JPWO2021214995A1 - - Google Patents

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Publication number
JPWO2021214995A1
JPWO2021214995A1 JP2022516808A JP2022516808A JPWO2021214995A1 JP WO2021214995 A1 JPWO2021214995 A1 JP WO2021214995A1 JP 2022516808 A JP2022516808 A JP 2022516808A JP 2022516808 A JP2022516808 A JP 2022516808A JP WO2021214995 A1 JPWO2021214995 A1 JP WO2021214995A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022516808A
Other languages
Japanese (ja)
Other versions
JPWO2021214995A5 (https=
JP7567905B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021214995A1 publication Critical patent/JPWO2021214995A1/ja
Publication of JPWO2021214995A5 publication Critical patent/JPWO2021214995A5/ja
Application granted granted Critical
Publication of JP7567905B2 publication Critical patent/JP7567905B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022516808A 2020-04-24 2020-04-24 判定システム Active JP7567905B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/017750 WO2021214995A1 (ja) 2020-04-24 2020-04-24 判定装置

Publications (3)

Publication Number Publication Date
JPWO2021214995A1 true JPWO2021214995A1 (https=) 2021-10-28
JPWO2021214995A5 JPWO2021214995A5 (https=) 2022-12-28
JP7567905B2 JP7567905B2 (ja) 2024-10-16

Family

ID=78270624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022516808A Active JP7567905B2 (ja) 2020-04-24 2020-04-24 判定システム

Country Status (4)

Country Link
US (1) US12437416B2 (https=)
EP (1) EP4141422B1 (https=)
JP (1) JP7567905B2 (https=)
WO (1) WO2021214995A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7835277B2 (ja) * 2022-04-28 2026-03-25 日本電気株式会社 検査システム、検査方法、及びプログラム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5011094A (https=) * 1973-05-29 1975-02-04
JPH0792109A (ja) * 1993-09-22 1995-04-07 Shibuya Kogyo Co Ltd 異物検査装置
JP2010048712A (ja) * 2008-08-22 2010-03-04 Olympus Corp 欠陥検査装置
JP2010181231A (ja) * 2009-02-04 2010-08-19 Hitachi Information & Control Solutions Ltd 不透明溶液中の異物検査装置および異物検査方法
JP2011085575A (ja) * 2009-09-16 2011-04-28 Hitachi Computer Peripherals Co Ltd 流動物内の異物検出方法、異物検出装置及び異物検出プログラム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0792108A (ja) * 1993-09-24 1995-04-07 Kirin Techno Syst:Kk 検査用照明装置
DE60223956T3 (de) * 2001-03-14 2011-05-19 Hitachi Information & Control Solutions, Ltd., Hitachi Untersuchungsgerät und System zur Untersuchung von Fremdkörpern in mit Flüssigkeit gefüllten Behältern
JP3668449B2 (ja) 2001-09-28 2005-07-06 日立エンジニアリング株式会社 透明容器等の充填液中の異物検出装置
JP4743552B2 (ja) * 2002-12-27 2011-08-10 キリンテクノシステム株式会社 異物検査方法、及び異物検査装置並びに異物検査用の照明装置
JP5374078B2 (ja) * 2008-06-16 2013-12-25 オリンパス株式会社 画像処理装置、画像処理方法および画像処理プログラム
JP5591849B2 (ja) * 2012-03-09 2014-09-17 株式会社 日立産業制御ソリューションズ 異物検査装置、異物検査プログラム、異物検査方法
JP6462544B2 (ja) * 2015-09-17 2019-01-30 株式会社東芝 推定装置、方法及びプログラム
US11012633B2 (en) * 2018-03-22 2021-05-18 Ricoh Company, Ltd. Image capturing apparatus, image capturing method, and image processing apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5011094A (https=) * 1973-05-29 1975-02-04
JPH0792109A (ja) * 1993-09-22 1995-04-07 Shibuya Kogyo Co Ltd 異物検査装置
JP2010048712A (ja) * 2008-08-22 2010-03-04 Olympus Corp 欠陥検査装置
JP2010181231A (ja) * 2009-02-04 2010-08-19 Hitachi Information & Control Solutions Ltd 不透明溶液中の異物検査装置および異物検査方法
JP2011085575A (ja) * 2009-09-16 2011-04-28 Hitachi Computer Peripherals Co Ltd 流動物内の異物検出方法、異物検出装置及び異物検出プログラム

Also Published As

Publication number Publication date
EP4141422A1 (en) 2023-03-01
WO2021214995A1 (ja) 2021-10-28
EP4141422B1 (en) 2026-02-11
US12437416B2 (en) 2025-10-07
US20230154012A1 (en) 2023-05-18
EP4141422A4 (en) 2023-06-21
JP7567905B2 (ja) 2024-10-16

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