KR101079650B1 - Method for removing synthetic resin film from semiconductor reject die - Google Patents
Method for removing synthetic resin film from semiconductor reject die Download PDFInfo
- Publication number
- KR101079650B1 KR101079650B1 KR1020090044506A KR20090044506A KR101079650B1 KR 101079650 B1 KR101079650 B1 KR 101079650B1 KR 1020090044506 A KR1020090044506 A KR 1020090044506A KR 20090044506 A KR20090044506 A KR 20090044506A KR 101079650 B1 KR101079650 B1 KR 101079650B1
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- KR
- South Korea
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- resin film
- semiconductor
- synthetic resin
- sodium hydroxide
- die
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Abstract
The present invention relates to a method for recycling a semiconductor reject die, and more particularly to a method for removing a resin film, such as a polyvinyl chloride film, from a silicon semiconductor die that has become defective during semiconductor processing.
Method for removing the synthetic resin film in the semiconductor reject die according to the present invention is the step of injecting a semiconductor die bonded to the synthetic resin film in a reservoir filled with a 10 ~ 50% sodium hydroxide solution, sodium hydroxide at a concentration of 10 to 50% Injecting a semiconductor die to which a synthetic resin film is adhered into an agitator filled with an aqueous solution, and injecting the synthetic resin film and the semiconductor chip separated in the stirring step into a rotating body together with sodium hydroxide, and a discharge hole in the rotating body. Separating the semiconductor chip and the synthetic resin film according to the size of the.
Semiconductor chip, semiconductor die, recycling
Description
The present invention relates to a method for recycling a semiconductor reject die, and more particularly, to a method for removing a resin film, such as a polyvinyl chloride film, from a silicon semiconductor reject die that has become defective during a semiconductor process.
Semiconductor devices generally include single crystal growth, wafer cutting, surface polishing, circuit design, mask fabrication, oxidation, photoresist coating, exposure, development, etching, ion implantation, deposition, metallization, wafer automatic sorting, wafer cutting, chip bonding, metal It consists of connecting, forming and final inspection steps.
Inevitably, in each step of manufacturing such a semiconductor device, material loss or defects occur in the manufacturing process. For example, silicon powder or the like is discharged in the wafer cutting process, and a die that is defective is determined in the wafer automatic sorting step. The die determined to be good in the wafer automatic sorting step is provided to the chip bonding step for bonding the chip through the wafer cutting step, but the defective die is usually discarded.
In the wafer automatic sorting step, the defective die is marked with defects on it, and the wafer is cut into chips by fixing the wafer with an adhesive to a synthetic film, especially a polyvinyl chloride (PVC) film. Good chips from the cut wafers are recovered and provided for subsequent processing, but the defective dies are discarded as adhered to the resin film.
On the other hand, since the semiconductor wafer for memory has a purity of about 11N and the photovoltaic wafer has a purity of about 6N, a research for recycling a recently defective memory semiconductor wafer as a raw material for producing a photovoltaic wafer is necessary. It's going on.
Accordingly, an object of the present invention is to provide a raw material for manufacturing a photovoltaic wafer by separating a semiconductor die disposed in a state of being bonded to a synthetic resin film in an economical and convenient manner.
The method for removing the synthetic resin film from the semiconductor reject die to achieve the above object is a step of injecting a semiconductor die bonded to the synthetic resin film in a reservoir filled with a 10 ~ 50% sodium hydroxide solution, the concentration of 10 to 50% Injecting a semiconductor die bonded with a synthetic resin film to a stirrer filled with an aqueous solution of sodium hydroxide, stirring, injecting the synthetic resin film and the semiconductor chip separated in the stirring step with a sodium hydroxide to the rotating body, and the rotating body And rotating the semiconductor chip and the synthetic resin film according to the size of the discharge hole by rotating.
In addition, the temperature of the sodium hydroxide aqueous solution in the input step and the stirring step in the present invention is 30 ~ 150 ℃.
In addition, in the present invention, it is preferable to weaken the adhesive strength of the adhesive by heating the aqueous sodium hydroxide solution in the input step for 2-3 hours.
The present invention removes the resin film from the semiconductor reject die by using a reservoir and agitator filled with 10% to 50% sodium hydroxide, and the removed resin film and the semiconductor chip are separated from each other by the size of the discharge hole of the rotating body. Therefore, the semiconductor die bonded to the resin film can be separated in a simple and economical process.
Hereinafter, a method of removing the synthetic resin film from the semiconductor reject die according to the present invention will be described in detail with reference to the accompanying drawings.
1 shows a semiconductor die attached to a plastic film. Since the defective semiconductor die is strongly adhered to the resin film with an adhesive, the method of manually separating the semiconductor die from the resin film requires a lot of processing time and is not economical. In the present invention, a semiconductor die and a semiconductor chip are distinguished from each other, and as shown in FIG. 1, a state in which the semiconductor chips are assembled is referred to as a semiconductor die.
2 is a schematic diagram of a system for implementing a method of removing a resin film from a semiconductor reject die in accordance with the present invention. First, the semiconductor die bonded to the synthetic resin film is introduced into a
The semiconductor die which is not separated from the
The synthetic resin film, the semiconductor chip and the sodium hydroxide aqueous solution introduced through the
In FIG. 2, the sodium hydroxide aqueous solution, the semiconductor chip, and the synthetic resin film are separated and discharged while moving from the left to the right by inclining the
Figure 3 is an enlarged perspective view of the
4 is a perspective view of the
Example
The semiconductor die adhered to the synthetic resin film is introduced into a
The sodium hydroxide aqueous solution was heated to about 30 to 150 ° C. using a
First of all, the synthetic resin film having weakened adhesive strength is introduced into the
The separated semiconductor chip and the synthetic resin film were discharged through the
FIG. 5 illustrates a semiconductor chip collected by moving to the right by the
6 is a process chart showing a process step of removing the synthetic resin film from the semiconductor reject die according to the present invention. Summarizing the process according to the present invention step by step, the semiconductor die bonded to the synthetic resin film is first heated to about 30 to 150 ℃ for 2 to 3 hours in a
Although the present invention uses an aqueous sodium hydroxide solution to separate the synthetic resin film and the semiconductor die economically and conveniently, it will be clear that other solvents having the same or similar functions as the aqueous sodium hydroxide solution fall within the protection scope of the present invention. Accordingly, the appended claims include all modifications of the invention within the spirit of the invention.
1 shows a semiconductor reject die bonded to a synthetic resin film, in particular a polyvinyl chloride film,
2 is a schematic diagram of a system for implementing a method of removing a resin film from a semiconductor reject die according to the present invention;
3 is an enlarged perspective view of a reservoir according to the present invention;
4 is a perspective view of a rotating device according to the present invention,
5 is a view showing a semiconductor chip separated from a synthetic resin film,
6 is a process chart showing a process according to the present invention.
[Description of Reference Numerals]
10:
12: rotating rod 13: rotating member
20: agitator 22: outlet
23: stirring
31: rotating body 32: discharge hole
33, 37: outlet 35: inlet
40, 50, 60: conveyor
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020090044506A KR101079650B1 (en) | 2009-05-21 | 2009-05-21 | Method for removing synthetic resin film from semiconductor reject die |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090044506A KR101079650B1 (en) | 2009-05-21 | 2009-05-21 | Method for removing synthetic resin film from semiconductor reject die |
Publications (2)
Publication Number | Publication Date |
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KR20100125680A KR20100125680A (en) | 2010-12-01 |
KR101079650B1 true KR101079650B1 (en) | 2011-11-03 |
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KR1020090044506A KR101079650B1 (en) | 2009-05-21 | 2009-05-21 | Method for removing synthetic resin film from semiconductor reject die |
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100512488B1 (en) | 2002-06-26 | 2005-09-05 | 주식회사 삼우테크놀로지 | Extraction method of magnetic paints and base film form magnetic tape |
JP2009510216A (en) | 2005-09-29 | 2009-03-12 | ダウ・コーニング・コーポレイション | Method for peeling high-temperature film and / or device from metal substrate |
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2009
- 2009-05-21 KR KR1020090044506A patent/KR101079650B1/en active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100512488B1 (en) | 2002-06-26 | 2005-09-05 | 주식회사 삼우테크놀로지 | Extraction method of magnetic paints and base film form magnetic tape |
JP2009510216A (en) | 2005-09-29 | 2009-03-12 | ダウ・コーニング・コーポレイション | Method for peeling high-temperature film and / or device from metal substrate |
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KR20100125680A (en) | 2010-12-01 |
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