JPS6435908A - Formation of polysilicon film - Google Patents

Formation of polysilicon film

Info

Publication number
JPS6435908A
JPS6435908A JP19102487A JP19102487A JPS6435908A JP S6435908 A JPS6435908 A JP S6435908A JP 19102487 A JP19102487 A JP 19102487A JP 19102487 A JP19102487 A JP 19102487A JP S6435908 A JPS6435908 A JP S6435908A
Authority
JP
Japan
Prior art keywords
layer
amorphous silicon
band gap
polysilicon film
optical band
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19102487A
Other languages
Japanese (ja)
Inventor
Hiroyuki Okamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP19102487A priority Critical patent/JPS6435908A/en
Publication of JPS6435908A publication Critical patent/JPS6435908A/en
Pending legal-status Critical Current

Links

Landscapes

  • Thin Film Transistor (AREA)
  • Recrystallisation Techniques (AREA)

Abstract

PURPOSE:To make it possible to obtain the polysilicon film having a large crystal grain size by a method wherein the amorphous silicon film, which is the precursor of the polysilicon film, is formed into the three-layer structure having a specific optical band gap value. CONSTITUTION:After an amorphous silicon film 2 has been formed on a substrate 1, the amorphous silicon film is covered on a polysilicon film 3 by conducting thermal annealing. Then, the amorphous silicon film 2 is divided into the first layer 2-1 having the optical band gap value of 1.72 eV or less or 1.77 eV or more, the second layer 2-2 having the optical band gap value of 1.73-1.76 eV, and the third layer 2-3 having the optical band gap value same as the first layer 2-1. As a result, crystal grain size can be made larger, and the degree of shifting of field effect can also be improved.
JP19102487A 1987-07-30 1987-07-30 Formation of polysilicon film Pending JPS6435908A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19102487A JPS6435908A (en) 1987-07-30 1987-07-30 Formation of polysilicon film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19102487A JPS6435908A (en) 1987-07-30 1987-07-30 Formation of polysilicon film

Publications (1)

Publication Number Publication Date
JPS6435908A true JPS6435908A (en) 1989-02-07

Family

ID=16267625

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19102487A Pending JPS6435908A (en) 1987-07-30 1987-07-30 Formation of polysilicon film

Country Status (1)

Country Link
JP (1) JPS6435908A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102629558A (en) * 2012-01-09 2012-08-08 深超光电(深圳)有限公司 Manufacturing method of low-temperature polycrystalline silicon (poly-Si) thin film transistor (TFT)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102629558A (en) * 2012-01-09 2012-08-08 深超光电(深圳)有限公司 Manufacturing method of low-temperature polycrystalline silicon (poly-Si) thin film transistor (TFT)

Similar Documents

Publication Publication Date Title
JPS56142630A (en) Manufacture of semiconductor device
JPS5681974A (en) Manufacture of mos type semiconductor device
JPS56115525A (en) Manufacture of semiconductor device
JPS54157485A (en) Planar semiconductor device
JPS6435908A (en) Formation of polysilicon film
JPS5678155A (en) Semiconductor device and manufacture thereof
JPS575328A (en) Growing method for semiconductor crystal
JPS5420671A (en) Production of semiconductor devices
JPS53148394A (en) Manufacture of semiconductor device
JPS5317068A (en) Semiconductor device and its production
JPS5758338A (en) Semiconductor integrated device
JPS53129981A (en) Production of semiconductor device
JPS52124860A (en) Electrode formation method for semiconductor devices
JPS57111043A (en) Semiconductor integrated circuit and manufacture thereof
JPS55110056A (en) Semiconductor device
JPS56146254A (en) Manufacture of semiconductor device
JPS53130979A (en) Manufacture for semiconductor device
JPS5753958A (en) Semiconductor device
JPS5322382A (en) Production of dielectric isolating substrate
JPS577926A (en) Manufacture of semiconductor device
JPS53101977A (en) Diffusion method of inpurity to semiconductor substrate
JPS5376776A (en) Semiconductor device
JPS5410688A (en) Production of semiconductor device
JPS5272162A (en) Production of semiconductor device
JPS54128678A (en) Forming method of insulation film