JPWO2022224654A1 - - Google Patents
Info
- Publication number
- JPWO2022224654A1 JPWO2022224654A1 JP2023516349A JP2023516349A JPWO2022224654A1 JP WO2022224654 A1 JPWO2022224654 A1 JP WO2022224654A1 JP 2023516349 A JP2023516349 A JP 2023516349A JP 2023516349 A JP2023516349 A JP 2023516349A JP WO2022224654 A1 JPWO2022224654 A1 JP WO2022224654A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021071316 | 2021-04-20 | ||
| PCT/JP2022/012397 WO2022224654A1 (ja) | 2021-04-20 | 2022-03-17 | 放射線検出素子、放射線検出器及び放射線検出装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2022224654A1 true JPWO2022224654A1 (de) | 2022-10-27 |
Family
ID=83722897
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023516349A Pending JPWO2022224654A1 (de) | 2021-04-20 | 2022-03-17 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2022224654A1 (de) |
| WO (1) | WO2022224654A1 (de) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63156368A (ja) * | 1986-12-19 | 1988-06-29 | Shimadzu Corp | 半導体放射線検出器 |
| JP2004179290A (ja) * | 2002-11-26 | 2004-06-24 | Kansai Tlo Kk | 半導体放射線検出器 |
| US8466534B2 (en) * | 2009-04-03 | 2013-06-18 | Shimadzu Corporation | Radiation detector, and a radiographic apparatus having the same |
| JP7197506B2 (ja) * | 2017-12-15 | 2022-12-27 | 株式会社堀場製作所 | シリコンドリフト型放射線検出素子、シリコンドリフト型放射線検出器及び放射線検出装置 |
| WO2019148474A1 (en) * | 2018-02-03 | 2019-08-08 | Shenzhen Xpectvision Technology Co., Ltd. | Methods of recovering radiation detector |
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2022
- 2022-03-17 JP JP2023516349A patent/JPWO2022224654A1/ja active Pending
- 2022-03-17 WO PCT/JP2022/012397 patent/WO2022224654A1/ja active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022224654A1 (ja) | 2022-10-27 |