KR0136744B1 - 반도체 메모리 - Google Patents

반도체 메모리

Info

Publication number
KR0136744B1
KR0136744B1 KR1019930008746A KR930008746A KR0136744B1 KR 0136744 B1 KR0136744 B1 KR 0136744B1 KR 1019930008746 A KR1019930008746 A KR 1019930008746A KR 930008746 A KR930008746 A KR 930008746A KR 0136744 B1 KR0136744 B1 KR 0136744B1
Authority
KR
South Korea
Prior art keywords
sub
array
word line
data
amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
KR1019930008746A
Other languages
English (en)
Korean (ko)
Other versions
KR930024167A (ko
Inventor
사토르 다카세
토흐르 후루야마
챨스 스타크 도날드
나츠키 구시야마
기요시 사쿠라이
히로유키 노지
시게오 오시마
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of KR930024167A publication Critical patent/KR930024167A/ko
Application granted granted Critical
Publication of KR0136744B1 publication Critical patent/KR0136744B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
    • G11C7/1018—Serial bit line access mode, e.g. using bit line address shift registers, bit line address counters, bit line burst counters
    • G11C7/1021—Page serial bit line access mode, i.e. using an enabled row address stroke pulse with its associated word line address and a sequence of enabled column address stroke pulses each with its associated bit line address
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/06—Arrangements for interconnecting storage elements electrically, e.g. by wiring
    • G11C5/063—Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408—Address circuits
    • G11C11/4085—Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Dram (AREA)
  • Memory System (AREA)
  • Static Random-Access Memory (AREA)
KR1019930008746A 1992-05-22 1993-05-21 반도체 메모리 Expired - Lifetime KR0136744B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP92-131095 1992-05-22
JP4131095A JP2892216B2 (ja) 1992-05-22 1992-05-22 半導体メモリ

Publications (2)

Publication Number Publication Date
KR930024167A KR930024167A (ko) 1993-12-22
KR0136744B1 true KR0136744B1 (ko) 1998-04-29

Family

ID=15049864

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930008746A Expired - Lifetime KR0136744B1 (ko) 1992-05-22 1993-05-21 반도체 메모리

Country Status (6)

Country Link
US (1) US5410512A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP0570977B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP2892216B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
KR (1) KR0136744B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE69322436T2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
TW (1) TW223707B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL96808A (en) * 1990-04-18 1996-03-31 Rambus Inc Introductory / Origin Circuit Agreed Using High-Performance Brokerage
US5896404A (en) * 1997-04-04 1999-04-20 International Business Machines Corporation Programmable burst length DRAM
JP3481868B2 (ja) * 1998-10-01 2003-12-22 株式会社日立製作所 データ伝送回路及び液晶表示装置
JP4270707B2 (ja) 1999-04-09 2009-06-03 株式会社東芝 ダイナミック型半導体記憶装置
US6404694B2 (en) 1999-08-16 2002-06-11 Hitachi, Ltd. Semiconductor memory device with address comparing functions
JP3705113B2 (ja) 2000-10-27 2005-10-12 セイコーエプソン株式会社 半導体メモリ装置内のワード線の活性化
US6735546B2 (en) 2001-08-31 2004-05-11 Matrix Semiconductor, Inc. Memory device and method for temperature-based control over write and/or read operations
US6724665B2 (en) * 2001-08-31 2004-04-20 Matrix Semiconductor, Inc. Memory device and method for selectable sub-array activation
US6954394B2 (en) * 2002-11-27 2005-10-11 Matrix Semiconductor, Inc. Integrated circuit and method for selecting a set of memory-cell-layer-dependent or temperature-dependent operating conditions
US7057958B2 (en) * 2003-09-30 2006-06-06 Sandisk Corporation Method and system for temperature compensation for memory cells with temperature-dependent behavior
US7218570B2 (en) * 2004-12-17 2007-05-15 Sandisk 3D Llc Apparatus and method for memory operations using address-dependent conditions
US7283414B1 (en) 2006-05-24 2007-10-16 Sandisk 3D Llc Method for improving the precision of a temperature-sensor circuit
TWI828229B (zh) * 2022-07-13 2024-01-01 港香蘭藥廠股份有限公司 麻黃中麻黃生物鹼的改良型核磁共振氫譜（１ｈ-ｎｍｒ）定量方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4701885A (en) * 1984-07-26 1987-10-20 Texas Instruments Incorporated Dynamic memory array with quasi-folded bit lines
US5257235A (en) * 1989-04-25 1993-10-26 Kabushiki Kaisha Toshiba Semiconductor memory device having serial access mode
JPH0330183A (ja) * 1989-06-28 1991-02-08 Nec Corp メモリ制御方式
US5121354A (en) * 1990-03-12 1992-06-09 International Business Machines Corp. Random access memory with access on bit boundaries
EP0488265B1 (en) * 1990-11-30 1996-08-14 Kabushiki Kaisha Toshiba Semiconductor memory device
JP2601951B2 (ja) * 1991-01-11 1997-04-23 株式会社東芝 半導体集積回路
JPH05274879A (ja) * 1992-03-26 1993-10-22 Nec Corp 半導体装置

Also Published As

Publication number Publication date
EP0570977A2 (en) 1993-11-24
JP2892216B2 (ja) 1999-05-17
DE69322436T2 (de) 1999-05-27
KR930024167A (ko) 1993-12-22
EP0570977B1 (en) 1998-12-09
EP0570977A3 (en) 1995-03-22
TW223707B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1994-05-11
JPH05325544A (ja) 1993-12-10
US5410512A (en) 1995-04-25
DE69322436D1 (de) 1999-01-21

Similar Documents

Publication Publication Date Title
US4879692A (en) Dynamic memory circuit with improved sensing scheme
US4156938A (en) MOSFET Memory chip with single decoder and bi-level interconnect lines
KR960001778B1 (ko) 이중포트메모리 및 그 데이터 전송방법
KR0136744B1 (ko) 반도체 메모리
US5544101A (en) Memory device having a latching multiplexer and a multiplexer block therefor
US20120265951A1 (en) Wide bandwidth read and write memory system and method
KR950020713A (ko) 다이나믹 반도체기억장치
US6768692B2 (en) Multiple subarray DRAM having a single shared sense amplifier
JP3494346B2 (ja) 半導体記憶装置およびその制御方法
US5617555A (en) Burst random access memory employing sequenced banks of local tri-state drivers
US6366526B2 (en) Static random access memory (SRAM) array central global decoder system and method
KR970022773A (ko) 다중 뱅크 메모리 설계 및 그를 이용한 시스템과 방법
US7940546B2 (en) ROM array
US6414875B2 (en) String programmable nonvolatile memory with NOR architecture
US6130855A (en) Latching wordline driver for multi-bank memory
KR100247723B1 (ko) 디램 어레이
KR100263574B1 (ko) 반도체 메모리 장치
US7027347B2 (en) Semiconductor memory device
KR930000768B1 (ko) 반도체 기억장치
US5828618A (en) Line memory
US6434074B1 (en) Sense amplifier imbalance compensation for memory self-timed circuits
US6154394A (en) Data input-output circuit and semiconductor data storage device provided therewith
US6046958A (en) Latching wordline driver for multi-bank memory
US6058068A (en) Write driver with locally generated reset pulse
US6400639B1 (en) Wordline decoder system and method

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 14

FPAY Annual fee payment

Payment date: 20120105

Year of fee payment: 15

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 15

EXPY Expiration of term
PC1801 Expiration of term

St.27 status event code: N-4-6-H10-H14-oth-PC1801

Not in force date: 20130522

Ip right cessation event data comment text: Termination Category : EXPIRATION_OF_DURATION

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000