KR100951493B1 - 진공 박막 증착용 분자빔 에피탁시 발사셀과 방법 - Google Patents
진공 박막 증착용 분자빔 에피탁시 발사셀과 방법 Download PDFInfo
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- KR100951493B1 KR100951493B1 KR1020020035710A KR20020035710A KR100951493B1 KR 100951493 B1 KR100951493 B1 KR 100951493B1 KR 1020020035710 A KR1020020035710 A KR 1020020035710A KR 20020035710 A KR20020035710 A KR 20020035710A KR 100951493 B1 KR100951493 B1 KR 100951493B1
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- crucible
- evaporation material
- beam epitaxy
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- 238000000427 thin-film deposition Methods 0.000 title claims description 13
- 238000000407 epitaxy Methods 0.000 title claims description 3
- 238000000034 method Methods 0.000 title claims 7
- 238000001704 evaporation Methods 0.000 claims abstract description 111
- 230000008020 evaporation Effects 0.000 claims abstract description 104
- 239000000463 material Substances 0.000 claims abstract description 97
- 238000001451 molecular beam epitaxy Methods 0.000 claims abstract description 34
- 238000010304 firing Methods 0.000 claims abstract description 29
- 238000010438 heat treatment Methods 0.000 claims abstract description 17
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000010409 thin film Substances 0.000 claims abstract description 9
- 239000007787 solid Substances 0.000 claims abstract description 7
- 239000010408 film Substances 0.000 claims description 15
- 238000005401 electroluminescence Methods 0.000 claims description 10
- 239000004020 conductor Substances 0.000 claims description 5
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 5
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 5
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 5
- 238000000151 deposition Methods 0.000 claims description 2
- 239000002245 particle Substances 0.000 claims 2
- 239000000758 substrate Substances 0.000 description 13
- 239000013078 crystal Substances 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 229920000620 organic polymer Polymers 0.000 description 3
- 239000002861 polymer material Substances 0.000 description 3
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000004020 luminiscence type Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- DCZNSJVFOQPSRV-UHFFFAOYSA-N n,n-diphenyl-4-[4-(n-phenylanilino)phenyl]aniline Chemical compound C1=CC=CC=C1N(C=1C=CC(=CC=1)C=1C=CC(=CC=1)N(C=1C=CC=CC=1)C=1C=CC=CC=1)C1=CC=CC=C1 DCZNSJVFOQPSRV-UHFFFAOYSA-N 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000005979 thermal decomposition reaction Methods 0.000 description 2
- 238000009834 vaporization Methods 0.000 description 2
- 230000008016 vaporization Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- -1 aluminum quinolinol Chemical compound 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
- C30B23/06—Heating of the deposition chamber, the substrate or the materials to be evaporated
- C30B23/066—Heating of the material to be evaporated
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/54—Organic compounds
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/54—Organic compounds
- C30B29/58—Macromolecular compounds
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- Organic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (17)
- 증발재료를 가열하는 것에 의해, 그 증발재료를 용융, 증발시켜, 고체표면에 박막을 성장시키기 위하여 증발분자를 발생하는 진공 박막 증착용 분자빔 에피탁시 발사셀에 있어서:증발재료를 수납하는 도가니 및;상기 도가니에 수납된 상기 증발재료를 가열하기 위한 가열수단을 구비하며, 상기 도가니에는, 상기 증발재료와 함께, 열적, 화학적으로 안정하며, 상기 증발재료보다 열전도율이 높은 열전도매체를 수납하고 있는 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 제 1 항에 있어서, 상기 열전도매체가 파이롤리틱 질화붕소(Pyrolytic Boron Nitride), 실리콘카바이드, 질화알루미늄 중의 적어도 하나를 포함하는, 높은 열전도재료로 이루어지는 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 제 1 항에 있어서, 상기 열전도매체가 입자형상인 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 제 1 항에 있어서, 상기 열전도매체가 상기 도가니와 동일한 재료로 만들어 진 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 삭제
- 제 1 항에 있어서, 상기 도가니 내에 수용된 상기 열전도매체가 상기 증발재료와 70% : 30% 내외의 체적비로 혼합된 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 제 1 항에 있어서, 상기 가열수단은, 상기 도가니의 바깥쪽 둘레에 설치되어, 상기 도가니를 둘러싸도록 설치된 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 제 1 항에 있어서, 상기 도가니는 상기 도가니의 상부에 형성된 원뿔형의 드라프트부를 가지는 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 제 8 항에 있어서, 상기 도가니의 원뿔형 드라프트부는 상기 도가니의 원통형 몸체의 상부로 갈수록 점차 가늘어지고, 상기 원통형 몸체의 상부의 위쪽으로 직경이 점차 넓어지도록 된 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 제 1 항에 있어서, 상기 증발재료는 유기 일렉트로 루미네센스 재료를 포함하는 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사셀.
- 입자형상의 증발재료를 준비하는 단계와;도가니 내에 상기 증발재료와 함께 열전도매체를 수납하는 단계와;상기 도가니를 가열하여, 상기 증발재료를 증발시키는 단계 및;상기 도가니내에 증발된 증발재료를 고체표면에 발사하여, 막 형상으로 증착시키는 단계로 이루어진 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사방법.
- 제 11 항에 있어서, 상기 증발재료가 유기 일렉트로 루미네센스 재료를 포함하는 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사방법.
- 제 11 항에 있어서, 상기 열전도매체가 입자형상인 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사방법.
- 제 11 항에 있어서, 상기 열전도매체가 파이롤리틱 질화붕소(Pyrolytic Boron Nitride), 실리콘카바이드, 질화알루미늄 중의 적어도 하나를 포함하는, 높은 열전도재료로 만들어진 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사방법.
- 제 11 항에 있어서, 상기 열전도매체가 상기 도가니와 동일한 재료로 만들어진 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사방법.
- 삭제
- 제 11 항에 있어서, 상기 도가니 내에 수용된 상기 열전도매체가 상기 증발재료와 70% : 30% 내외의 체적비로 혼합된 것을 특징으로 하는 진공 박막 증착용 분자빔 에피탁시 발사방법.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2001-00192261 | 2001-06-26 | ||
JP2001192261A JP2003002778A (ja) | 2001-06-26 | 2001-06-26 | 薄膜堆積用分子線セル |
Publications (2)
Publication Number | Publication Date |
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KR20030004033A KR20030004033A (ko) | 2003-01-14 |
KR100951493B1 true KR100951493B1 (ko) | 2010-04-07 |
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KR1020020035710A KR100951493B1 (ko) | 2001-06-26 | 2002-06-25 | 진공 박막 증착용 분자빔 에피탁시 발사셀과 방법 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20020197418A1 (ko) |
JP (1) | JP2003002778A (ko) |
KR (1) | KR100951493B1 (ko) |
CN (1) | CN100513629C (ko) |
HK (1) | HK1052728B (ko) |
TW (1) | TW574408B (ko) |
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CN111455342A (zh) * | 2019-01-18 | 2020-07-28 | 北京铂阳顶荣光伏科技有限公司 | 蒸发镀膜设备、蒸发镀膜系统及蒸发镀膜控制方法 |
KR102265055B1 (ko) * | 2019-06-05 | 2021-06-15 | 엘지전자 주식회사 | 증착 장치 |
CN114524424A (zh) * | 2021-12-17 | 2022-05-24 | 青海泰丰先行锂能科技有限公司 | 一种高压实高容量磷酸铁锂正极材料的制备方法 |
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- 2002-06-13 TW TW91112943A patent/TW574408B/zh not_active IP Right Cessation
- 2002-06-25 KR KR1020020035710A patent/KR100951493B1/ko active IP Right Grant
- 2002-06-26 CN CNB021249237A patent/CN100513629C/zh not_active Expired - Lifetime
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Also Published As
Publication number | Publication date |
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HK1052728A1 (en) | 2003-09-26 |
CN1393575A (zh) | 2003-01-29 |
HK1052728B (zh) | 2009-10-30 |
US20020197418A1 (en) | 2002-12-26 |
CN100513629C (zh) | 2009-07-15 |
KR20030004033A (ko) | 2003-01-14 |
TW574408B (en) | 2004-02-01 |
JP2003002778A (ja) | 2003-01-08 |
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