KR100834852B1 - Insert for test handler - Google Patents

Abstract

An insert for a test handler is provided to exchange a latch block simply and to recycle the latch block regardless of the size of a semiconductor device by detachably joining a latch block to an insert body. In an insert(400) for a test handler, an insert body(410) has a placing space(411) for settling a semiconductor device. At least one latch block(420) is detachably combined to the insert body to hold the placed state of the semiconductor device settled in the placing space. The insert body has a block receiving groove(412) for containing the latch block. The latch block is fitted in the block receiving groove. A hanging sill is formed on the inner wall of the block receiving groove in the insert body. A hanging pin projection(421a) to move elastically is hung to the hanging sill to prevent separation of the latch block, when the latch block is contained in the block receiving groove.

Description

Inserts for test handlers {INSERT FOR TEST HANDLER}

1 is a schematic diagram of a general test tray.

2 and 3 are reference diagrams for explaining the problem of the prior art 2.

4 is a plan view of an insert according to an embodiment of the present invention.

FIG. 5 is a cross-sectional view of the insert of FIG. 4 viewed in the direction A by cutting in the direction I-I. FIG.

FIG. 6 is a cross-sectional view of the insert of FIG. 4 viewed in the direction B by cutting in the J-J direction. FIG.

7 is a cross-sectional view showing the assembled state of the insert of FIG.

8 and 9 are plan and cross-sectional views of yet another insert modified from the insert of FIG.

* Description of the symbols for the main parts of the drawings *

400, 400 ': Insert

410, 410 ': Insert Body

411: seating space

412: Block receiving groove

412a: Hanging groove

412a-1: Jamming Jaw

420, 420 ': Latch Block

421: catching part

421a: locking pin projection

421 ': Bolt

The present invention relates to an insert for a test handler, and more particularly, to a technique for maintaining a seating state of a semiconductor device mounted on an insert.

The test handler is a device that classifies the tested semiconductor device according to the test result after supplying the semiconductor device to the tester if the tester wants to test the quality of the semiconductor device before shipment. Technical matters are already disclosed through a number of public documents such as Korean Patent Publication No. 10-0553992.

In general, the test handler loads the semiconductor devices loaded in the customer tray into the test tray at the loading position, and then supplies the semiconductor devices loaded in the test tray to the tester at the test position, and the semiconductor is tested at the unloading position. The devices are to be unloaded from the test tray into the customer tray. To this end, the test handler has a device configuration for circulating the test tray in a circulation path including a loading position, a test position and an unloading position.

FIG. 1 is a schematic diagram of a general test tray. As shown in FIG. 1, a general test tray 10 includes a plurality of inserts 11 (also referred to as carrier modules) mounted in a frame 12 in a matrix form. It has a structure that is, one insert 11 is to be able to seat one or more semiconductor devices. For reference, the test tray of FIG. 1 represents an example in which one semiconductor device is seated on one insert 11.

On the other hand, since the test tray is configured to circulate a constant circulation path as described above, the device for fixing the semiconductor device so that the seating state of the semiconductor device seated on the insert can be stably maintained (hereinafter referred to as a latch device). ) Is configured on the insert. Regarding the technology related to the latch device, the technology disclosed in Korean Laid-Open Patent Publication No. 10-2006-0003893 (name of the invention: an insert, a tray, and an electronic part handling device for an electronic part handling device) (hereinafter referred to as 'prior art 1') And Korean Patent Laid-Open Publication No. 10-2006-0125136 (name of the invention: a carrier module for a semiconductor device test handler) (hereinafter referred to as "prior art 2").

First, referring to the prior art 1, the latch device having a configuration for operating the latch 164 and the latch as described in each of the components as described in reference to Figures 8 and 8 of the disclosed Patent Publication 1 You can see that it is installed in the insert.

However, in the case of the prior art 1, the following problems follow.

If the semiconductor device to be tested has changed and the seating space of the insert (prior art 1 is referred to as IC housing-19), the insert must be replaced or the entire test tray must be replaced. For example, when the entire test tray is replaced, the frame and the insert are wasting resources, and even when only the insert is replaced, the insert is a waste of resources.

The production cost of inserts is usually the unit cost of the insert body (named insert body-161 and 161 '-in prior art 1), the unit price of the latch device, the latches and latches that make up the latch device. To be assembled by hand into the insert body.

Therefore, when using an insert such as the prior art 1, when the semiconductor element to be tested is changed and there is a need to replace the insert, recycling and disassembly and reassembly of the individual components must be carried out in order to recycle the individual components constituting the latching device. Should be. In this case, there are problems of part damage during component disassembly, increase of replacement time due to difficulty of disassembly and reassembly, and limitation of operation rate of the test handler due to increase of replacement time. There is a problem.

Next, referring to the prior art 2, as referred to in the description referring to the drawings 4 and 4 of the prior art 2 disclosed in the prior art 2, the prior art 2 is referred to as a latch (lattice-reference numeral 130- in the prior art 2). And the latch operating member for actuating the latch are separately mounted to the insert body (formerly known as carrier body-reference numeral 120-) and mounted on the frame (reference numeral 110 of the prior art 2). Able to know. That is, according to the related art 2, the latch and the latch operating member are separated from the insert body and mounted on the frame so that the latch and the latch operating member can be recycled even when the insert body is replaced.

However, the prior art 2 also has problems in the following points.

When the size of the semiconductor device to be tested first becomes small, it becomes difficult to maintain the semiconductor device which has been reduced in size by the existing latch and the latch operating member. In the case of the prior art 2, the degree of protruding the latch into the seating space (formerly known as the seating groove or the cavity-reference numeral 122- is defined and used in the prior art 2) is determined. When the size of the semiconductor device to be newly tested becomes small (when the semiconductor device is replaced from D ₁ to D ₂ ), the existing latch 21 and the latch operating member lose the function of holding the semiconductor device D ₂ .

In addition, according to the related art 2, a problem may occur with respect to the pusher even when the size of the semiconductor device to be tested is increased. The pusher is a component that pushes the semiconductor device at the test site to the test socket of the tester. The pusher has a cross-sectional area that is almost the same as that of the semiconductor device. This is because if only a part of the semiconductor device is pressed, fine cracks may occur in the semiconductor device due to the pressing force of the pusher. However, as shown in FIG. 3, when the size of the semiconductor device becomes large (when the semiconductor device is replaced from D ₁ to D ₃ ), the pusher P presses near the edge of the semiconductor device due to the interference with the latch 21. You won't be able to.

In addition, according to the related art 2, when the size of the semiconductor device to be tested is increased, especially when the size change is large, the semiconductor device may not be seated in the seating space. If the size of the semiconductor device is so large that the location of the latch is invaded, the latch does not allow the semiconductor device to be placed in the seating space. In this case, it is essential to replace the latch with the latch operation member of a different size.

Therefore, according to the related art 2, when the size of the semiconductor device is changed, there is still a burden of replacing the latch and the latch operating member, and in this case, the components of the latch and the latch operating member must be replaced by one. There is a problem that it is accompanied by a hassle.

SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and an object of the present invention is to provide a technique capable of detachably coupling a blocked latch block to an insert body.

An insert for a test handler according to the present invention for achieving the above object, the insert body having a seating space on which the semiconductor device can be mounted; And at least one latch block which is blocked and detachably coupled to the insert body to maintain a seating state of a semiconductor device seated in the seating space. Characterized in that it comprises a.

The insert body is characterized in that the block receiving groove is formed to accommodate the latch block, the latch block is to be accommodated in the block receiving groove is another feature.

The insert body has a locking jaw formed on the inner wall surface of the block receiving groove, and the latch block has an elastic flow that is caught by the locking jaw when it is accommodated in the block receiving groove to prevent the latch block from being separated. It is another feature that the possible locking pin protrusion is provided.

The latch block is another feature that is detachably coupled to the insert body via a coupling member.

The coupling member is characterized in that the bolt is more specific.

In another aspect, the at least one latch block may be combined with various insert bodies having a seating space in which semiconductor devices of different sizes may be seated.

Hereinafter, an insert for a test handler according to the present invention as described above will be described in detail with reference to the accompanying drawings.

4 is a plan view of the insert body 410 and the latch block 420 of the insert 400 according to an embodiment of the present invention, Figure 5 is a II of the insert body 410 and latch block 420 of FIG. 6 is a cross-sectional view of the insert body 410 and the latch block 420 of FIG. 4 taken from the JJ direction and viewed from the B direction.

4 to 6, the insert 400 according to the present embodiment includes an insert body 410 and a latch block 420.

The insert body 410 has a seating space 411 in which the semiconductor device can be seated, and the block receiving groove 412 in which the latch block 420 can be accommodated is opened up and down and the seating space 411. It is formed on both sides of the seating space 411, respectively. In addition, the block receiving groove 412 has a locking groove 412a extended to allow the locking portion 421 of the latch block 420 to be described later to be inserted into and out of three side surfaces except for the seating space 411. As will be seen in detail in the wall surface of the locking groove 412a is to form a locking step (412a-1) by placing a step. In addition, a lower jaw 413 is formed on the lower side of the block accommodating groove 412 to hang the bottom of the latch block 420 so that the latch block 420 accommodated in the block accommodating groove 412 is not separated downward.

The latch block 420 is a latch for holding the semiconductor element seated in the seating space 411 and components for operating the latch are integrally assembled and blocked, and the latch receiving groove 412 of the insert body 410 is blocked. Is accommodated).

In the latch block 420, the locking portions 421 are formed at three side surfaces of the latch block 420 except for the side of the seating space 411, and as shown in detail in FIG. 1) is provided with a locking pin projection (421a) that is caught to enable elastic flow. For reference, in the present exemplary embodiment, three latching portions 421 are provided in one latch block 420. However, it will be appreciated that only one or more latching units 421 are provided.

Therefore, as shown in FIG. 5, the assembler inserts the latch block 420 into the block receiving groove 412 in the insert body 410 and the latch block 420 as shown in FIG. 5. Assembly is completed. At this time, when the assembler inserts the latch block 420 into the block accommodating groove 412, the bottom of the latch block 420 is caught by the lower jaw 413 and the locking pin projection 421a is caught by the locking jaw 412a-1. As shown in FIG. 7, the latch block 420 can be stably coupled to the insert body 410 such that the latch block 420 is prevented from escaping upward or downward.

If it is necessary to replace the insert 400 to replace the semiconductor device in the future, the replacement by using a pin or jig in the downward direction of the block receiving groove 412, the locking jaw (4121a) of the locking jaw (4121a) After release from -1), the latch block 420 can be easily removed from the block accommodating groove 412. In addition, the removed latch block 420 may be used by being coupled to a newly applied insert body.

That is, according to the present embodiment, by standardizing the block receiving groove 412 of the insert body 410, the block receiving groove 412 is able to apply the latch block 420 to the insert body of various standards standardized. Recycling and replacement of the latch block 420 can be made simply.

In the above embodiment, although the detachable structure is applied to the latch block 420 and the insert body 410, a separate coupling member, for example, a bolt 421 'as shown in FIGS. Through the configuration of 3 it can be seen that a modification to enable the latch block 420 'detachably coupled to the insert body 410'.

In the above description of the preferred embodiment of the present invention with reference to the accompanying drawings, but the above-described embodiment is only described with a preferred example of the present invention, it is understood that the present invention is limited only to the above embodiment The scope of the invention should be understood by the claims and equivalent concepts described below.

As described in detail above, according to the present invention, since the semiconductor device seated in the seating space is held through the blocked latch block, and the latch block itself is detachably coupled to the insert body, the size of the semiconductor device is simple to replace. Regardless of the change, the latch block can be recycled, thereby preventing the waste of resources.

Claims (6)

An insert body having a seating space in which the semiconductor device may be seated; And At least one latch block that is blocked and detachably coupled to the insert body to maintain a seating state of a semiconductor device seated in the seating space; Characterized in that it comprises Insert for test handler. The method of claim 1, The insert body is formed with a block receiving groove that can accommodate the latch block, The latch block is to be accommodated in the block receiving groove Insert for test handler. The method of claim 2, The insert body is formed with a locking jaw to the inner wall surface of the block receiving groove, The latch block is provided with a locking pin projection which is elastically flowable to be prevented from being separated from the latch block caught on the locking jaw when accommodated in the block receiving groove. Insert for test handler. The method of claim 1, The latch block is detachably coupled to the insert body via a coupling member. Insert for test handler. The method of claim 4, wherein The coupling member is characterized in that the bolt Insert for test handler. The method of claim 1, The at least one latch block may be combined with various insert bodies each having a seating space in which semiconductor devices of different specifications may be seated. Insert for test handler.

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