JPS6346843Y2 - - Google Patents

Info

Publication number
JPS6346843Y2
JPS6346843Y2 JP1981188227U JP18822781U JPS6346843Y2 JP S6346843 Y2 JPS6346843 Y2 JP S6346843Y2 JP 1981188227 U JP1981188227 U JP 1981188227U JP 18822781 U JP18822781 U JP 18822781U JP S6346843 Y2 JPS6346843 Y2 JP S6346843Y2
Authority
JP
Japan
Prior art keywords
electrode
package
inspection
pinhole
sealed package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981188227U
Other languages
Japanese (ja)
Other versions
JPS5892658U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18822781U priority Critical patent/JPS5892658U/en
Publication of JPS5892658U publication Critical patent/JPS5892658U/en
Application granted granted Critical
Publication of JPS6346843Y2 publication Critical patent/JPS6346843Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Description

【考案の詳細な説明】 本考案は密封包装体の放電式ピンホール有無検
査に用いる電極に関する。
[Detailed Description of the Invention] The present invention relates to an electrode used for discharge-type pinhole detection in a sealed package.

更に詳言すれば本考案は、輸液やレトルト食品
等を密封包装したプラスチツク、ガラス等の電気
絶縁材製の密封包装体を電極間に臨ましめ、該電
極間に電圧を印加して該密封包装体上に放電電流
を生ぜしめ、この放電電流を検出して該密封包装
体のピンホール、クラツク等の有無を検査する場
合に用いられる電極装置に関する。
More specifically, the present invention involves placing a hermetically sealed package made of an electrically insulating material such as plastic or glass for an infusion or retort food, etc. between electrodes, and applying a voltage between the electrodes to seal the package. The present invention relates to an electrode device used for generating a discharge current on a package and detecting the discharge current to inspect the presence or absence of pinholes, cracks, etc. in the sealed package.

なお、実用新案答録請求の範囲の項及び以下の
記載においては、上記ピンホール、クラツク等を
「ピンホール」と総称する。
In addition, in the claims section of the Utility Model Answer and the following description, the above-mentioned pinholes, cracks, etc. are collectively referred to as "pinholes."

斯かるピンホール有無検査において従来用いら
れていた電極装置の電極は、例えば第1図に示す
ように、密封包装体Cの移送路中の検査位置にお
いて、該移送路に臨むように固定された電極E1
E2であつた。
The electrode of the electrode device conventionally used in such a pinhole presence inspection is fixed at the inspection position in the transfer path of the sealed package C so as to face the transfer path, as shown in FIG. 1, for example. Electrode E 1 ,
It was E2 .

そのため、密封包装体Cの被検査部位が図示の
如く、部位C1,C2とこれら部位に対し凹所とな
つた部位C3である場合には、電極E1と被検査部
位間の距離は、部位C1,C2については距離l1、部
位C3については距離l2,l2>l1である。
Therefore, when the parts to be inspected of the sealed package C are parts C 1 and C 2 and a part C 3 which is recessed relative to these parts as shown in the figure, the distance between the electrode E 1 and the part to be tested is is the distance l 1 for the parts C 1 and C 2 , and the distance l 2 for the part C 3 , l 2 >l 1 .

このように被検査部位の凹凸形状によつて電極
と被検査部位間の距離が変化するので、電極E1
及びE2間に印加される電圧を一定とすると、部
位C3のピンホールは、距離l2が長すぎて電圧不足
のため検出されない事態が発生する。部位C3
ピンホールをも検出すべく印加電圧を高く設定し
た場合には、部位C1,C2の包装体壁が該高電圧
に対し薄すきて絶縁破壊を起こすという事態も発
生する。また、上述の密封包装体の被検査部位
C1,C2,C3相互間に凹凸が無く、従つて電極と
被検査部位間の距離が一定に保たれるという場合
においても、これら部位相互間に壁厚の差が存す
る場合には、凹凸がある場合と同様の問題が発生
する。
In this way, the distance between the electrode and the tested part changes depending on the uneven shape of the tested part, so the electrode E 1
If the voltage applied between C and E 2 is constant, the pinhole at site C 3 may not be detected due to insufficient voltage because the distance l 2 is too long. If the applied voltage is set high in order to detect even the pinhole in the portion C3 , a situation may occur in which the walls of the package in the portions C1 and C2 become thin against the high voltage, causing dielectric breakdown. In addition, the part to be inspected of the above-mentioned sealed package
Even if there is no unevenness between C 1 , C 2 , and C 3 and the distance between the electrode and the area to be inspected is kept constant, if there is a difference in wall thickness between these areas, , the same problem occurs when there is unevenness.

すなわち、印加電圧を一定とすると肉厚壁の部
位については電圧不足のためにピンホールを検出
できない事態が発生し、印加電圧を高く設定する
と肉薄壁の部位が絶縁破壊を起すという問題であ
る。
In other words, if the applied voltage is constant, pinholes cannot be detected in areas with thick walls due to insufficient voltage, and if the applied voltage is set high, dielectric breakdown occurs in areas with thin walls. .

本考案の目的は、上記問題点を解決する密封包
装体の放電式ピンホール有無検査に用いる電極装
置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an electrode device for use in a discharge-type pinhole inspection of a sealed package that solves the above-mentioned problems.

本考案のこの目的は、密封包装体の放電式ピン
ホール有無検査に用いる電極装置にして、該密封
包装体の移送路中の検査位置において該移送路に
臨む電極と、該移送路に沿つて送られてくる密封
包装体が該検査位置を通過するとき、前記電極及
び該密封包装体の被検査部位間の距離がピンホー
ル検出可能な放電距離に保たれるように該電極を
前記被検査部位に対し前後動させるための電極駆
動装置とを備え、前記電極駆動装置が前記電極に
前進方向又は後退方向の偏倚力を与えるバネ装置
と、前記電極に前記バネ装置による偏倚力に勝る
反対偏倚力を与えることができる電磁石装置と、
前記密封包装体の被検査部位の状態(凹凸状態及
び/又は壁厚状態)に応じて、該電磁石装置をオ
ン−オフするスイッチ装置とを備えていることを
特徴とする電極装置により達成される。
The object of the present invention is to provide an electrode device for use in the discharge-type pinhole presence inspection of a sealed package, which includes an electrode facing the transfer path at an inspection position in the transfer path of the sealed package, and an electrode along the transfer path. When the incoming sealed package passes through the inspection position, the electrode is moved to the inspected area so that the distance between the electrode and the inspected part of the sealed package is maintained at a discharge distance that allows pinhole detection. an electrode driving device for moving the electrode back and forth with respect to the region, a spring device in which the electrode driving device applies a biasing force to the electrode in a forward direction or a backward direction, and an opposite biasing force to the electrode that exceeds the biasing force by the spring device. An electromagnetic device that can give power,
This is achieved by an electrode device comprising a switch device that turns on and off the electromagnetic device depending on the condition (unevenness condition and/or wall thickness condition) of the inspected portion of the sealed package. .

以下に本考案の実施例を、注射用輸液を密封包
装したポリエチレン製の密封包装体(以下、単に
「包装体」という)のピンホール有無検査に使用
するものに例をとり、図面に基き説明する。
The embodiments of the present invention will be explained below based on drawings, taking as an example the case used to inspect the presence of pinholes in polyethylene sealed packaging bodies (hereinafter simply referred to as "packaging bodies") in which infusions for injection are sealed. do.

第2図はいわゆる差動式ピンホール有無検査装
置例の慨略を示している。
FIG. 2 schematically shows an example of a so-called differential pinhole presence/absence inspection device.

この差動式装置は、図外給送装置により送られ
てくる包装体Aの移送路中の検査位置において該
移送路に臨設されて該包装体に臨むことができる
第1電極10と、2つの第2電極21,22を備
えている。第2電極21,22は、本考案実施例
である電極装置20の構成要素である。
This differential type device includes a first electrode 10 which is provided on the transfer path and can face the package A at an inspection position in the transfer path of the package A sent by a feeding device (not shown); Two second electrodes 21 and 22 are provided. The second electrodes 21 and 22 are components of the electrode device 20 which is an embodiment of the present invention.

各第2電極は電極10から略等距離の位置にお
かれる。一方の第2電極21は第1インピーダン
ス41の一方の端子に接続され、他方の第2電極
22は第1インピーダンスと並列配置の第2イン
ピーダンス42の一方の端子に接続される。第1
電極10とインピーダンス41,42の他方の端
子との間には、交流電源部5の後記昇圧トランス
54の2次側が接続される。また、インピーダン
ス41,42の前記他方の端子は安全のため接地
される。電源部5は、交流電源51と、この出力
に基いて所望の交番波形を発生する発振器52
(電源出力の周波数も変更可)と、発振器出力を
増幅する増幅器53と、増幅器出力に基いて2次
側に所望の高電圧を発生させる昇圧トランス54
とを備えており、これらによつて任意の低電圧、
任意の低周波から、トランス54の2次側に所望
の高電圧及び所望の高周波を得ることができる。
6は包装体A上に生ずる放電電流を2系統から個
別に検出してピンホールの有無を判定するための
判定器で、電極10と電極21との間に流れる電
流及び電極10と電極22との間に流れる電流を
個別に検出して、その差を各インピーダンスの両
端間の電圧の差に変換するものである。更に説明
すると、この判定器6は、電極21と22に接続
された差動増幅器61と、増幅器61の出力から
ある設定値以上の波形のみを取出す波形変換回路
62と、回路62の出力波を正又は負の方向に揃
える絶対値回路63と、該回路に接続されたコン
パレータ(電圧レベル判定器)64とを備えてい
る。
Each second electrode is positioned approximately equidistant from electrode 10. One second electrode 21 is connected to one terminal of a first impedance 41, and the other second electrode 22 is connected to one terminal of a second impedance 42 arranged in parallel with the first impedance. 1st
Between the electrode 10 and the other terminal of the impedances 41 and 42, the secondary side of a step-up transformer 54 (described later) of the AC power supply section 5 is connected. Further, the other terminals of the impedances 41 and 42 are grounded for safety. The power supply unit 5 includes an AC power supply 51 and an oscillator 52 that generates a desired alternating waveform based on the output of the AC power supply 51.
(the frequency of the power supply output can also be changed), an amplifier 53 that amplifies the oscillator output, and a step-up transformer 54 that generates a desired high voltage on the secondary side based on the amplifier output.
and are equipped with any low voltage,
A desired high voltage and a desired high frequency can be obtained on the secondary side of the transformer 54 from any low frequency.
Reference numeral 6 denotes a determiner for individually detecting the discharge current generated on the package A from two systems to determine the presence or absence of a pinhole. The current flowing between each impedance is individually detected and the difference is converted into a voltage difference between both ends of each impedance. To explain further, this determiner 6 includes a differential amplifier 61 connected to the electrodes 21 and 22, a waveform conversion circuit 62 that extracts only a waveform equal to or higher than a certain set value from the output of the amplifier 61, and an output wave of the circuit 62. It includes an absolute value circuit 63 for aligning in the positive or negative direction, and a comparator (voltage level determiner) 64 connected to the circuit.

かくして、電極10と電極21,22との間に
電圧を印加すると、包装体にピンホールが無い場
合は、包装体A上に2系統のコロナ放電電流が生
ずる。この電流の差は実質上零又は零に近いもの
となる。
Thus, when a voltage is applied between the electrode 10 and the electrodes 21, 22, two systems of corona discharge current are generated on the package A if there are no pinholes in the package. This current difference will be substantially zero or close to zero.

包装体Aにピンホールがある場合は、2系統の
放電電流のうち一方は火花放電電流となるので、
2系統放電電流間の差は大きくなる。
If there is a pinhole in package A, one of the two discharge currents will be a spark discharge current, so
The difference between the two system discharge currents becomes large.

従つて、判定器6が2系統放電電流を個別に検
出してその差を電圧に変換するので、その変換値
が零又は零に近いときはピンホール無し、大きい
ときはピンホール有りと判定でき、或は上記変換
値が、予め定めた値より小のときはピンホール無
し、大のときはピンホール有りと判定できる。
Therefore, since the determiner 6 detects the discharge currents of the two systems individually and converts the difference into voltage, it can be determined that there is no pinhole when the converted value is zero or close to zero, and that there is a pinhole when it is large. , or when the converted value is smaller than a predetermined value, it can be determined that there is no pinhole, and when it is larger, it can be determined that there is a pinhole.

第3図はいわゆる単動式ピンホール検査装置例
の概略を示している。
FIG. 3 schematically shows an example of a so-called single-action pinhole inspection device.

この装置例においては、第2電極21,22は
共に1つのインピーダンス4の一方の端子に接続
され、第1電極10は電源部5′を介してインピ
ーダンス4の他方の端子に接続されている。更に
インピーダンス4には判定器60が接続されてい
る。電源部5′の端子は接地されている。
In this device example, the second electrodes 21 and 22 are both connected to one terminal of one impedance 4, and the first electrode 10 is connected to the other terminal of the impedance 4 via the power supply section 5'. Furthermore, a determiner 60 is connected to the impedance 4. A terminal of the power supply section 5' is grounded.

かくして、電極10と電極21,22との間に
電圧を印加されると、包装体Aにピンホールが無
い場合は、該電極間にコロナ放電電流i1が生じ、
ピンホールが有る場合は、該電極間に火花放電電
流i2が生じる。i2>i1の関係があるので、予めi2
is>i1である値(ある一定の基準値)isを設定して
おき、個々の包装体Aに応じて前記電極間に発生
する放電電流を検出し、その検出電流がisより大
であるときはピンホール有り、isより小であると
きはピンホール無しと判定される。
Thus, when a voltage is applied between the electrode 10 and the electrodes 21, 22, if there is no pinhole in the package A, a corona discharge current i1 is generated between the electrodes,
If there is a pinhole, a spark discharge current i 2 will occur between the electrodes. Since there is a relationship of i 2 > i 1 , i 2 >
A value (certain reference value) i s that satisfies i s > i 1 is set, and the discharge current generated between the electrodes is detected according to each package A, and the detected current is determined from i s. If it is large, it is determined that there is a pinhole, and if it is smaller than i s , it is determined that there is no pinhole.

上記差動式及び単動式の各ピンホール有無検査
方法及び装置については、既に特開昭54−76284
号公報に記載されているのでここではこれ以上説
明しない。
Regarding the pinhole presence inspection method and device for the differential type and single acting type mentioned above, it has already been published in Japanese Patent Application Laid-Open No. 54-76284.
Since it is described in the publication, no further explanation will be given here.

斯かるピンホール有無検査において用いられる
上記本考案電極装置20について更に詳述する。
この装置20の各電極21,22は、基体23の
前部231を摺動自在に貫通して基体内へ延び、
電極保持部24に保持されている。基体23後面
に固着された電磁石装置25から可動ロッド25
1が基体23内へ延び、これは保持部24に連結
されている。基体前部231と保持部24との間
で各電極21,22にコイルバネ26嵌装されて
いる。このコイルバネは電極21,22を包装体
Aから後退させる方向へ偏倚させる力を付与する
もので、電磁石装置25がオフ状態のときには電
極21,22を後退位置におく。電磁石装置25
は通電(オン)状態においてその可動ロツド25
1を突出させ、コイルバネ26の弾力に抗して電
極21,22をその前進位置へ移動させることが
できる。
The electrode device 20 of the present invention used in such a pinhole presence inspection will be described in further detail.
Each electrode 21, 22 of this device 20 extends slidably through the front portion 231 of the base body 23 into the base body;
It is held by the electrode holding part 24. A movable rod 25 is connected to an electromagnet device 25 fixed to the rear surface of the base body 23.
1 extends into the base body 23 , which is connected to the holding part 24 . A coil spring 26 is fitted to each electrode 21, 22 between the base body front part 231 and the holding part 24. This coil spring applies a force that biases the electrodes 21 and 22 in the direction of retreating from the package A, and places the electrodes 21 and 22 in the retreated position when the electromagnetic device 25 is in the OFF state. Electromagnet device 25
is the movable rod 25 in the energized (on) state.
1 can be made to protrude, and the electrodes 21 and 22 can be moved to their advanced positions against the elasticity of the coil spring 26.

この電磁石装置25は、検査位置を通過する包
装体A被検査部位の凹凸状態に応じてスイツチ装
置によりオン−オフされるようになつている。こ
のスイツチ装置は、電磁石装置25へ通電するた
めの図外の公知回路にしてスイツチ部を含むもの
と、該スイツチ部を操作するタイミング装置27
とを備えている。タイミング装置27は、第4図
に示すように、包装体Aの被検査部位A1,A2
A3(第5図参照)が検査位置を通過する間に1回
転する円板271と、円板271に臨むフオトマ
イクロセンサ272とを含んでいる。円板271
は、被検査部位A1,A2に対し凹所となつた被検
査部位A3が検査位置を通過する時間に対応する
大きさの切欠き部273を有し、この切欠き部は
フオトマイクロセンサ272により検出され、こ
の検出信号によつて前記スイツチ部が閉じられる
ようになつている。該スイツチ部が閉じられると
電磁石装置25はオン状態となり、電極21,2
2はその後退位置から前進位置へ突出せしめられ
る。
This electromagnetic device 25 is turned on and off by a switch device depending on the unevenness of the inspected portion of the package A passing through the inspection position. This switch device includes a known circuit (not shown) for energizing the electromagnet device 25 and includes a switch portion, and a timing device 27 for operating the switch portion.
It is equipped with The timing device 27, as shown in FIG .
It includes a disk 271 that rotates once while A 3 (see FIG. 5) passes the inspection position, and a photomicro sensor 272 that faces the disk 271. Disk 271
has a notch 273 having a size corresponding to the time that the part to be inspected A 3 , which is a recess with respect to the parts to be inspected A 1 and A 2 , passes through the inspection position, and this notch is used for the photomicroscope. It is detected by a sensor 272, and the switch section is closed in response to this detection signal. When the switch section is closed, the electromagnetic device 25 is turned on, and the electrodes 21, 2
2 is projected from its retracted position to its forward position.

従つて、第5図(電極21は電極22の下側に
あつて図には表われていない)から分かるよう
に、電極21,22は、包装体Aの部位A1,A2
が検査位置を通過するときには後退位置にあつて
部位A1,A2とはピンホール検出可能な適度の放
電距離L1を保つており、部位A3が検査位置を通
過するときには前進位置にあつて部位A3とはピ
ンホール検出可能な放電距離L2を保つ。L1>L2
の関係にあるが、これは部位A3においては、吊
下げ部A4形成のため包装体壁が部位A1,A2にお
けるよりも厚くなつているためである。
Therefore, as can be seen from FIG. 5 (electrode 21 is located below electrode 22 and is not shown in the figure), electrodes 21 and 22 are located at portions A 1 and A 2 of package A.
When passing through the inspection position, it is in the backward position and maintains an appropriate discharge distance L 1 from parts A 1 and A 2 that can detect pinholes, and when part A 3 passes through the inspection position, it is in the forward position. Keep a discharge distance L 2 between the part A 3 and the pinhole detectable distance. L 1 > L 2
This is because the wall of the package is thicker in the region A 3 than in the regions A 1 and A 2 due to the formation of the hanging portion A 4 .

斯くして印加電圧一定のままで部位A1,A2
A3のピンホール有無検査を安全正確に行なえる。
In this way, while the applied voltage remains constant, the parts A 1 , A 2 ,
A3 pinhole inspection can be performed safely and accurately.

次に第6図及び第7図に示す本考案の他の実施
例30につき説明する。
Next, another embodiment 30 of the present invention shown in FIGS. 6 and 7 will be described.

この電極装置30においては、ブロツク31,
32を間隙をあけて上下に対向配置し、該ブロツ
ク背面をプレート33で連結したフレームが構成
され、該フレームはプレート33とは反対側を包
装体Aの移送路に臨ませて配置される。ブロツク
31,32間の間隙は、包装体Aの被検査部位に
ある吊下げ部A4をブロツク間に導入案内するよ
うに上下間隔が次第にせまくなつた導入案内用間
隙301と、間隙301に続く電極配置間隙30
2と、間隙302に続く送出し案内用間隙303
とからなる。
In this electrode device 30, blocks 31,
A frame is constructed by arranging blocks 32 facing each other vertically with a gap between them, and connecting the back surfaces of the blocks with a plate 33, and the frame is arranged with the side opposite to the plate 33 facing the transport path of the package A. The gap between the blocks 31 and 32 is continuous with the introduction guide gap 301 in which the vertical interval becomes gradually narrower so as to guide the introduction of the hanging part A4 in the inspection area of the package A between the blocks. Electrode placement gap 30
2, and a feed guide gap 303 following the gap 302.
It consists of.

間隙302には第2図に示す電極21,22に
相当する2つの電極341,342が上下に略水
平平行に配置され、これら電極は、ブロツク3
1,32に回動自在に支承された垂直軸351,
352の端部のうち間隙302内にある端部に片
持ち支持されている。垂直軸351,352の他
方の端部にはバネ支持アーム361,362が取
り付けられ、ブロツク31,32とこのアーム3
61,362間には引張りバネ371,372が
張設される。このバネは、軸351,352を介
して、電極341,342を包装体Aの方へ前進
回動させる(第7図参照)偏倚力を付与する。垂
直軸351,352の前記他方の端部には更に水
平なアーム381,382が片持ち支持されてい
る。
In the gap 302, two electrodes 341 and 342 corresponding to the electrodes 21 and 22 shown in FIG.
1, 32, a vertical shaft 351 rotatably supported;
352 is cantilevered by the end located within the gap 302. Spring support arms 361, 362 are attached to the other ends of the vertical shafts 351, 352, and the blocks 31, 32 and the arms 3
Tension springs 371 and 372 are tensioned between 61 and 362. This spring provides a biasing force via the shafts 351, 352 that causes the electrodes 341, 342 to rotate forward toward the package A (see FIG. 7). Further, horizontal arms 381, 382 are cantilevered at the other ends of the vertical shafts 351, 352.

ブロツク31,32及び連結プレート33で構
成されるフレームの背部には電磁石装置393が
取付枠394を介して保持され、装置393から
突出した可動ロツド395にはプレート396が
固着され、このプレート396の上下端にはプツ
シユロツド391,392が片持ち支持され、該
プツシユロツドはフレームを摺動自在に貫通して
アーム381,382の方へ延びている。
An electromagnetic device 393 is held on the back of the frame composed of the blocks 31, 32 and the connecting plate 33 via a mounting frame 394, and a plate 396 is fixed to a movable rod 395 protruding from the device 393. Push rods 391 and 392 are cantilevered at the upper and lower ends and extend slidably through the frame toward arms 381 and 382.

電磁石装置393がオフ状態のときには、バネ
371,372の作用により電極341,342
は、凹所となつた被検査部位A3を検査すべき前
進位置(第7図に仮想線で示す位置)に置かれ
る。
When the electromagnet device 393 is in the off state, the electrodes 341 and 342 are closed by the action of the springs 371 and 372.
is placed in the forward position (the position shown by the imaginary line in FIG. 7) where the inspection site A3 , which has become a recess, is to be inspected.

電磁石装置393はオン状態において、その可
動ロツド395を突出させ、プレート396及び
プツシユロツド391,392を介してアーム3
81,382を押し、以つてバネ371,372
の弾力に抗して電極341,342を検査部位
A1,A2を検査すべき後退位置(第7図に破線で
示す位置)へ移動させる。
When the electromagnet device 393 is in the ON state, the movable rod 395 is projected, and the arm 3 is connected to the arm 3 via the plate 396 and push rods 391 and 392.
81, 382, and then springs 371, 372
The electrodes 341 and 342 are moved against the elasticity of the test area.
Move A 1 and A 2 to the retracted position (indicated by the broken line in Figure 7) to be inspected.

この電磁石装置393も、検査位置を通過する
包装体A被検査部位の状態に応じて、既に述べた
最初の実施例におけると同様の図外スイツチ装置
によりオン−オフされるようになつている。但
し、第6及び7図の実施例の場合には、電磁石装
置へ通電するための回路中のスイツチ部は常時閉
成されており(従つて電磁石は常時オン状態にあ
り)、タイミング装置は被検査部位A3が検査位置
を通過する間、該スイツチ部を開成するようにな
つている。
This electromagnetic device 393 is also turned on and off by a switch device (not shown) similar to that in the first embodiment already described, depending on the state of the inspected portion of the package A passing through the inspection position. However, in the embodiments of Figures 6 and 7, the switch section in the circuit for energizing the electromagnet device is normally closed (therefore, the electromagnet is always on), and the timing device is not exposed. The switch section is opened while the inspection site A3 passes through the inspection position.

前述した各実施例における電磁石装置をオンー
オフするスイツチ装置は、前述例に限定されるも
のではなく、例えばタイミング装置をリミツトス
イツチ或は近接スイツチを用いたものにかえるこ
とも可能である。
The switch device for turning on and off the electromagnetic device in each of the embodiments described above is not limited to the above example, and for example, the timing device may be replaced with a limit switch or a proximity switch.

かくの如く本考案によれば、電極と密封包装体
の被検査部位間の距離を、該被検査部位の形状や
壁厚差に拘らず、ピンホール検出可能な放電距離
に保つことができ、印加電圧も必要最小の一定の
値に設定でき、被検査部位の形状や壁厚差に拘ら
ず、しかも当該部位の絶縁破壊を招くおそれな
く、ピンホール有無検査を正確に行なえる利点が
ある。
As described above, according to the present invention, the distance between the electrode and the part to be inspected of the sealed package can be maintained at a discharge distance that allows pinhole detection, regardless of the shape of the part to be inspected or the difference in wall thickness. The applied voltage can also be set to the minimum necessary constant value, and there is an advantage that pinhole presence inspection can be performed accurately regardless of the shape or wall thickness difference of the part to be inspected, and without fear of causing dielectric breakdown of the part.

なお、第2図及び第3図に示されるピンホール
検査装置における電極10は、包装体Aの他の被
検査部位A′の輪郭に応じた形状の臨部を周辺部
に有して、包装体Aの順次移送に応じて回動して
該臨部が被検査部位A′に臨める回動電極である。
Note that the electrode 10 in the pinhole inspection device shown in FIGS. 2 and 3 has a peripheral portion shaped in accordance with the contour of the other inspected area A' of the package A, and It is a rotating electrode that rotates as the body A is sequentially transferred, so that its front part can face the area to be inspected A'.

この電極は、例えばそれぞれが前記各臨部の一
部を有する複数のプレート状電極エレメントを電
極回動軸線方向に重ね配置して構成することがで
きる。
This electrode can be constructed, for example, by stacking a plurality of plate-shaped electrode elements, each of which has a portion of each of the aforesaid portions, in the direction of the electrode rotation axis.

この回動電極の1例が第8図に示されており、
この電極1は、これが接触乃至接近すべき包装体
Aの口部A′(被検査部位)の輪郭に略做つた形状
の複数の臨部11を周辺部12に有しており、ア
ーム13にシヤフト14にて回動自在に支承され
ている。アーム13は更に固定フレーム15に回
動自在に支承されていると共に、図外の適宜のバ
ネ手段により、電極を包装体Aの進行路中の検査
位置へ配置せしめる如く、常時偏倚力を受けてい
る。またこの電極は、後述する包装体Aとの接触
乃至接近開始が円滑に行われるように、接触乃至
接近部11の入口付近110がやや広く且つ滑ら
かに形成されている。
An example of this rotating electrode is shown in FIG.
This electrode 1 has a plurality of prongs 11 in its peripheral part 12, each having a shape that roughly follows the contour of the mouth A' (tested part) of the package A with which it should come into contact or approach, and has an arm 13. It is rotatably supported by a shaft 14. The arm 13 is further rotatably supported by a fixed frame 15, and is constantly biased by an appropriate spring means (not shown) so as to position the electrode at an inspection position in the travel path of the package A. There is. Further, this electrode is formed to be slightly wider and smoother in the vicinity of the entrance 110 of the contacting or approaching portion 11 so that the electrode can smoothly start contacting or approaching the package A, which will be described later.

電極は、複数のプレート状電極エレメント16
a,16b,16c…16gをシヤフト14の長
手方向に間隔をあけて又は間隔をあけずに重ね配
置してなつており、各エレメントは、臨部11の
一部を有している。このような構成にすると、各
エレメントをプレス加工により簡単に得て、これ
らエレメントを重ね配置するだけでよいから、電
極が接触すべき物体の所定部位の輪郭に応じた形
状の臨部を容易に得られるという利点がある。
The electrode includes a plurality of plate-shaped electrode elements 16
a, 16b, 16c, . With this configuration, each element can be easily obtained by press working and all that is required is to stack these elements, making it easy to form a part that matches the outline of a predetermined part of the object that the electrode is to contact. There are advantages that can be obtained.

図外の給送装置により順次移送されてくる複数
の包装体Aは、それぞれその口部A′が電極の臨
部11と接触乃至接近を開始すると共に上記バネ
手段に逆つて電極を若干持上げつつ電極を回動し
始める。
The plurality of packages A, which are sequentially transferred by a feeding device (not shown), have their mouths A' start contacting or approaching the proximal part 11 of the electrode, and at the same time, the electrodes are slightly lifted against the spring means. Start rotating the electrode.

包装体Aの移動と、これに伴う電極の回動によ
つて、包装体口部A′は、十分、確実に臨部11
に嵌合接触し、口部A′にピンホールがある場合
は、ピンホール有りと判定するに十分な放電電流
が確実に発生し、その後電極から離れて行く。1
つの包装体Aが電極を離れるときには、次の臨部
11が次の包装体Aに接触開始する位置に置かれ
る。
Due to the movement of the package A and the accompanying rotation of the electrode, the package mouth A' is sufficiently and reliably connected to the front part 11.
If there is a pinhole in the opening A', a discharge current sufficient to determine that there is a pinhole will be generated, and then the electrode will move away from the electrode. 1
When one package A leaves the electrode, the next part 11 is placed in a position to start contacting the next package A.

上記回動電極1は、包装体Aの移動により回動
するようになつているが、例えば包装体Aの移動
速度に同調する速度で図外の適宜駆動手段により
駆動されてもよい。この場合には、臨部11は1
つでも足りる場合がある。
The rotating electrode 1 is designed to rotate as the package A moves, but may be driven by an appropriate drive means (not shown) at a speed that is synchronized with the moving speed of the package A, for example. In this case, the part 11 is 1
Sometimes even one is enough.

上記回動電極によれば、電極は被検査部位の輪
郭に応じた形状の該電極の臨部が、包装体Aの移
送に応じた電極回動と共に被検査部位に臨むこと
ができるので、被検査部位への確実な電極接触乃
至接近が可能となり、従つてこの回動電極を本考
案電極装置と共に用いれば、ピンホール有無検査
精度及び検査速度の飛躍的向上を図ることができ
る。
According to the above-mentioned rotating electrode, the front part of the electrode, which is shaped according to the outline of the area to be inspected, can face the area to be inspected as the electrode rotates in accordance with the transfer of the package A. It is possible to reliably bring the electrode into contact with or approach the inspection site. Therefore, if this rotating electrode is used together with the electrode device of the present invention, it is possible to dramatically improve pinhole detection accuracy and inspection speed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は密封包装体のピンホール有無検査の従
来例の説明図、第2図及び第3図は本考案の1実
施電極装置を用いた差動式及び単動式ピンホール
有無検査装置例の慨略図、第4図はタイミング装
置例の斜面図、第5図は第2図及び第3図に示す
電極装置を用いたピンホール有無検査状況の説明
図、第6図及び第7図は本考案の他の実施例の正
面図及び平面図、第8図は回動電極例を示す斜面
図である。 20,30……本考案電極装置例、21,2
2,341,342……電極、l1,l2,L1,L2
…電極と被検査部位間の距離、26,371,3
72……バネ、25,393……電磁石装置、
C,A……密封包装体、C1,C2,C3,A1,A2
A3……被検査部位。
Fig. 1 is an explanatory diagram of a conventional example of pinhole presence inspection in a sealed package, and Figs. 2 and 3 are examples of differential and single-acting pinhole presence inspection devices using the first implementation electrode device of the present invention. 4 is a perspective view of an example of a timing device, FIG. 5 is an explanatory diagram of a pinhole presence inspection situation using the electrode device shown in FIGS. 2 and 3, and FIGS. 6 and 7 are A front view and a plan view of another embodiment of the present invention, and FIG. 8 is a perspective view showing an example of a rotating electrode. 20, 30... Example of the electrode device of the present invention, 21, 2
2,341,342... Electrode, l 1 , l 2 , L 1 , L 2 ...
...Distance between electrode and test site, 26,371,3
72... Spring, 25,393... Electromagnetic device,
C, A... Sealed package, C 1 , C 2 , C 3 , A 1 , A 2 ,
A 3 ... Part to be inspected.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 密封包装体の放電式ピンホール有無検査に用い
る電極装置にして、該密封包装体の移送路中の検
査位置において該移送路に臨む電極と、該移送路
に沿って送られてくる密封包装体が該検査位置を
通過するとき、前記電極及び該密封包装体の被検
査部位間の距離がピンホール検出可能な放電距離
に保たれるように該電極を前記被検査部位に対し
前後動させるための電極駆動装置とを備え、前記
電極駆動装置が、前記電極前進方向又は後退方向
の偏倚力を与えるバネ装置と、前記電極に前記バ
ネ装置による偏倚力に勝る反対偏倚力を与えるこ
とができる電磁石装置と、前記密封包装体の被検
査部位の状態に応じて、該電磁石装置をオン−オ
フするスイツチ装置とを備えていることを特徴と
する電極装置。
An electrode device used for discharge-type pinhole presence inspection of sealed packages, comprising: an electrode facing the transfer path at an inspection position in the transfer path of the sealed package; and a sealed package sent along the transfer path. When the electrode passes through the inspection position, the electrode is moved back and forth with respect to the inspection area so that the distance between the electrode and the inspection area of the sealed package is maintained at a discharge distance that allows pinhole detection. an electrode driving device, wherein the electrode driving device includes a spring device that applies a biasing force in the forward direction or the backward direction of the electrode, and an electromagnet that can apply a biasing force opposite to the biasing force by the spring device to the electrode. 1. An electrode device comprising: a device; and a switch device that turns on and off the electromagnetic device depending on the state of the inspected portion of the sealed package.
JP18822781U 1981-12-16 1981-12-16 Electrode device used for discharge-type pinhole inspection of sealed packages Granted JPS5892658U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18822781U JPS5892658U (en) 1981-12-16 1981-12-16 Electrode device used for discharge-type pinhole inspection of sealed packages

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18822781U JPS5892658U (en) 1981-12-16 1981-12-16 Electrode device used for discharge-type pinhole inspection of sealed packages

Publications (2)

Publication Number Publication Date
JPS5892658U JPS5892658U (en) 1983-06-23
JPS6346843Y2 true JPS6346843Y2 (en) 1988-12-05

Family

ID=29991618

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18822781U Granted JPS5892658U (en) 1981-12-16 1981-12-16 Electrode device used for discharge-type pinhole inspection of sealed packages

Country Status (1)

Country Link
JP (1) JPS5892658U (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0726889B2 (en) * 1986-12-15 1995-03-29 ニツカ電測株式会社 Pinhole detection device

Also Published As

Publication number Publication date
JPS5892658U (en) 1983-06-23

Similar Documents

Publication Publication Date Title
KR940018947A (en) Wafer detection and clamping monitor
JPS6346843Y2 (en)
FR2599840B1 (en) METHOD AND APPARATUS FOR NON-CONTACT MEASUREMENT OF THE VOLTAGE EXISTING IN A PLANE SHEET AND IN PARTICULAR A CONTINUOUS STRIP OF PAPER
JPS6311654Y2 (en)
EP1057619B1 (en) Flaw detector for package closures
ES548604A0 (en) PROCEDURE AND APPARATUS FOR VERIFICATION, BY MEASUREMENT OF IMPEDANCE, OF THE ELECTRICAL CONTINUITY OF A DEVICE OF ELECTROCONDUCTIVE MATERIAL
US6130702A (en) Method for reliable loading of unexposed printing plates
JP2003307509A (en) Pinhole inspection method for insulating covering material
JPH08240569A (en) Method and device for inspecting pinhole inferiority of food package sheet and food air-tight vessel
JP2004069458A (en) Pin hole inspection method for sealed food packaging container
JPS642886B2 (en)
US5056646A (en) Electrostatic-type registration system
JPH0623716B2 (en) Defect detection method and device for laminated material can lid
JPH0747732Y2 (en) Insulating film defect detection device for double-sided insulating coated steel sheet
JPH09222378A (en) Pin hole inspection device
JPS5945934B2 (en) Inspection method and device for internal vacuum degree of sealed container made of insulating material
JPH02269933A (en) Liquid leak detecting device for package body
JPS6446622A (en) Discharge type leak inspecting device
JP3971921B2 (en) A unit that attaches a removable opening device to a web of packaging material to produce a sterile hermetic package of liquid food
JPH10185852A (en) Apparatus and method for inspection of pinhole
JPH03123855A (en) Insulating film pinhole detecting device for insulating film steel plate
JPS5633846A (en) Detecting method for semiconductor substrate
JP2020201104A (en) Sealability inspection device and sealability inspection method
JPS61203319A (en) Method and device for packaging cake, etc.
JP2012026801A (en) Inspection apparatus and inspection method