JPS63229317A - Apparatus for inspecting burr of object to be inspected - Google Patents

Apparatus for inspecting burr of object to be inspected

Info

Publication number
JPS63229317A
JPS63229317A JP6252987A JP6252987A JPS63229317A JP S63229317 A JPS63229317 A JP S63229317A JP 6252987 A JP6252987 A JP 6252987A JP 6252987 A JP6252987 A JP 6252987A JP S63229317 A JPS63229317 A JP S63229317A
Authority
JP
Japan
Prior art keywords
burr
flaw
inspected
shade
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6252987A
Other languages
Japanese (ja)
Inventor
Shingo Sekiguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP6252987A priority Critical patent/JPS63229317A/en
Publication of JPS63229317A publication Critical patent/JPS63229317A/en
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To judge a flaw at a high speed, by picking up only the burr part of an object to be inspected as a shade and extracting a flaw part by the binarization and thinning of the image pickup signal of the burr part.
CONSTITUTION: A diffusion plate 2 allows the light from a lower light source to diffuse to allow the whole of an object 1 to be inspected to appear as a shade. An upper light source 4 illuminates the upper surface of the object 1 to leave the burr 5 at the bottom part of the object in a shade state. The image pickup signal obtained by a camera 6 is binarized by the binarization circuit 8 of an image processor 7 and only the part of the burr 5 is extracted. Continuously, the part of the burr 5 extracted by a thinning circuit 9 is thinned and, at this time, a flaw part exceeding the tolerance range of the burr 5 appears as a part markedly protruding from other part. This signal is sent to a 3×3 flaw detection filter 10 and, when the signal coincides with a flaw mask A (at the time of an end point) or a flaw mask B (a line width is other than 1), the product is determined as defective.
COPYRIGHT: (C)1988,JPO&Japio
JP6252987A 1987-03-19 1987-03-19 Apparatus for inspecting burr of object to be inspected Granted JPS63229317A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6252987A JPS63229317A (en) 1987-03-19 1987-03-19 Apparatus for inspecting burr of object to be inspected

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6252987A JPS63229317A (en) 1987-03-19 1987-03-19 Apparatus for inspecting burr of object to be inspected

Publications (1)

Publication Number Publication Date
JPS63229317A true JPS63229317A (en) 1988-09-26

Family

ID=13202810

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6252987A Granted JPS63229317A (en) 1987-03-19 1987-03-19 Apparatus for inspecting burr of object to be inspected

Country Status (1)

Country Link
JP (1) JPS63229317A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05149715A (en) * 1991-11-28 1993-06-15 Honda Motor Co Ltd Device for detecting position of hub-bolt hole
JP2018179774A (en) * 2017-04-13 2018-11-15 株式会社コジマプラスチックス Component shape inspection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05149715A (en) * 1991-11-28 1993-06-15 Honda Motor Co Ltd Device for detecting position of hub-bolt hole
JP2018179774A (en) * 2017-04-13 2018-11-15 株式会社コジマプラスチックス Component shape inspection device

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