JPS6417467U - - Google Patents

Info

Publication number
JPS6417467U
JPS6417467U JP11229287U JP11229287U JPS6417467U JP S6417467 U JPS6417467 U JP S6417467U JP 11229287 U JP11229287 U JP 11229287U JP 11229287 U JP11229287 U JP 11229287U JP S6417467 U JPS6417467 U JP S6417467U
Authority
JP
Japan
Prior art keywords
needle
lead wire
inspected
polished
bringing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11229287U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11229287U priority Critical patent/JPS6417467U/ja
Publication of JPS6417467U publication Critical patent/JPS6417467U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
JP11229287U 1987-07-21 1987-07-21 Pending JPS6417467U (US07534539-20090519-C00280.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11229287U JPS6417467U (US07534539-20090519-C00280.png) 1987-07-21 1987-07-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11229287U JPS6417467U (US07534539-20090519-C00280.png) 1987-07-21 1987-07-21

Publications (1)

Publication Number Publication Date
JPS6417467U true JPS6417467U (US07534539-20090519-C00280.png) 1989-01-27

Family

ID=31351097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11229287U Pending JPS6417467U (US07534539-20090519-C00280.png) 1987-07-21 1987-07-21

Country Status (1)

Country Link
JP (1) JPS6417467U (US07534539-20090519-C00280.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11971875B2 (en) 2019-03-29 2024-04-30 Panasonic Intellectual Property Corporation Of America Fault monitoring method, monitoring device, and recording medium

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS536574A (en) * 1976-07-08 1978-01-21 Denken Kk Spring contact probe needle used for checking jig of semiconductor* hybric ic or the like
JPS5899760A (ja) * 1981-12-09 1983-06-14 Toshiba Corp プロ−ブ装置
JPS6080722A (ja) * 1983-10-07 1985-05-08 Kawaguchiko Seimitsu Kk 電子秤
JPS6117669B2 (US07534539-20090519-C00280.png) * 1978-12-26 1986-05-08 Fujitsu Ltd
JPS6221065A (ja) * 1985-07-19 1987-01-29 Koichi Yoshida スプリング・コンタクト式プロ−ブ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS536574A (en) * 1976-07-08 1978-01-21 Denken Kk Spring contact probe needle used for checking jig of semiconductor* hybric ic or the like
JPS6117669B2 (US07534539-20090519-C00280.png) * 1978-12-26 1986-05-08 Fujitsu Ltd
JPS5899760A (ja) * 1981-12-09 1983-06-14 Toshiba Corp プロ−ブ装置
JPS6080722A (ja) * 1983-10-07 1985-05-08 Kawaguchiko Seimitsu Kk 電子秤
JPS6221065A (ja) * 1985-07-19 1987-01-29 Koichi Yoshida スプリング・コンタクト式プロ−ブ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11971875B2 (en) 2019-03-29 2024-04-30 Panasonic Intellectual Property Corporation Of America Fault monitoring method, monitoring device, and recording medium

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