JPWO2022113336A5 - - Google Patents
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- Publication number
- JPWO2022113336A5 JPWO2022113336A5 JP2022564993A JP2022564993A JPWO2022113336A5 JP WO2022113336 A5 JPWO2022113336 A5 JP WO2022113336A5 JP 2022564993 A JP2022564993 A JP 2022564993A JP 2022564993 A JP2022564993 A JP 2022564993A JP WO2022113336 A5 JPWO2022113336 A5 JP WO2022113336A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- exchange chamber
- charged particle
- particle beam
- beam device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 claims description 13
- 238000004140 cleaning Methods 0.000 claims description 10
- 238000010186 staining Methods 0.000 claims description 9
- 239000007788 liquid Substances 0.000 claims description 6
- 230000001954 sterilising effect Effects 0.000 claims description 5
- 238000004659 sterilization and disinfection Methods 0.000 claims description 5
- 239000000758 substrate Substances 0.000 claims description 4
- 238000004043 dyeing Methods 0.000 claims description 3
- 238000005406 washing Methods 0.000 claims description 3
- 229910001385 heavy metal Inorganic materials 0.000 claims 2
- 238000003384 imaging method Methods 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2020/044477 WO2022113336A1 (ja) | 2020-11-30 | 2020-11-30 | 免疫染色方法、試料交換室、及び荷電粒子線装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022113336A1 JPWO2022113336A1 (https=) | 2022-06-02 |
| JPWO2022113336A5 true JPWO2022113336A5 (https=) | 2023-08-14 |
| JP7530441B2 JP7530441B2 (ja) | 2024-08-07 |
Family
ID=81755501
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022564993A Active JP7530441B2 (ja) | 2020-11-30 | 2020-11-30 | 免疫染色方法、試料交換室、及び荷電粒子線装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12546687B2 (https=) |
| JP (1) | JP7530441B2 (https=) |
| CN (1) | CN116615652B (https=) |
| WO (1) | WO2022113336A1 (https=) |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08335449A (ja) | 1995-06-06 | 1996-12-17 | Kawasaki Steel Corp | 走査電子顕微鏡用試料の前処理方法及び装置 |
| JP4178741B2 (ja) * | 2000-11-02 | 2008-11-12 | 株式会社日立製作所 | 荷電粒子線装置および試料作製装置 |
| WO2003104846A2 (en) | 2002-06-05 | 2003-12-18 | Quantomix Ltd. | A sample enclosure for a scanning electron microscope and methods of use thereof |
| EP1953225A1 (en) | 2005-10-14 | 2008-08-06 | Genomembrane, Inc. | Novel transporter protein in mammal and utilization of the same |
| JP4991144B2 (ja) | 2005-11-30 | 2012-08-01 | 株式会社日立ハイテクノロジーズ | 試料測定方法、及び荷電粒子線装置 |
| US8507879B2 (en) * | 2006-06-08 | 2013-08-13 | Xei Scientific, Inc. | Oxidative cleaning method and apparatus for electron microscopes using UV excitation in an oxygen radical source |
| EP1890136A1 (en) * | 2006-08-16 | 2008-02-20 | FEI Company | Method for obtaining images from slices of a specimen |
| WO2008044351A1 (fr) | 2006-10-12 | 2008-04-17 | National University Corporation Okayama University | Nouvelle protéine transporteuse chez les mammifères et son utilisation |
| JP2009080108A (ja) | 2007-09-05 | 2009-04-16 | Shiseido Co Ltd | 生物組織薄切切片からｓｅｍ標本を作製する方法及びｓｅｍ標本、並びに皮膚の状態を評価する方法 |
| JP2011034895A (ja) * | 2009-08-05 | 2011-02-17 | Hitachi High-Technologies Corp | 荷電粒子線装置及び試料汚染除去機構 |
| TW201222617A (en) | 2010-10-07 | 2012-06-01 | Hitachi High Tech Corp | Sample device for charged particle beam |
| JP6818346B2 (ja) | 2016-04-28 | 2021-01-20 | 国立大学法人浜松医科大学 | 電子顕微鏡によるナノ粒子の直接的な同定・定量のための検出キットおよび方法 |
| JP6330074B2 (ja) | 2017-03-21 | 2018-05-23 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材 |
| JP6669795B2 (ja) | 2018-03-15 | 2020-03-18 | 株式会社ホロン | 走査型電子顕微鏡および検査装置 |
-
2020
- 2020-11-30 CN CN202080107489.6A patent/CN116615652B/zh active Active
- 2020-11-30 US US18/039,446 patent/US12546687B2/en active Active
- 2020-11-30 WO PCT/JP2020/044477 patent/WO2022113336A1/ja not_active Ceased
- 2020-11-30 JP JP2022564993A patent/JP7530441B2/ja active Active
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