JPWO2023073802A1 - - Google Patents
Info
- Publication number
- JPWO2023073802A1 JPWO2023073802A1 JP2023555927A JP2023555927A JPWO2023073802A1 JP WO2023073802 A1 JPWO2023073802 A1 JP WO2023073802A1 JP 2023555927 A JP2023555927 A JP 2023555927A JP 2023555927 A JP2023555927 A JP 2023555927A JP WO2023073802 A1 JPWO2023073802 A1 JP WO2023073802A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2021/039441 WO2023073802A1 (ja) | 2021-10-26 | 2021-10-26 | 半導体集積回路装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023073802A1 true JPWO2023073802A1 (https=) | 2023-05-04 |
| JP7558424B2 JP7558424B2 (ja) | 2024-09-30 |
Family
ID=86159237
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023555927A Active JP7558424B2 (ja) | 2021-10-26 | 2021-10-26 | 半導体集積回路装置 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7558424B2 (https=) |
| WO (1) | WO2023073802A1 (https=) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6232714A (ja) * | 1985-08-06 | 1987-02-12 | Clarion Co Ltd | オフセツト電圧補正回路 |
| JPH0829493A (ja) * | 1994-07-14 | 1996-02-02 | Fujitsu Ltd | 半導体集積回路装置 |
| JPH09139635A (ja) * | 1995-09-12 | 1997-05-27 | Toshiba Corp | カレントミラー回路 |
| US6008673A (en) * | 1997-09-30 | 1999-12-28 | Intel Corporation | High speed, low power, current mode comparator |
| US20110012605A1 (en) * | 2009-07-20 | 2011-01-20 | Texas Instruments Incorporated | Current based overvoltage and undervoltage detector |
| JP2012117983A (ja) * | 2010-12-02 | 2012-06-21 | Advantest Corp | 電子デバイスおよび測定装置 |
| JP2016211917A (ja) * | 2015-05-01 | 2016-12-15 | 国立研究開発法人産業技術総合研究所 | 半導体チップ、半導体装置及び半導体検査システム |
| JP2017005609A (ja) * | 2015-06-15 | 2017-01-05 | 株式会社デンソー | 過電圧検出回路 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7363657B2 (ja) * | 2020-04-21 | 2023-10-18 | 株式会社デンソー | 過電圧判定回路 |
-
2021
- 2021-10-26 JP JP2023555927A patent/JP7558424B2/ja active Active
- 2021-10-26 WO PCT/JP2021/039441 patent/WO2023073802A1/ja not_active Ceased
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6232714A (ja) * | 1985-08-06 | 1987-02-12 | Clarion Co Ltd | オフセツト電圧補正回路 |
| JPH0829493A (ja) * | 1994-07-14 | 1996-02-02 | Fujitsu Ltd | 半導体集積回路装置 |
| JPH09139635A (ja) * | 1995-09-12 | 1997-05-27 | Toshiba Corp | カレントミラー回路 |
| US6008673A (en) * | 1997-09-30 | 1999-12-28 | Intel Corporation | High speed, low power, current mode comparator |
| US20110012605A1 (en) * | 2009-07-20 | 2011-01-20 | Texas Instruments Incorporated | Current based overvoltage and undervoltage detector |
| JP2012117983A (ja) * | 2010-12-02 | 2012-06-21 | Advantest Corp | 電子デバイスおよび測定装置 |
| JP2016211917A (ja) * | 2015-05-01 | 2016-12-15 | 国立研究開発法人産業技術総合研究所 | 半導体チップ、半導体装置及び半導体検査システム |
| JP2017005609A (ja) * | 2015-06-15 | 2017-01-05 | 株式会社デンソー | 過電圧検出回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7558424B2 (ja) | 2024-09-30 |
| WO2023073802A1 (ja) | 2023-05-04 |
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