JPS6459863A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS6459863A JPS6459863A JP21687687A JP21687687A JPS6459863A JP S6459863 A JPS6459863 A JP S6459863A JP 21687687 A JP21687687 A JP 21687687A JP 21687687 A JP21687687 A JP 21687687A JP S6459863 A JPS6459863 A JP S6459863A
- Authority
- JP
- Japan
- Prior art keywords
- amorphous silicon
- tft
- phosphorus
- liquid crystal
- serving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract 6
- 229910021417 amorphous silicon Inorganic materials 0.000 abstract 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 abstract 3
- 239000010408 film Substances 0.000 abstract 3
- 239000004973 liquid crystal related substance Substances 0.000 abstract 3
- 229910052698 phosphorus Inorganic materials 0.000 abstract 3
- 239000011574 phosphorus Substances 0.000 abstract 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 abstract 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 abstract 1
- 229910052581 Si3N4 Inorganic materials 0.000 abstract 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract 1
- 229910052782 aluminium Inorganic materials 0.000 abstract 1
- 238000005229 chemical vapour deposition Methods 0.000 abstract 1
- 239000011521 glass Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
Abstract
PURPOSE:To obtain a thin film transistor (TFT) driving a liquid crystal display showing good image characteristics, by specifying a film thickness of an amorphous silicon semiconductor comprising phosphorus which improves an ohmic contact between a semiconductor layer and source and drain electrodes of the TFT for constituting an image display apparatus in combination with a liquid crystal. CONSTITUTION:A gate electrode 2 comprising chrome is formed on a glass substrate 1 and silicon nitride (4000A) serving as a gate insulating film 3, amorphous silicon (4000A) serving as a semiconductor layer 4, and amorphous silicon semiconductor layers 5a and 5b comprising phosphorus are sequentially and selectively deposited by a plasma chemical vapor deposition method, and aluminum serving as source and drain electrodes 6a and 6b is selectively formed to complete a TFT. At this time, by making the film thickness of the amorphous silicon semiconductor layer comprising phosphorus 80A-440A, a sufficient ON current and an ON/OFF ratio can be obtained and a liquid crystal display showing good image characteristics can be driven.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62216876A JP2667173B2 (en) | 1987-08-31 | 1987-08-31 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62216876A JP2667173B2 (en) | 1987-08-31 | 1987-08-31 | Semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6459863A true JPS6459863A (en) | 1989-03-07 |
JP2667173B2 JP2667173B2 (en) | 1997-10-27 |
Family
ID=16695298
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62216876A Expired - Lifetime JP2667173B2 (en) | 1987-08-31 | 1987-08-31 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2667173B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0647971A1 (en) * | 1993-04-23 | 1995-04-12 | Kabushiki Kaisha Toshiba | Thin film transistor and display using the transistor |
KR100237004B1 (en) * | 1996-07-09 | 2000-01-15 | 구본준 | Manufacturing method of thin-film transistor |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56135968A (en) * | 1980-03-27 | 1981-10-23 | Canon Inc | Amorphous silicon thin film transistor and manufacture thereof |
JPS62128566A (en) * | 1985-11-29 | 1987-06-10 | Seiko Instr & Electronics Ltd | Manufacture of thin film transistor |
-
1987
- 1987-08-31 JP JP62216876A patent/JP2667173B2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56135968A (en) * | 1980-03-27 | 1981-10-23 | Canon Inc | Amorphous silicon thin film transistor and manufacture thereof |
JPS62128566A (en) * | 1985-11-29 | 1987-06-10 | Seiko Instr & Electronics Ltd | Manufacture of thin film transistor |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5811846A (en) * | 1993-04-03 | 1998-09-22 | Kabushiki Kaisha Toshiba | Thin-film transistor and display device using the same |
EP0647971A1 (en) * | 1993-04-23 | 1995-04-12 | Kabushiki Kaisha Toshiba | Thin film transistor and display using the transistor |
EP0647971A4 (en) * | 1993-04-23 | 1995-05-03 | ||
US5563432A (en) * | 1993-04-23 | 1996-10-08 | Kabushiki Kaisha Toshiba | Thin-film transistor and display device using the same |
KR100237004B1 (en) * | 1996-07-09 | 2000-01-15 | 구본준 | Manufacturing method of thin-film transistor |
Also Published As
Publication number | Publication date |
---|---|
JP2667173B2 (en) | 1997-10-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
EXPY | Cancellation because of completion of term | ||
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080627 Year of fee payment: 11 |