KR100944890B1 - Test Tray of A Solid State Disk Test Handler - Google Patents

Test Tray of A Solid State Disk Test Handler Download PDF

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Publication number
KR100944890B1
KR100944890B1 KR1020080004112A KR20080004112A KR100944890B1 KR 100944890 B1 KR100944890 B1 KR 100944890B1 KR 1020080004112 A KR1020080004112 A KR 1020080004112A KR 20080004112 A KR20080004112 A KR 20080004112A KR 100944890 B1 KR100944890 B1 KR 100944890B1
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KR
South Korea
Prior art keywords
ssd
formed
groove
guide
test
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Application number
KR1020080004112A
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Korean (ko)
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KR20090078257A (en
Inventor
김차일
박성윤
Original Assignee
에버테크노 주식회사
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Application filed by 에버테크노 주식회사 filed Critical 에버테크노 주식회사
Priority to KR1020080004112A priority Critical patent/KR100944890B1/en
Publication of KR20090078257A publication Critical patent/KR20090078257A/en
Application granted granted Critical
Publication of KR100944890B1 publication Critical patent/KR100944890B1/en

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Abstract

The present invention relates to a test tray of an SSD test handler capable of accommodating and testing a plurality of SSDs used for storing data in a computer, a mobile terminal, and the like. A coupling member 50 coupled to the base frame 10 having a plurality of auxiliary frames 11 formed with two coupling grooves 11a and a plurality of coupling grooves 11a formed at the plurality of auxiliary frames 11. Composed of a plurality of pocket module 20 to accommodate the SSD, the plurality of pocket module 20 is installed in the base block 30 and the base block 30, respectively, a plurality of pockets 40 to support the SSD Characterized in that made.
SSD, Test, Handler, Tray, Pocket

Description

Test tray of a solid state disk test handler

The present invention relates to a test tray of an SSD test handler, and more particularly, to an SSD test handler capable of accommodating and testing a plurality of SSDs used for storing data in a computer or a mobile terminal. Relates to the test tray.

A solid state disk (SSD) is used to replace a hard disk used in a computer or a mini hard disk used in a mobile terminal. SSDs have the advantage of speeding up the execution of programs by storing data using devices such as flash memory, and shortening boot time compared to hard disks when used as a boot disk.

The configuration and operation of the SSD will be described with reference to FIG. 1.

The SSD shown in FIG. 1 represents a bare SSD in which a case (not shown) is not assembled, and the bare SSD represents a printed circuit board 1, a plurality of flash memories 2, and a controller. (3), an input / output controller 4 and a connector 5. A plurality of flash memories 2, a controller 3, an input / output controller 4, and a connector 5 are respectively mounted on the printed circuit board 1, and each of them is mounted on the printed circuit board according to the storage capacity of the data of the SSD. The controller 3 and the input / output controller 4 may be mounted on one surface of (1), and the flash memory 2 for storing data may be mounted on the other surface.

The controller 3 constituting the SSD generally controls the SSD, and the input / output controller 4 controls the input / output of data input / output through the connector 5. The plurality of flash memories 2 store data input from the input / output controller 4 under the control of the controller 3, and output data to be output to the input / output controller 4. The input / output controller 4 controls input or output data to be transmitted or received to the connector 5. The connector 5 into which data is input and output is provided with a plurality of pins 5a and connected to an input / output terminal (not shown) of a computer or a mobile terminal.

In the bare state in which the case (not shown) is assembled, a bare SSD is mounted on the test apparatus by a worker by hand or semi-automatically during the electrical characteristic test of the SSD due to the plurality of pins 5a provided in the connector 5. It was.

When the test of the SSD in the bare state using a manual operation as in the prior art, there is a problem that the productivity of the test work is reduced by inserting the SSD into the test apparatus one by one to test.

SUMMARY OF THE INVENTION The present invention has been made in view of the problems of the prior art, and an object thereof is to provide a test tray of an SSD test handler which can be accommodated to test a plurality of SSDs at the same time.

Another object of the present invention is to provide a test tray of an SSD test handler that can improve the productivity of the SSD test operation by allowing a plurality of SSDs to be tested at the same time.

The test tray of the SSD test handler of the present invention includes: a base frame having a side frame formed at an edge thereof, a separation wall provided inside the side frame, and an auxiliary frame having a coupling groove; The pocket module is installed in the base block and consists of a pocket module configured to support the SSD, wherein the pocket module is coupled to the coupling groove formed in the auxiliary frame by a coupling member to store the SSD.

The test tray of the SSD test handler of the present invention provides an advantage of improving the productivity of the SSD test operation by allowing a plurality of SSDs in which a case is not assembled or a plurality of SSDs in which a case is assembled to be tested at the same time.

(Example)

An embodiment of a test tray of an SSD test handler of the present invention will be described with reference to the accompanying drawings.

2 is a perspective view of a test tray of the SSD test handler of the present invention, Figure 3 is a perspective view of the pocket portion shown in FIG. As shown in Figure 2 and 3, the test tray of the SSD test handler of the present invention is composed of a base frame 10 and a plurality of pocket module 20.

As shown in FIG. 2, four side frames 16 are installed in the shape of a quadrangle on the upper part of the base frame 10, and a plurality of the plurality of side frames 16 are applied to the inside of the side frame 16 at intervals. The separation wall 15 is installed.
In addition, the base frame 10 includes a plurality of auxiliary frames 11 in which a plurality of coupling grooves 11a are formed. Here, four auxiliary frames 11 are applied, but the number may be changed according to a user's request. That is, when the size of the base frame 10 is changed, the number of the auxiliary frame 11 and the separating wall 15 can be sufficiently changed according to the size change. In addition, the coupling groove (11a) is also used in the appropriate size and number according to the user's request.
The base frame 10 is formed with a plurality of chucking grooves (14) connected to the chucking member (not shown) for supporting the base frame 10 on its side, the plurality of chucking grooves (14) A plurality of guide rollers 12 and 13 are installed to guide the base frame 10 when the chucking member is connected and moved. The guide rollers 12 and 13 are installed in directions perpendicular to each other. That is, as shown in Figure 2, the guide roller 12 guides the bottom surface during the movement of the base frame 10, while the guide roller 13 is installed in a direction perpendicular to the guide roller 12 and the base It is installed to guide the side of the frame 10.
Here, the guide rollers 12 and 13 are provided with guide rollers 12 at both ends and alternately installed guide rollers 13 with different directions therebetween, and the number thereof is the base frame 10. It can be changed according to the size. Here, although five guide rollers 12 and four guide rollers 13 are provided on one side of the base frame 10, the number of guide rollers 12 and 13 is not limited thereto. no.

The base frame 10 having the guide rollers 12 and 13 installed therein is installed inside the plurality of side frames 16 and the side frames 16 to protect the SSD supported by the pocket module 20. A plurality of separation walls 15 installed at intervals are further installed. Here, as shown in FIG. 2, four side frames 16 are provided on each of four sides, and three separation walls 15 are provided inside the side frame 16. As described above, the number can be increased or decreased.
The side frame 16 is provided in a plurality of quadrangles in the upper edge portion of the base frame 10, the identification (ID) recognition groove 17 to recognize the test tray in any one of the side frame 16 ) Is formed. The ID recognition groove 17 is for identifying a test tray, and may be provided with a barcode or a radio frequency (RF) identification device. A plurality of recognition grooves 17a are formed in the ID recognition groove 17, and a color is applied to the recognition groove 17a to recognize the test tray. Here, four recognition grooves 17a are formed as shown in FIG. 2, but the number of recognition grooves 17a may be increased or decreased according to a user's request.
For example, an optical sensor that can apply a color such as black or white to the first recognition groove 17a of the four recognition grooves 17a to distinguish it from the other recognition grooves 17a, and identify the same. The test tray may be recognized using a recognition device (not shown) such as a camera.
A plurality of separation walls 15 installed on the base frame 10 are installed between the auxiliary frames 11 so that the picking device (not shown) guides the SSD to pick the rows accurately when storing the SSD. It will protect your SSD during and place.

The pocket module 20 is installed by coupling the coupling member 50 to the plurality of coupling grooves 11a formed in the auxiliary frames 11 to accommodate the SSD. The coupling member 50 is inserted into the pocket module 20 and the auxiliary frame 11 and the coupling pin 51 and the coupling pin 11, respectively, the combination of the pocket module 20 and the auxiliary frame 11 It is composed of an elastic member 52 connected to the groove (11a). Coupling pins 51 constituting the coupling member 50 is fixed to the pocket module 20, the auxiliary frame 11 is installed to pass through. In addition, the elastic member 52 is a spring is applied so that each pocket module 20 is floating when the plurality of pocket module 20 is installed in the coupling groove (11a) of the plurality of auxiliary frames (11). . That is, by installing the pocket module 20 to the auxiliary frame 11 to be in a floating state by the elastic member 52 of the coupling member 50, the coupling pin 51 is a test tray of the present invention is a test apparatus (not shown) ), It is possible to correct a slight left / right distortion occurs when contacting the test site (not shown) is installed.

The pocket module 20 includes a pair of pockets 40 installed in the base block 30 to support the base block 30 and the SSD, respectively.

The configuration of the pocket module 20 will be described in more detail with reference to FIGS. 4 and 5 as follows.

The pocket module 20 is composed of a base block 30 and a pocket portion 40, the base block 30 is formed with a guide member 31 for guiding the SSD, each pocket portion 40 is formed on both sides Is installed. In addition, the base block 30 is formed with an SSD insertion hole 32 into which the connector 5 of the SSD supported by the pocket portion 40 is inserted.

The pocket portion 40 installed on the base block 30 includes a pair of fixed guides 41 and a movement guide 42. The movement guides 42 are provided on the fixed guide 41 to support the SSD. A plurality of connecting shafts 43 and a plurality of elastic members 44 are connected and installed.

Each of the fixed guides 41 is formed with a guide installation groove 41c for installing the movement guide 42, and a first guide groove 41d for guiding the SSD. In addition, the fixing guide 41 is formed with an elastic member mounting groove 41a to which the elastic member 44 is respectively installed, and a connecting shaft insertion groove 41b into which the connecting shaft 43 is inserted, respectively. The elastic member 44 is a spring is applied.

The movable guide 42 installed in the fixed guide 41 has a plurality of long holes 42a into which the connecting shafts 43 are inserted, respectively, and a second guide groove 42b for guiding the SSD. The third guide groove 42c is formed to extend in the second guide groove 42b and is formed to be wider than the second guide groove 42b to guide the SSD more easily.

Referring to the operation of the test tray of the SSD test handler of the present invention having the above configuration is as follows.

The pocket module 20 installed in the base frame 10 accommodates or discharges the SSD by a pick and place operation of a picking device (not shown) of the SSD test handler. When the picking device picks the SSD and stores the SSD in the pocket module 20, the pocket module 20 moves the pocket part 40 by a force applied to the picking device to accommodate the SSD. 42) moves away from each other.

When the picking device releases the picking state after the movement guide 42 moves away from each other, the movement guide 42 is moved in a narrowing direction by the elasticity of the elastic member 44 to support the SSD. The movement range of the movement guide 42 moved to support the SSD is restrained by the long hole 42a formed in the movement guide 42. That is, when the movement guide 42 moves to and supports the SSD housed by the elasticity of the elastic member 44, a plurality of connecting shafts 43 connected to the fixed guide 41 are restrained by the long holes 42a. Due to the movement, the SSD can be accommodated in the pocket module 20 with an appropriate force.

The test tray of the SSD test handler of the present invention is a test to classify a good SSD and a bad SSD by assembling a bare SSD or a case assembled with a case after mounting a component on a printed circuit board such as a NAND flash or a controller. Applicable to handlers.

1 is a perspective view of an SSD,

2 is a perspective view of a test tray of the SSD test handler of the present invention,

3 is a perspective view of the pocket part shown in FIG.

4 is a front view of the pocket part shown in FIG. 3;

5 is an exploded perspective view of the pocket guide shown in FIG.

Explanation of symbols on the main parts of the drawings

10: base frame 11: subframe

12,13: guide roller 20: pocket module

30: base block 40: pocket part

41: fixed guide 42: moving guide

43: connecting shaft 44: elastic member

50: coupling member 51: coupling pin

52: elastic member

Claims (8)

  1. A base frame having a side frame formed at an edge thereof, a separation wall provided inside the side frame, and an auxiliary frame having a coupling groove formed therein;
    A base block formed by a guide member for guiding the SSD and an SSD insertion hole into which the connector of the SSD is inserted, and a pair of fixed guides installed on the base block and a connecting shaft and an elastic member connected to the fixed guide to support the SSD; It consists of a pocket module consisting of a pocket part consisting of a pair of moving guides,
    The base frame has a chucking groove is formed on the side of the chucking member to support the base frame, the chucking member is connected to the chucking groove is provided with a plurality of guide rollers for guiding the base frame when moving,
    The pocket module is a test tray of the SSD test handler, characterized in that coupled to the coupling groove formed in the auxiliary frame to receive the SSD.
  2. delete
  3. The test tray of claim 1, wherein the side frame of the base frame includes one of an ID recognition groove, a barcode, and an RF recognition device for identifying a test tray.
  4. delete
  5. delete
  6. The method of claim 1, wherein the fixed guide is formed with a guide installation groove for each movement guide is installed, a first guide groove for guiding the SSD is formed, an elastic member installation groove is formed is installed, the elastic member is connected, Test tray of the SSD test handler, characterized in that the connecting shaft insertion groove is formed is inserted into the shaft.
  7. The method of claim 1, wherein the movement guide is formed with a plurality of holes each insertion shaft is inserted, a second guide groove for guiding the SSD is formed, extending in the second guide groove and wider than the second guide groove The test tray of the SSD test handler, characterized in that the third guide groove is formed.
  8. According to claim 1, The coupling member for coupling the pocket module to the coupling groove is respectively coupled to the coupling pin is installed in the pocket module and the auxiliary frame, the coupling pin is elastically connected to the coupling groove of the pocket module and the auxiliary frame The test tray of the SSD test handler, characterized in that the member.
KR1020080004112A 2008-01-14 2008-01-14 Test Tray of A Solid State Disk Test Handler KR100944890B1 (en)

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Application Number Priority Date Filing Date Title
KR1020080004112A KR100944890B1 (en) 2008-01-14 2008-01-14 Test Tray of A Solid State Disk Test Handler

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014070176A1 (en) * 2012-10-31 2014-05-08 Hewlett-Packard Development Company, L.P. Modular rack system
US9529395B2 (en) 2012-03-12 2016-12-27 Hewlett Packard Enterprise Development Lp Liquid temperature control cooling
US9803937B2 (en) 2013-01-31 2017-10-31 Hewlett Packard Enterprise Development Lp Liquid cooling
US9927187B2 (en) 2012-09-28 2018-03-27 Hewlett Packard Enterprise Development Lp Cooling assembly
US10123464B2 (en) 2012-02-09 2018-11-06 Hewlett Packard Enterprise Development Lp Heat dissipating system

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101509188B1 (en) * 2013-11-08 2015-04-07 주식회사 아테코 Ssd tray and ssd loading and unloading apparatus
KR101652986B1 (en) * 2015-03-26 2016-09-02 주식회사 오킨스전자 Module test socket
KR101712661B1 (en) 2015-07-22 2017-03-07 주식회사 아테코 Ssd test board guide apparatus and ssd guide apparatus
KR200486185Y1 (en) * 2016-03-15 2018-04-11 주식회사 대성엔지니어링 Magazine for Testing Solid State Drive

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100610779B1 (en) 2005-02-25 2006-08-02 미래산업 주식회사 Test tray for handler for testing semiconductors

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100610779B1 (en) 2005-02-25 2006-08-02 미래산업 주식회사 Test tray for handler for testing semiconductors

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10123464B2 (en) 2012-02-09 2018-11-06 Hewlett Packard Enterprise Development Lp Heat dissipating system
US9529395B2 (en) 2012-03-12 2016-12-27 Hewlett Packard Enterprise Development Lp Liquid temperature control cooling
US9927187B2 (en) 2012-09-28 2018-03-27 Hewlett Packard Enterprise Development Lp Cooling assembly
WO2014070176A1 (en) * 2012-10-31 2014-05-08 Hewlett-Packard Development Company, L.P. Modular rack system
US9788452B2 (en) 2012-10-31 2017-10-10 Hewlett Packard Enterprise Development Lp Modular rack system
US9803937B2 (en) 2013-01-31 2017-10-31 Hewlett Packard Enterprise Development Lp Liquid cooling
US10330395B2 (en) 2013-01-31 2019-06-25 Hewlett Packard Enterprise Development Lp Liquid cooling
US10458724B2 (en) 2013-01-31 2019-10-29 Hewlett Packard Enterprise Development Lp Liquid cooling

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