JPS642177U - - Google Patents

Info

Publication number
JPS642177U
JPS642177U JP9758987U JP9758987U JPS642177U JP S642177 U JPS642177 U JP S642177U JP 9758987 U JP9758987 U JP 9758987U JP 9758987 U JP9758987 U JP 9758987U JP S642177 U JPS642177 U JP S642177U
Authority
JP
Japan
Prior art keywords
contact piece
base
insulating base
guide insulating
connection board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9758987U
Other languages
English (en)
Japanese (ja)
Other versions
JP2519621Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9758987U priority Critical patent/JP2519621Y2/ja
Publication of JPS642177U publication Critical patent/JPS642177U/ja
Application granted granted Critical
Publication of JP2519621Y2 publication Critical patent/JP2519621Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
JP9758987U 1987-06-24 1987-06-24 半導体素子用測定装置 Expired - Lifetime JP2519621Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9758987U JP2519621Y2 (ja) 1987-06-24 1987-06-24 半導体素子用測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9758987U JP2519621Y2 (ja) 1987-06-24 1987-06-24 半導体素子用測定装置

Publications (2)

Publication Number Publication Date
JPS642177U true JPS642177U (US20100268047A1-20101021-C00003.png) 1989-01-09
JP2519621Y2 JP2519621Y2 (ja) 1996-12-11

Family

ID=30964687

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9758987U Expired - Lifetime JP2519621Y2 (ja) 1987-06-24 1987-06-24 半導体素子用測定装置

Country Status (1)

Country Link
JP (1) JP2519621Y2 (US20100268047A1-20101021-C00003.png)

Also Published As

Publication number Publication date
JP2519621Y2 (ja) 1996-12-11

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