JPWO2023275929A1 - - Google Patents

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Publication number
JPWO2023275929A1
JPWO2023275929A1 JP2023531146A JP2023531146A JPWO2023275929A1 JP WO2023275929 A1 JPWO2023275929 A1 JP WO2023275929A1 JP 2023531146 A JP2023531146 A JP 2023531146A JP 2023531146 A JP2023531146 A JP 2023531146A JP WO2023275929 A1 JPWO2023275929 A1 JP WO2023275929A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2023531146A
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Japanese (ja)
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JP7666598B2 (ja
JPWO2023275929A5 (https=
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Publication of JPWO2023275929A1 publication Critical patent/JPWO2023275929A1/ja
Publication of JPWO2023275929A5 publication Critical patent/JPWO2023275929A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2023531146A 2021-06-28 2021-06-28 光干渉断層撮像装置、光干渉断層撮像方法、及び記録媒体 Active JP7666598B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/024337 WO2023275929A1 (ja) 2021-06-28 2021-06-28 光干渉断層撮像装置、光干渉断層撮像方法、及び記録媒体

Publications (3)

Publication Number Publication Date
JPWO2023275929A1 true JPWO2023275929A1 (https=) 2023-01-05
JPWO2023275929A5 JPWO2023275929A5 (https=) 2024-03-11
JP7666598B2 JP7666598B2 (ja) 2025-04-22

Family

ID=84691001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023531146A Active JP7666598B2 (ja) 2021-06-28 2021-06-28 光干渉断層撮像装置、光干渉断層撮像方法、及び記録媒体

Country Status (3)

Country Link
US (1) US20240288263A1 (https=)
JP (1) JP7666598B2 (https=)
WO (1) WO2023275929A1 (https=)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03123323A (ja) * 1989-10-06 1991-05-27 Furukawa Electric Co Ltd:The ファイバカップラー
JP2002014037A (ja) * 2000-04-26 2002-01-18 Fuji Photo Film Co Ltd 光断層画像化装置
JP2002050816A (ja) * 2000-08-02 2002-02-15 Fujitsu Ltd 光増幅器
WO2008090599A1 (ja) * 2007-01-22 2008-07-31 School Juridical Person Kitasato Institute オプティカル・コヒーレンス・トモグラフィー装置
JP2010540914A (ja) * 2007-09-28 2010-12-24 カール ツァイス メディテック アクチエンゲゼルシャフト ショート・コヒーレンス干渉計
WO2013118541A1 (ja) * 2012-02-08 2013-08-15 株式会社 日立ハイテクノロジーズ 光断層画像測定装置
JP2014525563A (ja) * 2011-08-19 2014-09-29 マイケルソン ダイアグノステックス リミテッド 干渉計用検出回路
JP2018521326A (ja) * 2015-07-22 2018-08-02 メドルミクス, エセ.エレ.Medlumics, S.L. 抑制された多重散乱クロストークを有する複数の干渉計を用いる高速光干渉断層撮影
JP2020060455A (ja) * 2018-10-10 2020-04-16 株式会社吉田製作所 光干渉断層画像生成装置
JP2021503595A (ja) * 2017-11-16 2021-02-12 クオリティー ヴィジョン インターナショナル インコーポレイテッドＱｕａｌｉｔｙ Ｖｉｓｉｏｎ Ｉｎｔｅｒｎａｔｉｏｎａｌ， Ｉｎｃ． 測定機のための複数ビーム走査システム

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03123323A (ja) * 1989-10-06 1991-05-27 Furukawa Electric Co Ltd:The ファイバカップラー
JP2002014037A (ja) * 2000-04-26 2002-01-18 Fuji Photo Film Co Ltd 光断層画像化装置
JP2002050816A (ja) * 2000-08-02 2002-02-15 Fujitsu Ltd 光増幅器
WO2008090599A1 (ja) * 2007-01-22 2008-07-31 School Juridical Person Kitasato Institute オプティカル・コヒーレンス・トモグラフィー装置
JP2010540914A (ja) * 2007-09-28 2010-12-24 カール ツァイス メディテック アクチエンゲゼルシャフト ショート・コヒーレンス干渉計
JP2014525563A (ja) * 2011-08-19 2014-09-29 マイケルソン ダイアグノステックス リミテッド 干渉計用検出回路
WO2013118541A1 (ja) * 2012-02-08 2013-08-15 株式会社 日立ハイテクノロジーズ 光断層画像測定装置
JP2018521326A (ja) * 2015-07-22 2018-08-02 メドルミクス, エセ.エレ.Medlumics, S.L. 抑制された多重散乱クロストークを有する複数の干渉計を用いる高速光干渉断層撮影
JP2021503595A (ja) * 2017-11-16 2021-02-12 クオリティー ヴィジョン インターナショナル インコーポレイテッドＱｕａｌｉｔｙ Ｖｉｓｉｏｎ Ｉｎｔｅｒｎａｔｉｏｎａｌ， Ｉｎｃ． 測定機のための複数ビーム走査システム
JP2020060455A (ja) * 2018-10-10 2020-04-16 株式会社吉田製作所 光干渉断層画像生成装置

Also Published As

Publication number Publication date
JP7666598B2 (ja) 2025-04-22
WO2023275929A1 (ja) 2023-01-05
US20240288263A1 (en) 2024-08-29

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