JPS6417467U - - Google Patents
Info
- Publication number
- JPS6417467U JPS6417467U JP11229287U JP11229287U JPS6417467U JP S6417467 U JPS6417467 U JP S6417467U JP 11229287 U JP11229287 U JP 11229287U JP 11229287 U JP11229287 U JP 11229287U JP S6417467 U JPS6417467 U JP S6417467U
- Authority
- JP
- Japan
- Prior art keywords
- needle
- lead wire
- inspected
- polished
- bringing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims 2
- 238000005259 measurement Methods 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11229287U JPS6417467U (US20020193084A1-20021219-M00002.png) | 1987-07-21 | 1987-07-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11229287U JPS6417467U (US20020193084A1-20021219-M00002.png) | 1987-07-21 | 1987-07-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6417467U true JPS6417467U (US20020193084A1-20021219-M00002.png) | 1989-01-27 |
Family
ID=31351097
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11229287U Pending JPS6417467U (US20020193084A1-20021219-M00002.png) | 1987-07-21 | 1987-07-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6417467U (US20020193084A1-20021219-M00002.png) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11971875B2 (en) | 2019-03-29 | 2024-04-30 | Panasonic Intellectual Property Corporation Of America | Fault monitoring method, monitoring device, and recording medium |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS536574A (en) * | 1976-07-08 | 1978-01-21 | Denken Kk | Spring contact probe needle used for checking jig of semiconductor* hybric ic or the like |
| JPS5899760A (ja) * | 1981-12-09 | 1983-06-14 | Toshiba Corp | プロ−ブ装置 |
| JPS6080722A (ja) * | 1983-10-07 | 1985-05-08 | Kawaguchiko Seimitsu Kk | 電子秤 |
| JPS6117669B2 (US20020193084A1-20021219-M00002.png) * | 1978-12-26 | 1986-05-08 | Fujitsu Ltd | |
| JPS6221065A (ja) * | 1985-07-19 | 1987-01-29 | Koichi Yoshida | スプリング・コンタクト式プロ−ブ |
-
1987
- 1987-07-21 JP JP11229287U patent/JPS6417467U/ja active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS536574A (en) * | 1976-07-08 | 1978-01-21 | Denken Kk | Spring contact probe needle used for checking jig of semiconductor* hybric ic or the like |
| JPS6117669B2 (US20020193084A1-20021219-M00002.png) * | 1978-12-26 | 1986-05-08 | Fujitsu Ltd | |
| JPS5899760A (ja) * | 1981-12-09 | 1983-06-14 | Toshiba Corp | プロ−ブ装置 |
| JPS6080722A (ja) * | 1983-10-07 | 1985-05-08 | Kawaguchiko Seimitsu Kk | 電子秤 |
| JPS6221065A (ja) * | 1985-07-19 | 1987-01-29 | Koichi Yoshida | スプリング・コンタクト式プロ−ブ |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11971875B2 (en) | 2019-03-29 | 2024-04-30 | Panasonic Intellectual Property Corporation Of America | Fault monitoring method, monitoring device, and recording medium |
