JPWO2023032286A1 - - Google Patents
Info
- Publication number
- JPWO2023032286A1 JPWO2023032286A1 JP2023545039A JP2023545039A JPWO2023032286A1 JP WO2023032286 A1 JPWO2023032286 A1 JP WO2023032286A1 JP 2023545039 A JP2023545039 A JP 2023545039A JP 2023545039 A JP2023545039 A JP 2023545039A JP WO2023032286 A1 JPWO2023032286 A1 JP WO2023032286A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
- G21K5/02—Irradiation devices having no beam-forming means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/204—Sources of radiation source created from radiated target
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021141055 | 2021-08-31 | ||
| JP2021141055 | 2021-08-31 | ||
| PCT/JP2022/010561 WO2023032286A1 (ja) | 2021-08-31 | 2022-03-10 | 蛍光x線分析装置およびx線の絞り部材 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2023032286A1 true JPWO2023032286A1 (https=) | 2023-03-09 |
| JPWO2023032286A5 JPWO2023032286A5 (https=) | 2024-05-16 |
| JP7711760B2 JP7711760B2 (ja) | 2025-07-23 |
Family
ID=85411782
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023545039A Active JP7711760B2 (ja) | 2021-08-31 | 2022-03-10 | 蛍光x線分析装置およびx線の絞り部材 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12523623B2 (https=) |
| JP (1) | JP7711760B2 (https=) |
| CN (1) | CN117897610A (https=) |
| WO (1) | WO2023032286A1 (https=) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0288607U (https=) * | 1988-12-28 | 1990-07-13 | ||
| JPH07140573A (ja) * | 1992-10-09 | 1995-06-02 | Tadashi Yogi | X線の不用線束除去用自動絞り |
| JPH08247968A (ja) * | 1995-03-07 | 1996-09-27 | Ishikawajima Harima Heavy Ind Co Ltd | 非破壊検査装置 |
| JP2001085192A (ja) * | 1999-09-17 | 2001-03-30 | Horiba Ltd | 漏洩x線遮蔽機構 |
| JP2002340824A (ja) * | 2001-05-15 | 2002-11-27 | Rigaku Industrial Co | 蛍光x線分析装置 |
| US20110255662A1 (en) * | 2010-04-15 | 2011-10-20 | Bruker Axs Handheld, Inc. | Compact collimating device |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2503862B2 (ja) | 1993-04-23 | 1996-06-05 | 株式会社島津製作所 | 蛍光x線分析装置 |
| JP3639855B2 (ja) | 1998-10-30 | 2005-04-20 | 理学電機工業株式会社 | 蛍光x線分析装置 |
| JP2001208705A (ja) | 2000-01-27 | 2001-08-03 | Mitsubishi Heavy Ind Ltd | 散乱x線式欠陥検出装置及びx線検出装置 |
| JP2009002795A (ja) * | 2007-06-21 | 2009-01-08 | Shimadzu Corp | 蛍光x線分析装置 |
-
2022
- 2022-03-10 WO PCT/JP2022/010561 patent/WO2023032286A1/ja not_active Ceased
- 2022-03-10 CN CN202280059055.2A patent/CN117897610A/zh active Pending
- 2022-03-10 JP JP2023545039A patent/JP7711760B2/ja active Active
- 2022-03-10 US US18/688,318 patent/US12523623B2/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0288607U (https=) * | 1988-12-28 | 1990-07-13 | ||
| JPH07140573A (ja) * | 1992-10-09 | 1995-06-02 | Tadashi Yogi | X線の不用線束除去用自動絞り |
| JPH08247968A (ja) * | 1995-03-07 | 1996-09-27 | Ishikawajima Harima Heavy Ind Co Ltd | 非破壊検査装置 |
| JP2001085192A (ja) * | 1999-09-17 | 2001-03-30 | Horiba Ltd | 漏洩x線遮蔽機構 |
| JP2002340824A (ja) * | 2001-05-15 | 2002-11-27 | Rigaku Industrial Co | 蛍光x線分析装置 |
| US20110255662A1 (en) * | 2010-04-15 | 2011-10-20 | Bruker Axs Handheld, Inc. | Compact collimating device |
Non-Patent Citations (1)
| Title |
|---|
| S1 TAITAN, JPN6025011984, 29 May 2020 (2020-05-29), ISSN: 0005614651 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN117897610A (zh) | 2024-04-16 |
| JP7711760B2 (ja) | 2025-07-23 |
| US20240385130A1 (en) | 2024-11-21 |
| US12523623B2 (en) | 2026-01-13 |
| WO2023032286A1 (ja) | 2023-03-09 |
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