KR100718671B1 - 2차원 참조검출기 및 참조 검출기용 콜리메이터를 포함하는고해상도 콘빔 엑스선 단층 촬영 장치 - Google Patents
2차원 참조검출기 및 참조 검출기용 콜리메이터를 포함하는고해상도 콘빔 엑스선 단층 촬영 장치 Download PDFInfo
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- KR100718671B1 KR100718671B1 KR1020050059951A KR20050059951A KR100718671B1 KR 100718671 B1 KR100718671 B1 KR 100718671B1 KR 1020050059951 A KR1020050059951 A KR 1020050059951A KR 20050059951 A KR20050059951 A KR 20050059951A KR 100718671 B1 KR100718671 B1 KR 100718671B1
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- 238000004364 calculation method Methods 0.000 description 1
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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Abstract
Description
도 2는 1차원 또는 2차원 검출기의 구조와 팬빔 또는 콘빔의 엑스선 빔의 모양에 따른 단층촬영장치의 종류를 설명하기 위한 도면이고,
도 3은 종래의 참조 검출기를 이용한 엑스선 초점의 움직임을 보상하는 기술을 설명하기 위한 도면이고,
도 4는 도 3을 Y-Z평면에서 나타낸 도면이며,
도 5는 콘빔 형태의 엑스선 빔과 2차원 엑스선 검출기를 사용할 경우, 2차원 참조검출기를 사용하여 초점 움직임의 정보를 획득하여 엑스선 초점의 움직임을 보상하기 위한 원리를 설명하기 위한 도면이다.
*도면의 주요 부분에 대한 부호의 설명*
10: 엑스선관.
30: 2차원 곡면검출기.
31: 평면형 검출기.
41: 2차원 참조 검출기.
50 : 팬빔 엑스선.
51 : 콘빔 엑스선,
70 : 조사야
90: 엑스선 빔,
더욱 상세 하게는, 엑스선관, 주콜리메이터, 2차원 주검출기를 포함하는 고해상도 콘빔 엑스선 단층 촬영장치에 있어서, 상기한 주콜리미터의 측부에, 구멍이 뚫린 참조 검출기용 콜리메이터(61)를 더 설치하고, 참조 결출기용 콜리메이터(61)의 하부에는 2차원 참조검출기(41)를 설치하되, 2차원 참조검출기(41)의 검출면과 엑스선관에서 입사하는 엑스선 빔(90)이 수직으로 이루어지게 구성한 것을 특징으로 한다.
이하, 본 발명을 상세히 설명한다.
Claims (5)
- 엑스선관, 주콜리메이터, 2차원 주검출기를 포함하는 고해상도 콘빔 엑스선 단층 촬영장치에 있어서,상기한 주콜리미터의 측부에, 구멍이 뚫린 참조 검출기용 콜리메이터(61)를 더 설치하고, 참조 검출기용 콜리메이터(61)의 하부에는 2차원 참조검출기(41)를 설치하되, 2차원 참조검출기(41)의 검출면과 엑스선관에서 입사하는 엑스선 빔(90)이 수직으로 이루어지게 구성한 것을 특징으로 하는 엑스선 단층 촬영 장치.
- 삭제
- 제 1항에 있어서,2차원 참조 검출기(41)는 포토 다이오드 또는 CMOS 또는 CCD를 부품으로 선택하는 것을 특징으로 하는 엑스선 단층 촬영 장치.
- 삭제
- 삭제
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KR1020050059951A KR100718671B1 (ko) | 2005-07-05 | 2005-07-05 | 2차원 참조검출기 및 참조 검출기용 콜리메이터를 포함하는고해상도 콘빔 엑스선 단층 촬영 장치 |
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US9057680B2 (en) | 2010-12-02 | 2015-06-16 | Korea Atomic Energy Research Institute | Portable industrial limited angle gamma-ray tomography scanning system |
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KR101495136B1 (ko) | 2008-11-17 | 2015-02-25 | 삼성전자주식회사 | 2차원 영상으로부터 3차원 영상을 재구성하는 방법 및 장치 |
CN102768219B (zh) * | 2012-07-26 | 2014-07-30 | 清华大学 | 组合式射线无损检测方法及系统 |
KR102078335B1 (ko) * | 2013-05-03 | 2020-02-17 | 삼성전자주식회사 | 의료 영상 장치 및 그 제어 방법 |
KR102279966B1 (ko) * | 2013-12-23 | 2021-07-21 | 주식회사 바텍 | 치과용 엑스선 촬영장치 |
CN108158597B (zh) * | 2016-12-07 | 2021-08-06 | 北京东软医疗设备有限公司 | 确定原始x射线能量数据的方法、装置及ct设备 |
EP3992619B1 (en) * | 2020-10-27 | 2024-09-04 | Due2Lab S.R.L. | X-ray collimator and related x-ray inspection apparatus |
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JPH06169914A (ja) * | 1992-12-04 | 1994-06-21 | Toshiba Corp | X線コンピュータトモグラフィ装置 |
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JP2000033085A (ja) | 1998-07-17 | 2000-02-02 | Shimadzu Corp | X線ct装置 |
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US9057680B2 (en) | 2010-12-02 | 2015-06-16 | Korea Atomic Energy Research Institute | Portable industrial limited angle gamma-ray tomography scanning system |
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