JPWO2023189002A5 - - Google Patents

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Publication number
JPWO2023189002A5
JPWO2023189002A5 JP2024511433A JP2024511433A JPWO2023189002A5 JP WO2023189002 A5 JPWO2023189002 A5 JP WO2023189002A5 JP 2024511433 A JP2024511433 A JP 2024511433A JP 2024511433 A JP2024511433 A JP 2024511433A JP WO2023189002 A5 JPWO2023189002 A5 JP WO2023189002A5
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JP
Japan
Prior art keywords
thin film
film transistor
crystal orientation
semiconductor layer
oxide semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024511433A
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English (en)
Japanese (ja)
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JPWO2023189002A1 (https=
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/006035 external-priority patent/WO2023189002A1/ja
Publication of JPWO2023189002A1 publication Critical patent/JPWO2023189002A1/ja
Publication of JPWO2023189002A5 publication Critical patent/JPWO2023189002A5/ja
Pending legal-status Critical Current

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JP2024511433A 2022-03-30 2023-02-20 Pending JPWO2023189002A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022057449 2022-03-30
PCT/JP2023/006035 WO2023189002A1 (ja) 2022-03-30 2023-02-20 薄膜トランジスタ及び電子機器

Publications (2)

Publication Number Publication Date
JPWO2023189002A1 JPWO2023189002A1 (https=) 2023-10-05
JPWO2023189002A5 true JPWO2023189002A5 (https=) 2024-12-10

Family

ID=88200383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024511433A Pending JPWO2023189002A1 (https=) 2022-03-30 2023-02-20

Country Status (7)

Country Link
US (1) US20250015196A1 (https=)
JP (1) JPWO2023189002A1 (https=)
KR (1) KR102944325B1 (https=)
CN (1) CN118805263A (https=)
DE (1) DE112023000799T5 (https=)
TW (1) TWI887624B (https=)
WO (1) WO2023189002A1 (https=)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8871565B2 (en) 2010-09-13 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
JP5189674B2 (ja) * 2010-12-28 2013-04-24 出光興産株式会社 酸化物半導体薄膜層を有する積層構造、積層構造の製造方法、薄膜トランジスタ及び表示装置
EP2880690B1 (en) 2012-08-03 2019-02-27 Semiconductor Energy Laboratory Co. Ltd. Semiconductor device with oxide semiconductor stacked film
TWI761605B (zh) 2012-09-14 2022-04-21 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
KR102220279B1 (ko) 2012-10-19 2021-02-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막을 포함하는 다층막 및 반도체 장치의 제작 방법
US9425217B2 (en) 2013-09-23 2016-08-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
CN109121438B (zh) 2016-02-12 2022-02-18 株式会社半导体能源研究所 半导体装置以及包括该半导体装置的显示装置
JP7187322B2 (ja) * 2017-02-01 2022-12-12 出光興産株式会社 結晶質酸化物半導体薄膜、積層体の製造方法、薄膜トランジスタ、薄膜トランジスタの製造方法、電子機器、車載用表示装置
KR102738325B1 (ko) * 2019-10-30 2024-12-03 엘지디스플레이 주식회사 박막 트랜지스터, 그를 포함한 게이트 구동부, 및 그를 포함한 표시장치

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