DEVICE CONTAINING SAME
EP2998837A4 (en) DETECTION SENSOR FOR A DISPLAY DEVICE AND DETECTION DEVICE FOR A DISPLAY DEVICE
EP3078061A4 (en) Semiconductor device and semiconductor circuit including the device
EP3214648A4 (en) Sensing chip encapsulation component and electronic device with same
EP3074100A4 (en) Contact sensing device and system
EP3024273A4 (en) SIGNAL MEASUREMENT METHOD AND DEVICE
HK1202985A1 (en) Image sensor and imaging device
SG11201707285TA (en) Semiconductor device and image sensor module
EP3092721A4 (en) Sensor device and electronic device having the same
EP2942955A4 (en) Video signal processing method and apparatus
IL249034A0 (en) Integrated readout circuit with integrated compressive sensing
EP3276314A4 (en) Electronic device and pyroelectric sensor
EP3012971A4 (en) AMPLIFIER CIRCUIT AND AMPLIFIER CIRCUIT SCHIP
EP2975417A4 (en) MEASURING DEVICE AND MOUNTING UNIT

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
G170 Re-publication after modification of scope of protection [patent]