KR101637327B1 - Light emitting device package, backlight unit, lighting device and its manufacturing method - Google Patents
Light emitting device package, backlight unit, lighting device and its manufacturing method Download PDFInfo
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- KR101637327B1 KR101637327B1 KR1020150068232A KR20150068232A KR101637327B1 KR 101637327 B1 KR101637327 B1 KR 101637327B1 KR 1020150068232 A KR1020150068232 A KR 1020150068232A KR 20150068232 A KR20150068232 A KR 20150068232A KR 101637327 B1 KR101637327 B1 KR 101637327B1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8138—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/81385—Shape, e.g. interlocking features
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15151—Shape the die mounting substrate comprising an aperture, e.g. for underfilling, outgassing, window type wire connections
Abstract
Description
BACKGROUND OF THE
A light emitting diode (LED) is a kind of semiconductor device that can emit light of various colors by forming a light emitting source through the formation of a PN diode of a compound semiconductor. Such a light emitting device has a long lifetime, can be reduced in size and weight, and can be driven at a low voltage. In addition, these LEDs are resistant to shock and vibration, do not require preheating time and complicated driving, can be packaged after being mounted on a substrate or lead frame in various forms, so that they can be modularized for various purposes and used as a backlight unit A lighting device, and the like.
In a conventional light emitting device package, when a flip chip type light emitting device is mounted on a substrate such as a lead frame or a PCB, solder paste is applied to the first electrode and the second electrode of the substrate, And then performing a series of processes of reflowing and fusing.
However, conventional solder paste is generally a method of mixing a vaporizable flux into a conductive bonding medium, in which the flux is reflowed and the overall volume is reduced. As a result, the solder paste is first Silicon or a phosphor having weak adhesive strength, which is a filler for reflecting cup parts, penetrates to weaken the adhesive force between the light emitting element and the substrate. Second, bubbles are formed in the empty space between the light emitting element and the electrode separating line, Further, the adhesive force between the light emitting device and the substrate is weakened, and a sufficient underfill effect can not be obtained, thereby deteriorating the durability of the product.
Disclosure of Invention Technical Problem [8] Accordingly, the present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide an epoxy solder which can be melted first and the bonding medium can be melted later, A light emitting device package capable of omitting a separate underfilling process by using an epoxy solder paste and being applicable to a microprocessing and greatly improving the adhesion between parts to maximize the durability of the product, And a method of manufacturing the light emitting device package. However, these problems are exemplary and do not limit the scope of the present invention.
According to an aspect of the present invention, there is provided a method of manufacturing a light emitting device package, the method comprising: forming a first electrode on one side and a second electrode on the other side of the electrode separation line, A method of manufacturing a semiconductor device, comprising: preparing a substrate having a molding material; Applying a mixed paste to the first electrode and the second electrode of the substrate, the mixed paste being a mixture of a bonding medium, which is a conductive material, and an underfill medium, which is an insulating material; Placing a light emitting device in the form of a flip chip so that the first pad and the second pad are seated on the mixed paste; And a reflow step of reflowing the mixed paste, wherein in the reflow step, the underfill medium is melted in a state where the bonding medium of the mixed paste is not melted, so that the resin affinity with the molding material Heating the mixed paste to a temperature equal to or higher than a melting point of the underfill medium so that the mixed paste can be flowed along the upper surface of the electrode separation line by the heating means while melting the underfill medium only through the upper surface of the electrode separation line An underfill media melting step for maintaining a temperature condition for the underfill media; And a step of mixing the bonding paste so that the bonding medium is melted and agglomerated by the metal affinity between the first pad and the first electrode and between the second pad and the second electrode among the mixed paste. And a bonding medium melting step of heating the bonding medium to a temperature higher than a melting point of the bonding medium higher than a melting point of the underfill medium.
In addition, according to the present invention, the bonding medium includes a solder powder having a first melting point and a first viscosity at melting, the underfill medium having a second melting point lower than the first melting point, 1, and the mixed paste may be an epoxy solder paste in which the solder powder and the epoxy-based resin are mixed with each other.
According to the present invention, the solder powder is in the form of a powder having a size of 5 micrometers to 15 micrometers so that the movement of the epoxy-based resin during flow can be restricted. The material of the solder powder is high in viscosity and high in metal affinity 2.8 to 3.2% by weight of silver (Ag), 0.3 to 0.7% by weight of copper (Cu), and the balance of tin (Sn).
Further, according to the present invention, the underfill medium melting step may include: a preheating step of preheating the mixed paste for a first time so that the mixed paste can be sufficiently heated; An underfill melting step of heating the mixed paste to a temperature higher than the melting point of the underfill medium and lower than a melting point of the bonding medium for a second time so that the underfill medium is melted in the mixed paste; And an underfill flow step for heating the mixed paste to a temperature higher than the melting point of the underfill medium and lower than the melting point of the bonding medium for a third time such that the molten underfill medium can flow sufficiently along the upper surface of the electrode separation line ; . ≪ / RTI >
In addition, according to the present invention, the bonding medium melting step may include melting the bonding medium contained in the molten underfill medium to melt the bonding medium between the first pad and the first electrode, And heating the mixed paste to a temperature not lower than a melting point of the bonding medium for a fourth time so that the mixed paste can be agglomerated between the first electrode and the second electrode. And a slow cooling step of slowly cooling the underfill medium and the bonding medium for a fifth time period in order to prevent cracks and thermal stresses due to abrupt temperature change upon discharge at normal temperature.
According to another aspect of the present invention, there is provided a light emitting device package comprising: a first electrode formed on one side of an electrode separation line, a second electrode formed on the other side of the electrode separation line, A substrate having a molding material; A first pad and a second pad are formed on the lower surface of the substrate, the first pad is electrically connected to the first electrode, and the flip- Chip type light emitting device; Wherein the first pad is electrically connected to the first electrode and the second pad and the second electrode are electrically connected to each other, the first pad has a first melting point, and when melted over the first melting point, A bonding medium having a metal affinity to be agglomerated between the first electrodes and between the second pad and the second electrode, and having a first viscosity when melted; And a second electrode having a second melting point lower than the first melting point and being coated on the first electrode and the second electrode together with the bonding medium and having a temperature higher than the second melting point and lower than the first melting point Has a resin affinity with respect to the molding material so as to flow in the direction of the electrode separation line while the melting temperature is maintained during melting and can be underfilled between the light emitting device and the electrode separation line, and has a second viscosity / RTI > underfill media.
According to the present invention, the underfill medium includes an epoxy-based resin having a high resin affinity with the molding material, and the bonding medium contains 2.8 to 3.2% by weight of silver, 0.3 to 0.7% by weight of copper ) And the remainder is tin (Sn).
According to the present invention, in the substrate, an alignment protrusion or a bonding medium receiving groove is formed at a position corresponding to the first pad and the second pad of the light emitting device so that the optical axis of the light emitting device can be aligned .
According to another aspect of the present invention, there is provided a backlight unit including a first electrode formed on one side of a first electrode and a second electrode formed on a second side of the first electrode, A substrate having a molding material; A first pad and a second pad are formed on the lower surface of the substrate, the first pad is electrically connected to the first electrode, and the flip- Chip type light emitting device; Wherein the first pad is electrically connected to the first electrode and the second pad and the second electrode are electrically connected to each other, the first pad has a first melting point, and when melted over the first melting point, A bonding medium having a metal affinity to be agglomerated between the first electrodes and between the second pad and the second electrode, and having a first viscosity when melted; And a second electrode having a second melting point lower than the first melting point and being coated on the first electrode and the second electrode together with the bonding medium and having a temperature higher than the second melting point and lower than the first melting point Has a resin affinity with respect to the molding material so as to flow in the direction of the electrode separation line while the melting temperature is maintained during melting and can be underfilled between the light emitting device and the electrode separation line, and has a second viscosity ; . ≪ / RTI >
According to an aspect of the present invention, there is provided an illumination device comprising: a first electrode formed on one side of an electrode separation line; a second electrode formed on the other side; A substrate having a molding material; A first pad and a second pad are formed on the lower surface of the substrate, the first pad is electrically connected to the first electrode, and the flip- Chip type light emitting device; Wherein the first pad is electrically connected to the first electrode and the second pad and the second electrode are electrically connected to each other, the first pad has a first melting point, and when melted over the first melting point, A bonding medium having a metal affinity to be agglomerated between the first electrodes and between the second pad and the second electrode, and having a first viscosity when melted; And a second electrode having a second melting point lower than the first melting point and being coated on the first electrode and the second electrode together with the bonding medium and having a temperature higher than the second melting point and lower than the first melting point Has a resin affinity with respect to the molding material so as to flow in the direction of the electrode separation line while the melting temperature is maintained during melting and can be underfilled between the light emitting device and the electrode separation line, and has a second viscosity / RTI > underfill media.
According to some embodiments of the present invention as described above, it is possible to greatly reduce process time and process cost by using a mixed paste in which a bonding medium and an underfill medium are mixed, The package can be made compact and the adhesion between the parts can be greatly improved to greatly improve the reliability and durability of the product and to line up the reflow process to maximize the productivity of the product. Of course, the scope of the present invention is not limited by these effects.
1 is a cross-sectional view illustrating a light emitting device package according to some embodiments of the present invention.
FIGS. 2 to 5 are cross-sectional views illustrating steps of manufacturing the light emitting device package of FIG.
6 is a flowchart illustrating a method of manufacturing a light emitting device package according to some embodiments of the present invention.
7 is a graph showing an example of a temperature curve of the light emitting device package with respect to time in the reflow step of FIG.
8 is a plan view schematically showing an example of a heat treatment apparatus capable of implementing the reflow step of FIG.
FIG. 9 is a chart showing reflow conditions and examples of photographs of the heat treatment apparatus of FIG. 6; FIG.
10 is an enlarged cross-sectional view showing an edge portion of a conventional light emitting device package using a solder paste.
11 is an enlarged cross-sectional view showing an electrode separation line portion of a light emitting device package using a conventional solder paste.
12 is a cross-sectional enlarged view showing an edge portion of a light emitting device package according to some embodiments of the present invention.
13 is a cross-sectional enlarged view showing a portion of the electrode division line of the light emitting device package according to some embodiments of the present invention.
14 is a cross-sectional view illustrating a light emitting device package according to some other embodiments of the present invention.
15 is a cross-sectional view illustrating a light emitting device package according to still another embodiment of the present invention.
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.
The embodiments of the present invention are described in order to more fully explain the present invention to those skilled in the art, and the following embodiments may be modified into various other forms, It is not limited to the embodiment. Rather, these embodiments are provided so that this disclosure will be more thorough and complete, and will fully convey the concept of the invention to those skilled in the art. In the drawings, the thickness and size of each layer are exaggerated for convenience and clarity of explanation.
1 is a cross-sectional view illustrating a light
1, a light
1, a
More specifically, for example, as shown in FIG. 1, the
1, a first pad P1 and a second pad P2 are formed on a lower surface of the
More specifically, for example, as shown in Fig. 1, the LED may be a flip chip type LED or an ultraviolet (UV) LED. However, the
For example, the
1, the
More specifically, for example, as shown in FIG. 1, the first pad P1 and the second pad P2 include a silver (Ag) component, and the silver (Ag) The
Therefore, since the solder includes a silver (Ag) component and is in the form of a powder containing tin (Sn) and copper (Cu) having excellent adhesion, if the
The bonding
1, the under-
More specifically, for example, as shown in FIG. 1, the
Therefore, the
That is, the
FIGS. 2 to 5 are cross-sectional views illustrating steps of manufacturing the light emitting
At this time, the mixing ratio of the
3, a flip chip type
4, the
In this case, for example, the
More specifically, for example, the solder powder may be in the form of a powder having a size of 5 micrometers to 15 micrometers so that movement of the epoxy-based resin during flow may be restricted, 2.8 to 3.2% by weight of silver (Ag), 0.3 to 0.7% by weight of copper (Cu) and the remainder may be tin (Sn) so as to have an excellent affinity.
Therefore, since the solder includes a silver (Ag) component and is in the form of powder having a size of 5 micrometers to 15 micrometers including tin (Sn) and copper (Cu) 40 do not flow together with the
5, the
Accordingly, the
6 is a flowchart illustrating a method of manufacturing a light emitting
1 to 6, a method of manufacturing a light emitting
6, the
More specifically, for example, as shown in FIGS. 1 to 6, the underfill media melting step S41 may include a step of melting the
1 to 6, the bonding medium melting step S42 may be performed by melting the
7 is a graph showing an example of a temperature curve of the light emitting
As shown in FIGS. 6 and 7, if the relationship between temperature and time is schematically displayed in the reflow step S4 described above, the reflow step S4 is performed in the preheating step S411 and the preheating step S411. , The underfill melting step S412, the underfill flow step S413, the bonding medium flocculation step S421, and the slow cooling step S422.
7, for example, it is possible to gradually heat up to the first temperature T1 during the first time t1 in the preheating step S411, and to heat the underfill medium 40) can be heated to a temperature above the melting point of the underfill media (40) for a second time (t2) such that the first underfill media (40) can be melted first, and the underfill flow The second temperature T2 may remain unchanged for a third time t3 so that the second temperature T2 can sufficiently flow until the
Fig. 8 is a plan view schematically showing an example of a heat treatment apparatus H capable of implementing the reflow step S4 of Fig. 6; Fig.
8, light emitting device packages 100 according to some embodiments of the present invention are transported along a transport line ML, and the light emitting
Here, for example, such a heat treatment apparatus H may include the preheating step S411, the underfilling step S412, the underfill flow step S413, and the bonding medium agglomeration The first heat
Various heaters using a conduction method and / or a convection method may be installed in the respective regions. Here, the conduction type heater is easy to control the temperature, and the convection type heater has a small thermal stress, so that they can be appropriately applied to each region and effectively applied.
Fig. 9 is a diagram showing an example of a photograph and a reflow condition of the heat treatment apparatus H of Fig. 6; Fig.
9, the temperature conditions of the first heat treatment zone Zone1, the second heat treatment zone Zone2, and the third heat treatment zone Zone3 are 150 ° C., which is the melting point or higher of the epoxy, , The temperature condition of the fourth heat treatment zone (Zone 4) is 260 degrees Celsius, which is higher than the melting point of the solder, the temperature condition of the fifth heat treatment zone (Zone 5) is natural cooling, and each time is 40 seconds, The epoxy is heated in the first heat
FIG. 10 is an enlarged cross-sectional view showing an edge portion of a light emitting device package using a conventional solder paste, and FIG. 11 is an enlarged cross-sectional view showing an electrode dividing line portion of a light emitting device package using a conventional solder paste.
As shown in FIG. 10, in the photograph (lower middle portion) of the light emitting device edge portion of the light emitting device package using the solder paste using the flux having the vaporization component as an example, As shown in FIG. 11, a photograph (middle portion) of a portion of the light emitting device package using the solder paste using the flux having the conventional vaporization component, which is filled in void portions where silicon is vaporized and reduced in volume, , Voids are generated intermittently between the light emitting element and the electrode separating line, so that the bonding force between the entire components is greatly weakened and the underfill can not be sufficiently performed, thereby causing a weak point that is thermally, electrically and physically weak in a high temperature operating environment .
FIG. 12 is an enlarged cross-sectional view showing an edge portion of the light emitting
According to the light emitting
14 is a cross-sectional view showing a light emitting
14, a
The first pad P1 and the second pad P2 of the
15 is a cross-sectional view illustrating a light emitting
15, a
The first pad P1 and the second pad P2 of the
1, the present invention may include a
1, the
Here, the
While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, but, on the contrary, is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the invention. Accordingly, the true scope of the present invention should be determined by the technical idea of the appended claims.
Claims (10)
Applying a mixed paste to the first electrode and the second electrode of the substrate, the mixed paste being a mixture of a bonding medium, which is a conductive material, and an underfill medium, which is an insulating material;
Placing a light emitting device in the form of a flip chip so that the first pad and the second pad are seated on the mixed paste; And
And a reflow step of reflowing the mixed paste,
The reflow step includes:
The underfill medium is melted in a state in which the bonding medium is not melted and the mixed paste is flowed along the upper surface of the electrode separation line due to resin affinity with the molding material, An underfill medium melting step of heating to a temperature higher than a melting point and maintaining a temperature condition for melting only the underfill medium while the underfill medium flows along the upper surface of the electrode dividing line; And
The bonding paste is melted so that the bonding paste can be agglomerated by the metal affinity between the first pad and the first electrode and between the second pad and the second electrode among the mixed paste, A bonding medium melting step of heating the bonding medium to a melting point higher than the melting point of the underfill medium;
Emitting device package.
Wherein the bonding medium comprises a solder powder having a first melting point and having a first viscosity upon melting,
Wherein the underfill medium comprises an epoxy-based resin having a second melting point lower than the first melting point and having a viscosity lower than the first viscosity upon melting,
Wherein the mixed paste is an epoxy solder paste in which the solder powder and the epoxy-based resin are mixed.
In the solder powder,
(Ag) of 2.8 to 3.2% by weight so as to have a high viscosity and a good metal affinity. The epoxy resin is in the form of a powder having a size of 5 micrometers to 15 micrometers so that the movement of the epoxy- 0.3 to 0.7% by weight of copper (Cu), and the balance of tin (Sn).
The underfill media melting step comprises:
A preheating step of preheating the mixing paste for a first time so that the mixing paste can be sufficiently heated;
An underfill melting step of heating the mixed paste to a temperature higher than the melting point of the underfill medium and lower than a melting point of the bonding medium for a second time so that the underfill medium is melted in the mixed paste; And
An underfill flow step of heating the mixed paste to a temperature above the melting point of the underfill medium and a temperature below the melting point of the bonding medium for a third time such that the molten underfill medium can flow sufficiently along the top surface of the electrode separation line;
Emitting device package.
The bonding medium melting step may include:
Wherein the bonding medium contained in the molten underfill medium is melted and is mixed with the first electrode and the second electrode by using the affinity between the first and second electrodes and between the second electrode and the second electrode, A bonding medium agglomerating step of heating the paste for a fourth time at a melting point or more of the bonding medium; And
A slow cooling step of slowly cooling the underfill medium and the bonding medium for a fifth time period to prevent cracks and thermal stresses due to abrupt temperature changes upon discharge at room temperature;
Emitting device package.
A first pad and a second pad are formed on the lower surface of the substrate, the first pad is electrically connected to the first electrode, and the flip- Chip type light emitting device;
Wherein the first pad is electrically connected to the first electrode and the second pad and the second electrode are electrically connected to each other, the first pad has a first melting point, and when melted over the first melting point, A bonding medium having a metal affinity to be agglomerated between the first electrodes and between the second pad and the second electrode, and having a first viscosity when melted; And
A second electrode having a second melting point lower than the first melting point and coated on the first electrode and the second electrode together with the bonding medium and having a temperature higher than the second melting point and lower than the first melting point Has a resin affinity with respect to the molding material so as to flow in the direction of the electrode separation line while being kept at the melting temperature during melting so as to be underfilled between the light emitting device and the electrode separation line and has a second viscosity lower than the first viscosity Underfill media;
Emitting device package.
Wherein the underfill medium includes the molding material and an epoxy-based resin having a high resin affinity,
Wherein the bonding medium is a solder containing 2.8 to 3.2 wt% silver (Ag), 0.3 to 0.7 wt% copper (Cu), and the balance tin (Sn).
Wherein the substrate has an alignment protrusion or a bonding medium receiving groove formed at a position corresponding to the first pad and the second pad of the light emitting element so that the optical axis of the light emitting element can be aligned.
A first pad and a second pad are formed on the lower surface of the substrate, the first pad is electrically connected to the first electrode, and the flip- Chip type light emitting device;
Wherein the first pad is electrically connected to the first electrode and the second pad and the second electrode are electrically connected to each other, the first pad has a first melting point, and when melted over the first melting point, A bonding medium having a metal affinity to be agglomerated between the first electrodes and between the second pad and the second electrode, and having a first viscosity when melted; And
A second electrode having a second melting point lower than the first melting point and coated on the first electrode and the second electrode together with the bonding medium and having a temperature higher than the second melting point and lower than the first melting point Has a resin affinity with respect to the molding material so as to flow in the direction of the electrode separation line while being kept at the melting temperature during melting so as to be underfilled between the light emitting device and the electrode separation line and has a second viscosity lower than the first viscosity Underfill media;
And a backlight unit.
A first pad and a second pad are formed on the lower surface of the substrate, the first pad is electrically connected to the first electrode, and the flip- Chip type light emitting device;
Wherein the first pad is electrically connected to the first electrode and the second pad and the second electrode are electrically connected to each other, the first pad has a first melting point, and when melted over the first melting point, A bonding medium having a metal affinity to be agglomerated between the first electrodes and between the second pad and the second electrode, and having a first viscosity when melted; And
A second electrode having a second melting point lower than the first melting point and coated on the first electrode and the second electrode together with the bonding medium and having a temperature higher than the second melting point and lower than the first melting point Has a resin affinity with respect to the molding material so as to flow in the direction of the electrode separation line while being kept at the melting temperature during melting so as to be underfilled between the light emitting device and the electrode separation line and has a second viscosity lower than the first viscosity Underfill media;
.
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Cited By (1)
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KR20210153732A (en) * | 2019-06-17 | 2021-12-17 | 청두 비스타 옵토일렉트로닉스 씨오., 엘티디. | Display device, display panel and manufacturing method thereof |
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JP2006245189A (en) * | 2005-03-02 | 2006-09-14 | Matsushita Electric Ind Co Ltd | Flip-chip mounting method and mounting structure of semiconductor device |
KR20070100363A (en) * | 2005-02-03 | 2007-10-10 | 마쯔시다덴기산교 가부시키가이샤 | Flip chip mounting body and method for mounting such flip chip mounting body and bump forming method |
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JP2006245189A (en) * | 2005-03-02 | 2006-09-14 | Matsushita Electric Ind Co Ltd | Flip-chip mounting method and mounting structure of semiconductor device |
KR20070116895A (en) * | 2005-04-06 | 2007-12-11 | 마쯔시다덴기산교 가부시키가이샤 | Flip chip mounting method and bump forming method |
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KR102604712B1 (en) * | 2019-06-17 | 2023-11-22 | 청두 비스타 옵토일렉트로닉스 씨오., 엘티디. | Display device, display panel and method of manufacturing the same |
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